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other oscillators

other oscillators, Total:500 items.

In the international standard classification, other oscillators involves: Electric filters, Piezoelectric and dielectric devices, Medical equipment, Construction materials, Structures of buildings, Valves, Environmental testing, Electronic components in general, Aircraft and space vehicles in general, Electricity. Magnetism. Electrical and magnetic measurements, Telecommunication terminal equipment, Installations in buildings, Components and accessories for telecommunications equipment, Vocabularies, Dentistry, Semiconductor devices, Materials for aerospace construction, Integrated circuits. Microelectronics, Telecommunication systems, Measurement of time, velocity, acceleration, angular velocity, Horology, Telecommunications in general, Shafts and couplings, Measurement of volume, mass, density, viscosity, Thermodynamics and temperature measurements, Radiocommunications, Electrical engineering in general, Rotating machinery, Physics. Chemistry, Audio, video and audiovisual engineering, Standardization. General rules, Electromagnetic compatibility (EMC), Transformers. Reactors, Metrology and measurement in general, Electronic tubes, Motor cycles and mopeds, Mechanical structures for electronic equipment, Equipment for petroleum and natural gas industries, Petroleum, petroleum products and natural gas handling equipment, Electrical and electronic testing, Power stations in general, Domestic, commercial and industrial heating appliances, Components for electrical equipment, Kitchen equipment, Rubber, Iron and steel products, Fluid storage devices, Mechanical testing, Continuous handling equipment, Bearings.


Professional Standard - Nuclear Industry, other oscillators

Taiwan Provincial Standard of the People's Republic of China, other oscillators

  • CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)
  • CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)
  • CNS 3770-1989 Dimensions and Winding of Intermediate Frequency Transformer and Oscillator Coil for Transistor Radio

Professional Standard - Medicine, other oscillators

German Institute for Standardization, other oscillators

  • DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
  • DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
  • DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017
  • DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
  • DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN 61338-2:2005 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
  • DIN EN 61338-2:2005-02 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
  • DIN EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
  • DIN 4235-3:1978 Compacting of Concrete by Vibrating; Compacting by External Vibrators during the Manufacture of Precast Components
  • DIN IEC 61080:1993 Guide to the measurement of equivalent electrical parameters of quartz crystal units; identical with IEC 61080:1991
  • DIN EN 169200:1996 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
  • DIN EN 168201:1992 Blank detail specification; quartz crystal units (qualification approval); german version EN 168201:1992
  • DIN EN 168101:1992 Blank detail specification; quartz crystal units (capability approval); german version EN 168101:1992
  • DIN EN ISO 15212-1 Berichtigung 1:2009-07 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999, Corrigendum to DIN EN ISO 15212-1:1999-06; German version EN ISO 15212-1:1999/AC:2009
  • DIN EN ISO 15212-1:1999-06 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998); German version EN ISO 15212-1:1999
  • DIN EN 169200:1996-05 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
  • DIN EN 60747-16-5:2021-08 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020); German version EN 60747-16-5:2013 + A1:2020 / Note: DIN EN 60747-16-5 (2014-04) remains valid alongside this standard until 2023...
  • DIN 4235-2:1978 Compacting of Concrete by Vibrating; Compacting by Internal Vibrators
  • DIN EN 62570:2016-09 Standard practice for marking medical devices and other items for safety in the magnetic resonance environment (IEC 62570:2014); German version EN 62570:2015
  • DIN EN 169201:1996 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
  • DIN EN ISO 15212-2 Berichtigung 1:2009-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002, Corrigendum to DIN EN ISO 15212-2:2002-07; German version EN ISO 15212-2:2002/AC:2009
  • DIN EN ISO 15212-2:2002-07 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002); German version EN ISO 15212-2:2002
  • DIN EN 169201:1996-05 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
  • DIN 8313-2:1977 Technical requirements and verification for clocks and clockmovements with electrical energy source; frequency of resonator 1000 Hz, terms of delivery for clock movements
  • DIN EN 60679-1:2008 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007
  • DIN 8313-1:1975 Technical requirements and verification for clocks and clock movements with electrical energy source; frequency of oscillating system 1000 Hz
  • DIN EN 60747-16-5/A1:2019 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/649/CD:2019); Text in German and English
  • DIN EN 60679-5:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
  • DIN EN 60679-1:2018-04 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017); German version EN 60679-1:2017 / Note: DIN EN 60679-1 (2008-02) remains valid alongside this standard until 2020-08-30.
  • DIN EN 60679-4:1998-11 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998
  • DIN EN 60679-4-1:1998-12 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification; capability approval (IEC 60679-4-1:1998); German version EN 60679-4-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (2008-02), DIN EN 60679-4 (1...
  • DIN EN 60679-5-1:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification; qualification approval (IEC 60679-5-1:1998); German version EN 60679-5-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (1998-09), DIN EN 60679-5...
  • DIN 8312-2:1975 Technical requirements and verification for watches and watch movements; watches with electrical energy source, frequency of oscillating system 1000 Hz
  • DIN EN 62884-1:2018-02 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
  • DIN EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998

U.S. Military Regulations and Norms, other oscillators

TR-TSE, other oscillators

  • TS 2319-1976 Quartz Crystal Units For Oscilators
  • TS 2268-1976 Quartz Crystal Unit Holders For Oscillators And Pin Connectiors
  • TS 3521-1980 CONICALFITTINGS FOR SYRINGES NEEDLES AND OTHER MEDICAL EQUIPMENT

Military Standards (MIL-STD), other oscillators

United States Navy, other oscillators

Professional Standard - Electron, other oscillators

  • SJ/T 10104-1991 Level oscillators for Type YX5071
  • SJ/Z 9155.2-1987 Quartz crystal oscillator Part 2: Guide to the use of quartz crystal oscillator
  • SJ 2942-1988 Methods of measurement for level oscillators
  • SJ 1852-1981 Terms for quartz crystal controlled oscillators
  • SJ 51648/5-1997 Type ZC 503,oscillators,crystal,detail specification for
  • SJ 2941-1988 General specification for level oscillators
  • SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
  • SJ 51648.4-1995 Oscillator,crystal,type ZC505E,detail specification for
  • SJ 2762-1987 Terms for surface acoustic wave (SAW) oscillators
  • SJ 2763-1987 Terms for surface acoustic wave (SAW) oscillators
  • SJ 51648/1-1994 Oscillator,crystal,Type ZF507 detail specification for
  • SJ 51648/2-1994 Oscillator,crystal Type ZD509,detail specification for
  • SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
  • SJ 20803-2001 Microwave circuits Measuring methods for voltage controlled oscillator
  • SJ 51648/3-1994 Oscillator,crystal,Type ZC505(A～D) detail specification for
  • SJ 20527.2-1995 Microwave assembly.detail specification for model WFZ817 voltage controlled oscillator
  • SJ 20527.3-2001 Microwave assembly detail specification for model WFZ816A voltage controlled oscillator
  • SJ/T 11457.2-2022 Waveguide Dielectric Resonators Part 2: Usage Guidelines for Oscillators and Filters
  • SJ 20527.7-2003 Microwave assembly Detail specification for model WFZ1006 phased locked dielectric resonator oscillator
  • SJ 2073-1982 Cores for IF transformers and medium wave oscillator coil of transistor radio receivers
  • SJ/T 11256-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 1:Generic specification
  • SJ/T 10685-1995 Intermediate-frequency transformers and oscillator coils for transistorized amplitude modulation broadcast receivers
  • SJ/T 11257-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 5:Sectional specification Qualification approval
  • SJ 2072-1982 Cores for IF transformers of transistor and for short wave oscillator coils of radio receivers
  • SJ/T 11743.3-2019 Piezoelectric and dielectric devices for frequency control and selection– Glossary – Part 3: Piezoelectric and dielectric oscillators（IEC/TS 61994-3:2011, Piezoelectric, dielectric and electrostatic devices and associated materials for frequ...

