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Chip Data Instruments
Chip Data Instruments, Total:173 items.
In the international standard classification, Chip Data Instruments involves: Road vehicle systems, Semiconductor devices, Industrial automation systems, Integrated circuits. Microelectronics, Power transmission and distribution networks, Resistors, Nuclear energy engineering, Applications of information technology, Radiocommunications, Metrology and measurement in general, Linear and angular measurements, Information technology (IT) in general, Telecontrol. Telemetering, Open systems interconnection (OSI), Measurement of force, weight and pressure, Radiation protection, Space systems and operations, Geology. Meteorology. Hydrology, Character sets and information coding, Microprocessor systems, Cinematography, Measurement of time, velocity, acceleration, angular velocity, Vocabularies, Hospital equipment, Mining equipment, Electrical accessories, Components for electrical equipment, Analytical chemistry.
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Chip Data Instruments
Group Standards of the People's Republic of China, Chip Data Instruments
- T/CTS 11-2023 Technical requirements of data security chip for data recorder of vehicle
- T/CIE 134-2022 Test method for data retention time of magnetic random access memory chip
- T/CEC 358-2020 Test Instrument Data Transmission Protocol
- T/SDZDH 001-2021 Identification and Resolution for Industrial Internet- Basic dataset of Instrument
- T/XJSIA 006-2021 Data Interface Specification for Scientific Instrument Shared Collaboration Network
- T/XJSIA 005-2021 Specification for Metadata Collection and Submission of Scientific Instrument Sharing and Collaboration Network
- T/CHES 19-2018 General Protocol for Data Interaction of Model Test Water and Sediment Measuring Instruments
U.S. Air Force, Chip Data Instruments
British Standards Institution (BSI), Chip Data Instruments
- PD ES 59008-6-2:2001 Data requirements for semiconductor die. Exchange data formats and data dictionary. Data dictionary
- PD ES 59008-5-3:2001 Data requirements for semiconductor die. Particular requirements and recommendations for die types. Minimally-packaged die
- PD IEC/TR 62258-7:2007 Semiconductor die products. XML schema for data exchange
- PD ES 59008-5-2:2001 Data requirements for semiconductor die. Particular requirements and recommendations for die types. Bare die with added connection structures
- PD IEC/TR 62258-8:2008 Semiconductor die products. EXPRESS model schema for data exchange
- BS EN IEC 63047:2021 Nuclear instrumentation. Data format for list mode digital data acquisition used in radiation detection and measurement
- PD ES 59008-4-1:2001 Data requirements for semiconductor die. Specific requirements and recommendations. Test and quality
- BS 5554:1978 Guide to a modular instrumentation system for data handling; CAMAC system
- BS IEC 62755:2012+A1:2020 Radiation protection instrumentation. Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
- 20/30400497 DC BS IEC 62755 AMD1. Radiation protection instrumentation. Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
- BS EN 60401-3:2004 Terms and nomenclature for cores made of magnetically soft ferrites - Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
- BS EN 60401-3:2016 Terms and nomenclature for cores made of magnetically soft ferrites. Guidelines on the format of data appearing in manufacturers catalogues of transformer and inductor cores
CENELEC - European Committee for Electrotechnical Standardization, Chip Data Instruments
- ES 59008-5-1-2001 Data Requirements for Semiconductor Die Part 5-1: Particular Requirements and Recommendations for Die Types - Bare Die
- ES 59008-5-3-2001 Data Requirements for Semiconductor Die - Part 5-3: Particular Requirements and Recommendations for Die Types - Minimally-Packaged Die
- EN 62258-2:2005 Semiconductor die products Part 2: Exchange data formats
- EN 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
- ES 59008-4-3-1999 Data Requirements for Semiconductor Die Part 4-3: Specific Requirements and Recommendations - Thermal
- ES 59008-4-4-1999 Data Requirements for Semiconductor Die Part 4-4: Specific Requirements and Recommendations Electrical Simulation
- ES 59008-4-2-2000 2001 Data Requirements for Semiconductor Die - Part 4-2: Specific Requirements and Recommendations Handling and Storage
Danish Standards Foundation, Chip Data Instruments
- DS/ES 59008-5-1:2001 Data requirements for semiconductor die - Part 5-1: Particular requirements and recommendations for die types - Bare die
- DS/EN 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
- DS/EN IEC 63047:2021 Nuclear instrumentation – Data format for list mode digital data acquisition used in radiation detection and measurement
- DS/CLC/TR 62258-7:2008 Semiconductor die products - Part 7: XML schema for data exchange
- DS/CLC/TR 62258-8:2008 Semiconductor die products - Part 8: EXPRESS model schema for data exchange
- DS/ES 59008-4-1:2001 Data requirements for semiconductor die - Part 4-1: Specific requirements and recommendations - Test and quality
- DS/EN 60401-3:2004 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
国家市场监督管理总局、中国国家标准化管理委员会, Chip Data Instruments
- GB/T 38845-2020 Data description of smart instrumentation—Positioners
- GB/T 40216-2021 Data description of intelligent instruments—General requirements of properties database
- GB/T 38843-2020 Data description of smart instrumentation—Actuators
- GB/T 39555-2020 Intelligent laboratory—Instruments and equipment—Data interface of climatic and environmental testing equipment
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Chip Data Instruments
German Institute for Standardization, Chip Data Instruments
- DIN EN 62258-2:2011-12 Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2011); English version EN 62258-2:2011 / Note: DIN EN 62258-2 (2005-12) remains valid alongside this standard until 2014-06-29.
