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Sample Preparation for Electron Probe Instruments

Sample Preparation for Electron Probe Instruments, Total:10 items.

In the international standard classification, Sample Preparation for Electron Probe Instruments involves: Optical equipment, Analytical chemistry, Ceramics.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Sample Preparation for Electron Probe Instruments

• GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
• GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
• GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products

National Electrical Manufacturers Association（NEMA), Sample Preparation for Electron Probe Instruments

• NEMA LL 6-1999 Procedures for Integral Electronic Compact Fluorescent Lamp Sample Preparation and the TCLP

Korean Agency for Technology and Standards (KATS), Sample Preparation for Electron Probe Instruments

• KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KR-KS, Sample Preparation for Electron Probe Instruments

• KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

British Standards Institution (BSI), Sample Preparation for Electron Probe Instruments

• BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
• BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

Association Francaise de Normalisation, Sample Preparation for Electron Probe Instruments

• NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

Japanese Industrial Standards Committee (JISC), Sample Preparation for Electron Probe Instruments

• JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

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