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Pseudocapacitance of metal oxides
Pseudocapacitance of metal oxides, Total:500 items.
In the international standard classification, Pseudocapacitance of metal oxides involves: Insulation, Electrical accessories, Semiconductor devices, Power transmission and distribution networks, Valves, Fibre optic communications, Insulating fluids, Thermodynamics and temperature measurements, Switchgear and controlgear, Integrated circuits. Microelectronics, Dentistry, Powder metallurgy, Non-ferrous metals, Capacitors, Resistors, Power stations in general, Protection of and in buildings, Analytical chemistry, Non-metalliferous minerals, Surface treatment and coating, Materials for aerospace construction, Linear and angular measurements, Air quality, Galvanic cells and batteries, Electrical and electronic testing, Physics. Chemistry, Electricity. Magnetism. Electrical and magnetic measurements, Electric filters, Refractories, Laboratory medicine, Radiocommunications, Testing of metals, Products of the textile industry, Railway rolling stock.
Professional Standard - Machinery, Pseudocapacitance of metal oxides
- JB/T 9670-2014 Zinc oxide for the varistor of metal oxide surge arresters
- JB/T 8444-2015 Specification for silver-metal oxide elwctrical contacts by powder metallurgy method
- JB/T 8444-1996 Technical specification for silver-metal oxide electric contactor of powder metallurgic method
- JB/T 6479-2014 Metal oxide surge arresters with series gaps for line trap for a.c. power systems
- JB/T 10497-2005 Polymeric housed metal oxide surge arresters with series gap for a.c. electric power transmission line
- JB/T 6479-1992 Metal oxide surge arresters with series gap for line trapping of AC power system
Korean Agency for Technology and Standards (KATS), Pseudocapacitance of metal oxides
- KS C 4808-2011(2016) Polymer-housed metal-oxide surge arresters without gaps for distribution line
- KS C 6425-1985(2000) METALLIZED PLASTIC FILM CAPACITORS FOR AC
- KS C 6425-1985 METALLIZED PLASTIC FILM CAPACITORS FOR AC
- KS C 4808-2011(2021) Polymer-housed metal-oxide surge arresters without gaps for distribution line
- KS C 6371-1995(2000) FIXED METAL OXIDE FILM RESISTORS FOR ELECTRONICS EQUIPMENT
- KS C 6371-1990 FIXED METAL OXIDE FILM RESISTORS FOR ELECTRONICS EQUIPMENT
- KS C 6371-1995 FIXED METAL OXIDE FILM RESISTORS FOR ELECTRONICS EQUIPMENT
- KS C 4616-2011 Metal-oxide surge arresters without gaps for a.c. systems
- KS C 6428-1992(1997) FIXED METALLIZED POLYESTER FILM CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT
- KS C 6428-1992 FIXED METALLIZED POLYESTER FILM CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT
- KS C 6428-1979 FIXED METALLIZED POLYESTER FILM CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT
- KS D 8519-2009 Metallic and oxide coating-Measurement of coating thickness-Microscopical method
- KS D 8519-2009(2015) Metallic and oxide coating-Measurement of coating thickness-Microscopical method
- KS C IEC 60099-4:2021 Surge arresters — Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- KS L ISO 21068-3-2012(2022) Chemical analysis of silicon-carbide-containing raw materials and refractory products-Part 3:Determination of nitrogen, oxygen and metallic and oxidic constituents
- KS C IEC 60099-4:2019 Surge arresters — Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- KS C IEC 61643-331-A:2014 Component for low-voltage surge protective devices — Part 331: Specification for metal oxide varistors(MOV)
- KS C IEC 60099-4:2012 Surge arresters-Part 4:Metal-oxide surge arresters without gaps for a.c. systems
- KS C IEC 61643-331-A:2015 Component for low-voltage surge protective devices — Part 331: Specification for metal oxide varistors(MOV)
- KS C IEC 61643-331:2006 Components for low-voltage surge protective devices-Part 331:Specification for metal oxide varistors(MOV)
- KS C ISO TS 18827:2021 Nanotechnologies — Electron spin resonance(ESR) as a method for measuring reactive oxygen species(ROS) generated by metal oxide nanomaterials
- KS C IEC 61643-331-2006(2019) Components for low-voltage surge protective devices-Part 331:Specification for metal oxide varistors(MOV)
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Pseudocapacitance of metal oxides
- GB/T 13397-2008 Technical specification for silver-metaloxide electrical contacts by alloy internal oxidation method
- GB 13397-1992 Technical specification for silver-metaloxide electrical contacts by alloy internal oxidation method
- GB/T 27746-2011 Technical specification for metal oxide varistors(MOV) used in low-voltage apparatus
- GB/T 12690.1-1990 Lanthanum oxide--Determination of cerium oxide, praseodymium oxide, nedeodynium oxide, samarium oxide and yttrium oxide--Induetively coupled plasma atomic emission spectrographic method
- GB/T 12690.14-1990 Lanthanum oxide, cerium oxide, neodymium oxide, gadolinium oxide--Determination of cobalt, iron,manganese, nichel, copper, ckromium, lead and zinc in oxides contents--Emission spectrographic method
- GB/T 12690.28-2000 Rare earth metals and their oxide-Determination of calcium oxide content-Inductively coupled plasma atomic emission spectrographic method
- GB/T 41917-2022 Nanotechnologies—Electron spin resonance (ESR) as a method for measuring reactive oxygen species (ROS) generated by metal oxide nanomaterials
- GB/T 18802.331-2007 Components for low-voltage surge protective devices.Part 331:Specifiecation for metal oxide varistors(MOV)
- GB/T 12690.17-2010 Chemical analysis methods of non-rare earth impurities in rare earth metals and the oxides.Part 17: Determination of niobium and tantalum contents of rare earth metals
- GB/T 12690.14-2006 Chemical analysis methods for non-rare earth impurities in rare earth metals and their oxide.Determination of titanium in rare earth metals
- GB/T 12690.15-2006 Chemical analysis methods for non-rare earth metals and their oxide.Determination of calcium oxide content
- GB/T 12690.3-2015 Chemical analysis methods for non-rare earth impurity of rare earth metals and their oxides.Part 3:Determination of water content of rare earth oxides.Gravimetric method
- GB/T 12690.2-2015 Chemical analysis methods for non-rare earth impurity of rare earth metals and their oxides.Part 2: Determination of ignition loss content of rare earth oxides.Gravimetric method
- GB/T 12690.2-2015(英文版) Chemical analysis methods for nonrare earth impurity of rare earth metals and their oxides—Part 2: Determination of ignition loss content of rare earth oxides—Gravimetric method
American Society for Testing and Materials (ASTM), Pseudocapacitance of metal oxides
- ASTM F1153-92(1997) Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements
- ASTM E1652-00 Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Metal-Sheathed Platinum Resistance Thermometers, Base Metal Thermocouples, and Noble Metal Thermocouples
- ASTM E1652-21 Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Base Metal Thermocouples, Metal-Sheathed Platinum Resistance Thermometers, and
- ASTM E1652-03 Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Metal-Sheathed Platinum Resistance Thermometers, Base Metal Thermocouples, and
- ASTM E1652-15 Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Base Metal Thermocouples, Metal-Sheathed Platinum Resistance Thermometers, and Noble Metal Thermocouples
- ASTM E1652-14 Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Base Metal Thermocouples, Metal-Sheathed Platinum Resistance Thermometers, and Noble Metal Thermocouples
