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Electron and Light Microscopy

Electron and Light Microscopy, Total:488 items.

In the international standard classification, Electron and Light Microscopy involves: Optical equipment, Waxes, bituminous materials and other petroleum products, Vocabularies, Optics and optical measurements, Machine tool systems, Air quality, Optoelectronics. Laser equipment, Medical equipment, Quality, Analytical chemistry, Photography, Electronic component assemblies, Linear and angular measurements, Metrology and measurement in general, Electronic components in general, Electrical wires and cables, Welding, brazing and soldering, Education, Thermodynamics and temperature measurements, Meat, meat products and other animal produce, Technical drawings, Electronic display devices, Particle size analysis. Sieving, Microbiology, Testing of metals, Non-ferrous metals, Coals, Products of the textile industry, Protection against crime, Surface treatment and coating, Physics. Chemistry, Aerospace fluid systems and components, Electrical equipment for working in special conditions, Materials for the reinforcement of composites, Construction materials, Raw materials for rubber and plastics, Fluid power systems.

International Organization for Standardization (ISO), Electron and Light Microscopy

ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 8578:1997/Cor 1:2002 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces; Technical Corrigendum 1
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 8036-1:1986 Optics and optical instruments; Microscopes; Part 1 : Immersion oil for general use in light microscopy
ISO 10936-2:2001 Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 8038-2:2001 Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm
ISO 10935:1996 Optics and optical instruments - Microscopes - Interfacing connection type C
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 19056-3:2022 Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
ISO 15362:1998 Optics and optical instruments - Stereomicroscopes - Information provided to the user
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Part 1: Requirements and test methods
ISO 8037-1:1986 Optics and optical instruments; Microscopes; Slides; Part 1 : Dimensions, optical properties and marking
ISO 19056-1:2015 Microscopes - Definition and measurement of illumination properties - Part 1: Image brightness and uniformity in bright field microscopy
ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 8255-1:1986 Optics and optical instruments; Microscopes; Cover glasses; Part 1 : Dimensional tolerances, thickness and optical properties
ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
ISO/CD 4407 Hydraulic fluid power — Fluid contamination — Determination of particulate contamination by the counting method using an optical microscope
ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary
ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
ISO 4407:2002 Hydraulic fluid power - Fluid contamination - Determination of particulate contamination by the counting method using an optical microscope
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method

Japanese Industrial Standards Committee (JISC), Electron and Light Microscopy

JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

British Standards Institution (BSI), Electron and Light Microscopy

BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 8036:2015 Tracked Changes. Microscopes. Immersion liquids for light microscopy
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
BS 7012-6:1998 Light microscopes. Specification for spectral filters
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS 7012-11:1998 Light microscopes - Information provided to the user
BS 7012-0:1989 Light microscopes - General introduction
BS ISO 19056-3:2022 Microscopes. Definition and measurement of illumination properties - Incident light fluorescence microscopy with incoherent light sources
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
BS ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Requirements and test methods
BS 7011 Sec.2.1:1989 Consumable accessories for light microscopes. Slides. Specification for dimensions and optical properties
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 8255-1:2017 Tracked Changes. Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS ISO 8255-1:2011 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
BS ISO 19056-1:2015 Microscopes. Definition and measurement of illumination properties. Image brightness and uniformity in bright field microscopy
BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30395346 DC BS ISO 19056-3. Microscopes. Definition and measurement of illumination properties. Part 3. Incident light fluorescence microscopy with incoherent light sources
BS 7011-1-1.1:1998 Consumable accessories for light microscopes - Immersion oils - Specification for immersion oils for general use
BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
PD ISO/TR 14880-5:2010 Optics and photonics. Microlens arrays. Guidance on testing
BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS EN ISO 14880-1:2019 Tracked Changes. Optics and photonics. Microlens arrays. Vocabulary
BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS 7012-13:1997 Light microscopes. Interfacing connection for 35 mm SLR photo cameras (T-thread adaptation)
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 14880-2:2006 Optics and photonics. Microlens arrays. Test methods for wavefront aberrations
BS 7011-3.1:1989 Consumable accessories for light microscopes - Cover glasses - Specification for dimensions and optical properties
BS 7011 Sec.3.1:1989 Consumable accessories for light microscopes. Cover glasses. Specification for dimensions and optical properties
BS ISO 9345-2:2014 Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope

Korean Agency for Technology and Standards (KATS), Electron and Light Microscopy

KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 8039:2006 Optics and optical instruments Microscopes Magnification
KS B ISO 8039-2016(2021) Optics and optical instruments Microscopes Magnification
KS B ISO 8039:2016 Optics and optical instruments Microscopes Magnification
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS B ISO 12853:2006 Optics and optical instruments-Microscopes-Information provided to the user
KS B ISO 12853-2016(2021) Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 12853:2016 Optics and optical instruments－Microscopes－Information provided to the user
KS I 0051-1999 General rules for scanning electron microscopy
KS B ISO 15362:2006 Optics and optical instruments-Stereomicroscopes-Information provided to the user
KS B ISO 15362-2016(2021) Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 15362:2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
KS B ISO 8038-1:2006 Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 8038-2:2006 Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm
KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 8038-2-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 10936-1:2006 Optics and optical instruments－Operation microscopes－Part 1：Requirements and test methods
KS B ISO 10936-1-2006(2016) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 10936-1-2006(2021) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 8038-1-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 8038-1-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS E 4005-2007(2012) Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS E 4005-1981 Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
KS B ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
KS I ISO 13794:2008 Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
KS I ISO 4407:2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS I ISO 4407-2017(2022) Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm

KR-KS, Electron and Light Microscopy

KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
KS B ISO 12853-2016 Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 15362-2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 8040-2023 Optics and optical instruments — Microscopes — Dimensions of tube slide and tube slot connections
KS B ISO 8038-2-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 2: Screw thread type M25 × 0.75 mm
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS K 5578-2023 Detection of landfowl feather fiber in plumage — Light microscopy method
KS B ISO 8038-1-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS(4/5 in × 1/36 in)
KS B ISO 14880-1-2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS I ISO 4407-2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy

PT-IPQ, Electron and Light Microscopy

E E 15-1971

Military Standards (MIL-STD), Electron and Light Microscopy

DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)
DOD A-A-54386-1991 MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)

Professional Standard - Medicine, Electron and Light Microscopy

YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

German Institute for Standardization, Electron and Light Microscopy

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 10937:2003 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
DIN ISO 12853:2005 Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN ISO 8038-2:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006
DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
DIN ISO 8037-1:2003 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN ISO 8038-1:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006
DIN EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08
DIN 58959-4:1997-06 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes / Note: To be replaced by DIN 58959-6 Beiblatt 2 (2021-08, t).
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN ISO 8037-1:2003-05 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006) English version of DIN EN ISO 14880-3:2006-08
DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)
DIN EN ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties (ISO 14880-1:2016); German version EN ISO 14880-1:2016
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron and Light Microscopy

GB/T 27668-2023 Microscope Light Microscopy Terminology
GB/T 26600-2011 Microscopes.Immersion liquids for light microscopy
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 41869.1-2022 Optics and photonics—Microlens array—Part 1:Vocabulary
GB/T 28044-2011 General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
GB/T 20082-2006 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope

Professional Standard - Machinery, Electron and Light Microscopy

JB/T 5480-1991 Diaphragm of electron microscope
JB/T 9333-1999 Microscopes.Immersion oil for general use in light microscopy
JB/T 8230.1-1999 Light microscope.Vocabulary
JB/T 7398.2-1994 Microscope Optical Connection Dimensions
JB/T 5481-1991 Lamp filament of electron microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution

Defense Logistics Agency, Electron and Light Microscopy

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR
DLA A-A-50207 A VALID NOTICE 3-2006 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 2-2001 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 1-1993 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A-1988 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION

机械工业部, Electron and Light Microscopy

JB/T 8230.1-1995 Light microscopy terminology

Association Francaise de Normalisation, Electron and Light Microscopy

NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
NF S12-024-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. COVER GLASSES. PART 1 : DIMENSIONAL TOLERANCES,THICKNESS AND OPTICAL PROPERTIES.
NF S12-021-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. SLIDES. PART 1 : DIMENSIONS,OPTICAL PROPERTIES AND MARKING.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF S10-132-2*NF EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2 : test methods for wavefront aberrations
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF S10-132-1*NF EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1 : vocabulary
NF EN ISO 14880-1:2019 Optique et photonique - Réseaux de microlentilles - Partie 1 : vocabulaire
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
NF EN ISO 21363:2022 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à transmission

Professional Standard - Commodity Inspection, Electron and Light Microscopy

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 3129.2-2013 Rules for the inspection of optical instruments for import and export.Part 2:Biological microscopes

RU-GOST R, Electron and Light Microscopy

GOST 28489-1990 Light microscopes. Terms and definitions
GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST R 56169-2014 Optics and optical instruments. Operation microscope. Requirements and test methods
GOST 29214-1991 Optics and optical instruments. Microscopes. Connecting dimensions of tube slides and tube slots
GOST 23392-1978 Meat. Methods for chemical and microscopic analysis of freshness
GOST 20235.1-1974 Meat of rabbits. Methods for chemical and microscopic analysis of meat freshness
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST 7702.1-1974 Poultry meat. Methods for chemical and microscopic analysis of meat freshness
GOST 15114-1978 Telescope system for optical devices. Visual method of resolution limits determination
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST ISO 4407-2006 Industrial cleanliness. Determination of fluid contamination by the counting method using an optical microscope

