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oscillator

oscillator, Total:457 items.

In the international standard classification, oscillator involves: Medical equipment, Valves, Piezoelectric and dielectric devices, Environmental testing, Electric filters, Electronic components in general, Aircraft and space vehicles in general, Electricity. Magnetism. Electrical and magnetic measurements, Telecommunication terminal equipment, Installations in buildings, Vocabularies, Integrated circuits. Microelectronics, Semiconductor devices, Construction materials, Structures of buildings, Components and accessories for telecommunications equipment, Telecommunication systems, Materials for aerospace construction, Horology, Measurement of time, velocity, acceleration, angular velocity, Thermodynamics and temperature measurements, Rotating machinery, Physics. Chemistry, Radiocommunications, Metrology and measurement in general, Dentistry, Mechanical structures for electronic equipment, Components for electrical equipment.

Professional Standard - Nuclear Industry, oscillator

EJ 220-1984 Oscillator stand

Professional Standard - Medicine, oscillator

YY 0156-1994 Minim oscillator

U.S. Military Regulations and Norms, oscillator

ARMY MIL-O-14850 NOTICE 1-1997 OSCILLATOR, HIGH VOLTAGE, 10549785
ARMY MIL-O-14850 (1)-1973 OSCILLATOR, HIGH VOLTAGE, 10549785
ARMY MIL-O-14850-1969 OSCILLATOR, HIGH VOLTAGE, 10549785
ARMY MIL-PRF-55310/32 A-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY MIL-G-45717-1961 GENERATOR, PULSE SG-95/MPQ-25
ARMY MIL-PRF-55310/29 C-2011 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, HCMOS
ARMY MIL-PRF-55310/34 C-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/38 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/28 C VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
ARMY MIL-PRF-55310/30 D VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
ARMY QPL-55310-70-2008 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-71-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-74-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310/36 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/27 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
ARMY MIL-PRF-55310/40 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/27 D VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
ARMY QPL-55310-69-2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-76-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-81-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-83-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-84-2013 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310/25 D-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 25 MHz THROUGH 175 MHz, HERMETIC SEAL, SQUARE WAVE, EMITTER COUPLED LOGIC
ARMY MIL-PRF-55310/35-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-PRF-49192 A-1997 GENERATOR, SIGNAL, VHF SG-1170/U
ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/30 D-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 450 kHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/12 H-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHz THROUGH 10 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/37 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
ARMY MIL-PRF-55310/27 D-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
ARMY MIL-PRF-55310/32 B-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHz THROUGH 125 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY MIL-PRF-55310/18 F-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/31 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHz THROUGH 200 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
ARMY MIL-PRF-55310/33 B-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
ARMY MIL-PRF-55310/34 B-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/38 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/35 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-PRF-55310/36 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
ARMY MIL-PRF-55310/39 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 133 MHz, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
ARMY MIL-L-63119-1977 LOCAL OSCILLATOR/MIXER HYBRID FOR XM122 FIRING DEVICE RECEIVER
ARMY MIL-PRF-55310/40 A-2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS

TR-TSE, oscillator

TS 2319-1976 Quartz Crystal Units For Oscilators
TS 2268-1976 Quartz Crystal Unit Holders For Oscillators And Pin Connectiors

Military Standards (MIL-STD), oscillator

DOD A-A-50891 A-1993 VIBRATOR, DENTAL MOLDING

United States Navy, oscillator

NAVY MIL-O-85432 B NOTICE 1-1996 OSCILLATOR, VOLTAGE CONTROLLED
NAVY MIL-O-85432 B-1988 OSCILLATOR, VOLTAGE CONTROLLED
NAVY MIL-O-81144 B NOTICE 1-1996 OSCILLATOR SUBASSEMBLY (FOR TORPEDO MARK 37 MODS 0, 2, AND 3)
NAVY MIL-O-81144 B-1970 OSCILLATOR SUBASSEMBLY (FOR TORPEDO MARK 37 MODS 0, 2, AND 3)
NAVY MIL-B-82564 NOTICE 1-1998 BISTABLE MULTIVIBRATOR ASSEMBLY LD 546989 (FOR GUIDANCE) show 86 558 m
NAVY MIL-B-82564 (3)-1972 BISTABLE MULTIVIBRATOR ASSEMBLY LD 546989 (FOR GUIDANCE CONTROL TEST SET MK 443 MOD 0 AND MOD 1)
NAVY MIL-B-82564-1968 BISTABLE MULTIVIBRATOR ASSEMBLY LD 546989 (FOR GUIDANCE CONTROL TEST SET MK 443 MOD 0 AND MOD 1)

Professional Standard - Electron, oscillator

SJ/T 10104-1991 Level oscillators for Type YX5071
SJ/Z 9155.2-1987 Quartz crystal oscillator Part 2: Guide to the use of quartz crystal oscillator
SJ 2942-1988 Methods of measurement for level oscillators
SJ 1852-1981 Terms for quartz crystal controlled oscillators
SJ 51648/5-1997 Type ZC 503,oscillators,crystal,detail specification for
SJ 2941-1988 General specification for level oscillators
SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
SJ 51648.4-1995 Oscillator,crystal,type ZC505E,detail specification for
SJ 2762-1987 Terms for surface acoustic wave (SAW) oscillators
SJ 2763-1987 Terms for surface acoustic wave (SAW) oscillators
SJ 51648/1-1994 Oscillator,crystal,Type ZF507 detail specification for
SJ 51648/2-1994 Oscillator,crystal Type ZD509,detail specification for
SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
SJ 20803-2001 Microwave circuits Measuring methods for voltage controlled oscillator
SJ 51648/3-1994 Oscillator,crystal,Type ZC505(A～D) detail specification for
SJ 20527.2-1995 Microwave assembly.detail specification for model WFZ817 voltage controlled oscillator
SJ 20527.3-2001 Microwave assembly detail specification for model WFZ816A voltage controlled oscillator
SJ 20527.7-2003 Microwave assembly Detail specification for model WFZ1006 phased locked dielectric resonator oscillator
SJ/T 11256-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 1:Generic specification
SJ/T 11457.2-2022 Waveguide Dielectric Resonators Part 2: Usage Guidelines for Oscillators and Filters
SJ/T 11257-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 5:Sectional specification Qualification approval
SJ/T 11258-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 5-1:Blank detail specification Qualification approval
SJ/T 11743.3-2019 Piezoelectric and dielectric devices for frequency control and selection– Glossary – Part 3: Piezoelectric and dielectric oscillators（IEC/TS 61994-3:2011, Piezoelectric, dielectric and electrostatic devices and associated materials for frequ...

Korean Agency for Technology and Standards (KATS), oscillator

KS C 6503-1999 Quartz crystal units for oscillators
KS C 6503-1984 Quartz crystal units for oscillators
KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
KS C 6504-1987 Ovens for Quartz Crystal Units
KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
KS C 6509-2013 General Rules of Quartz Crystal Controlled Oscillators
KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS C IEC 62860-1:2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS C IEC 61338-2:2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
KS C IEC 61338-2-2023 Waveguide Dielectric Resonators Part 2: Oscillator and Filter Application Guide
KS C IEC 60679-1:2018 Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
KS C IEC 60679-1-2023 Qualified piezoelectric, dielectric and electrostatic oscillators Part 1: General specifications
KS C IEC 60679-5:2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS C IEC 60679-4:2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 60679-4-2023 Evaluating the quality of quartz crystal oscillators Part 4: Certification of competency to segment specifications
KS C IEC 60679-5-2023 Evaluating the quality of quartz crystal oscillators Part 5: Partial Specification Qualification
KS C IEC 60679-3:2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections
KS C IEC 62884-1:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement
KS C IEC 62884-2:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method
KS C IEC 60679-5-1-2002(2017) Quartz crystal controlled oscillators of assessed quality－Part 5－1：Blank detail specification－Qualification approval
KS C IEC 60679-4-1-2002(2017) Quartz crystal controlled oscillators of assessed quality－Part 4－1 : Blank detail specification－Capability approval
KS C IEC 60679-4-1:2002 Quartz crystal controlled oscillators of assessed quality－Part 4－1 : Blank detail specification－Capability approval
KS C IEC 60679-5-1:2002 Quartz crystal controlled oscillators of assessed quality－Part 5－1：Blank detail specification－Qualification approval
KS C IEC 60679-4-1-2002(2022) Quartz crystal controlled oscillators of assessed quality－Part 4－1 : Blank detail specification－Capability approval
KS C IEC 62884-4:2022 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 4: Short-term frequency stability test methods
KS C IEC 60679-5-1-2002(2022) Quartz crystal controlled oscillators of assessed quality－Part 5－1：Blank detail specification－Qualification approval