- ASTM E1652-14a Standard Specification for Magnesium Oxide and Aluminum Oxide Powder and Crushable Insulators Used in the Manufacture of Base Metal Thermocouples, Metal-Sheathed Platinum Resistance Thermometers, and Noble Metal Thermocouples
- ASTM E574-19 Standard Specification for Duplex, Base Metal Thermocouple Wire With Glass Fiber or Silica Fiber Insulation
Defense Logistics Agency, Pseudocapacitance of metal oxides
- DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
- DLA A-A-55564/3 B-2004 RESISTOR, VOLTAGE SENSITIVE (VARISTOR), METAL OXIDE, RADIAL LEAD
- DLA A-A-55562 A VALID NOTICE 1-2006 RESISTOR, VOLTAGE SENSITIVE (VARISTOR, METAL OXIDE), CHIP
- DLA A-A-55562 A-2001 RESISTOR, VOLTAGE SENSITIVE (VARISTOR, METAL OXIDE), CHIP
- DLA A-A-55562 A VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip
- DLA SMD-5962-96736-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HIGH SPEED 8-BIT BIDIRECTIONAL CMOS/TTL INTERFACE LEVEL CONVERTER, MONOLITHIC SILICON
- DLA A-A-55564/2 B-2012 RESISTOR, VOLTAGE SENSITIVE (VARISTOR), METAL OXIDE, HIGH ENERGY
- DLA SMD-5962-88543 REV C-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT IDENTITY COMPARATOR, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA A-A-55562/2 A-2001 RESISTOR, VOTAGE SENSITIVE (VARISTOR, METAL OXIDE), CHIP, STYLE 0805
- DLA SMD-5962-87653 REV A-1991 MICROCIRCUIT, MICROPROCESSOR, COMPATIBLE REAL-TIME CLOCK, CMOS MONOLITHIC SILICON
- DLA MIL-PRF-83530 C-2008 RESISTORS, VOLTAGE SENSITIVE (VARISTOR, METAL-OXIDE), GENERAL SPECIFICATION FOR
- DLA A-A-55562/1 A VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip, Style 0603
- DLA A-A-55562/2 A VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip, Style 0805
- DLA A-A-55562/3 A VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip, Style 1206
- DLA A-A-55562/4 A VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip, Style 1210
- DLA A-A-55562/5 VALID NOTICE 2-2011 Resistor, Voltage Sensitive (Varistor, Metal Oxide), Chip, Style 0402
- DLA A-A-55564/3 C-2012 RESISTOR, VOLTAGE SENSITIVE (VARISTOR), METAL OXIDE, RADIAL LEAD
- DLA QPL-83530-7-2004 RESISTORS, VOLTAGE SENSITIVE (VARISTOR, METAL-OXIDE), GENERAL SPECIFICATION FOR
- DLA SMD-5962-94745-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
- DLA SMD-5962-91533 REV A-1994 MICROCIRCUITS, LINEAR, CMOS, HIGH PERFORMANCE DUAL SWITCHED CAPACITOR FILTER, MONOLITHIC SILICON
- DLA SMD-5962-96521 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96523 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88608 REV A-2004 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88624-1988 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, PROGRAMMABLE DIVIDE-BY-N COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88656 REV A-2004 MICROCIRCUIT, DIGITAL, FAST CMOS, 9-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95826 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-87686 REV D-1999 MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 MULTIPLIER, MONOLITHIC SILICON
- DLA SMD-5962-86873 REV B-1993 MICROCIRCUIT, DIGITAL, CMOS 16 X 16 MULTIPLIER, MONOLITHIC SILICON
- DLA SMD-5962-95658 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE THREE-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95659 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95762-1995 MICROCIRCUIT, DIGITAL, FAST CMOS, BUFFER/CLOCK DRIVER WITH INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
- DLA DSCC-DWG-09006-2009 CAPACITORS, FIXED, METALLIZED PLASTIC DIELECTRIC, DIRECT CURRENT, HERMETICALLY SEALED
- DLA SMD-5962-88756 REV C-2004 MICROCIRCUITS, DIGITAL, ADVANCED CMOS, 8-INPUT MULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96517 REV D-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, HEX INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95683 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, QUAD 2-INPUT AND GATE, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-96529 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-94709-1994 MICROCIRCUIT, LINEAR, CMOS, BANG-BANG CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-96691 REV D-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, SRAM, 128K X 8-BIT, MONOLITHIC SILICON
- DLA SMD-5962-88639 REV C-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL TRANSPARENT LATCH WITH THREESTATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-88640 REV A-1992 MICROCIRCUITS, DIGITAL, FAST CMOS SYNCHRONOUS PRESETTABLE BINARY, COUNTER, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-96720 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR CHECKER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-97528-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE-NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-97571-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE-NOR GATE, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-96577 REV A-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, LOOK-AHEAD CARRY GENERATOR FOR COUNTERS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96621 REV E-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
- DLA SMD-5962-96654 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96655 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-96803-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON
- DLA SMD-5962-96804 REV B-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS HEX INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96805 REV A-2005 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX INVERTER, MONOLITHIC SILICON
- DLA SMD-5962-95794 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
- DLA SMD-5962-94734-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
- DLA SMD-5962-95715-1996 MICROCIRCUIT, DIGITAL, CMOS, CLOCK GENERATOR DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-90741 REV B-2006 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER AND LINE DRIVERS/MOS DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-90744 REV B-2006 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, 10-BIT BUS/MOS MEMORY DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88755 REV A-2002 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD 2-INPUT MULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-89458 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 14-STAGE BINARY RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-89513 REV B-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-89547 REV F-2004 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD TWO-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-85149 REV A-1988 MICROCIRCUIT, NMOS, BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-91641 REV A-2005 MICROCIRCUIT, DIGITAL, CMOS, REAL TIME CLOCK, MONOLITHIC SILICON
- DLA SMD-5962-88572 REV B-1991 MICROCIRCUIT, DIGITAL, NMOS INTERRUPT GENERATOR, MONOLITHIC SILICON
- DLA SMD-5962-90708 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