Korean Agency for Technology and Standards (KATS), other oscillators

  • KS C 6503-1999 Quartz crystal units for oscillators
  • KS C 6503-1984 Quartz crystal units for oscillators
  • KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
  • KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6504-1987 Ovens for Quartz Crystal Units
  • KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
  • KS C IEC 61338-2:2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C IEC 61338-2-2023 Waveguide Dielectric Resonators Part 2: Oscillator and Filter Application Guide
  • KS C 6509-2013 General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS B ISO 15212-1:2006 Oscillation-type density meters－Part 1：Laboratory instruments
  • KS B ISO 15212-1-2006(2016) Oscillation-type density meters－Part 1：Laboratory instruments
  • KS B ISO 15212-1-2006(2021) Oscillation-type density meters－Part 1：Laboratory instruments
  • KS C IEC 62860-1:2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS B ISO 7475-2004(2009) Mechanical vibration－Balancing machines－Enclosures and other protective measures for the measuring station
  • KS B ISO 15212-2:2006 Oscillation-type density meters－Part 2：Process instruments for homogeneous liquids
  • KS B ISO 7475:2004 Mechanical vibration-Balancing machines-Enclosures and other protective measures for the measuring station
  • KS B ISO 7475:2014 Mechanical vibration－Balancing machines－Enclosures and other protective measures for the measuring station
  • KS C IEC 60679-1:2018 Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
  • KS C IEC 60679-1-2023 Qualified piezoelectric, dielectric and electrostatic oscillators Part 1: General specifications
  • KS C IEC 60679-5:2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
  • KS C IEC 60679-4:2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
  • KS C IEC 60679-4-2023 Evaluating the quality of quartz crystal oscillators Part 4: Certification of competency to segment specifications
  • KS C IEC 60679-5-2023 Evaluating the quality of quartz crystal oscillators Part 5: Partial Specification Qualification
  • KS C IEC 60679-3:2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections
  • KS C IEC 62884-1:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement
  • KS D 3543-2009 Chromium-molybdenum alloy steel plates for boilers and pressure vessels
  • KS T ISO 2139-2006(2016) Continuous mechanical handling equipment for loose bulk materials — Oscillating conveyors and shaking or reciprocating feeders with tubular trough

Japanese Industrial Standards Committee (JISC), other oscillators

  • JIS C 6701:1995 Quartz crystal units for oscillators
  • JIS T 5504:2021 Dental rotary and oscillating instruments -- Shanks
  • JIS C 6710:1995 General rules of quartz crystal controlled oscillators
  • JIS C 6710:1999 Generic specification of crystal controlled oscillators
  • JIS C 6710:2007 Generic specification of crystal controlled oscillators
  • JIS C 6710:2021 Generic specification and test methods of oscillators
  • JIS W 0613:1979 Airplane strength and rigidity, flutter, divergence, and other aero elastic instabilities
  • JIS W 0610:1987 Airplane strength and rigidity, miscellaneous loads
  • JIS K 6300-2:2001 Rubber, unvulcanized -- Physical property -- Part 2: Determination of cure characteristics with oscillating curemeters

工业和信息化部/国家能源局, other oscillators

National Metrological Verification Regulations of the People's Republic of China, other oscillators

International Electrotechnical Commission (IEC), other oscillators

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • IEC 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60747-16-5:2013+AMD1:2020 CSV Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60050-702:1992 International electrotechnical vocabulary; chapter 702: oscillations, signals and related devices
  • IEC 60050-702:1992/COR1:1992 International electrotechnical vocabulary; chapter 702: oscillations, signals and related devices; Erratum 1.
  • IEC 60050-702:1992/COR2:1994 International electrotechnical vocabulary; chapter 702: oscillations, signals and related devices; Erratum 2.
  • IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60747-16-5:2013/AMD1:2020/COR1:2020 Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • IEC 62860-1:2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • IEC 60679-3:1989 Quartz crystal controlled oscillators; part 3: standard outlines and lead connections
  • IEC 60679-1/AMD1:2002 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 1
  • IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
  • IEC 60679-1:1980 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
  • IEC 60679-1/AMD1:1985 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
  • IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
  • IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
  • IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
  • IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
  • IEC TS 61994-3:2004 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators
  • IEC 60679-1/AMD2:2003 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 2

