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TEM Secondary Electron Diffraction

TEM Secondary Electron Diffraction, Total:78 items.

In the international standard classification, TEM Secondary Electron Diffraction involves: Optical equipment, Optics and optical measurements, Analytical chemistry, Metrology and measurement in general, Education, Optoelectronics. Laser equipment, Testing of metals, Technical drawings, Surface treatment and coating, Materials for the reinforcement of composites, Physics. Chemistry, Air quality.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, TEM Secondary Electron Diffraction

GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
GB/Z 21738-2008 Fundamental structures of one dimensional nano-materials.High resolution transmission electron microscopy characterization

International Organization for Standardization (ISO), TEM Secondary Electron Diffraction

ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
ISO/TS 22292:2021 Nanotechnologies — 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

British Standards Institution (BSI), TEM Secondary Electron Diffraction

BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
15/30292710 DC BS ISO 19214. Guidelines for growth direction determination of wirelike crystals by transmission electron microscopy
BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
BS PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy

Professional Standard - Machinery, TEM Secondary Electron Diffraction

JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

Group Standards of the People's Republic of China, TEM Secondary Electron Diffraction

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China, TEM Secondary Electron Diffraction

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Professional Standard - Education, TEM Secondary Electron Diffraction

JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy

国家市场监督管理总局、中国国家标准化管理委员会, TEM Secondary Electron Diffraction

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy

Shanghai Provincial Standard of the People's Republic of China, TEM Secondary Electron Diffraction

DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

IX-IX-IEC, TEM Secondary Electron Diffraction

IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy

Korean Agency for Technology and Standards (KATS), TEM Secondary Electron Diffraction

KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
KS I ISO 13794-2008(2018) Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method

KR-KS, TEM Secondary Electron Diffraction

KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy

工业和信息化部, TEM Secondary Electron Diffraction

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy

American Society for Testing and Materials (ASTM), TEM Secondary Electron Diffraction

ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes

Professional Standard - Commodity Inspection, TEM Secondary Electron Diffraction

SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, TEM Secondary Electron Diffraction

GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope

PH-BPS, TEM Secondary Electron Diffraction

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

Danish Standards Foundation, TEM Secondary Electron Diffraction

DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

Association Francaise de Normalisation, TEM Secondary Electron Diffraction

FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission

European Committee for Standardization (CEN), TEM Secondary Electron Diffraction

EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

AENOR, TEM Secondary Electron Diffraction

UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.

ES-UNE, TEM Secondary Electron Diffraction

UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)

AT-ON, TEM Secondary Electron Diffraction

OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

Japanese Industrial Standards Committee (JISC), TEM Secondary Electron Diffraction

JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method

未注明发布机构, TEM Secondary Electron Diffraction

DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy

German Institute for Standardization, TEM Secondary Electron Diffraction

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022

GOSTR, TEM Secondary Electron Diffraction

PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry