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AFM sample
AFM sample, Total:24 items.
In the international standard classification, AFM sample involves: Physics. Chemistry, Analytical chemistry, Linear and angular measurements, Optics and optical measurements, Materials for aerospace construction, Thermodynamics and temperature measurements, Test conditions and procedures in general.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, AFM sample
- GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
ESDU - Engineering Sciences Data Unit, AFM sample
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
International Organization for Standardization (ISO), AFM sample
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
British Standards Institution (BSI), AFM sample
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
American Society for Testing and Materials (ASTM), AFM sample
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
- ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
Group Standards of the People's Republic of China, AFM sample
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, AFM sample
- GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
Professional Standard - Petroleum, AFM sample
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
国家能源局, AFM sample
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
German Institute for Standardization, AFM sample
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
国家市场监督管理总局、中国国家标准化管理委员会, AFM sample
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)