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Electron Microscope Optical Microscope

Electron Microscope Optical Microscope, Total:490 items.

In the international standard classification, Electron Microscope Optical Microscope involves: Optical equipment, Waxes, bituminous materials and other petroleum products, Vocabularies, Optics and optical measurements, Machine tool systems, Air quality, Optoelectronics. Laser equipment, Quality, Medical equipment, Analytical chemistry, Electronic component assemblies, Metrology and measurement in general, Electronic components in general, Electrical wires and cables, Linear and angular measurements, Welding, brazing and soldering, Photography, Education, Thermodynamics and temperature measurements, Coals, Metalliferous minerals, Technical drawings, Electronic display devices, Meat, meat products and other animal produce, Particle size analysis. Sieving, Microbiology, Testing of metals, Non-ferrous metals, Products of the textile industry, Water quality, Fuels, Mining equipment, Protection against crime, Physics. Chemistry, Surface treatment and coating, Fluid power systems, Applications of information technology, Textile fibres, Materials for the reinforcement of composites, Construction materials, Animal feeding stuffs, Aerospace fluid systems and components, Materials for aerospace construction, Raw materials for rubber and plastics, Electrical equipment for working in special conditions.


International Organization for Standardization (ISO), Electron Microscope Optical Microscope

  • ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
  • ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
  • ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
  • ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
  • ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
  • ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
  • ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
  • ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
  • ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
  • ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
  • ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
  • ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
  • ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 8036-1:1986 Optics and optical instruments; Microscopes; Part 1 : Immersion oil for general use in light microscopy
  • ISO 8578:1997/Cor 1:2002 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces; Technical Corrigendum 1
  • ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
  • ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
  • ISO 10936-2:2001 Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
  • ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
  • ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
  • ISO 8038-2:2001 Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm
  • ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
  • ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
  • ISO 10935:1996 Optics and optical instruments - Microscopes - Interfacing connection type C
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
  • ISO 19056-3:2022 Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
  • ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
  • ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
  • ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
  • ISO 15362:1998 Optics and optical instruments - Stereomicroscopes - Information provided to the user
  • ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
  • ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Part 1: Requirements and test methods
  • ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
  • ISO 8037-1:1986 Optics and optical instruments; Microscopes; Slides; Part 1 : Dimensions, optical properties and marking
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO/TS 22218-2:2023 Health informatics — Ophthalmic examination device data — Part 2: Specular microscope
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
  • ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
  • ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
  • ISO 19056-1:2015 Microscopes - Definition and measurement of illumination properties - Part 1: Image brightness and uniformity in bright field microscopy
  • ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
  • ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
  • ISO 8255-1:1986 Optics and optical instruments; Microscopes; Cover glasses; Part 1 : Dimensional tolerances, thickness and optical properties
  • ISO/CD 4407 Hydraulic fluid power — Fluid contamination — Determination of particulate contamination by the counting method using an optical microscope
  • ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
  • ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
  • ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm

Japanese Industrial Standards Committee (JISC), Electron Microscope Optical Microscope

  • JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
  • JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
  • JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS T 10936-2:2014 Operation microscopes.Part 2: Light hazard from operation microscopes used in ocular surgery
  • JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
  • JIS B 7251:2000 Reference system of polarized light microscopy
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

