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Electron Probe Sample Preparation

Electron Probe Sample Preparation, Total:17 items.

In the international standard classification, Electron Probe Sample Preparation involves: Optical equipment, Optics and optical measurements, Test conditions and procedures in general, Analytical chemistry.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Probe Sample Preparation

• GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
• GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
• GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
• GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
• GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
• GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis

国家市场监督管理总局、中国国家标准化管理委员会, Electron Probe Sample Preparation

• GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)

National Electrical Manufacturers Association（NEMA), Electron Probe Sample Preparation

• NEMA LL 6-1999 Procedures for Integral Electronic Compact Fluorescent Lamp Sample Preparation and the TCLP

International Organization for Standardization (ISO), Electron Probe Sample Preparation

• ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
• ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

Korean Agency for Technology and Standards (KATS), Electron Probe Sample Preparation

• KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
• KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

KR-KS, Electron Probe Sample Preparation

• KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
• KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

British Standards Institution (BSI), Electron Probe Sample Preparation

• BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
• BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy

Association Francaise de Normalisation, Electron Probe Sample Preparation

• NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

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