- DLA SMD-5962-90939 REV C-2006 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER AND LINE DRIVER/MOS DRIVER WITH INVERTED THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96597 REV B-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95721 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, TRIPLE 3-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95732 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, HEX INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95734 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, TRIPLE 3-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95735 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, 8-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95736 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, QUAD 2-INPUT OR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95760 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL 4-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95765 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, TRIPLE 3-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95766 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, DUAL 4-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95619 REV B-2002 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT BUFFER/LINE DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95620 REV D-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95661 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96581 REV B-2006 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUADRUPLE S-R LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96585 REV A-2006 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 4-BIT BINARY FULL ADDER WITH FAST CARRY, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96761-1996 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 1-LINE TO 8-LINE CLOCK DRIVER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95557 REV A-1997 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
- DLA SMD-5962-96753 REV A-1999 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, CLOCK AND WAIT-STATE GENERATION CIRCUIT, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96774 REV A-1999 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER WITH 25-OMEGA SERIES RESISTORS AND THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-97533 REV C-2003 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, QUADRUPLE 2-INPUT POSITIVE NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-97534 REV B-2001 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, QUADRUPLE 2-INPUT POSITIVE-AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95595 REV N-2004 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 32-BIT
- DLA SMD-5962-94688 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
- DLA SMD-5962-95599 REV B-1999 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY 4000 GATES, MONOLITHIC SILICON
- DLA SMD-5962-88642 REV A-2005 MICROCIRCUIT, DIGITAL, CMOS, PROCESSOR INTERFACE CIRCUIT, MONOLITHIC SILICON
- DLA SMD-5962-96607 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, LOOKAHEAD CARRY GENERATOR, MONOLITHIC SILICON
- DLA SMD-5962-88650 REV A-1996 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, MICROPROCESSOR COMPATIBLE, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
- DLA SMD-5962-88765 REV B-2002 MICROCIRCUIT, LINEAR, CMOS, MICROPROCESSOR COMPATIBLE, DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON
- DLA SMD-5962-87697 REV C-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-90997-1991 MICROCIRCUIT, DIGITAL, CHMOS BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-87609 REV E-2007 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER, MONOLITHIC SILICON
- DLA SMD-5962-92026-1992 MICROCIRCUIT, DIGITAL, CMOS, FIXED POINT PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-87744-1987 MICROCIRCUIT, DIGITAL, 1M (64K X 16) BIT, NMOS, UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-92103-1992 MICROCIRCUIT, DIGITAL, CMOS, FLOATING POINT PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88619 REV E-2005 MICROCIRCUIT, DIGITAL, CMOS, SIGNAL PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-85528-1986 MICROCIRCUIT, DIGITAL, CMOS, BUS ARBITER, MONOLITHIC SILICON
- DLA SMD-5962-88739 REV G-2005 MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
- DLA SMD-5962-86880 REV C-2003 MICROCIRCUIT, LINEAR, CMOS ARINC BUS INTERFACE, MONOLITHIC SILICON
- DLA SMD-5962-89503 REV H-2004 MICROCIRCUIT, LINEAR, CMOS, PRECISION TIMERS, MONOLITHIC SILICON
- DLA SMD-5962-90864 REV A-1993 MICROCIRCUIT, DIGITAL, HCMOS MULTIFUNCTION PERIPHERAL, MONOLITHIC SILICON
- DLA SMD-5962-95654 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT EXCLUSIVE OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96742 REV E-2000 MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, MULTIPLEXER WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
- DLA SMD-5962-95653 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-95657 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, QUAD 2-INPUT AND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95660 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT EXCLUSIVE OR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-94730 REV D-2002 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-94733-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 12000 GATE CONFIGURABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-95717-1995 MICROCIRCUIT, DIGITAL, CMOS, OCTAL BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-96895-1997 MICROCIRCUIT, DIGITAL, BICMOS, HIGH-SPEED OPTICAL/COPPER TRANSMITTER INTERFACE, MONOLITHIC SILICON
- DLA SMD-5962-96896-1997 MICROCIRCUIT, DIGITAL, BICMOS, HIGH-SPEED OPTICAL/COPPER RECEIVER INTERFACE, MONOLITHIC SILICON
- DLA SMD-5962-96664 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, MICROPOWER PHASE LOCKED LOOP, MONOLITHIC SILICON
- DLA SMD-5962-96683-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4 BIT ARITHMETIC LOGIC UNIT, MONOLITHIC SILICON
- DLA SMD-5962-95834 REV J-2006 MICROCIRCUIT, LINEAR, LVDS QUAD CMOS DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
- DLA SMD-5962-88705 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 10-BIT D-TYPE FLIP-FLOP WITH THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96768 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96867 REV B-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-87654 REV C-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, 1-OF-8 DECODER, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-96863 REV B-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95733 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL 4-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96869 REV B-1997 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96870 REV B-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 18-BIT UNIVERSAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95749 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95752 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, QUAD 2-INPUT EXCLUSIVE NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95768 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, 4-BIT MAGNITUDE COMPARATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95774 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, 4-BIT BINARY FULL ADDER WITH FAST CARRY, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95610 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-95611 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-95612 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-90901-1992 MICROCIRCUITS, DIGITAL, CMOS, OCTAL REGISTERED TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-87577 REV B-2005 MICROCIRCUIT, CMOS, OCTAL BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-87597 REV B-2005 MICROCIRCUIT, UNIVERSAL INTERRUPT CONTROLLER, N-CHANNEL MOS, MONOLITHIC SILICON
- DLA SMD-5962-87667 REV C-1993 MICROCIRCUIT, HIGH PERFORMANCE CMOS BUS BUFFERS, MONOLITHIC SILICON
- DLA SMD-5962-92042 REV F-2005 MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-92106-1993 MICROCIRCUIT, DIGITAL, CMOS, ADDRESS PROCESSOR 2, MONOLITHIC SILICON
- DLA SMD-5962-88501 REV G-2007 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88547 REV B-2005 MICROCIRCUIT, DIGITAL, NMOS, NUMERIC DATA PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88599-1988 MICROCIRCUITS, DIGITAL, CMOS, TIMING CONTROL UNIT, MONOLITHIC SILICON
- DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88750 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, QUAD ANALOG SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-94712 REV B-1996 MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-96528 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96656 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT D-TYPE REGISTER, MONOLITHIC SILICON
- DLA SMD-5962-88674-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT, NONINVERTING , BUS INTERFACE REGISTERS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-88757 REV B-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, PHASE-LOCKED-LOOP WITH VOLTAGE CONTROLLED OSCILLATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-87735 REV B-1998 MICROCIRCUIT,CMOS, MICROPROCESSOR OPTIMIZED FOR DIGITAL SIGNAL PROCESSING, MONOLITHIC SILICON
- DLA SMD-5962-95636 REV B-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95637 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, QUAD 2-INPUT NAND GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95737 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, 4-BIT BINARY RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95741 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, 10-TO-4 LINE PRIORITY ENCODER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95750 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL FOUR-STAGE BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95754 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL 4-INPUT MULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95755 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, QUAD 2-INPUT MULTIPLEXER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95770 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, 4-BIT BINARY SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95816 REV A-2007 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT TRANSCEIVER/REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95629 REV A-2001 MICROCIRCUIT, LINEAR, CMOS, DUAL SPST ANALOG SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-88770 REV H-2003 MICROCIRCUIT, LINEAR, SINGLE POWER MOSFET DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-96514 REV D-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, QUAD 2-INPUT NOR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96522 REV B-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, TRIPLE 3-INPUT AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-96619 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4-BIT FULL ADDER WITH PARALLEL CARRY OUT, MONOLITHIC SILICON
- DLA SMD-5962-96627 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, QUAD AND/OR SELECT GATE, MONOLITHIC SILICON
- DLA SMD-5962-96638 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 8-INPUT NOR/OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96643 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
- DLA SMD-5962-96653 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON
- DLA SMD-5962-96727 REV B-2001 MICROCIRCUIT, DIGITAL, CMOS, BUS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-96786-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS/TTL CONVERTER, 8-BIT, BIDIRECTIONAL, MONOLITHIC SILICON
- DLA SMD-5962-95714 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED 8-BIT BUS TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-95525-1995 MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON
- DLA SMD-5962-88533 REV C-1994 MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
- DLA SMD-5962-96694 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS/SOS, 4K X 1 STATIC RAM, MONOLITHIC SILICON
- DLA SMD-5962-96695 REV A-1996 MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS/SOS, 1K X 4 STATIC RAM, MONOLITHIC SILICON
- DLA SMD-5962-90525 REV C-2008 MICROCIRCUIT, DIGITAL, CMOS, UNIVERSAL ASYNCHRONOUS RECEIVER TRANSMITTER, MONOLITHIC SILICON
- DLA SMD-5962-89596 REV D-2004 MICROCIRCUIT, DIGITAL, NMOS, 16-BIT MICROCONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-91513-1993 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, AND-OR-INVERT GATES, MONOLITHIC SILICON
- DLA SMD-5962-91623 REV F-2005 MICROCIRCUIT, DIGITAL, CMOS, GRAPHICS SYSTEM PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-92094 REV C-2004 MICROCIRCUIT, LINEAR, DUAL, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
- DLA SMD-5962-88503 REV J-2003 MICROCIRCUIT, LINEAR, DUAL MOSFET DRIVERS, MONOLITHIC SILICON
- DLA SMD-5962-88568-1988 MICROCIRCUITS, DIGITAL, NMOS, SINGLE COMPONENT, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
- DLA SMD-5962-86021 REV D-1992 MICROCIRCUIT, DIGITAL, HCMOS, FLOATING POINT COPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88645 REV D-2007 MICROCIRCUIT, DIGITAL, CMOS, REMOTE TERMINAL MULTI-PROTOCOL, MONOLITHIC SILICON
- DLA SMD-5962-88653-1989 MICROCIRCUIT, DIGITAL, FAST CMOS, BUFFER TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-86032 REV H-2005 MICROCIRCUIT, DIGITAL, HCMOS, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
- DLA SMD-5962-86846 REV C-2001 MICROCIRCUIT, DIGITAL, CMOS 64 X 5 PARALLEL FIFO, MONOLITHIC SILICON
- DLA SMD-5962-88758-1991 MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, QUAD BILATERAL SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-86864-1988 MICROCIRCUITS, DIGITAL, ERASEABLE, CMOS, PROGRAMMABLE LOGIC DEVICE
- DLA SMD-5962-89506 REV A-1993 MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-89507 REV B-2000 MICROCIRCUIT, LINEAR, HIGH SPEED CMOS, QUAD BILATERAL SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-89508-1989 MICROCIRCUIT, DIGITAL, FAST CMOS, 1 OF 4 DECODER, MONOLITHIC SILICON
- DLA SMD-5962-85504 REV D-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 3-TO-8 LINE DECODER WITH TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-86867 REV D-2003 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96557 REV C-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96561 REV B-2001 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 4-BIT UP/DOWN BINARY SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96583 REV B-2006 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96718 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, NONINVERTING OCTAL BUFFER/LINE DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96719 REV E-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, NONINVERTING OCTAL BIDIRECTIONAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96746 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 8-BIT TO 9-BIT PARITY BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96748 REV D-1999 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-VOLT OCTAL BUS TRANSCEIVER AND REGISTER WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-03247 REV B-2005 MICROCIRCUIT, HYBRID, LINEAR, POWER MOSFET, DUAL CHANNEL, OPTOCOUPLER