British Standards Institution (BSI), Electron Microscope Optical Microscope

  • BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
  • BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
  • BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
  • BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
  • BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
  • 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
  • BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
  • BS ISO 8036:2015 Tracked Changes. Microscopes. Immersion liquids for light microscopy
  • BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
  • BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
  • BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS 7012-8:1997 Light microscopes - Graticules for eyepieces
  • BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
  • BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
  • BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
  • 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
  • BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
  • BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
  • BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
  • BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
  • BS 7012-6:1998 Light microscopes. Specification for spectral filters
  • BS 7012-16:2001 Light microscopes - Diameter of interchangeable eyepieces
  • BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
  • BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
  • BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
  • BS 7012-11:1998 Light microscopes - Information provided to the user
  • BS 7012-0:1989 Light microscopes - General introduction
  • BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
  • BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
  • BS ISO 19056-3:2022 Microscopes. Definition and measurement of illumination properties - Incident light fluorescence microscopy with incoherent light sources
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • BS 7011 Sec.2.1:1989 Consumable accessories for light microscopes. Slides. Specification for dimensions and optical properties
  • BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
  • BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
  • BS ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Requirements and test methods
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS ISO 8255-1:2017 Tracked Changes. Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
  • PD ISO/TS 22218-2:2023 Health informatics. Ophthalmic examination device data. Specular microscope
  • BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
  • BS ISO 8255-1:2011 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
  • 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
  • BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
  • BS 7011-1-1.1:1998 Consumable accessories for light microscopes - Immersion oils - Specification for immersion oils for general use
  • BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
  • 21/30395346 DC BS ISO 19056-3. Microscopes. Definition and measurement of illumination properties. Part 3. Incident light fluorescence microscopy with incoherent light sources
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 19056-1:2015 Microscopes. Definition and measurement of illumination properties. Image brightness and uniformity in bright field microscopy
  • BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
  • BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
  • BS ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
  • BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
  • PD ISO/TR 14880-5:2010 Optics and photonics. Microlens arrays. Guidance on testing
  • BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
  • BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
  • BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
  • PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
  • BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
  • BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
  • BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate

PT-IPQ, Electron Microscope Optical Microscope

Military Standards (MIL-STD), Electron Microscope Optical Microscope

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscope Optical Microscope

  • GB/T 27668-2023 Microscope Light Microscopy Terminology
  • GB/T 26600-2011 Microscopes.Immersion liquids for light microscopy
  • GB/T 9247-1996 Microscope--Condensers
  • GB/T 9247-2008 Microscopes-Condensers
  • GB/T 24665-2009 Polarizing microscope
  • GB 9247-1988 Microscopes--Series of condensers
  • GB/T 22061-2008 Microscopes-Reference system of polarized light microscopy
  • GB/T 26601-2011 Microscopes.Spectral filters
  • GB 7667-1996 The dose of X-rays leakage from electron microscope
  • GB 7667-2003 The dose of X-rays leakage from electron microscope
  • GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
  • GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
  • GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
  • GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy

Korean Agency for Technology and Standards (KATS), Electron Microscope Optical Microscope

  • KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
  • KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
  • KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
  • KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
  • KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
  • KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
  • KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
  • KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
  • KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
  • KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
  • KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
  • KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
  • KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
  • KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
  • KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
  • KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
  • KS B 5619-2019 Microscopes — Eyepiece reticles
  • KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
  • KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
  • KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
  • KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
  • KS B ISO 8039:2006 Optics and optical instruments Microscopes Magnification
  • KS B ISO 8039-2016(2021) Optics and optical instruments Microscopes Magnification
  • KS B ISO 8039:2016 Optics and optical instruments Microscopes Magnification
  • KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
  • KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
  • KS M 0044-1999
  • KS I 0051-1999(2019) General rules for scanning electron microscopy
  • KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
  • KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
  • KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
  • KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
  • KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
  • KS I 0051-1999 General rules for scanning electron microscopy
  • KS B ISO 12853:2006 Optics and optical instruments-Microscopes-Information provided to the user
  • KS B ISO 12853-2016(2021) Optics and optical instruments－Microscopes－Information provided to the user
  • KS B ISO 12853:2016 Optics and optical instruments－Microscopes－Information provided to the user
  • KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
  • KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
  • KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
  • KS B ISO 15362:2006 Optics and optical instruments-Stereomicroscopes-Information provided to the user
  • KS B ISO 15362-2016(2021) Optics and optical instruments－Stereomicroscopes－Information provided to the user
  • KS B ISO 15362:2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
  • KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
  • KS B ISO 8038-1:2006 Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)
  • KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
  • KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
  • KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
  • KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
  • KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
  • KS B ISO 8038-2:2006 Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm
  • KS B ISO 8038-2-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
  • KS B ISO 8038-2-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
  • KS B ISO 10936-1:2006 Optics and optical instruments－Operation microscopes－Part 1：Requirements and test methods
  • KS B ISO 10936-1-2006(2016) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
  • KS B ISO 10936-1-2006(2021) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
  • KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
  • KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
  • KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
  • KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
  • KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
  • KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
  • KS B ISO 8038-1-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
  • KS B ISO 8038-1-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
  • KS E 4005-2007(2012) Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
  • KS E 4005-1981 Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
  • KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
  • KS I ISO 13794:2008 Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
  • KS I ISO 10312-2008(2018) Ambient air－Determination of asbestos fibers－Direct-transfer transmission electron microscopy method
  • KS I ISO 4407:2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
  • KS I ISO 4407-2017(2022) Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
  • KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
  • KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
  • KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length