Japanese Industrial Standards Committee (JISC), oscillator

JIS C 6701:1995 Quartz crystal units for oscillators
JIS C 6710:1995 General rules of quartz crystal controlled oscillators
JIS C 6710:1999 Generic specification of crystal controlled oscillators
JIS C 6710:2007 Generic specification of crystal controlled oscillators
JIS C 6710:2021 Generic specification and test methods of oscillators
JIS T 5504:2021 Dental rotary and oscillating instruments -- Shanks

工业和信息化部/国家能源局, oscillator

JB/T 12922-2016 Constant temperature culture shaker

Taiwan Provincial Standard of the People's Republic of China, oscillator

CNS 12253-1988 Quartz Crystal Units For Oscillators (For 1 MHz -- 125 MHz)
CNS 12254-1988 Quartz Crystal Units for Oscillators (for 200-1000 kHz)

International Electrotechnical Commission (IEC), oscillator

IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
IEC 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013+AMD1:2020 CSV Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 62860-1:2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEC 60679-3:1989 Quartz crystal controlled oscillators; part 3: standard outlines and lead connections
IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013/AMD1:2020/COR1:2020 Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60679-1/AMD1:2002 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 1
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-1:1980 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
IEC 60679-1/AMD1:1985 Quartz crystal controlled oscillators. Part 1 : General information, test conditions and methods
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 60679-1/AMD2:2003 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 2
IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 62884-2:2017 Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
IEC 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
IEC 60679-3:2001 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
IEC TS 61994-3:2004 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators
IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

British Standards Institution (BSI), oscillator

BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
BS EN 61338-2:2004 Waveguide type dielectric resonators - Guidelines for oscillator and filter applications
BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
BS EN 60747-16-5:2013 Semiconductor devices. Microwave integrated circuits. Oscillators
BS ISO 3159:2009 Timekeeping instruments. Wrist-chronometers with spring balance oscillator
BS EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality. Generic specification
BS ISO 3159:2010 Timekeeping instruments - Wrist-chronometers with spring balance oscillator
BS IEC 62860-1:2013 Test methods for the characterization of organic transistor-based ring oscillators
BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality. Generic specification
BS 9620:1975 Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
BS EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Basic methods for the measurement
BS EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Phase jitter measurement method
BS EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators. Frequency aging test methods
BS 9625:1983 Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level
BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Capability approval
BS EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Qualification approval
19/30393894 DC BS EN 60747-16-5 AMD1. Semiconductor devices. Part 16-5. Microwave integrated circuits. Oscillators
BS EN 169000:1993 Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
BS EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Capability approval
BS EN 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality. Blank detail specification. Qualification approval
BS EN IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Short-term frequency stability test methods
BS EN 169100:1993 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
BS EN 169101:1995 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval)
12/30274095 DC BS EN 60679-1 AMD1. Quartz crystal controlled oscillators of assessed quality. Part 1. Generic specification

Military Standard of the People's Republic of China-General Armament Department, oscillator

GJB 1648-1993 General specifications for crystal oscillators
GJB 3160-1998 General specifications for gyromagnetic oscillators
GJB 1648-2-2011 Genenral specification for crystal oscillators
GJB 1648A-2011 Genenral specification for crystal oscillators
GJB 3515-1999 General specification for surface acoustic wave oscillators
GJB 1648/1-2011 Detail specification for type ZA511(ZPB-5)crystal oscillator
GJB/Z 45.2-1993 Military piezoelectric device series spectrum crystal oscillator
GJB 1648/2-2011 Detail specification for type ZC547(ZWB-1)temperature compensated crystal oscillators
GJB 1648/3-2011 Detail specification for type ZC545(ZWC-6B-1/2)temperature compensated crystal oscillator
GJB 2438/25-2021 Detailed specifications for hybrid integrated circuit WHZD6500M-11 microwave hybrid integrated voltage controlled oscillator
GJB 2438/23-2021 Hybrid integrated circuit WHZD950M1050M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/24-2021 Hybrid integrated circuit WHZD800M1100M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/28-2021 Hybrid integrated circuit WHZD2200M2600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications
GJB 2438/21-2021 Hybrid integrated circuit WHZD8240M8600M-10 type microwave hybrid integrated voltage controlled oscillator detailed specifications

Association Francaise de Normalisation, oscillator

NF EN 60679-6:2011 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 6 : méthode de mesure de la gigue de phase pour les oscillateurs à quartz et les oscillateurs SAW - Lignes directrices pour l'application
NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
NF EN ISO 1797:2017 Médecine bucco-dentaire - Queues pour instruments rotatifs et oscillants
NF UTE C93-611:1975 Dispositifs piézoélectriques - Quartz oscillateurs - Recueil de feuilles particulières.
NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF C96-627-2*NF EN 61338-2:2004 Waveguide type dielectric resonators - Part 2 : guidelines for oscillator and filter applications
NF C96-016-5*NF EN 60747-16-5:2014 Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
NF EN 60747-16-5/A1:2020 Dispositifs à semiconducteurs - Partie 16-5 : circuits intégrés hyperfréquences - Oscillateurs
NF EN 60747-16-5:2014 Dispositifs à semiconducteurs - Partie 16-5 : Circuits intégrés hyperfréquences - oscillateurs
NF EN 61338-2:2004 Résonateurs diélectriques à modes guidés - Partie 2 : guide pour l'application aux filtres et aux oscillateurs
NF C93-620-1:2013 Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification
UTE C93-611U*UTE C93-611:1975 Components for electric equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF EN 60679-4-1:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 4-1 : spécification particulière cadre. Agrément de savoir-faire.
NF EN 60679-5:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 5 : spécification intermédiaire - Homologation
NF EN 60679-5-1:2000 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 5-1 : spécification particulière cadre - Homologation
NF EN 60679-3:2013 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 3 : encombrements normalisés et connexions des sorties
NF EN 60679-1:2017 Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance de la qualité - Partie 1 : spécification générique
NF C93-620-4*NF EN 60679-4:1999 Quartz crystal controlled oscillators of assessed quality - Part 4 : sectional specification - Capability approval
NF EN 62884-1:2017 Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 1 : méthodes fondamentales pour le mesurage
NF C93-684-3*NF EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3 : frequency aging test methods
NF C93-684-2*NF EN 62884-2:2017 Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2 : phase jitter measurement method
UTE C93-611/A1U*UTE C93-611/A1:1979 COMPONENTS FOR ELECTRIC EQUIPMENT. PIEZOELECTRIC DEVICES. QUARTZ CRYSTAL UNITS FOR OSCILLATORS. RELEVANT ARTICLE SHEETS.
NF EN 60679-4:1999 Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 4 : spécification intermédiaire - Agrément de savoir-faire
NF EN IEC 62884-3:2018 Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques Partie 3 : méthodes d'essai de vieillissement en fréquence
NF EN 62884-2:2017 Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 2 : méthode de mesure de la gigue de phase
NF C93-620-5*NF EN 60679-5:1999 Quartz crystal controlled oscillators of assessed quality - Part 5 : sectional specification - Qualification approval
NF C93-620-3:2002 Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections.
NF C93-620-3*NF EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3 : standard outlines and lead connections
NF EN ISO 389-3:2016 Acoustique - Zéro de référence pour l'étalonnage d'équipements audiométriques - Partie 3 : niveaux de référence équivalents de force vibratoire liminaire pour les vibrateurs à sons purs et les ossivibrateurs
NF C93-684-4*NF EN IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : short-term frequency stability test methods

KR-KS, oscillator

KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS B ISO 3159-2008 Timekeeping instruments－Wrist-chronometers with spring balance oscillator
KS C IEC 62860-1-2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS C IEC 61338-2-2018 Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
KS C IEC 61338-2-2018(2023) Waveguide type dielectric resonators ― Part 2: Guidelines for oscillator and filter applications
KS C IEC 62860-1-2018(2023) Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
KS C IEC 60679-1-2018 Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
KS C IEC 60679-1-2018(2023) Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
KS C IEC 60679-4-2018 Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 60679-5-2018 Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS C IEC 60679-5-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 5: Sectional specification — Qualification approval
KS C IEC 60679-4-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 4: Sectional Specification — Capability approval
KS C IEC 62884-1-2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement
KS C IEC 60679-3-2021 Quartz crystal controlled oscillators of assessed quality — Part 3: Standard outlines and lead connections
KS C IEC 62884-2-2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method
KS C IEC 62884-3-2023 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 3: Frequency aging test methods
KS C IEC 62884-4-2022 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 4: Short-term frequency stability test methods

National Metrological Verification Regulations of the People's Republic of China, oscillator

JJG 374-1997 Verification Regulation of Level Oscillator
JJG(航天) 8-1985 Verification Regulations for Beat Frequency Oscillators
JJG(铁道) 126-1991 Verification Regulations for Level Oscillators
JJG(邮电) 013-1992 Specification for verification of level oscillators
JJG(电子) 12008-1987 3080B Type 1kHz Oscillator Trial Verification Regulations
JJG(电子) 11004-1988 620kHz~18.6MHz Level Oscillator Trial Verification Regulations
JJG(电子) 01002-1989 QF16101GAJF 5MHz Voltage Controlled Crystal Oscillator Verification Regulations
JJG(电子) 11002-1988 Trial Verification Regulations for Low Frequency Level Oscillators Below 620kHz
JJG 180-2002 Verification Regulation of Crystal Oscillators inside the Electrical Measuring Instruments
JJG(电子) 11005-1988 18.6MHz and above frequency band electronic oscillator trial verification regulations

Professional Standard - Post and Telecommunication, oscillator

YD 301-1983 Test method for level oscillator
YD/T 650-1994 Quality grading criteria of 620kHz level oscillator
YD/T 294-1982 Main technical requirement for 620KHz level oscillators

American National Standards Institute （ANSI), oscillator

ANSI/AWWA C713-2010 Cold-Water Meters - Fluidic-Oscillator Type
ANSI/AWWA C713-2005 Cold-Water Meters - Fluidic Oscillator Type
ANSI/AWWA C713-2015 Cold-Water Meters - Fluidic-Oscillator Type
ANSI/IEEE 1620.1:2006 Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

Group Standards of the People's Republic of China, oscillator

T/HEBQIA 135-2022 OC1409 Constant Temperature Crystal Oscillator
T/CASME 403-2023 Vco for hybrid integrated circuits
T/SHDSGY 120-2022 Temperature monitoring and regulating device for rotary thermostatic oscillator

National Metrological Technical Specifications of the People's Republic of China, oscillator

JJF 1982-2022 Level Oscillator Calibration Specifications
JJF(纺织)105-2023 Calibration Specification for Constant Temperature Water Bath Oscillator
JJF 1984-2022 Specification for calibration of quartz crystal oscillators in electronic measuring instruments

IEC - International Electrotechnical Commission, oscillator

PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

Danish Standards Foundation, oscillator

DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
DS/EN 169200:1998 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)
DS/EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
DS/EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
DS/EN 169201:1998 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)
DS/EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
DS/EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
DS/EN 60679-5:1999 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
DS/EN 60679-3:2002 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
DS/EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
DS/EN 60679-5-1:1999 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

CENELEC - European Committee for Electrotechnical Standardization, oscillator

EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
EN 169200:1995 Sectional Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
EN 169201:1995 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2002)
EN 60679-3:2001 Quartz Crystal Controlled Oscillators of Assessed Quality Part 3: Standard Outlines and Lead Connections
EN IEC 62884-3:2018 Measurement techniques of piezoelectric@ dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

German Institute for Standardization, oscillator

DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017
DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
DIN EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011
DIN IEC 61080:1993 Guide to the measurement of equivalent electrical parameters of quartz crystal units; identical with IEC 61080:1991
DIN EN 169200:1996 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
DIN EN 168201:1992 Blank detail specification; quartz crystal units (qualification approval); german version EN 168201:1992
DIN EN 168101:1992 Blank detail specification; quartz crystal units (capability approval); german version EN 168101:1992
DIN EN 169200:1996-05 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
DIN EN 169201:1996 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
DIN EN 61338-2:2005 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
DIN EN 61338-2:2005-02 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
DIN EN 60747-16-5:2021-08 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020); German version EN 60747-16-5:2013 + A1:2020 / Note: DIN EN 60747-16-5 (2014-04) remains valid alongside this standard until 2023...
DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
DIN EN 169201:1996-05 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
DIN EN 60679-1:2008 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007
DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
DIN EN 60679-5:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
DIN 4235-2:1978 Compacting of Concrete by Vibrating; Compacting by Internal Vibrators
DIN EN 60679-1:2018-04 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2017); German version EN 60679-1:2017 / Note: DIN EN 60679-1 (2008-02) remains valid alongside this standard until 2020-08-30.
DIN EN 60747-16-5/A1:2019 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/649/CD:2019); Text in German and English
DIN EN 60679-4:1998-11 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998
DIN EN 60679-4-1:1998-12 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification; capability approval (IEC 60679-4-1:1998); German version EN 60679-4-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (2008-02), DIN EN 60679-4 (1...
DIN EN 60679-5-1:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification; qualification approval (IEC 60679-5-1:1998); German version EN 60679-5-1:1998 / Note: Applies in conjunction with DIN EN 60679-1 (1998-09), DIN EN 60679-5...
DIN 4235-3:1978 Compacting of Concrete by Vibrating; Compacting by External Vibrators during the Manufacture of Precast Components
DIN EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998
DIN EN 62884-1:2018-02 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
DIN EN 60679-5:1999 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
DIN EN 62884-2:2018-05 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
DIN EN 60679-3:2014-01 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013 / Note: DIN EN 60679-3 (2002-07) remains valid alongside this standard until 2016-01-18.
DIN EN IEC 62884-3:2018-10 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods (IEC 62884-3:2018); German version EN IEC 62884-3:2018
DIN EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification; capability approval (IEC 60679-4-1:1998); German version EN 60679-4-1:1998
DIN EN IEC 62884-4:2020-02 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 62884-4:2019); German version EN IEC 62884-4:2019
DIN EN 60679-5-1:1999 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification; qualification approval (IEC 60679-5-1:1998); German version EN 60679-5-1:1998

Defense Logistics Agency, oscillator

DLA MIL-PRF-55310/21 F-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA MIL-PRF-55310/21 G-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA MIL-O-52374 D-2006 OSCILLATOR: HIGH VOLTAGE GENERAL SPECIFICATION FOR
DLA SMD-5962-05203-2005 MICROCIRCUIT, HYBRID, VOLTAGE CONTROLLED OSCILLATOR
DLA SMD-5962-05203 REV A-2012 MICROCIRCUIT, HYBRID, VOLTAGE CONTROLLED OSCILLATOR
DLA MIL-O-52374 E-2013 OSCILLATOR: HIGH VOLTAGE GENERAL SPECIFICATION FOR
DLA SMD-5962-81020 REV F-2006 MICROCIRCUIT, DIGITAL, CMOS, MONOSTABLE/ASTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA A-A-59433 VALID NOTICE 1-2004 MIXERS, LIQUID, REVOLVING SHAFT AND AGITATOR TYPES
DLA A-A-59433-1999 MIXERS, LIQUID, REVOLVING SHAFT AND AGITATOR TYPES
DLA SMD-5962-89778 REV A-2006 MICROCIRCUIT, LINEAR, VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-89785 REV K-2006 MICROCIRCUIT, HYBRID, LINEAR, DUAL CHANNEL, HIGH GAIN, OPTOCOUPLER
DLA SMD-5962-89810 REV G-2007 MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, HIGH GAIN, OPTOCOUPLER
DLA SMD-5962-87773 REV B-2007 MICROCIRCUIT, DIGITAL, ECL, ONE SHOT MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT, LINEAR, VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-79011 REV E-1994 MICROCIRCUIT, DIGITAL, CMOS DUAL D FLIP-FLOP MONOLITHIC SILICON
DLA SMD-5962-87805 REV B-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL MULTIVIBRATOR, MONOLITHIC SILICON
DLA MIL-M-38510/12 J VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar, TTL, Monostable Multivibrators, Monolithic Silicon
DLA SMD-5962-90557 REV C-2010 MICROCIRCUIT, DIGITAL, CMOS, DUAL PRECISION MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-81020 REV G-2013 MICROCIRCUIT, DIGITAL, CMOS, MONOSTABLE/ASTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-76039 REV G-2009 MICROCIRCUIT, DIGITAL, LOW-POWER SCHOTTKY TTL, MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-87711 REV B-2009 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, DUAL MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-76039 REV F-2003 MICROCIRCUIT, DIGITAL, LOW-POWER SCHOTTKY TTL, MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-76042 REV G-2005 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-81021 REV E-2005 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-89609 REV B-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, PHASE LOCKED LOOP WITH VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-97553 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA MIL-M-38510/314 C VALID NOTICE 2-2013 Microcircuits, Digital, Low-Power Schottky, TTL, Monostable Multivibrators, Monolithic Silicon
DLA SMD-5962-86847 REV E-2013 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA MIL-M-38510/175 C VALID NOTICE 1-2011 Microcircuits, Digital, CMOS, Positive Logic, Flip-Flops and Monostable Multivibrator, Monolithic Silicon
DLA SMD-5962-94579 REV A-2004 MICROCIRCUIT, DIGITAL, ECL, LOW-POWER HEX D FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-83020 REV G-2005 MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, FLIP-FLOPS, MONOLITHIC SILICON
DLA DSCC-DWG-05014 REV A-2013 OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
DLA SMD-5962-77055 REV B-1981 MICROCIRCUITS, DIGITAL, CMOS DUAL, RETRIGGERABLE/RESETTABLE MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-82022 REV A-2001 MICROCIRCUIT, DIGITAL, CMOS, HEX D FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-88757 REV C-2013 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, PHASE-LOCKED-LOOP WITH VOLTAGE CONTROLLED OSCILLATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA DSCC-DWG-05013 REV A-2013 OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
DLA SMD-5962-76013 REV J-2005 MICROCIRCUIT, DIGITAL, LOW-POWER SCHOTTKY TTL, FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-87505 REV C-2007 MICROCIRCUIT, DIGITAL, ECL, FLIP-FLOP, MONOLITHIC SILICON
DLA DSCC-DWG-05013-2006 OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
DLA SMD-5962-83019 REV G-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW-POWER SCHOTTKY TTL, FLIP-FLOPS MONOLITHIC SILICON
DLA SMD-5962-84001 REV K-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW-POWER SCHOTTKY TTL, FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-84010 REV D-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW-POWER SCHOTTKY TTL, FLIP-FLOPS, MONOLITHIC SILICON
DLA SMD-5962-84136 REV E-2005 MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-87805 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-84056 REV E-2002 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL D-TYPE FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-90557 REV B-2003 MICROCIRCUIT, DIGITAL, CMOS, DUAL PRECISION MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-87662 REV C-2013 MICROCIRCUIT, DIGITAL, SCHOTTKY, DUAL RETRIGGERABLE, RESETTABLE, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-78011 REV G-2003 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY, TTL, OCTAL FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-89771 REV B-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 14-STAGE BINARY COUNTER WITH OSCILLATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA DSCC-VID-V62/11604 REV A-2010 MICROCIRCUIT, DIGITAL, VARIABLE RESOLUTION, 10-BIT TO 16-BIT R/D CONVERTER WITH REFERENCE OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-77045 REV E-1987 MICROCIRCUIT, DIGITAL, CMOS DUAL, RETRIGGERABLE, RESETTABLE, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-89609 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, PHASE LOCKED LOOP WITH VOLTAGE CONTROLLED OSCILLATOR, MONOLITHIC SILICON
DLA SMD-5962-87662 REV B-2006 MICROCIRCUIT, DIGITAL, SCHOTTKY, DUAL RETRIGGERABLE, RESETTABLE, MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-87711 REV A-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, DUAL MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON
DLA SMD-5962-96751 REV A-2003 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DUAL J-K FLIP-FLOPS WITH CLEAR, MONOLITHIC SILICON
DLA SMD-5962-97562 REV A-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-89925 REV A-2004 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, HEX D-TYPE FLIP-FLOPS WITH ENABLE, MONOLITHIC SILICON
DLA SMD-5962-93102-1993 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 4-BIT D-TYPE FLIP FLOP, MONOLITHIC SILICON
DLA SMD-5962-78010 REV E-2003 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, OCTAL D-TYPE FLIP FLOP WITH CLEAR, MONOLITHIC SILICON

未注明发布机构, oscillator

DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
BS EN 169200:1996(2000) Harmonized system of quality assessment for electronic components — Sectional specification : Quartz crystal controlled oscillators (qualification approval)

SE-SIS, oscillator

SIS SEN 43 60 01-1964 Quartz crystal units for oscillators

RU-GOST R, oscillator

GOST 22866-1977 Crystal oscillators. Terms and definitions
GOST 16165-1980 Transistor ultrasonic osillators for technological installations. General specifications
GOST 12152-1966 Frequency characteristics meters and generators of fluctuating freqnency. Control methods
GOST 16863-1971 Measuring generators for frequency range 0,1-35 MHz. Methods and means of verification
GOST R 52932-2008 Electromagnetic, ultrasonic, vortex and fluid oscillator counters for water heat supply systems. General specifications

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, oscillator

GB 12274-1990 Quartz crystal controlled oscillators Generic specificatoin for
GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature
GB/T 12274-1990 Quartz crystal controlled oscillators--Generic specification for
GB/T 20870.5-2023 Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
GB/T 12274.1-2012 Quartz crystal controlled oscillators of assessed quality.Part 1:Generic specification
GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment.Part 13:Shakers, shaking water baths and shaking incubators
GB/T 43024.2-2023 Measurement techniques for piezoelectric, dielectric and electrostatic oscillators Part 2: Phase jitter measurement methods
GB/T 12274.401-2023 Qualified quartz crystal oscillators Part 4-1: Blank detail specification capability approval