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, other oscillators

  • GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment.Part 13:Shakers, shaking water baths and shaking incubators
  • GB 12274-1990 Quartz crystal controlled oscillators Generic specificatoin for
  • GB/T 14733.7-1993 Terminology for telecommunications. Oscillations,signals and related devices
  • GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
  • GB/T 14733.7-2008 Terminology for telecommunication.Oscillations,signals and related devices
  • GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature
  • GB/T 12274-1990 Quartz crystal controlled oscillators--Generic specification for
  • GB/T 20870.5-2023 Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
  • GB/T 12274.1-2012 Quartz crystal controlled oscillators of assessed quality.Part 1:Generic specification

Military Standard of the People's Republic of China-General Armament Department, other oscillators

  • GJB 3160-1998 General specifications for gyromagnetic oscillators
  • GJB 1648-1993 General specifications for crystal oscillators
  • GJB 1648-2-2011 Genenral specification for crystal oscillators
  • GJB 1648A-2011 Genenral specification for crystal oscillators
  • GJB 3515-1999 General specification for surface acoustic wave oscillators
  • GJB/Z 45.2-1993 Military piezoelectric device series spectrum crystal oscillator
  • GJB 1648/1-2011 Detail specification for type ZA511(ZPB-5)crystal oscillator
  • GJB 1648/2-2011 Detail specification for type ZC547(ZWB-1)temperature compensated crystal oscillators
  • GJB 1648/3-2011 Detail specification for type ZC545(ZWC-6B-1/2)temperature compensated crystal oscillator
  • GJB 3480-1998 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 3480A-2021 Low-speed wind tunnel test method for aircraft model rotation and oscillation motion
  • GJB 2438/23-2021 Hybrid integrated circuit WHZD950M1050M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
  • GJB 2438/24-2021 Hybrid integrated circuit WHZD800M1100M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
  • GJB 2438/28-2021 Hybrid integrated circuit WHZD2200M2600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
  • GJB 2438/21-2021 Hybrid integrated circuit WHZD8240M8600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
  • GJB 2438/25-2021 Detailed specifications for hybrid integrated circuit WHZD6500M-11 microwave hybrid integrated voltage controlled oscillator

KR-KS, other oscillators

  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS B ISO 3159-2008 Timekeeping instruments－Wrist-chronometers with spring balance oscillator
  • KS C IEC 61338-2-2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C IEC 61338-2-2018(2023) Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
  • KS C IEC 62860-1-2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C IEC 62860-1-2018(2023) Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C IEC 60679-1-2018 Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
  • KS C IEC 60679-1-2018(2023) Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
  • KS C IEC 60679-4-2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
  • KS C IEC 60679-5-2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
  • KS C IEC 60679-5-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
  • KS C IEC 60679-4-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
  • KS C IEC 62884-1-2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement
  • KS C IEC 60679-3-2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections

Professional Standard - Post and Telecommunication, other oscillators

American National Standards Institute （ANSI), other oscillators

Group Standards of the People's Republic of China, other oscillators

National Metrological Technical Specifications of the People's Republic of China, other oscillators

  • JJF 1982-2022 Level Oscillator Calibration Specifications
  • JJF(纺织)105-2023 Calibration Specification for Constant Temperature Water Bath Oscillator
  • JJF 2016-2022 Calibration specification for damped oscillatory wave simulator
  • JJF 1984-2022 Specification for calibration of quartz crystal oscillators in electronic measuring instruments

Association Francaise de Normalisation, other oscillators

  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF EN 60679-6:2011 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6 : méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application
  • NF EN ISO 1797:2017 Médecine bucco-dentaire - Queues pour instruments rotatifs et oscillants
  • NF C96-627-2*NF EN 61338-2:2004 Waveguide type dielectric resonators - Part 2 : guidelines for oscillator and filter applications
  • NF UTE C93-611:1975 Dispositifs piézoélectriques - Quartz oscillateurs - Recueil de feuilles particulières.
  • NF EN ISO 15212-1:1999 Densimètres à oscillations - Partie 1 : instruments de laboratoire
  • NF EN 61338-2:2004 Résonateurs diélectriques à modes guidés - Partie 2 : guide pour l'application aux filtres et aux oscillateurs
  • NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
  • NF C96-016-5*NF EN 60747-16-5:2014 Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
  • NF EN 60747-16-5/A1:2020 Dispositifs à semiconducteurs - Partie 16-5 : circuits intégrés hyperfréquences - Oscillateurs
  • NF EN 60747-16-5:2014 Dispositifs à semiconducteurs - Partie 16-5 : Circuits intégrés hyperfréquences - oscillateurs
  • NF EN ISO 15212-2:2002 Densimètres à oscillation - Partie 2 : instruments industriels pour liquides homogènes
  • NF C74-237*NF EN 62570:2015 Standard practice for marking medical devices and other items for safety in the magnetic resonance environement
  • NF EN ISO 389-3:2016 Acoustique - Zéro de référence pour l'étalonnage d'équipements audiométriques - Partie 3 : niveaux de référence équivalents de force vibratoire liminaire pour les vibrateurs à sons purs et les ossivibrateurs
  • NF C93-620-1:2013 Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification
  • NF B35-212-2*NF EN ISO 15212-2:2002 Oscillation-type density meters - Part 2 : process instruments for homogeneous liquids
  • UTE C93-611U*UTE C93-611:1975 Components for electric equipment. Piezoelectric devices. Quartz crystal units for oscillators.
  • NF EN 60679-4-1:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 4-1 : spécification particulière cadre. Agrément de savoir-faire.
  • NF EN 60679-5:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 5 : spécification intermédiaire - Homologation
  • NF EN 60679-5-1:2000 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 5-1 : spécification particulière cadre - Homologation
  • NF EN 60679-3:2013 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 3 : encombrements normalisés et connexions des sorties
  • NF EN 60679-1:2017 Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance de la qualité - Partie 1 : spécification générique
  • NF C93-620-3:2002 Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections.
  • NF C93-620-3*NF EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections
  • NF C93-620-4*NF EN 60679-4:1999 Quartz crystal controlled oscillators of assessed quality - Part 4 : sectional specification - Capability approval
  • NF EN 62884-1:2017 Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 1 : méthodes fondamentales pour le mesurage
  • NF EN 60068-2-47:2005 Essais d'environnement - Partie 2-47 : essais - Fixation de spécimens pour essais de vibrations, d'impacts et autres essais dynamiques

British Standards Institution (BSI), other oscillators

  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
  • BS EN 61338-2:2004 Waveguide type dielectric resonators - Guidelines for oscillator and filter applications
  • BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
  • BS ISO 3159:2009 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
  • BS EN 60747-16-5:2013 Semiconductor devices. Microwave integrated circuits. Oscillators
  • BS ISO 3159:2010 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
  • BS EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality. Generic specification
  • BS IEC 62860-1:2013 Test methods for the characterization of organic transistor-based ring oscillators
  • BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality. Generic specification
  • 19/30393894 DC BS EN 60747-16-5 AMD1. Semiconductor devices. Part 16-5. Microwave integrated circuits. Oscillators
  • BS EN ISO 15212-2:2002 Oscillation-type density meters — Part 2: Process instruments for homogenous liquids
  • BS 9620:1975 Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
  • BS EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
  • BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Basic methods for the measurement
  • BS EN ISO 12185:1996 Methods of test for petroleum and its products. Crude petroleum and petroleum products. Determination of density. Oscillating U-tube method
  • BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Phase jitter measurement method
  • BS EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators. Frequency aging test methods
  • BS 9625:1983 Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level
  • BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Capability approval
  • BS EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Qualification approval
  • BS EN 169000:1993 Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
  • BS EN 169100:1993 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
  • BS EN 62570:2015 Standard practice for marking medical devices and other items for safety in the magnetic resonance environment
  • BS EN IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Short-term frequency stability test methods
  • BS EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Capability approval
  • BS EN 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Qualification approval
  • BS 1101:1977 Specification for pressure containers for paint and other similar substances
  • BS EN 50708-2-3:2022 Power transformers. Additional European requirements - Medium power transformer. Accessories

IEC - International Electrotechnical Commission, other oscillators

  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)
  • IEC TR 61869-102:2014 Instrument transformers – Part 102: Ferroresonance oscillations in substations with inductive voltage transformers (Edition 1.0)

Danish Standards Foundation, other oscillators

  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
  • DS/EN ISO 15212-1:1999 Oscillation-type density meters - Part 1: Laboratory instruments
  • DS/EN ISO 15212-1/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments
  • DS/EN 169200:1998 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)
  • DS/EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • DS/EN ISO 15212-2/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
  • DS/EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids
  • DS/EN 169201:1998 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)
  • DS/EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • DS/EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
  • DS/EN 60679-5:1999 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

CENELEC - European Committee for Electrotechnical Standardization, other oscillators

  • EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • EN 169200:1995 Sectional Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
  • EN 169201:1995 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
  • EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2002)

Defense Logistics Agency, other oscillators

未注明发布机构, other oscillators

SE-SIS, other oscillators

RU-GOST R, other oscillators

  • GOST 22866-1977 Crystal oscillators. Terms and definitions
  • GOST R 51499-1999 Environmental dynamic testing for machines, instruments and other articles. Vibration. Time-history method
  • GOST R IEC 60068-3-8-2015 Environmental dynamic testing for machines, instrument and other articles. Selecting amongst vibration tests
  • GOST 31321-2006 Vibration. Balancing machines. Enclosures and other protective measures
  • GOST IEC 60068-2-57-2016 Environmental dynamic testing for machines, instrument and other articles. Vibration. Time-history and sine-beat method
  • GOST 30630.1.8-2002 Test methods for resistance to environmental factors of machines, instruments and other articles. Time-history vibration tests
  • GOST 31419-2010 Environmental dynamic test methods for machines, instruments and other technical articles. Mixed mode vibration tests
  • GOST 16165-1980 Transistor ultrasonic osillators for technological installations. General specifications
  • GOST R 51502-1999 Environmental dynamic testing for machines, instruments and other articles. Exposure to broad-band random vibration (digital control)
  • GOST R 51801-2001 General requirements for machines, instruments and other industrial products as to chemically active and other special media endurance
  • GOST R 51802-2001 Aggressive and other special media stability test methods for machines, instruments and other industrial products
  • GOST 29178-1991 Electromagnetic compatibility of technical means. HUF electrovacuum equipment. Generators, amplifiers and modules on their basis. Requirements for side oscillations levels
  • GOST 12152-1966 Frequency characteristics meters and generators of fluctuating freqnency. Control methods
  • GOST 16863-1971 Measuring generators for frequency range 0,1-35 MHz. Methods and means of verification
  • GOST 30630.1.9-2002 Environmental dynamic testing for machines, instruments and other articles. Exposure to broad-band random vibration (digital control)
  • GOST 19438.3-1974 Low-power electronic tubes and valves. Method of measurement of insulation resistance between electrodes and between electrodes and all other elements of tubes and valves
  • GOST R 52932-2008 Electromagnetic, ultrasonic, vortex and fluid oscillator counters for water heat supply systems. General specifications
  • GOST 30630.1.2-1999 Mechanical environment stability test methods for machines, instruments and other industrial products. Tests for influences of vibration
  • GOST 29179-1991 Electromagnetic compatibility of technical means. HUF equipment. Methods of measurements for side oscillations

PL-PKN, other oscillators

IET - Institution of Engineering and Technology, other oscillators

American Water Works Association (AWWA), other oscillators

ES-UNE, other oscillators

  • UNE-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
  • UNE-EN 61338-2:2004 Waveguide type dielectric resonators -- Part 2: Guidelines for oscillator and filter applications (Endorsed by AENOR in November of 2004.)
  • UNE-EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
  • UNE-EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
  • UNE-EN 62570:2015 Standard practice for marking medical devices and other items for safety in the magnetic resonance environment (Endorsed by AENOR in July of 2015.)
  • UNE-EN ISO 15212-2:2002/AC:2010 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
  • UNE-EN ISO 15212-1:1999/AC:2010 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
  • UNE-EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
  • UNE-EN 60679-4:1998 QUARZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4: SECTORIAL SPECIFICATION. CAPABILITY APPROVAL. (Endorsed by AENOR in June of 1998.)
  • UNE-EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
  • UNE-EN 60679-5:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)

Lithuanian Standards Office , other oscillators

  • LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
  • LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators
  • LST EN 169200-2001 Sectional specification. Quarz crystal controlled oscillators (Qualification approval)
  • LST EN 168200-2002/A1-2005 Sectional specification. Quartz crystal units (qualification approval)
  • LST EN 168200-2002 Sectional specification. Quartz crystal units (qualification approval)
  • LST EN 61338-2-2004 Waveguide type dielectric resonators. Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004)
  • LST EN 169100-2003 Sectional specification: Quartz crystal controlled oscillators (Capability approval)
  • LST EN 169201-2001 Blank detail specification. Quarz crystal controlled oscillators (Qualification approval)
  • LST EN 168201-2001 Blank detail specification. Quartz crystal units (qualification approval)
  • LST EN 168101-2001 Blank detail specification. Quartz crystal units (capability approval)
  • LST EN ISO 15212-1:2000 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998)
  • LST EN 169101-2003 Blank detail specification: Quartz crystal controlled oscillators (Capability approval)
  • LST EN ISO 15212-1:2000/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)
  • LST EN 60747-16-5/A1-2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013/A1:2020)
  • LST EN ISO 15212-2:2003/AC:2009 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids (ISO 15212-2:2002/Cor 1:2008)
  • LST EN 60679-1-2007 Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2007)

CZ-CSN, other oscillators

European Standard for Electrical and Electronic Components, other oscillators

  • EN 169000:1992 Generic specification: quartz crystal controlled oscillatores

RO-ASRO, other oscillators

  • STAS SR ISO 3159:1994 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
  • STAS 8310-1986 WOODEN FURNITURE AND OTH ER WOODEN FINISHED PRODUCTS Limiting testers
  • STAS 9190-1991 CAPACITORS FOR USE IN TUBULAR FLUORESCENT AND OTHER DISCHARGE LAMP CIRCUITS

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, other oscillators

  • GB/T 35011-2018 Microwave circuits—Measuring methods for voltage controlled oscillater

Professional Standard - Aerospace, other oscillators

  • QJ 3047-1998 Detailed specifications for Z602 voltage controlled crystal oscillators
  • QJ 3046-1998 Detailed specifications for Z601 voltage controlled crystal oscillators
  • QJ 2658-1994 Detail specification for semiconductor integrated circuit TTL-megahertz main frequency oscillator MF05

International Organization for Standardization (ISO), other oscillators

  • ISO 15212-1:1998 Oscillation-type density meters - Part 1: Laboratory instruments
  • ISO 3159:2009 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
  • ISO 3159:1976 Timekeeping instruments; Wrist-chronometers with spring balance oscillator
  • ISO 15212-1:1998/cor 1:2008 Oscillation-type density meters - Part 1: Laboratory instruments; Technical Corrigendum 1
  • ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogeneous liquids
  • ISO 7475:2002 Mechanical vibration - Balancing machines - Enclosures and other protective measures for the measuring station

European Committee for Standardization (CEN), other oscillators

  • EN ISO 15212-1:1999 Oscillation-Type Density Meters - Part 1: Laboratory Instruments
  • EN ISO 15212-2:2002 Oscillation-type density meters - Part 2: Process instruments for homogenous liquids (ISO 15212-2:2002)
  • EN ISO 15212-1:1999/AC:2009 Oscillation-type density meters - Part 1: Laboratory instruments (ISO 15212-1:1998/Cor 1:2008)