Professional Standard - Medicine, Electron Microscope Optical Microscope

  • YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

KR-KS, Electron Microscope Optical Microscope

  • KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
  • KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
  • KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
  • KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
  • KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
  • KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
  • KS B ISO 12853-2016 Optics and optical instruments－Microscopes－Information provided to the user
  • KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
  • KS B ISO 15362-2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
  • KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
  • KS B ISO 8040-2023 Optics and optical instruments — Microscopes — Dimensions of tube slide and tube slot connections
  • KS K 5578-2023 Detection of landfowl feather fiber in plumage — Light microscopy method
  • KS B ISO 8038-2-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 2: Screw thread type M25 × 0.75 mm
  • KS B ISO 8038-1-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS(4/5 in × 1/36 in)
  • KS I ISO 4407-2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope

German Institute for Standardization, Electron Microscope Optical Microscope

  • DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
  • DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
  • DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
  • DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
  • DIN ISO 10937:2003 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)
  • DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
  • DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
  • DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
  • DIN ISO 12853:2005 Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)
  • DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
  • DIN ISO 8038-2:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006
  • DIN 58959-4:1997-06 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes / Note: To be replaced by DIN 58959-6 Beiblatt 2 (2021-08, t).
  • DIN ISO 8038-1:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006
  • DIN ISO 8037-1:2003 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
  • DIN 53943-3:1983 Testing of textiles; cotton fibre maturity; determination of the percent maturity; microscopic method using a polarisation microscope
  • DIN EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08
  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
  • DIN ISO 8037-1:2003-05 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)

Professional Standard - Machinery, Electron Microscope Optical Microscope

HU-MSZT, Electron Microscope Optical Microscope

Defense Logistics Agency, Electron Microscope Optical Microscope

机械工业部, Electron Microscope Optical Microscope

Association Francaise de Normalisation, Electron Microscope Optical Microscope

  • NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
  • NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
  • X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
  • NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
  • NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
  • NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
  • NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
  • NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
  • NF S12-024-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. COVER GLASSES. PART 1 : DIMENSIONAL TOLERANCES,THICKNESS AND OPTICAL PROPERTIES.
  • NF S12-021-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. SLIDES. PART 1 : DIMENSIONS,OPTICAL PROPERTIES AND MARKING.
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
  • NF S10-132-2*NF EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2 : test methods for wavefront aberrations
  • FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
  • NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

RO-ASRO, Electron Microscope Optical Microscope

  • STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
  • STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
  • STAS 7353/5-1982 MICROSCOPES Basic optical parameters
  • STAS SR ISO 8040 Optics and optioal instruments - Mlcroscopes - Connecting dimensions of tube slides and tubes slois
  • STAS SR ISO 8037-1:1995 Optics and optical instruments Microscopes - Slides Part 1: Dimensions, optical properties and marking
  • STAS SR ISO 8255-1:1995 Optics and optical instruments Microscopes — Cover glasses Part 1: Dimensional tolerances, thickness and optical properties

