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electron microscope optics

electron microscope optics, Total:425 items.

In the international standard classification, electron microscope optics involves: Optical equipment, Waxes, bituminous materials and other petroleum products, Vocabularies, Optics and optical measurements, Optoelectronics. Laser equipment, Air quality, Machine tool systems, Medical equipment, Quality, Photography, Electronic component assemblies, Analytical chemistry, Electronic components in general, Electrical wires and cables, Thermodynamics and temperature measurements, Metrology and measurement in general, Linear and angular measurements, Technical drawings, Electronic display devices, Welding, brazing and soldering, Education, Microbiology, Particle size analysis. Sieving, Non-ferrous metals, Coals, Products of the textile industry, Testing of metals, Protection against crime, Surface treatment and coating, Physics. Chemistry, Construction materials, Fluid power systems, Materials for the reinforcement of composites, Raw materials for rubber and plastics, Paints and varnishes.

International Organization for Standardization (ISO), electron microscope optics

ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 8036-1:1986 Optics and optical instruments; Microscopes; Part 1 : Immersion oil for general use in light microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
ISO 8578:1997/Cor 1:2002 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces; Technical Corrigendum 1
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
ISO 8038-2:2001 Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm
ISO 10935:1996 Optics and optical instruments - Microscopes - Interfacing connection type C
ISO 10936-2:2001 Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 15362:1998 Optics and optical instruments - Stereomicroscopes - Information provided to the user
ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary
ISO 8037-1:1986 Optics and optical instruments; Microscopes; Slides; Part 1 : Dimensions, optical properties and marking
ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Part 1: Requirements and test methods
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 8255-1:1986 Optics and optical instruments; Microscopes; Cover glasses; Part 1 : Dimensional tolerances, thickness and optical properties
ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO/CD 4407 Hydraulic fluid power — Fluid contamination — Determination of particulate contamination by the counting method using an optical microscope
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/DIS 14880-2 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
ISO/DIS 14880-4 Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties

British Standards Institution (BSI), electron microscope optics

BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS ISO 8036:2015 Tracked Changes. Microscopes. Immersion liquids for light microscopy
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
BS 7012-6:1998 Light microscopes. Specification for spectral filters
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS 7012-11:1998 Light microscopes - Information provided to the user
BS 7012-0:1989 Light microscopes - General introduction
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Requirements and test methods
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
PD ISO/TR 14880-5:2010 Optics and photonics. Microlens arrays. Guidance on testing
BS 7011 Sec.2.1:1989 Consumable accessories for light microscopes. Slides. Specification for dimensions and optical properties
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS EN ISO 14880-1:2019 Tracked Changes. Optics and photonics. Microlens arrays. Vocabulary
BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
BS ISO 8255-1:2011 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS ISO 8255-1:2017 Tracked Changes. Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS 7011-1-1.1:1998 Consumable accessories for light microscopes - Immersion oils - Specification for immersion oils for general use
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS EN ISO 14880-2:2006 Optics and photonics. Microlens arrays. Test methods for wavefront aberrations
BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS IEC 62679-3-1:2014 Electronic paper displays. Optical measuring methods
BS 7011-3.1:1989 Consumable accessories for light microscopes - Cover glasses - Specification for dimensions and optical properties
BS 7011 Sec.3.1:1989 Consumable accessories for light microscopes. Cover glasses. Specification for dimensions and optical properties

Japanese Industrial Standards Committee (JISC), electron microscope optics

JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Professional Standard - Medicine, electron microscope optics

YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

Korean Agency for Technology and Standards (KATS), electron microscope optics

KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8039:2006 Optics and optical instruments Microscopes Magnification
KS B ISO 8039-2016(2021) Optics and optical instruments Microscopes Magnification
KS B ISO 8039:2016 Optics and optical instruments Microscopes Magnification
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 12853:2006 Optics and optical instruments-Microscopes-Information provided to the user
KS B ISO 12853-2016(2021) Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 12853:2016 Optics and optical instruments－Microscopes－Information provided to the user
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS B ISO 15362:2006 Optics and optical instruments-Stereomicroscopes-Information provided to the user
KS B ISO 15362-2016(2021) Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 15362:2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS I 0051-1999 General rules for scanning electron microscopy
KS B ISO 8038-1:2006 Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 10936-1:2006 Optics and optical instruments－Operation microscopes－Part 1：Requirements and test methods
KS B ISO 10936-1-2006(2016) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 10936-1-2006(2021) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 8038-2-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2:2006 Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 8038-1-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 8038-1-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 14880-2:2018 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
KS I ISO 4407:2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS I ISO 4407-2017(2022) Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm

PT-IPQ, electron microscope optics

E E 15-1971

Military Standards (MIL-STD), electron microscope optics

DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)
DOD A-A-54386-1991 MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)

Professional Standard - Machinery, electron microscope optics

JB/T 5480-1991 Diaphragm of electron microscope
JB/T 8230.1-1999 Light microscope.Vocabulary
JB/T 9333-1999 Microscopes.Immersion oil for general use in light microscopy
JB/T 7398.2-1994 Microscope Optical Connection Dimensions
JB/T 5481-1991 Lamp filament of electron microscope
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5383-1991 Specification for transmission electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 5584-1991 Test method of transmission electron microscope amplification
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

German Institute for Standardization, electron microscope optics

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 10937:2003 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
DIN ISO 12853:2005 Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08
DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
DIN ISO 8037-1:2003 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN ISO 8038-2:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006
DIN EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006) English version of DIN EN ISO 14880-3:2006-08
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN 58959-4:1997-06 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes / Note: To be replaced by DIN 58959-6 Beiblatt 2 (2021-08, t).
DIN ISO 8038-1:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006
DIN ISO 8037-1:2003-05 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
DIN EN ISO 14880-1:2019-10 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019); German version EN ISO 14880-1:2019
DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)
DIN EN ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties (ISO 14880-1:2016); German version EN ISO 14880-1:2016
DIN EN ISO 14880-4:2006-08 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006); German version EN ISO 14880-4:2006
DIN EN ISO 14880-2:2007-03 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); German version EN ISO 14880-2:2006
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

KR-KS, electron microscope optics

KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 12853-2016 Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 15362-2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 8040-2023 Optics and optical instruments — Microscopes — Dimensions of tube slide and tube slot connections
KS B ISO 14880-1-2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS B ISO 8038-2-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 2: Screw thread type M25 × 0.75 mm
KS K 5578-2023 Detection of landfowl feather fiber in plumage — Light microscopy method
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS B ISO 8038-1-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS(4/5 in × 1/36 in)
KS B ISO 14880-2-2018 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
KS I ISO 4407-2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, electron microscope optics

GB/T 27668-2023 Microscope Light Microscopy Terminology
GB/T 26600-2011 Microscopes.Immersion liquids for light microscopy
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 41869.1-2022 Optics and photonics—Microlens array—Part 1:Vocabulary
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 41869.2-2022 Optics and photonics—Microlens array—Part 2:Test methods for wavefront aberrations

Defense Logistics Agency, electron microscope optics

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR
DLA A-A-50207 A VALID NOTICE 3-2006 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 2-2001 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 1-1993 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A-1988 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION

机械工业部, electron microscope optics

JB/T 8230.1-1995 Light microscopy terminology

Danish Standards Foundation, electron microscope optics

DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
DS/EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties

Association Francaise de Normalisation, electron microscope optics

NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
NF S12-024-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. COVER GLASSES. PART 1 : DIMENSIONAL TOLERANCES,THICKNESS AND OPTICAL PROPERTIES.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF S10-132-1*NF EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1 : vocabulary
NF EN ISO 14880-1:2019 Optique et photonique - Réseaux de microlentilles - Partie 1 : vocabulaire
NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
NF S12-021-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. SLIDES. PART 1 : DIMENSIONS,OPTICAL PROPERTIES AND MARKING.
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF S10-132-2*NF EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2 : test methods for wavefront aberrations
NF EN ISO 14880-2:2007 Optique et photonique - Réseaux de microlentilles - Partie 2 : méthodes d'essai pour les aberrations du front d'onde
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage

PL-PKN, electron microscope optics

PN N53040-1988 Light microscopes Optical mechanical dimensions
PN H04951-1986 Powder metallurgy Determination of the particie size of powder by the optical microscope method

Professional Standard - Commodity Inspection, electron microscope optics

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 3129.2-2013 Rules for the inspection of optical instruments for import and export.Part 2:Biological microscopes

European Committee for Standardization (CEN), electron microscope optics

EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
EN ISO 14880-3:2006 Optics and phonotics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

RO-ASRO, electron microscope optics

STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS 7353/5-1982 MICROSCOPES Basic optical parameters
STAS SR ISO 8040 Optics and optioal instruments - Mlcroscopes - Connecting dimensions of tube slides and tubes slois
STAS SR ISO 8037-1:1995 Optics and optical instruments Microscopes - Slides Part 1: Dimensions, optical properties and marking
STAS SR ISO 8255-1:1995 Optics and optical instruments Microscopes — Cover glasses Part 1: Dimensional tolerances, thickness and optical properties

RU-GOST R, electron microscope optics

GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
GOST 28489-1990 Light microscopes. Terms and definitions
GOST 29214-1991 Optics and optical instruments. Microscopes. Connecting dimensions of tube slides and tube slots
GOST R 56169-2014 Optics and optical instruments. Operation microscope. Requirements and test methods
GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST 15114-1978 Telescope system for optical devices. Visual method of resolution limits determination
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R 59743.1-2021 Optics and photonics. Microlens arrays. Part 1. Terms and definitions. Classification
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

American Society for Testing and Materials (ASTM), electron microscope optics

ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

Institute of Interconnecting and Packaging Electronic Circuits (IPC), electron microscope optics

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components

International Electrotechnical Commission (IEC), electron microscope optics

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

IN-BIS, electron microscope optics

IS 5258-1969

国家市场监督管理总局、中国国家标准化管理委员会, electron microscope optics

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary

TIA - Telecommunications Industry Association, electron microscope optics

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices

Group Standards of the People's Republic of China, electron microscope optics

T/QGCML 1940-2023
T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/TIAA 014-2018 Optical measuring methods of display devices for Vehicle electronic rearview mirror
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope

National Metrological Technical Specifications of the People's Republic of China, electron microscope optics

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China, electron microscope optics

JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Professional Standard - Education, electron microscope optics

JY/T 011-1996 General Principles of Transmission Electron Microscopy
JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

American National Standards Institute （ANSI), electron microscope optics

ANSI/TIA/EIA 573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, electron microscope optics

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

Association of German Mechanical Engineers, electron microscope optics

DVS 2803-1974 Electron-beam welding in microscopy (survey)
DVS 2310-1-1984 Instruction for metallographic section manufacture and evaluation of thermally sprayed layers under the light-optical microscope

Professional Standard - Aviation, electron microscope optics

HB/Z 110-1986 Plexiglass Fracture Optical Microscope Observation Display Technical Instructions

Standard Association of Australia （SAA）, electron microscope optics

AS 2856.1:2000(R2013)
AS 2856.1:2000 Coal petrography - Preparation of coal samples for incident light microscopy

Professional Standard - Public Safety Standards, electron microscope optics

GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy

ES-UNE, electron microscope optics

UNE-EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019) (Endorsed by Asociación Española de Normalización in August of 2019.)
UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Indonesia Standards, electron microscope optics

SNI ISO 10936-1:2008 Microscope for surgery - Part 1 : Specification and test method

Professional Standard - Petroleum, electron microscope optics

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, electron microscope optics

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, electron microscope optics

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

国家能源局, electron microscope optics

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

GOSTR, electron microscope optics

GOST R 58566-2019 Optics and photonics. Lenses for optical electronic systems. Test methods

工业和信息化部, electron microscope optics

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

Jiangsu Provincial Standard of the People's Republic of China, electron microscope optics

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

U.S. Air Force, electron microscope optics

AIR FORCE MIL-HDBK-87213 A-2005 ELECTRONICALLY/OPTICALLY GENERATED AIRBORNE DISPLAYS

Professional Standard - Judicatory, electron microscope optics

SF/T 0139-2023

IPC - Association Connecting Electronics Industries, electron microscope optics

IPC/JEDEC J-STD-035 CD-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components (Incorporates Amendment 1: January 2007)

ZA-SANS, electron microscope optics

SANS 6154:2006 Glass content of granulated metallurgical slag (transmitted-light microscopy method)

ESDU - Engineering Sciences Data Unit, electron microscope optics

SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.

SE-SIS, electron microscope optics

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

IT-UNI, electron microscope optics

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.