RO-ASRO, Electron and Light Microscopy

STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS 7353/5-1982 MICROSCOPES Basic optical parameters
STAS SR ISO 8040 Optics and optioal instruments - Mlcroscopes - Connecting dimensions of tube slides and tubes slois
STAS SR ISO 8037-1:1995 Optics and optical instruments Microscopes - Slides Part 1: Dimensions, optical properties and marking
STAS SR ISO 8255-1:1995 Optics and optical instruments Microscopes — Cover glasses Part 1: Dimensional tolerances, thickness and optical properties
STAS 7856-1967

PL-PKN, Electron and Light Microscopy

PN N53040-1988 Light microscopes Optical mechanical dimensions
PN H04951-1986 Powder metallurgy Determination of the particie size of powder by the optical microscope method
PN-ISO 4407-2021-03 P Hydraulic fluid power -- Fluid contamination -- Determination of particulate contamination by the counting method using an optical microscope

Danish Standards Foundation, Electron and Light Microscopy

DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

European Committee for Standardization (CEN), Electron and Light Microscopy

EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 14880-3:2006 Optics and phonotics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

IN-BIS, Electron and Light Microscopy

IS 5258-1969

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron and Light Microscopy

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC/JEDEC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components [Superseded: IPC TM-650 2.6.22]

American Society for Testing and Materials (ASTM), Electron and Light Microscopy

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

National Metrological Technical Specifications of the People's Republic of China, Electron and Light Microscopy

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China, Electron and Light Microscopy

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/QGCML 1940-2023
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/TIAA 014-2018 Optical measuring methods of display devices for Vehicle electronic rearview mirror

National Metrological Verification Regulations of the People's Republic of China, Electron and Light Microscopy

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Education, Electron and Light Microscopy

JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

International Electrotechnical Commission (IEC), Electron and Light Microscopy

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

TIA - Telecommunications Industry Association, Electron and Light Microscopy

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices

国家市场监督管理总局、中国国家标准化管理委员会, Electron and Light Microscopy

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron and Light Microscopy

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

Association of German Mechanical Engineers, Electron and Light Microscopy

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2310-1-1984 Instruction for metallographic section manufacture and evaluation of thermally sprayed layers under the light-optical microscope
VDI/VDE 2655 Blatt 1.1-2008 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
VDI/VDE 2655 Blatt 1.2-2010 Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurement

American National Standards Institute （ANSI), Electron and Light Microscopy

ANSI/TIA/EIA 573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes

Professional Standard - Aviation, Electron and Light Microscopy

HB/Z 110-1986 Plexiglass Fracture Optical Microscope Observation Display Technical Instructions

Standard Association of Australia （SAA）, Electron and Light Microscopy

AS 2856.1:2000(R2013)
AS 2856.1:2000 Coal petrography - Preparation of coal samples for incident light microscopy

Professional Standard - Petroleum, Electron and Light Microscopy

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, Electron and Light Microscopy

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron and Light Microscopy

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

国家能源局, Electron and Light Microscopy

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Indonesia Standards, Electron and Light Microscopy

SNI ISO 10936-1:2008 Microscope for surgery - Part 1 : Specification and test method

Jiangsu Provincial Standard of the People's Republic of China, Electron and Light Microscopy

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

工业和信息化部, Electron and Light Microscopy

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

Professional Standard - Public Safety Standards, Electron and Light Microscopy

GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)

Professional Standard - Judicatory, Electron and Light Microscopy

SF/T 0139-2023

Society of Automotive Engineers (SAE), Electron and Light Microscopy

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems

ESDU - Engineering Sciences Data Unit, Electron and Light Microscopy

SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.

SE-SIS, Electron and Light Microscopy

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

ZA-SANS, Electron and Light Microscopy

SANS 6154:2006 Glass content of granulated metallurgical slag (transmitted-light microscopy method)

IT-UNI, Electron and Light Microscopy

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

PH-BPS, Electron and Light Microscopy

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

ES-UNE, Electron and Light Microscopy

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019) (Endorsed by Asociación Española de Normalización in August of 2019.)
UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)

IPC - Association Connecting Electronics Industries, Electron and Light Microscopy

IPC/JEDEC J-STD-035 CD-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components (Incorporates Amendment 1: January 2007)

AENOR, Electron and Light Microscopy

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE 32300:1995 COAL AND ANTHRACITE. PETROGRAPHY. METHODS OF PREPARING COAL SAMPLES FOR MICROSCOPIC ANALYSIS.
UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.

Lithuanian Standards Office , Electron and Light Microscopy

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

AT-ON, Electron and Light Microscopy

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)