RU-GOST R, Electron Microscope Optical Microscope

  • GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
  • GOST 28489-1990 Light microscopes. Terms and definitions
  • GOST 29214-1991 Optics and optical instruments. Microscopes. Connecting dimensions of tube slides and tube slots
  • GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
  • GOST R 56169-2014 Optics and optical instruments. Operation microscope. Requirements and test methods
  • GOST 23392-1978 Meat. Methods for chemical and microscopic analysis of freshness
  • GOST 20235.1-1974 Meat of rabbits. Methods for chemical and microscopic analysis of meat freshness
  • GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
  • GOST 15114-1978 Telescope system for optical devices. Visual method of resolution limits determination
  • GOST 7702.1-1974 Poultry meat. Methods for chemical and microscopic analysis of meat freshness
  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
  • GOST R 56168-2014 Medical electrical equipment. Operation microscope. Specifications for governmental purchase

PL-PKN, Electron Microscope Optical Microscope

  • PN N53040-1988 Light microscopes Optical mechanical dimensions
  • PN N53041-1989 Light microscopy Objectives Basic requirements
  • PN N53049-1988 Immersion oil for genera? use in light microscopy
  • PN H04951-1986 Powder metallurgy Determination of the particie size of powder by the optical microscope method

Professional Standard - Commodity Inspection, Electron Microscope Optical Microscope

  • SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
  • SN/T 3129.2-2013 Rules for the inspection of optical instruments for import and export.Part 2:Biological microscopes

Danish Standards Foundation, Electron Microscope Optical Microscope

  • DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

Group Standards of the People's Republic of China, Electron Microscope Optical Microscope

American Society for Testing and Materials (ASTM), Electron Microscope Optical Microscope

  • ASTM E175-82(1999)e1 Standard Terminology of Microscopy
  • ASTM E175-82(2005)e1 Standard Terminology of Microscopy
  • ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
  • ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM D1245-84(2003) Standard Practice for Examination of Water-Formed Deposits by Chemical Microscopy
  • ASTM D3997-97 Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D3997-97(2004) Standard Practice for Preparing Coke Samples for Microscopical Analysis by Reflected Light
  • ASTM D2797/D2797M-09 Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light
  • ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
  • ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
  • ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
  • ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
  • ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
  • ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
  • ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM D1245-84(1999) Standard Practice for Examination of Water-Formed Deposits by Chemical Microscopy
  • ASTM D1245-84(2007) Standard Practice for Examination of Water-Formed Deposits by Chemical Microscopy
  • ASTM D1245-17 Standard Practice for Examination of Water-Formed Deposits by Chemical Microscopy
  • ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
  • ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
  • ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
  • ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
  • ASTM E3060-16 Standard Guide for Subvisible Particle Measurement in Biopharmaceutical Manufacturing Using Dynamic (Flow) Imaging Microscopy
  • ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
  • ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
  • ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
  • ASTM E3143-18b(2023) Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
  • ASTM D2797/D2797M-11a(2019) Standard Practice for Preparing Coal Samples for Microscopical Analysis by Reflected Light

IN-BIS, Electron Microscope Optical Microscope

European Committee for Standardization (CEN), Electron Microscope Optical Microscope

  • EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
  • EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
  • EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
  • EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron Microscope Optical Microscope

National Metrological Technical Specifications of the People's Republic of China, Electron Microscope Optical Microscope

  • JJF 1092-2002 Calibration Specification for Light Section Microscopes
  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China, Electron Microscope Optical Microscope

Professional Standard - Education, Electron Microscope Optical Microscope

  • JY/T 011-1996 General Principles of Transmission Electron Microscopy
  • JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
  • JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
  • JY/T 010-1996 General principles of analytical scanning electron microscopy
  • JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy

International Electrotechnical Commission (IEC), Electron Microscope Optical Microscope

TIA - Telecommunications Industry Association, Electron Microscope Optical Microscope

国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscope Optical Microscope

  • GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
  • GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscope Optical Microscope

  • GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
  • GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
  • GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

Association of German Mechanical Engineers, Electron Microscope Optical Microscope

  • DVS 2803-1974 Electron-beam welding in microscopy (survey)
  • DVS 2801-1968 Resistance welding in microscopy (survey)
  • DVS 2310-1-1984 Instruction for metallographic section manufacture and evaluation of thermally sprayed layers under the light-optical microscope

American National Standards Institute （ANSI), Electron Microscope Optical Microscope

Professional Standard - Petroleum, Electron Microscope Optical Microscope

  • SY/T 5614-1993 Rock Fluorescence Microscopy Identification Method
  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Standard Association of Australia （SAA）, Electron Microscope Optical Microscope

Professional Standard - Aviation, Electron Microscope Optical Microscope

  • HB/Z 110-1986 Plexiglass Fracture Optical Microscope Observation Display Technical Instructions

Indonesia Standards, Electron Microscope Optical Microscope

Shanghai Provincial Standard of the People's Republic of China, Electron Microscope Optical Microscope

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron Microscope Optical Microscope

国家能源局, Electron Microscope Optical Microscope

  • SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Jiangsu Provincial Standard of the People's Republic of China, Electron Microscope Optical Microscope

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

工业和信息化部, Electron Microscope Optical Microscope

  • YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
  • YS/T 1210-2018 Microscope polarization test method for oxygen content in copper

Professional Standard - Coal, Electron Microscope Optical Microscope

  • MT/T 1053-2008 Technical conditions of microscope photometer for vitrinite reflectance determination

国家安全生产监督管理总局, Electron Microscope Optical Microscope

  • MT/T 1053-2007 Microscope photometer technical conditions for measuring vitrinite reflectance

Taiwan Provincial Standard of the People's Republic of China, Electron Microscope Optical Microscope

  • CNS 11018-1984 Method of Preparing Coal Samples for Microscopical Analysis by Reflected Light
  • CNS 6600-1980 Portable Polarizing Microscope for Sampling and Determining Incombustible Matter in Coal and Rock-Dust Mixture
  • CNS 11020-1984 Method for Microscopical Determination of Volume Percent of Petrographic Components of Coal
  • CNS 11019-1984 Method for Microscopical Determination of the Reflectance of the Organic Components in a Polished Specimen of Coal

ESDU - Engineering Sciences Data Unit, Electron Microscope Optical Microscope

  • SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
  • SPB-M2-1-2007 Interfacial and rheological properties of asphaltenes studied by atomic force microscopy.

Professional Standard - Public Safety Standards, Electron Microscope Optical Microscope

  • GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1670-2019 General Technical Requirements for Forensic Science Comparative Microscopy
  • GA/T 1659-2019 Forensic Science Cashmere Fiber Inspection Biomicroscopy
  • GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy

Professional Standard - Judicatory, Electron Microscope Optical Microscope

Heilongjiang Provincial Standard of the People's Republic of China, Electron Microscope Optical Microscope

  • DB23/T 1529-2013 Basic Requirements for Continuous Spectrum Confocal Microscopy
  • DB23/T 1525-2013 Basic Requirements for Reflective Fluorescence Confocal Microscopy

SE-SIS, Electron Microscope Optical Microscope

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
  • SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

ZA-SANS, Electron Microscope Optical Microscope

  • SANS 6154:2006 Glass content of granulated metallurgical slag (transmitted-light microscopy method)

IT-UNI, Electron Microscope Optical Microscope

  • UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
  • UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

Society of Automotive Engineers (SAE), Electron Microscope Optical Microscope

  • SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems

ES-UNE, Electron Microscope Optical Microscope

  • UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

IPC - Association Connecting Electronics Industries, Electron Microscope Optical Microscope

  • IPC/JEDEC J-STD-035 CD-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components (Incorporates Amendment 1: January 2007)

PH-BPS, Electron Microscope Optical Microscope

  • PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

  Optical and Electron Microscopy, Electron and Light Microscopy, Electron Microscope vs Optical Microscope, Optical and Electron Microscopy, Light Microscope and Electron Microscope, Optical Electron Microscope, Optical Microscope Scanning Electron Microscope, Optical Electron Microscope, Electron Microscope Optical Microscope, Electron Microscope Optical Microscope, Optical Microscope Electron Microscope, Electron Microscope Optical Microscope, Optical Microscope Electron Microscope, Optical Microscope Electron Microscope, Electron Microscope vs Optical Microscope, Optical Microscope, Scanning Electron Microscope, optical microscope optics, Electron Microscope vs Light Microscope, Electron Microscopy and Optics, electron microscope optics.

 



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