- DLA SMD-5962-96576 REV A-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, LOOK-AHEAD CARRY GENERATOR FOR COUNTERS, MONOLITHIC SILICON
- DLA SMD-5962-96626 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PRESETTABLE DIVIDE-BY-"N" COUNTER, MONOLITHIC SILICON
- DLA SMD-5962-95713 REV B-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
- DLA SMD-5962-87761 REV A-2005 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, DUAL 4-INPUT MULTIPLEXER WITH THREESTATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88671 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BINARY UP/DOWN COUNTER WITH TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88672 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT MAGNITUDE COMPARATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-88675-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT NONINVERTING BUS INTERFACE LATCH, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-89436 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH TRI-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
- DLA SMD-5962-96747-1997 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SCAN PATH SELECTOR WITH 8-BIT BIDIRECTIONAL DATA BUS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-95521 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 10,000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-90512-1992 MICROCIRCUIT, DIGITAL, HMOS, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
- DLA SMD-5962-96612 REV B-1997 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, BINARY RATE MULTIPLIER, MONOLITHIC SILICON
- DLA SMD-5962-96615 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT ADDRESSABLE LATCH, MONOLITHIC SILICON
- DLA SMD-5962-96646 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD EXCLUSIVE OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96671 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-BIT PRIORITY ENCODER, MONOLITHIC SILICON
- DLA SMD-5962-96672 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, PROGRAMMABLE TIMER, MONOLITHIC SILICON
- DLA SMD-5962-96701 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD, BILATERAL SWITCH, MONOLITHIC SILICON
- DLA SMD-5962-96816-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-96820 REV B-1999 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE-AND GATE, MONOLITHIC SILICON
- DLA SMD-5962-96822-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-96825-1996 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE TWO-INPUT POSITIVE OR GATE, MONOLITHIC SILICON
- DLA SMD-5962-95722 REV B-2007 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-95801 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, HEX INVERTER WITH OPEN DRAIN, MONOLITHIC SILICON
- DLA SMD-5962-95824-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 8-BIT MICROPROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-94684-1996 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
- DLA SMD-5962-89463 REV D-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, FLOATING POINT COPROCESSOR, MONOLITHIC SILICON
- DLA DSCC-DWG-85006 REV E-2008 RELAY, SOLID STATE, HERMETICALLY SEALED, OPTICALLY ISOLATED, 1.0 AMPERE, 60 V DC, SPST (N.0.), CMOS INPUT
- DLA SMD-5962-96721 REV C-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- DLA SMD-5962-91532 REV C-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL, LOW POWER, VOLTAGE COMPARATOR, MONOLITHIC SILICON
- DLA SMD-5962-87660 REV A-2001 MICROCIRCUITS, LINEAR, MOSFET DRIVER, DUAL POWER
- DLA SMD-5962-87685-1987 MICROCIRCUITS, 8-BIT MICROPROCESSOR CPU, NMOS, MONOLITHIC SILICON
- DLA SMD-5962-92009 REV B-1995 MICROCIRCUIT, DIGITAL, CMOS, VMEBUS ADDRESS CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-92010 REV B-2001 MICROCIRCUIT, DIGITAL, CMOS, VMEBUS INTERFACE CONTROLLER, MONOLITHIC SILICON
- DLA SMD-5962-87723-1987 MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, 13 INPUT NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-92093 REV C-2005 MICROCIRCUIT, LINEAR, QUAD, CMOS, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
- DLA SMD-5962-92104-1993 MICROCIRCUIT, DIGITAL, CMOS, ADDRESS PROCESSOR 1, MONOLITHIC SILICON
- DLA SMD-5962-87805 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL MULTIVIBRATOR, MONOLITHIC SILICON
Military Standard of the People's Republic of China-General Armament Department, Pseudocapacitance of metal oxides
- GJB 3794-1999 Specification for silver-based metal oxide alloys for electrical contact
- GJB 3794A-2018 Specification for processed materials for electrical contact with silver-based metal oxides
- GJB 1214/1-2011 Detail specification for metallized polyester film direct current fixed capacitors with a failure rate rating, metallized polyester film, type CLK41
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Pseudocapacitance of metal oxides
- GB/T 34869-2017 Metal-oxide varistor for the protection of series compensation capacitor banks sets
- GB/T 32996-2016 Surface chemical analysis—Analysis of metal oxide films by glow-discharge optical emission spectrometry
International Organization for Standardization (ISO), Pseudocapacitance of metal oxides
- ISO/TS 5094:2023 Nanotechnologies — Assessment of peroxidase-like activity of metal and metal oxide nanoparticles
- ISO/TR 20489:2018 Nanotechnologies — Sample preparation for the characterization of metal and metal-oxide nano-objects in water samples
- ISO 1463:1973 Title missing - Legacy paper document
- ISO 1463:1982 Metallic and oxide coatings; Measurement of coating thickness; Microscopical method
- ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO/TS 18827:2017 Nanotechnologies - Electron spin resonance (ESR) as a method for measuring reactive oxygen species (ROS) generated by metal oxide nanomaterials
- ISO 1463:2003 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
- ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- ISO/DIS 21068-3 Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon — Part 3: Determination of nitrogen, oxygen and metallic and oxidic constituents
- ISO/DIS 23597 Rare earth — Determination of rare earth content in individual rare earth metal and their oxides — Titration method
- ISO/FDIS 23597 Rare earth — Determination of rare earth content in individual rare earth metal and their oxides — Titration method
- ISO 23597:2023 Rare earth — Determination of rare earth content in individual rare earth metals and their oxides — Titration method
British Standards Institution (BSI), Pseudocapacitance of metal oxides
- PD ISO/TS 5094:2023 Nanotechnologies. Assessment of peroxidase-like activity of metal and metal oxide nanoparticles
- BS EN 61643-331:2003 Low voltage surge protective devices. Specification for metal oxide varistors (MOV)
- PD ISO/TR 20489:2018 Nanotechnologies. Sample preparation for the characterization of metal and metal-oxide nano-objects in water samples
- BS EN 60099-4:2004+A2:2009 Surge arresters —
Part 4: Metal-oxide surge arresters
without gaps for a.c. systems
- BS EN 60099-4:2004 Surge arresters - Metal-oxide surge arresters without gaps for a.c. systems
- BS EN 60099-4:2014 Surge arresters. Metal-oxide surge arresters without gaps for a.c. systems
- BS EN ISO 1463:2005 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
- BS EN ISO 1463:2021 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
- PD ISO/TS 18827:2017 Nanotechnologies. Electron spin resonance (ESR) as a method for measuring reactive oxygen species (ROS) generated by metal oxide nanomaterials
- PD ISO/TS 25138:2019 Tracked Changes. Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
- BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
- BS EN IEC 61643-331:2020 Components for low-voltage surge protection - Performance requirements and test methods for metal oxide varistors (MOV)
- 20/30395419 DC BS EN ISO 1463. Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
- BS ISO 17299-5:2014 Textiles. Determination of deodorant property. Metal-oxide semiconductor sensor method
- BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
- BS ISO 23597:2023 Rare earth. Determination of rare earth content in individual rare earth metals and their oxides. Titration method
Institute of Electrical and Electronics Engineers (IEEE), Pseudocapacitance of metal oxides
Professional Standard - Electron, Pseudocapacitance of metal oxides
- SJ/T 11824-2022 Metal Oxide Semiconductor Field Effect Transistor (MOSFET) Equivalent Capacitance and Voltage Change Rate Test Method
工业和信息化部, Pseudocapacitance of metal oxides
Professional Standard - Energy, Pseudocapacitance of metal oxides
- NB/T 10452-2020 Epoxy soybean oil for insulating liquid metallized film capacitors
- NB/T 42059-2015 Disconnectors of metal-oxide surge arresters for a.c. systems
- DL/T 815-2021 Metal Oxide Surge Arrester with Composite Jacket for AC Transmission Lines
国家能源局, Pseudocapacitance of metal oxides
- NB/T 10452-2026 Epoxy soybean oil for insulating liquid metallized film capacitors
- NB/T 42152-2018 General technical requirements for nonlinear metal oxide resistors
IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Pseudocapacitance of metal oxides
- IEEE C62.11-2012 Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV)
- IEEE C62.11-1993 Standard for Metal-Oxide Surge Arresters for Alternating Current Power Circuits
- IEEE C62.11-1987 STANDARD FOR METAL-OXIDE SURGE ARRESTERS FOR AC POWER CIRCUITS
- IEEE C62.11-1999 Standard for Metal-Oxide Surge Arresters for AC Power Circuits (> 1kV)
- IEEE C62.11-2005 Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV)
- IEEE 641-1987 STANDARD DEFINITIONS AND CHARACTERIZATION OF METAL NITRIDE OXIDE SEMICONDUCTOR ARRAYS
- IEEE PC62.11/D2.0-2019 Draft Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV)
- IEEE C62.33-2016 Test Methods and Performance Values for Metal-Oxide Varistor Surge Protective Components
- IEEE C62.11A-2008 Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Amendment 1: Short-Circuit Tests for Station@ Intermediate@ and Distribution Arresters
American National Standards Institute (ANSI), Pseudocapacitance of metal oxides
工业和信息化部/国家能源局, Pseudocapacitance of metal oxides
- JB/T 8444-2014 Technical conditions for powder metallurgy silver metal oxide electrical contacts
Group Standards of the People's Republic of China, Pseudocapacitance of metal oxides
- T/CAB 0156-2022 Metal-oxide MEMS gas sensor for smart home appliances
- T/CECA 27-2017 General specification for metal oxide varistors with reliability specifications
- T/CEC 221-2019 General Technical Standards for High Gradient and Low Residual Voltage Metal Oxide Resistors
- T/GDC 143-2022 Fugitive emissions—Determination of volatile organic compounds metal oxide method
- T/QGCML 911-2023 10kV AC Transmission Line Composite Jacket Gapless Metal Oxide Surge Arrester
Military Standards (MIL-STD), Pseudocapacitance of metal oxides
ES-UNE, Pseudocapacitance of metal oxides
- UNE-EN 24501:1993 HARDMETALS. DETERMINATION OF TITANIUM. PHOTOMETRIC PEROXIDE METHOD. (Endorsed by AENOR in January of 1994.)
- UNE-EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
- UNE-EN 60099-9:2014 Surge arresters - Part 9: Metal-oxide surge arresters without gaps for HVDC converter stations (Endorsed by AENOR in January of 2015.)
- UNE-EN 60099-4:2016 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- UNE-EN ISO 21068-3:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 3: Determination of nitrogen, oxygen and metallic and oxidic constituents (ISO 21068-3:2008) (Endorsed by AENOR in October of 2008.)
Professional Standard - Non-ferrous Metal, Pseudocapacitance of metal oxides
- YS/T 484-2005 Method for measuring the discharge capacity of the hydrogen storage alloys as the negative electrode of the metal hydride-nickel battery
RU-GOST R, Pseudocapacitance of metal oxides
- GOST 23862.1-1979 Rare-earth metals and their oxides. Spectral method of determination of impurities in oxides of rare-earth elements
- GOST 23862.2-1979 Rare-earth metals and their oxides. Direct spectral method of determination of impurities in oxides of rare-earth elements
- GOST 23862.7-1979 Rare-earth metals and their oxides. Chemical-spectral methods of determination of impurities in oxides of rare-earth elements
- GOST 23862.0-1979 Rare-earth metals and their oxides. General requirements for methods of analysis
- GOST 26318.8-1984 Non-metallic ore materials. Radiometric method for determination of potassium oxide mass fraction
- GOST 23862.6-1979 Rare-earth metals and their oxides. Methods of determination of sodium, potassium and calcium
- GOST 23862.11-1979 Rare-earth metals and their oxides. Chemical-spectral method of determination of impurities of vanadium, iron, cobalt, manganese, copper, nickel
- GOST 30550-1998 Metallic of powders. Determination of acid-insoluble content in iron, copper, tin and bronze powders
- GOST 23862.4-1979 Rare-earth metals and their oxides. Spectral method of determination of vanadium, iron, cobalt, silicon, manganese, copper, nickel, lead, titanium, chromium
U.S. Military Regulations and Norms, Pseudocapacitance of metal oxides
- ARMY MIL-M-63530 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY MIL-M-63530 (1)-1987 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY MIL-M-63530-1981 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
- ARMY MIL-M-48646 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
- ARMY MIL-M-48646-1986 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
- ARMY MIL-M-63320 A NOTICE 1-1997 MILITARY SPECIFICATION
MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
- ARMY MIL-M-63320 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
- ARMY MIL-M-63320 A-1981 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
- ARMY MIL-M-63321 A NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
- ARMY MIL-M-63324 A VALID NOTICE 1-1988 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
- ARMY MIL-M-63324 A (1)-1982 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
- ARMY MIL-M-63324 A-1981 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
- ARMY MIL-M-63324 A NOTICE 2-1997 MICROCIRCUIT, DIGITAL, CMOS, SPECIAL PURPOSE NOR GATE
- ARMY MIL-I-48632 NOTICE 1-1996 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
- ARMY MIL-I-48632 (2)-1993 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
- ARMY MIL-I-48632-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
- ARMY MIL-I-48634 NOTICE 1-1996 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
- ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
- ARMY MIL-I-48634-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
- ARMY MIL-M-63321 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
- ARMY MIL-M-63321 A-1981 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)
Association Francaise de Normalisation, Pseudocapacitance of metal oxides
- NF EN 24501:1994 Métaux durs - Détermination du titane - Méthode photométrique au peroxyde.