- DIN 18724:1990 Geodetic instruments; precision of levels and theodolites from technical data
- DIN 43751-3:1987-05 Measurement and control; digital measuring instruments; instruments for measuring digital quantities; definitions, tests and data sheet details
- DIN 16086:2006-01 Electrical pressure measuring instruments - Pressure transmitters, pressure measuring instruments - Concepts, specifications on data sheets
- DIN 43751-2:1987-05 Measurement and control; digital measuring instruments; instruments for measuring analogue quantities; definitions, tests and data sheet details
- DIN 16086:2006 Electrical pressure measuring instruments - Pressure transmitters, pressure measuring instruments - Concepts, specifications on data sheets
- DIN 43751-4:1990-06 Measurement and control; digital measuring instruments; instruments for measuring time reference quantities; definitions, tests and data sheet details / Note: Applies in conjunction with DIN 43751-1 (1987-05).
- DIN EN 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2011); English version EN 62258-2:2011
- DIN 15567:1980 Film 35 mm; preamplifier for optical sound, general data for measuring
- DIN 43751-4:1990 Measurement and control; digital measuring instruments; instruments for measuring time reference quantities; definitions, tests and data sheet details
- DIN 13411:1999 Protection of walls and apparatus in medical facilities - Terms, specific data
- DIN V 66291-1:2000 Chipcards with digital signatur application/function according to SigG and SigV - Part 1: Application interface
- DIN V 12900-3:2001 Laboratory data communication - Part 3: Device profiles for laboratory apparatus
- DIN V 66291-4:2002 Chip cards with digital signature application/function according to SigG and SigV - Part 4: Basic security services
- DIN V 66291-2:2003 Chip cards with digital signature application/function according to SigG and SigV - Part 2: Personalisation processes
- DIN EN 60401-3:2004 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores (IEC 60401-3:2003); German version EN 60401-3:2003
- DIN EN 60401-3:2016-10 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers catalogues of transformer and inductor cores (IEC 60401-3:2015); German version EN 60401-3:2016 / Note: DIN EN 604...
ES-UNE, Chip Data Instruments
- UNE-EN 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats (Endorsed by AENOR in October of 2011.)
- UNE-EN IEC 63047:2021 Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement (Endorsed by Asociación Española de Normalización in March of 2021.)
- UNE-EN 60401-3:2016 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers catalogues of transformer and inductor cores (Endorsed by AENOR in May of 2016.)
Association Francaise de Normalisation, Chip Data Instruments
- NF EN 62258-2:2011 Produits de puces de semiconducteurs - Partie 2 : formats d'échange de données
- NF C19-147*NF EN IEC 63047:2021 Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement
- NF E11-064:1990 Electronic comparators. Electronic conditioners. Technical data sheet.
- NF E11-066:1990 Electronic comparators. Angular dimensional sensors. Technical data sheet.
- NF E11-061:1992 Electronic comparators. Linear dimensionalsensors. Technical data sheet.
- NF EN IEC 63047:2021 Instrumentation nucléaire - Format de données pour l'acquisition de données numériques en mode liste utilisées dans la détection et la mesure des rayonnements
- NF C93-372-3*NF EN 60401-3:2016 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3 : guidelines on the format of data appearing in manufacturer's catalogues of transformer and inductor cores
Defense Logistics Agency, Chip Data Instruments
- DLA SMD-5962-81008 REV B-2008 MICROCIRCUIT, LINEAR, MONOLITHIC AND MULTICHIP, 12-BIT DIGITAL-TO-ANALOG CONVERTERS
- DLA SMD-5962-90976-1992 MICROCIRCUIT, CHMOS SINGLE-CHIP, 8-BIT MICROCONTROLLER WITH 256 BYTES OF ON CHIP DATA RAM, MONOLITHIC SILICON
- DLA DSCC-DWG-03017 REV A-2007 RESISTOR, THERMAL, THERMISTOR, DIE CHIP, POSITIVE TEMPERATURE COEFFICIENT (PTC) style 0303
- DLA DSCC-DWG-03018 REV A-2007 RESISTOR, THERMAL, THERMISTOR, DIE CHIP, NEGATIVE TEMPERATURE COEFFICIENT (NTC), STYLE 0404
- DLA SMD-5962-92061 REV G-2008 MICROCIRCUIT, HYBRID, DIGITAL, MULTICHIP, DUAL CHANNEL, DRIVER-RECEIVER
- DLA MIL-M-38510/156 C VALID NOTICE 1-2010 Microcircuits, Digital, TTL, Data Encoders, Monolithic Silicon
- DLA MIL-PRF-32192/1 (2)-2012 RESISTOR, CHIP, THERMAL (THERMISTOR), POSITIVE TEMPERATURE COEFFICIENT, STYLE RCTP0303
- DLA SMD-5962-92061 REV F-2003 MICROCIRCUIT, HYBRID, DIGITAL, MULTICHIP, DUAL CHANNEL, DRIVER-RECEIVER
- DLA MIL-M-38510/152 C VALID NOTICE 1-2009 Microcircuits, Digital, TTL, Data Decoders/Demultiplexers, Monolithic Silicon
- DLA MIL-PRF-32192/2 (2)-2012 RESISTOR, CHIP, THERMAL (THERMISTOR), INSULATED POSITIVE TEMPERATURE COEFFICIENT STYLE RCTP0805
- DLA SMD-5962-90564 REV E-2013 MICROCIRCUIT, DIGITAL, CHMOS, SINGLE-CHIP, 8-BIT MICROCONTROLLER WITH 16K BYTES OF EPROM PROGRAM MEMORY, MONOLITHIC SILICON
- DLA SMD-5962-95580 REV B-2008 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
- DLA MIL-M-38510/662 VALID NOTICE 4-2012 Microcircuits, Digital, High Speed, CMOS Data Selectors/Multiplexers, Monolithic Silicon
- DLA SMD-5962-85124 REV F-2009 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 3-STATE DATA SELECTOR/MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-01511 REV F-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K x 32-BIT, RADIATION-HARDENED SRAM, MULTICHIP MODULE
- DLA SMD-5962-95592 REV B-2013 MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL, 16-BIT, A/D CONVERTER, MULTICHIP SILICON
- DLA SMD-5962-01533 REV B-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K X 32-BIT, 3.3V, RADIATION-HARDENED SRAM, MULTICHIP MODULE
- DLA SMD-5962-10232-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2M X 32-BIT (64Mb), RADIATIONHARDENED, SRAM, MULTI-CHIP MODULE
- DLA SMD-5962-10232 REV A-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2M X 32-BIT (64Mb), RADIATIONHARDENED, SRAM, MULTI-CHIP MODULE
- DLA SMD-5962-02517 REV B-2011 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 128M X 8 bit STACKED DIE(1Gbit) SYNCHRONOUS DRAM (SDRAM), MODULE
- DLA SMD-5962-01532 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1024K x 8-BIT (8 M), RADIATION-HARDENED SRAM, MULTICHIP MODULE
- DLA SMD-5962-01533 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K x 32-BIT, 3.3 V, RADIATION-HARDENED SRAM, MULTICHIP MODULE
- DLA SMD-5962-02518 REV A-2009 MICROCIRCUIT MEMORY CMOS, DIGITAL, 256M X 8 BIT STACKED DIE (2GBIT) SYNCHRONOUS DRAM (SDRAM), MODULE
- DLA SMD-5962-88547 REV B-2005 MICROCIRCUIT, DIGITAL, NMOS, NUMERIC DATA PROCESSOR, MONOLITHIC SILICON
- DLA SMD-5962-06229 REV D-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MBIT (512K X 32), RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-76017 REV H-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DATA SELECTOR/MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-76033 REV E-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DATA SELECTOR/MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-00506 REV C-2013 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER, MONOLITHIC SILICON
- DLA SMD-5962-10205 REV A-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1MEG X 39-BIT (40M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-10205 REV B-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1MEG X 39-BIT (40M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-10206-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2MEG X 39-BIT (80M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-10207-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-10205-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1MEG X 39-BIT (40M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-94773-1995 MICROCICUIT, DIGITAL, 9-BIT TTL/BTL ADDRESS/DATA TRANSCEIVER, MONOLITHIC SILICON
- DLA SMD-5962-04227 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K x 32-BIT (16 M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-01532 REV B-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1024K X 8-BIT, (8 M) RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE
- DLA SMD-5962-80022 REV E-2005 MICROCIRCUIT, DIGITAL, TTL, SCHOTTKY, DATA SELECTORS/MULTIPLEXERS WITH THREE-STATE OUTPUT, MONOLITHIC SILICON
- DLA SMD-5962-85125 REV D-2013 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-INPUT DATA SELECTOR/MULTIPLEXER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
- DLA SMD-5962-96552 REV D-2013 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER, MONOLITHIC SILICON
- DLA MIL-M-38510/79 D VALID NOTICE 1-2010 Microcircuits, Digital, Bipolar, SCHOTTKY TTL, Data Selectors/Multiplexers with Three-State Outputs, Monolithic Silicon
- DLA MIL-M-38510/339 E-2011 MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DATA SELECTORS/MULTIPLEXERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
US-FCR, Chip Data Instruments
Professional Standard - Public Safety Standards, Chip Data Instruments
- GA/T 1966-2021 Forensic science electronic equipment storage chip data inspection technical specification
European Committee for Standardization (CEN), Chip Data Instruments
- CWA 17552-2020 Engineering materials - Electronic data interchange - Instrumented indentation test data
- CWA 17552:2020 Engineering materials - Electronic data interchange - Instrumented indentation test data
- EN 13757-4:2005 Communication systems for meters and remote reading of meters - Part 4: Wireless meter readout (Radio meter reading for operation in the 868 MHz to 870 MHz SRD band)
- EN 13757-4:2013 Communication systems for meters and remote reading of meters - Part 4: Wireless meter readout (Radio meter reading for operation in SRD bands)
Lithuanian Standards Office , Chip Data Instruments
- LST EN 62258-2-2011 Semiconductor die products -- Part 2: Exchange data formats (IEC 62258-2:2011)
- LST EN IEC 63047:2021 Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement (IEC 63047:2018 + COR1:2020)
- LST HD 357 S2-2002 A modular instrumentation system for data handling. CAMAC system (IEC 60516:1975+A1:1984)
European Committee for Electrotechnical Standardization(CENELEC), Chip Data Instruments
- CLC/TR 62258-7:2007 Semiconductor die products - Part 7: XML schema for data exchange
- CLC/TR 62258-8:2008 Semiconductor die products - Part 8: EXPRESS model schema for data exchange
- EN 60401-3:2016 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers catalogues of transformer and inductor cores
Professional Standard - Machinery, Chip Data Instruments
- JB/T 9330-1999 The basic parameter for diaphragm plate of optical instrument
- JB/T 50123-1999 Guide for the collection of reliability,availability,maintainability data from field performance of instrument
IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Chip Data Instruments
- IEEE 106-1972 Standard Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
- IEEE 431-1958 PROPOSED STANDARD FOR PRESENTING DATA ON MAGNETIC AMPLIFIER CORE MATERIALS
ISA - International Society of Automation, Chip Data Instruments
工业和信息化部, Chip Data Instruments
- JB/T 13778-2020 Positive temperature coefficient thermistor chip for compressor starter
Professional Standard - Aerospace, Chip Data Instruments
- QJ 1571.1-1988 Instrument management system data acquisition card and filling specification
IN-BIS, Chip Data Instruments
- IS 10732-1983
- IS 13875 Pt.3-1993 Digital Measuring Instruments for Measurement and Control Part 3 Terms, Test and Data Sheet Details of Instruments for Measuring Digital Quantities
- IS 13875 Pt.2-1993 Digital Measuring Instruments for Measurement and Control Part 2 Terms, Test and Data Sheet Details of Instruments for Measuring Analog Quantities
AT-OVE/ON, Chip Data Instruments
- OVE EN IEC 63047:2020 Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement (english version)
International Electrotechnical Commission (IEC), Chip Data Instruments
- IEC 63047:2018 Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement
- IEC 63047:2018/COR1:2020 Corrigendum 1 - Nuclear instrumentation - Data format for list mode digital data acquisition used in radiation detection and measurement
- IEC 62755:2012/AMD1:2020 Radiation protection instrumentation - Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
- IEC 60935:1996 Nuclear instrumentation - Modular high speed data acquisition system - FASTBUS
- IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy
- IEC TR 62246-3:2018 Reed switches - Part 3: Reliability data for reed switch-devices in typical safety applications
- IEC 60401-3:2015 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3: Guidelines on the format of data appearing in manufacturers catalogues of transformer and inductor cores
RO-ASRO, Chip Data Instruments
- STAS 12461-1987 A modular instrumentation system for data handling GAMAC System
United States Navy, Chip Data Instruments
Institute of Electrical and Electronics Engineers (IEEE), Chip Data Instruments
- IEEE Std 1554-2005 IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
- IEEE Std 106-1972 IEEE Standard Test procedure for Test Procedure for Toroidal Magnetic Amplifier Cores (Including Core Material Data)
- IEEE 1554-2005 IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
- IEEE Std P1554/D15d, Apr 2005 IEEE Draft Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
- IEEE 1616A-2010 Motor Vehicle Event Data Recorders (MVEDRs) Amendment 1: MVEDR Connector Lockout Apparatus (MVEDRCLA)
Military Standard of the People's Republic of China-General Armament Department, Chip Data Instruments
- GJB 6301-2008 General specification for data acquisition unit of surface telemetering meteorological instruments
- GJB 570.3-1988 Data acquisition and processing for static testing of meteorological instrument finalization test methods
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Chip Data Instruments
- GB/T 5691-1985 A modular instrumentation system for data handling--CAMAC system
IT-UNI, Chip Data Instruments
ANSI - American National Standards Institute, Chip Data Instruments
- Z80.26-1996 For Opthalmics - Data Processing and Information Interchange for Opthalmic Instruments (VC)
- INCITS 187-1990 Information Systems - Recorded Magnetic Tape for Longitudinal Recording of Instrumentation Data - Interchange
GB-REG, Chip Data Instruments
- REG NASA-LLIS-0388-1995 Lessons Learned - Galileo Command Data Subsystem Memory Devices (Leadless Chip Carriers) Rework Problems
SAE - SAE International, Chip Data Instruments
- SAE AS791-1996 Remote Servoed Air Data Instruments for Subsonic Aircraft
Society of Automotive Engineers (SAE), Chip Data Instruments
- SAE AS791-2008 Remote Servoed Air Data Instruments for Subsonic Aircraft
Standard Association of Australia (SAA), Chip Data Instruments
- IEC 62755:2012+AMD1:2020 CSV Radiation protection instrumentation — Data format for radiation instruments used in the detection of illicit trafficking of radioactive materials
Professional Standard - Aviation, Chip Data Instruments
- HB 7504.13-1997 Data Requirements for Flight Simulator Design and Performance Flight Instruments
International Organization for Standardization (ISO), Chip Data Instruments
- ISO/TS 10303-1650:2006 Industrial automation systems and integration - Product data representation and exchange - Part 1650: Application module: Bare die
- ISO/TS 10303-1650:2018 Industrial automation systems and integration — Product data representation and exchange — Part 1650: Application module: Bare die
Guangdong Provincial Standard of the People's Republic of China, Chip Data Instruments
- DB44/T 2192-2019 Data exchange specification for large-scale scientific instrument facility sharing service platform
Professional Standard - Geology, Chip Data Instruments
- DZ/T 0121.8-1994 Terminology of geological instruments Terminology of data processing equipment for geological and geophysical data
Korean Agency for Technology and Standards (KATS), Chip Data Instruments
- KS C IEC 62056-21-2003(2018)
- KS C IEC 60401-3:2017 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3:Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
- KS C IEC 60401-3:2006 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3:Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
- KS C IEC 60401-3-2017(2022) Terms and nomenclature for cores made of magnetically soft ferrites - Part 3:Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
KR-KS, Chip Data Instruments
- KS C IEC 60401-3-2017 Terms and nomenclature for cores made of magnetically soft ferrites - Part 3:Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores
American National Standards Institute (ANSI), Chip Data Instruments
- ANSI/IEEE 1554:2005 Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
- ANSI/IEEE 1554-200x:2005 Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis
AENOR, Chip Data Instruments
- UNE-EN 60401-3:2004 Terms and nomenclature for cores made of magnetically soft ferrites -- Part 3: Guidelines on the format of data appearing in manufacturers' catalogues of transformer and inductor cores