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Principle of electrical testing

Principle of electrical testing, Total:34 items.

In the international standard classification, Principle of electrical testing involves: Integrated circuits. Microelectronics, Non-destructive testing.

VDI - Verein Deutscher Ingenieure, Principle of electrical testing

• VDI/VDE/DGQ/DKD 2622 BLATT 9.1-2009 Kalibrieren von Messmitteln fuer elektrische Groessen - Pruefgeraete zur Feststellung der elektrischen Sicherheit - Elektrische Geraete nach DIN VDE 0701-0702
• VDI/VDE/DGQ/DKD 2622 BLATT 9.1-2019 Kalibrieren von Messmitteln fuer elektrische Groessen - Pruefgeraete zur Feststellung der elektrischen Sicherheit - Elektrische Geraete nach DIN VDE 0701-0702

Professional Standard - Electron, Principle of electrical testing

• SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
• SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
• SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
• SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
• SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
• SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
• SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
• SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
• SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
• SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
• SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
• SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
• SJ/T 11007-1996 Semiconductor TV integrated circuits - General principles of measuring methods for video signal and chrominance signal processing circuits
• SJ/T 10804-2000 Semiconductor integrated circuits.General principles of measuring methods for level translator
• SJ/T 10805-2000 Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
• SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers
• SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
• SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Principle of electrical testing

• GB/T 14030-1992 General principles of measuring methods of timer circuits for semiconductor integrated circuits
• GB 14030-1992 Basic principles of semiconductor integrated circuit time-based circuit testing methods
• GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
• GB/T 6798-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage comparators
• GB/T 4377-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
• GB/T 12843-1991 General principle of measuring methods of microprocessors and peripheral interface circuits' parameters for semiconductor integrated circuits
• GB 12843-1991 Basic principles of electrical parameter testing methods for semiconductor integrated circuit microprocessors and peripheral interface circuits
• GB/T 14028-1992 General principles of measuring methods of analogue switches for semiconductor integrated circuits
• GB 14028-2018 Basic principles of semiconductor integrated circuit analog switch test methods
• GB 3442-1986 Basic principles of semiconductor integrated circuit operational (voltage) amplifier testing methods
• GB/T 14114-1993 General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits

Military Standard of the People's Republic of China-General Armament Department, Principle of electrical testing

• GJB 3289-1998 Satellite electrical performance test fault prevention and handling principles

Japanese Industrial Standards Committee (JISC), Principle of electrical testing

• JIS Z 2359:2021 Principle of strain gauge testing

German Institute for Standardization, Principle of electrical testing

• DIN 66054:2017-08 Comparative testing - Technical principles

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