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Sample preparation for atomic force microscopy

Sample preparation for atomic force microscopy, Total:13 items.

In the international standard classification, Sample preparation for atomic force microscopy involves: Physics. Chemistry, Linear and angular measurements, Optics and optical measurements, Ceramics, Testing of metals, Protection against dangerous goods, Air quality.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Sample preparation for atomic force microscopy

• GB/T 32262-2015 Preparation of deoxyribonucleic acid sample for atomic force microscope measurement

American Society for Testing and Materials (ASTM), Sample preparation for atomic force microscopy

• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM D6480-05(2010) Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
• ASTM D6480-99 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Concentration by Transmission Electron Microscopy
• ASTM E1741-00 Standard Practice for Preparation of Airborne Particulate Lead Samples Collected During Abatement and Construction Activities for Subsequent Analysis by Atomic Spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Sample preparation for atomic force microscopy

• GB/T 28872-2012 Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells

German Institute for Standardization, Sample preparation for atomic force microscopy

• DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

PL-PKN, Sample preparation for atomic force microscopy

• PN H87903-1972 Irwestigations o? copper alloys castings Preparation and sampling ot ?es? pieces for microscopis examinations

Japanese Industrial Standards Committee (JISC), Sample preparation for atomic force microscopy

• JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

IT-UNI, Sample preparation for atomic force microscopy

• UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
• UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

International Electrotechnical Commission (IEC), Sample preparation for atomic force microscopy

• IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

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