IN-BIS, other oscillators

European Committee for Electrotechnical Standardization（CENELEC）, other oscillators

  • EN 61338-2:2004 Waveguide type dielectric resonators Part 2: Guidelines for oscillator and filter applications
  • EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • EN 169101:1993 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Capability Approval) (Remains Current)
  • EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
  • EN 62570:2015 Standard practice for marking medical devices and other items for safety in the magnetic resonance environment
  • EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
  • EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
  • EN 169000:1998 Generic Specification: Quartz Crystal Controlled Oscillators (Incorporates Amendment A1: 1998)
  • EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

American Society for Testing and Materials (ASTM), other oscillators

  • ASTM F2503-20 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment
  • ASTM F2503-23 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment
  • ASTM F2503-23e1 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment
  • ASTM F2503-13 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment
  • ASTM F1202-06 Standard Specification for Washing Machines, Heat Sanitizing, Commercial, Pot, Pan, and Utensil Vertically Oscillating Arm Type
  • ASTM F1202-16 Standard Specification for Washing Machines, Heat Sanitizing, Commercial, Pot, Pan, and Utensil Vertically Oscillating Arm Type
  • ASTM F2503-05 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment
  • ASTM F2503-08 Standard Practice for Marking Medical Devices and Other Items for Safety in the Magnetic Resonance Environment

National Aeronautics and Space Administration (NASA), other oscillators

  • NASA NACA-TR-762-1943 A theoretical investigation of the lateral oscillations of an airplane with free rudder with special reference to the effect of friction

AENOR, other oscillators

  • UNE-EN ISO 15212-1:1999 OSCILLATION-TYPE DENSITY METERS. PART 1: LABORATORY INSTRUMENTS (ISO 15212-1:1999)
  • UNE-EN ISO 15212-2:2003 Osscilation-type density meters. Part 2: Process instruments for homogenous liquids. (ISO 15212-2:2002)

AT-OVE/ON, other oscillators

  • OVE EN 60747-16-5-2021 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (german version)

Institute of Electrical and Electronics Engineers (IEEE), other oscillators

Standard Association of Australia （SAA）, other oscillators

U.S. Air Force, other oscillators

  • AIR FORCE MIL-A-8865 B-1987 AIRPLANE STRENGTH AND RIGIDITY MISCELLANEOUS LOADS [Use In Lieu Of: AIR FORCE MIL-A-008865 A CANC NOTICE 1]

American Gear Manufacturers Association, other oscillators

AGMA - American Gear Manufacturers Association, other oscillators

  • 9004-A99-1999 Flexible Couplings - Mass Elastic Properties and Other Characteristics
  • 9004A-A99-1999 Flexible Couplings - Mass Elastic Properties and Other Characteristics
  • 9004-B08-2008 Flexible Couplings - Mass Elastic Properties and Other Characteristics

Underwriters Laboratories (UL), other oscillators

  • UL 180-2012 Liquid-Level Gauges for Oil Burner Fuels and Other Combustible Liquids

国家市场监督管理总局、中国国家标准化管理委员会, other oscillators

  • GB/T 12274.4-2021 Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval

Professional Standard - Electricity, other oscillators

  • DL/T 849.5-2004 General technical specification of test instruments used for power equipments Part 5: oscillating wave high voltage generator
  • DL/T 849.5-2019 General Specifications for Special Test Instruments for Power Equipment Part 5: Oscillating Wave High Voltage Generator

Canadian Standards Association (CSA), other oscillators

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., other oscillators

  • IEEE 1620.1-2006 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (IEEE Computer Society)

PK-PSQCA, other oscillators

  • PS 1368-1975 CONICAL FITTINGS FOR SYRINGES, NEEDLES AND OTHER MEDICAL EQUIPMENT

American Bureau of Shipping , other oscillators

  • ABS 210-2021 GUIDE FOR GAS AND OTHER LOW-FLASHPOINT FUEL READY VESSELS

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