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Electron probe sample preparation

Electron probe sample preparation, Total:36 items.

In the international standard classification, Electron probe sample preparation involves: Optical equipment, Optics and optical measurements, Test conditions and procedures in general, Analytical chemistry, Products of non-ferrous metals, Spices and condiments. Food additives, Nuclear energy engineering, Tobacco, tobacco products and related equipment, Ceramics, Vocabularies.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron probe sample preparation

• GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
• GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
• GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
• GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
• GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
• GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis

国家市场监督管理总局、中国国家标准化管理委员会, Electron probe sample preparation

• GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

IPC - Association Connecting Electronics Industries, Electron probe sample preparation

• IPC TM-650 5.6-1973 Preparation of Printed Circuit Specimens

Association Francaise de Normalisation, Electron probe sample preparation

• NF V03-926*NF ISO 5502:1993 Oilseed residues. Preparation of test samples.
• NF EN 12229:2014 Sols sportifs - Méthode de préparation d'éprouvettes en textile aiguilleté et en gazon synthétique
• NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
• NF V32-051:1968 Spices and condiments. Mustard seeds. Preparation of sample for laboratory analysis.
• NF C93-400-16-1*NF EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1 : mechanical tests on contacts and terminations - Test 16a : probe damage

National Electrical Manufacturers Association（NEMA), Electron probe sample preparation

• NEMA LL 6-1999 Procedures for Integral Electronic Compact Fluorescent Lamp Sample Preparation and the TCLP

Korean Agency for Technology and Standards (KATS), Electron probe sample preparation

• KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
• KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy

KR-KS, Electron probe sample preparation

• KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
• KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

RU-GOST R, Electron probe sample preparation

• GOST 28106-1989 Copper cathodes. Sampling and preparation of samples and test pieces for determination of electrical resistivity
• GOST 28106-2015 Copper cathodes. Sampling and preparation of samples and pieces for determination of electrical resistivity

British Standards Institution (BSI), Electron probe sample preparation

• BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
• BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
• BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
• BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage
• 20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product

International Organization for Standardization (ISO), Electron probe sample preparation

• ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
• ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
• ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
• ISO/CD 17297 Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

US-FCR, Electron probe sample preparation

• FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

American Society for Testing and Materials (ASTM), Electron probe sample preparation

• ASTM D5139-90(1996) Standard Specification for Sample Preparation for Qualification Testing of Coatings to be Used in Nuclear Power Plants
• ASTM D5139-19 Standard Specification for Sample Preparation for Qualification Testing of Coatings to be Used in Nuclear Power Plants

Professional Standard - Tobacco, Electron probe sample preparation

• YC/T 510-2014 Measurement for tobacco molecular biology.Preparation of tobacco leaf samples.Liquid nitrogen-method

ES-UNE, Electron probe sample preparation

• UNE-EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)

German Institute for Standardization, Electron probe sample preparation

• DIN EN 60512-16-1:2009-03 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008 / Note: DIN IEC 60512-8 (1994-05) remains valid al...

Japanese Industrial Standards Committee (JISC), Electron probe sample preparation

• JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

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