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Substrate defect

Substrate defect, Total:6 items.

In the international standard classification, Substrate defect involves: Semiconductor devices.

Group Standards of the People's Republic of China, Substrate defect

• T/CASAS 004.1-2018 The Terminology for Defects in both 4H-SiC Substrates and Epilayers
• T/CASAS 004.2-2018 The Metallographs Collection for Defects in both 4H-SiC Substrates and Epilayers

British Standards Institution (BSI), Substrate defect

• BS IEC 63229:2021 Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
• 18/30386543 DC BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
• 19/30404655 DC BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

International Electrotechnical Commission (IEC), Substrate defect

• IEC 63229:2021 Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Others:   Substrate, led substrate, GaN substrate, led substrate, Substrate lattice, insulating substrate, led +substrate+, Substrate defect, Substrate, single crystal substrate, Substrate structure, thin film substrate, silicon substrate, substrate salt, single crystal substrate, silicon substrate, Substrate tool, substrate film, Substrate preparation, foam backing.