Lithuanian Standards Office , oscillator

LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators
LST EN 169200-2001 Sectional specification. Quarz crystal controlled oscillators (Qualification approval)
LST EN 168200-2002/A1-2005 Sectional specification. Quartz crystal units (qualification approval)
LST EN 168200-2002 Sectional specification. Quartz crystal units (qualification approval)
LST EN 169100-2003 Sectional specification: Quartz crystal controlled oscillators (Capability approval)
LST EN 169201-2001 Blank detail specification. Quarz crystal controlled oscillators (Qualification approval)
LST EN 168201-2001 Blank detail specification. Quartz crystal units (qualification approval)
LST EN 168101-2001 Blank detail specification. Quartz crystal units (capability approval)
LST EN 169101-2003 Blank detail specification: Quartz crystal controlled oscillators (Capability approval)
LST EN 61338-2-2004 Waveguide type dielectric resonators. Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004)
LST EN 60747-16-5/A1-2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013/A1:2020)
LST EN 60679-1-2007 Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification (IEC 60679-1:2007)

PL-PKN, oscillator

PN T01029-1985 Quartz crystal controlled oscillators Terminology
PN-EN 60747-16-5-2014-01/A1-2021-04 E Semiconductor devices--Part 16-5: Microwave integrated circuits--Oscillators (IEC 60747-16-5:2013/A1:2020 + COR1:2020)

IET - Institution of Engineering and Technology, oscillator

OSCILL DES COMP SIMUL-1995 Oscillator Design and Computer Simulation

American Water Works Association (AWWA), oscillator

AWWA C713-2015 Cold-Water Meters - Fluidic-Oscillator Type
AWWA C713-2010 Cold-Water Meters - Fluidic-Oscillator Type

ES-UNE, oscillator

UNE-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 61338-2:2004 Waveguide type dielectric resonators -- Part 2: Guidelines for oscillator and filter applications (Endorsed by AENOR in November of 2004.)
UNE-EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
UNE-EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
UNE-EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
UNE-EN 60679-4:1998 QUARZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4: SECTORIAL SPECIFICATION. CAPABILITY APPROVAL. (Endorsed by AENOR in June of 1998.)
UNE-EN 60679-5:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)
UNE-EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (Endorsed by AENOR in August of 2013.)
UNE-EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (Endorsed by Asociación Española de Normalización in January of 2018.)
UNE-EN IEC 62884-3:2018 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN 60679-4-1:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 4-1: BLANK DETAIL SPECIFICATION. CAPABILITY APPROVAL (Endorsed by AENOR in July of 1998.)
UNE-EN 60679-5-1:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5-1: BLANK DETAIL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.)
UNE-EN IEC 62884-4:2019 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)

European Standard for Electrical and Electronic Components, oscillator

EN 169000:1992 Generic specification: quartz crystal controlled oscillatores

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, oscillator

GB/T 35011-2018 Microwave circuits—Measuring methods for voltage controlled oscillater

Professional Standard - Aerospace, oscillator

QJ 3047-1998 Detailed specifications for Z602 voltage controlled crystal oscillators
QJ 3046-1998 Detailed specifications for Z601 voltage controlled crystal oscillators
QJ 2658-1994 Detail specification for semiconductor integrated circuit TTL-megahertz main frequency oscillator MF05

CZ-CSN, oscillator

CSN 35 8490 Z1-1996
CSN 35 8490-1965 Piezoelectric crystal units for oscillators and filters

IN-BIS, oscillator

RO-ASRO, oscillator

STAS SR ISO 3159:1994 Timekeeping instruments. Wrist-chronometers with spring balance oscillator

European Committee for Electrotechnical Standardization（CENELEC）, oscillator

EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
EN 169101:1993 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Capability Approval) (Remains Current)
EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 61338-2:2004 Waveguide type dielectric resonators Part 2: Guidelines for oscillator and filter applications
EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
EN 169000:1998 Generic Specification: Quartz Crystal Controlled Oscillators (Incorporates Amendment A1: 1998)
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
EN 62884-2:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
EN 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

Institute of Electrical and Electronics Engineers (IEEE), oscillator

IEC 62860-1:2013*IEEE Std 1620.1:2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE/IEC 62860-1-2013 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE Std 1620.1-2006 IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
IEC 62860-1:2013(E) IEEE Std. 1620.1-2006 IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
IEEE Std P1620.1/D8, Jul 2005 IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

AT-OVE/ON, oscillator

OVE EN 60747-16-5-2021 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (german version)

国家市场监督管理总局、中国国家标准化管理委员会, oscillator

GB/T 12274.4-2021 Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., oscillator

IEEE 1620.1-2006 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (IEEE Computer Society)