- NF A91-110:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method.
- NF A91-110*NF EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
- NF A91-110:1995 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method.
- NF C65-100-9*NF EN 60099-9:2015 Surge arresters - Part 9 : metal-oxide surge arresters without gaps for HVDC converter stations
- NF C65-101/A1:2006 Surge arresters - Part 4 : metal-oxide surge arresters without gaps for a.c. systems.
- NF S91-141:1997 Biodégradabilité des alliages métalliques utilisés en art dentaire - Normalisation d'essais électrochimiques
- NF C65-101/A2:2009 Surge arresters - Part 4 : metal-oxide surge arresters without gaps for a.c. systems.
- NF C65-100-4*NF EN 60099-4:2015 Surge arresters - Part 4 : metal-oxide surge arresters without gaps for a.c. systems
- NF C65-101:2005 Surge arresters - Part 4 : metal-oxide surge arresters without gaps for a.c. systems.
- NF S91-141:1990 BIODEGRADABILITY OF DENTAL ALLOYS. STANDARDIZATION OF ELECTROCHEMICAL TESTS.
- NF A05-106*NF EN ISO 6988:1995 Metallic and other non-organic coatings. Sulfur dioxide test with general condensation of moisture.
ECIA - Electronic Components Industry Association, Pseudocapacitance of metal oxides
- 377-1970 Metallized Dielectric Capacitors in Metallic and Non-Metallic Cases for Direct Current Application (ANSI C83.62-71)
- 377-1-1972 "Parts List Supplement to RS-377@ ""Metallized Dielectric Capacitors in Metallic and Non-Metallic Cases for Direct Current Applications"""
- 495-A-1990 Film Dielectric Capacitors with Metallized Paper Electrodes for Alternating Current Applications
- 495-A-1989 Film Dielectric Capacitors with Metallized Paper Electrodes for Alternating Current Applications
Professional Standard - Electricity, Pseudocapacitance of metal oxides
- DL/T 804-2002 Application guide of metal oxide surge arresters for a.c. power system
- DL/T 804-2014 Application guide of metal oxide surge arresters for a.c. power system
- DL/T 815-2012 Polymer-housed metal oxide surge arresters for a.c.power transmission lines
- DL/T 815-2002 Metal oxide surge arresters for a.c. power transmission lines
- DL/T 1294-2013 Application guide of metal-oxide surge arrester disconnectors for a.c. power system
- DL/T 1432.3-2016 Testing specification for on-line monitoring device of transformation equipment.Part 3: On-line insulation monitoring device of capacitive equipment and metal-oxide surge arrester
- DL/T 1498.3-2016 Technical specification for on-line monitoring device of transformation equipment.Part 3: On-line insulation monitoring device of capacitive equipment and metal-oxide surge arrester
International Telecommunication Union (ITU), Pseudocapacitance of metal oxides
- ITU-T K.77-2009 Characteristics of metal oxide varistors for the protection of telecommunication installations Study Group 5
- ITU-T K.77 CORR 1-2011 Characteristics of metal oxide varistors for the protection of telecommunication installations Corrigendum 1
BE-NBN, Pseudocapacitance of metal oxides
- NBN-EN 24501-1994 Hardmetals. Determination of titanium. Photometric peroxide method (ISO 4501:1978)
Danish Standards Foundation, Pseudocapacitance of metal oxides
- DS/EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method
- DS/ISO 1463:2021 Metallic and oxide coatings – Measurement of coating thickness – Microscopical method
- DS/ISO 1463:1983 Metallic and oxide coatings. Measurement of coating thickness. Microscopical method
- DS/EN 60099-4/A2:2009 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- DS/EN 60099-4/A1:2007 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- DS/EN 60099-4:2005 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- DS/EN ISO 21068-3:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 3: Determination of nitrogen, oxygen and metallic and oxidic constituents
- DS/EN 61643-331:2007 Components for low-voltage surge protective devices - Part 331: Specification for metal oxide varistors (MOV)
- DS/EN ISO 1463:2021 Metallic and oxide coatings – Measurement of coating thickness – Microscopical method (ISO 1463:2021)
Professional Standard - Hydroelectric Power, Pseudocapacitance of metal oxides
- SD 176-1986 Technical specifications for metal oxide arresters of 3-500 kV AC power systems
- SD 177-1986 Guidelines for the use of metal oxide arresters in 3-500 kV AC power systems
Professional Standard - Railway, Pseudocapacitance of metal oxides
- TB/T 1844-1987 Specifications for Gapless Metal Oxide Surge Arresters for 25kV AC Electrified Railway
YU-JUS, Pseudocapacitance of metal oxides
- JUS C.A6.031-1990 Metal11c and oxid coatlngs. tteasurement of coatlng thickness. Hicroscopical method
- JUS C.T7.228-1984 Anodic oxidation of a/uminium and aluminium allols. Measurement of thickness of oxide coatings. Eddy current method
European Committee for Standardization (CEN), Pseudocapacitance of metal oxides
- EN ISO 1463:1994 Metallic and Oxide Coatings - Measurement of Coating Thickness - Microscopical Method (ISO 1463 : 1982)
- EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
- EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)
German Institute for Standardization, Pseudocapacitance of metal oxides
- DIN EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003); German version EN ISO 1463:2004
- DIN EN 60099-4:2010 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems (IEC 60099-4:2004, modified + A1:2006 + A2:2009); German version EN 60099-4:2004 + A1:2006 + A2:2009
- DIN EN 61643-331:2004 Components for low-voltage surge protective devices - Part 331: Specification for metal oxide varistors (MOV) (IEC 61643-331:2003); German version EN 61643-331:2003
- DIN 50938:2018 Black oxide coatings on ferrous metal components - Requirements and test methods
- DIN 50938:2018-01 Black oxide coatings on ferrous metal components - Requirements and test methods
Japanese Industrial Standards Committee (JISC), Pseudocapacitance of metal oxides
