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Semiconductor Photocatalytic Oxidation

Semiconductor Photocatalytic Oxidation, Total:83 items.

In the international standard classification, Semiconductor Photocatalytic Oxidation involves: Ceramics, Surface treatment and coating, Semiconductor devices, Integrated circuits. Microelectronics, Electronic components in general, Semiconducting materials.

British Standards Institution (BSI), Semiconductor Photocatalytic Oxidation

BS ISO 22601:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative analysis of total organic carbon (TOC)
BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
BS ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
BS ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Removal of nitric oxide
BS ISO 22197-1:2016 Tracked Changes. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of nitric oxide
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS ISO 10676:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BS ISO 22197-2:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of acetaldehyde
BS ISO 10676:2010 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BS ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antifungal activity of semiconducting photocatalytic materials
BS ISO 19635:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antialgal activity of semiconducting photocatalytic materials
BS ISO 22197-3:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of toluene

International Organization for Standardization (ISO), Semiconductor Photocatalytic Oxidation

ISO 22601:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative
ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
ISO 10676:2010 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 1: Removal of nitric oxide
ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antifungal activity of semiconducting photocatalytic materials
ISO 19635:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antialgal activity of semiconducting photocatalytic materials
ISO 27447:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials

Association Francaise de Normalisation, Semiconductor Photocatalytic Oxidation

XP CEN/TS 16599:2014 Photocatalyse - Détermination des conditions d'irradiation pour tester les propriétés photocatalytiques de matériaux semi-conducteurs
XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
NF ISO 22197-4:2021 Céramiques techniques - Méthodes d'essai relatives à la performance des matériaux photocatalytiques semi-conducteurs pour la purification de l'air - Partie 4 : élimination du formaldéhyde
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)
NF ISO 22197-5:2021 Céramiques techniques - Méthodes d'essai relatives à la performance des matériaux photocatalytiques semi-conducteurs pour la purification de l'air - Partie 5 : élimination du mercaptan méthylique

European Committee for Standardization (CEN), Semiconductor Photocatalytic Oxidation

PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions

Japanese Industrial Standards Committee (JISC), Semiconductor Photocatalytic Oxidation

JIS R 1708:2016 Fine ceramics (Advanced ceramics, advanced technical ceramics) -- Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
JIS R 1712:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Test method for antialgal activity of semiconducting photocatalytic materials

German Institute for Standardization, Semiconductor Photocatalytic Oxidation

DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
DIN ISO 22197-1:2018-12 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
DIN ISO 22197-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2007)

Defense Logistics Agency, Semiconductor Photocatalytic Oxidation

DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
DLA SMD-5962-94532-1994 MICROCIRCUIT, CMOS, 64-BIT MICROPROCESSOR
DLA SMD-5962-77044 REV F-2005 MICROCIRCUIT, DIGITAL, CMOS, NOR GATES, MONOLITHIC SILICON
DLA SMD-5962-96736-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HIGH SPEED 8-BIT BIDIRECTIONAL CMOS/TTL INTERFACE LEVEL CONVERTER, MONOLITHIC SILICON

European Committee for Electrotechnical Standardization（CENELEC）, Semiconductor Photocatalytic Oxidation

EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Group Standards of the People's Republic of China, Semiconductor Photocatalytic Oxidation

T/CECA 35-2019 Metal oxide semiconductor gas sensor
T/QGCML 743-2023 Specifications for anodizing process of semiconductor equipment parts
T/CASAS 006-2020 The general specification for silicon carbide metal-oxide-semiconductor field-effect-transistor

AENOR, Semiconductor Photocatalytic Oxidation

UNE-ISO 22197-1:2012 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 1: Removal of nitric oxide
UNE 127197-1:2013 Test method application to evaluate the air-purification performance of semiconducting photocatalytic materials soaked into precast concrete products - Part 1: Removal of nitric oxide.

Korean Agency for Technology and Standards (KATS), Semiconductor Photocatalytic Oxidation

KS L ISO 22197-1:2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics)-Test method for air-purification performance of semiconducting photocatalytic materials-Part 1:Removal of nitric oxide
KS L ISO 22197-1:2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 17168-1:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
KS L ISO 10676:2012 Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
KS L ISO 27447-2011(2016) Fine ceramics (advanced ceramics, advanced technical ceramics)－Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 27447-2011(2021) Fine ceramics (advanced ceramics, advanced technical ceramics)－Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 10676-2012(2022) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxyg

KR-KS, Semiconductor Photocatalytic Oxidation

KS L ISO 22197-1-2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
KS L ISO 22197-1-2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 17168-1-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
KS L ISO 27447-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 14605-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

International Electrotechnical Commission (IEC), Semiconductor Photocatalytic Oxidation

IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Professional Standard - Electron, Semiconductor Photocatalytic Oxidation

SJ 20025-1992 Generic specification for gas sensors of metal-oxide semiconductor
SJ 20026-1992 Measuring methods for gas sensors of metal-oxide semiconductor
SJ 20079-1992 Test mehods for gas sensors of metal-oxide semiconductor

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor Photocatalytic Oxidation

GB/T 15652-1995 Generic specification for gas sensors of metal-oxide semiconductor
GB/T 15653-1995 Measuring methods for gas sensors of metal-oxide semiconductor

Danish Standards Foundation, Semiconductor Photocatalytic Oxidation

DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

ES-UNE, Semiconductor Photocatalytic Oxidation

UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

U.S. Military Regulations and Norms, Semiconductor Photocatalytic Oxidation

ARMY MIL-M-48646 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
ARMY MIL-M-48646-1986 MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS
ARMY MIL-M-63530 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
ARMY MIL-M-63530 (1)-1987 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
ARMY MIL-M-63530-1981 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Semiconductor Photocatalytic Oxidation

IEEE 641-1987 STANDARD DEFINITIONS AND CHARACTERIZATION OF METAL NITRIDE OXIDE SEMICONDUCTOR ARRAYS

Lithuanian Standards Office , Semiconductor Photocatalytic Oxidation

LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

Institute of Electrical and Electronics Engineers (IEEE), Semiconductor Photocatalytic Oxidation

ANSI/IEEE Std 641-1987 IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays