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Contact Thin Film Probe

Contact Thin Film Probe, Total:29 items.

In the international standard classification, Contact Thin Film Probe involves: Ceramics, Analytical chemistry, Linear and angular measurements, Electronic display devices, Surface treatment and coating, Semiconducting materials.

Japanese Industrial Standards Committee (JISC), Contact Thin Film Probe

JIS R 1636:1998 Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer

German Institute for Standardization, Contact Thin Film Probe

DIN EN ISO 18452:2016-09 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
DIN EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer; German version EN 1071-1:2003

ES-UNE, Contact Thin Film Probe

UNE-EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005) (Endorsed by AENOR in June of 2016.)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Contact Thin Film Probe

GB/T 33826-2017 Measurement of nanofilm thickness on glass substrate—Profilometric method
GB/T 16857.5-2017 Geometrical product specifications(GPS)—Acceptance and reverification tests for coordinate measuring machines (CMM)—Part 5:CMMs using single or multiple stylus contacting probing systems

国家市场监督管理总局、中国国家标准化管理委员会, Contact Thin Film Probe

GB/T 39518-2020 Geometrical product specifications (GPS) — Guidelines for the evaluation of coordinate measuring machine (CMM) test uncertainty for CMMs using single and multiple stylus contacting probing systems

Association Francaise de Normalisation, Contact Thin Film Probe

NF EN ISO 18452:2016 Céramiques techniques - Détermination de l'épaisseur des films céramiques avec un profilomètre à contact
NF A92-810*NF EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
NF A09-326:1987 Non-destructive testing - Ultrasonic testing - Method of evaluation under working of ultrasonic beam characteristics of contact probe
NF E05-031-605*NF EN ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture : areal - Part 605 : nominal characteristics of non-contact (point autofocus probe) instruments
NF A92-801-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1 : determination of coating thickness by contact probe filometer.

British Standards Institution (BSI), Contact Thin Film Probe

BS IEC 62899-202-3:2019 Printed electronics - Materials. Conductive ink. Measurement of sheet resistance of conductive films. Contactless method
BS EN ISO 25178-602:2010 Geometrical product specifications (GPS) - Surface texture - Areal - Nominal characteristics of non-contact (confocal chromatic probe) instruments
BS EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
BS EN ISO 25178-605:2014 Geometrical product specifications (GPS). Surface texture: Areal. Nominal characteristics of non-contact (point autofocus probe) instruments

American Society for Testing and Materials (ASTM), Contact Thin Film Probe

ASTM F1844-97(2016) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
ASTM F1844-97(2002) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
ASTM F1844-97 Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
ASTM F1844-97(2008) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
ASTM F374-00a Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

International Organization for Standardization (ISO), Contact Thin Film Probe

ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture: Areal - Part 605: Nominal characteristics of non-contact (point autofocus probe) instruments
ISO/DIS 25178-602:2023 Geometrical product specifications (GPS) — Surface texture: Areal — Part 602: Design and characteristics of non-contact (confocal chromatic probe) instruments

European Committee for Standardization (CEN), Contact Thin Film Probe

EN ISO 25178-605:2014 Geometrical product specifications (GPS) - Surface texture: Areal - Part 605: Nominal characteristics of non-contact (point autofocus probe) instruments (ISO 25178-605:2014)
DD ENV 1071-1-1993 Advanced Technical Ceramics - Methods of Test for Ceramic Coatings - Part 1 : Determination of Coating Thickness by Contact Probe Profilometer

Danish Standards Foundation, Contact Thin Film Probe

DS/EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe filometer
DS/EN ISO 10360-5:2010 Geometrical product specifications (GPS) - Acceptance and reverification tests for coordinate measuring machines (CMM) - Part 5: CMMs using single and multiple stylus contacting probing systems

Lithuanian Standards Office , Contact Thin Film Probe

LST EN 1071-1-2003 Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe filometer