Taiwan Provincial Standard of the People's Republic of China, Pseudocapacitance of metal oxides
- CNS 8104-1981 Method for Measuring MOSFET Linear Threshold Voltage
- CNS 8106-1981 Method for Measuring MOSFET Saturated Threshold Voltage
PH-BPS, Pseudocapacitance of metal oxides
- PNS ISO/TS 18827:2021 Nanotechnologies - Electron spin resonance (ESR) as a method for measuring reactive oxygen species (ROS) generated by metal oxide nanomaterials
ZA-SANS, Pseudocapacitance of metal oxides
- SANS 60099-4:2007 Surge arresters Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- NRS 039-2-1999 Surge arresters for use in distribution systems Part 2: Distribution class, gapless metal-oxide surge arresters
- NRS 039-1-1999 Surge arresters for use in distribution systems Part 1: Guide for the application of gapless metal-oxide surge arresters
International Electrotechnical Commission (IEC), Pseudocapacitance of metal oxides
- IEC 60099-4:2004+AMD1:2006+AMD2:2009 CSV Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 60099-4:2004+AMD1:2006 CSV Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 60099-4:1998 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 60099-4:2009 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 60099-4:2004 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 61643-331:2003 Components for low-voltage surge protective devices - Part 331: Specification for metal oxide varistors (MOV)
- IEC 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
- IEC 60099-4:2004/AMD2:2009 Amendment 2 - Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- IEC 62848-1:2016 Railway applications - DC surge arresters and voltage limiting devices - Part 1: Metal-oxide surge arresters without gaps
KR-KS, Pseudocapacitance of metal oxides
- KS C IEC 60099-4-2021 Surge arresters — Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- KS C IEC 60099-4-2019 Surge arresters — Part 4: Metal-oxide surge arresters without gaps for a.c. systems
- KS C IEC 61643-331-A-2014 Component for low-voltage surge protective devices — Part 331: Specification for metal oxide varistors(MOV)
- KS C ISO TS 18827-2021 Nanotechnologies — Electron spin resonance(ESR) as a method for measuring reactive oxygen species(ROS) generated by metal oxide nanomaterials
IT-UNI, Pseudocapacitance of metal oxides
Standard Association of Australia (SAA), Pseudocapacitance of metal oxides
US-FCR, Pseudocapacitance of metal oxides
PL-PKN, Pseudocapacitance of metal oxides
- PN-EN ISO 1463-2021-10 E Metallic and oxide coatings -- Measurement of coating thickness -- Microscopical method (ISO 1463:2021)
Jiangxi Provincial Standard of the People's Republic of China, Pseudocapacitance of metal oxides
- DB36/T 688-2012 Chemical analysis of yttrium-rich oxides and their metals Determination of the composition of fifteen rare earth element oxides Inductively coupled plasma emission spectrometry
European Committee for Electrotechnical Standardization(CENELEC), Pseudocapacitance of metal oxides
- EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
CENELEC - European Committee for Electrotechnical Standardization, Pseudocapacitance of metal oxides
- EN 60099-4:1993 Surge Arresters Part 4: Metal-Oxide Surge Arresters Without Gaps for a.c. Systems
- EN 131200:2002 Sectional Specification: Fixed Capacitors with Metallized Electrodes and Polypropylene Dielectric
- EN 131201:2002 Blank Detail Specification: Fixed Capacitors with Metallized Electrodes and Polypropylene Dielectric
AENOR, Pseudocapacitance of metal oxides
- UNE-EN 61643-331:2004 Components for low-voltage surge protective devices -- Part 331: Specification for metal oxide varistors (MOV).
- UNE-EN ISO 1463:2005 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)
NEMA - National Electrical Manufacturers Association, Pseudocapacitance of metal oxides
- NEMA C78.387-1987 ELECTRIC LAMPS - METAL-HALIDE LAMPS - METHODS OF MEASURING CHARACTERISTICS
NL-NEN, Pseudocapacitance of metal oxides
- NEN 10099-4-1993 Surge arresters. Part 4: Metal-oxide surge arresters without gaps for a.c. systems (IEC 99-4:1991)
Lithuanian Standards Office , Pseudocapacitance of metal oxides
- LST EN ISO 1463:2004 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2003)
- LST EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
- LST EN 60099-4-2004/A1-2006 Surge arresters -- Part 4: Metal-oxide surge arresters without gaps for a.c. systems (IEC 60099-4:2004/A1:2006)
- LST EN 60099-4-2004/A2-2009 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems (IEC 60099-4:2004/A2:2009)
AT-ON, Pseudocapacitance of metal oxides
- OENORM EN ISO 1463:2021 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method (ISO 1463:2021)
CH-SNV, Pseudocapacitance of metal oxides
CZ-CSN, Pseudocapacitance of metal oxides
- CSN 70 0641 Cast.3-1976 Chemical análysis of glass. Determinat- ion of alkali metal oxides. Fláme photo- metric method (with the use of synthe- tic solutions)
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Pseudocapacitance of metal oxides
- JEDEC JEP184-2021 Guideline for evaluating Bias Temperature Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion
NO-SN, Pseudocapacitance of metal oxides
- NS 1181-1979 Metal and oxide coating - Measurement of thickness by microscopical examination of cross-sections
RO-ASRO, Pseudocapacitance of metal oxides
- SR 7043/1-1993 Non-metallic (anorganic) coatings. Anodic oxide coatings on aluminium and aluminium alloys. Tehnical requirements for quality
ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, Pseudocapacitance of metal oxides
- PREN 3796-1997 Aerospace Series Anaerobic Polymerisable Compounds Test Method Determination of Ability of Anaerobic Polymerisable Compounds to Set on Metal Surfaces (Edition P1)
SE-SIS, Pseudocapacitance of metal oxides
- SIS SMS 2953-1971 Measurement of metal and oxide coating thicknesses by microscopic examination of cross-sections