Authentic spectrometer

Authentic spectrometer, Total:160 items.

In the international standard classification, Authentic spectrometer involves: Optics and optical measurements, Fibre optic communications, Analytical chemistry, Vacuum technology, Radiation measurements, Linear and angular measurements, Non-destructive testing, Electricity. Magnetism. Electrical and magnetic measurements, Soil quality. Pedology, Radiation protection, Ceramics, Plastics, Nuclear energy engineering, Water quality, Petroleum products in general, Tobacco, tobacco products and related equipment.

British Standards Institution (BSI), Authentic spectrometer

BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS IEC 62484:2010 Radiation protection instrumentation. Spectroscopy-based portal monitors used for the detection and identification of illicit trafficking of radioactive material
BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
24/30469712 DC BS ISO 19618 Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 19318:2021 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

International Electrotechnical Commission (IEC), Authentic spectrometer

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
IEC 62484:2010 Radiation protection instrumentation - Spectroscopy-based portal monitors used for the detection and identification of illicit trafficking of radioactive material

ZA-SANS, Authentic spectrometer

SANS 62129:2008 Calibration of optical spectrum analyzers

German Institute for Standardization, Authentic spectrometer

DIN EN 62129:2007 Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 38413-6:2007 German standard methods for the examination of water, waste water and sludge - Single components (group P) - Part 6: Determination of acrylamide - Methode using high performance liquid chromatography with mass spectrometric detection (HPLC-MS/MS) (P 6)
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments

Korean Agency for Technology and Standards (KATS), Authentic spectrometer

KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS I 2000-2010 Functional evaluation of high performance liquid chromatograph
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 61452:2017 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS C IEC 61452-2022 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17974-2021 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19318-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 17974-2011(2016) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis

Japanese Industrial Standards Committee (JISC), Authentic spectrometer

JIS Z 8754:1999 Vacuum technology -- Mass-spectrometer-type leak-detector calibration
JIS Z 4511:2005 Methods of calibration for exposure meters, air kerma meters, air absorbed dose meters and dose-equivalent meters
JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Institute of Electrical and Electronics Engineers (IEEE), Authentic spectrometer

IEEE N42.14-1999 Calibration and use of germanium spectrometers for the measurement of gammma-ray emission rates of radionuclides
IEEE N42.14-1990 Calibration and use of germanium spectrometers for the measurement of gammma-ray emission rates of radionuclides
IEEE N42.17A-1989 Performance Specifications for Health Physics Instrumentation - Portable Instrumentation for Use in Normal Environmental Conditions
ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
IEEE/ANSI N42.17A-1989 American National Standard Performance Specifications for Health Physics Instrumentation - Portable Instrumentation for Use in Normal Environmental Conditions
IEEE P802.15.4s/D07, October 2017 IEEE Draft Standard for Low-Rate Wireless Networks: Amendment Enabling Spectrum Resource Measurement Capability
IEEE P802.15.4s/D06, July 2017 IEEE Draft Standard for Low-Rate Wireless Networks: Amendment Enabling Spectrum Resource Measurement Capability
ANSI N42.17AC-2022 American National Standard Performance Specifications for Health Physics Instrumentation-Portable Survey Instrumentation for Use in Normal and Extreme Environmental Conditions
IEEE/ANSI N42.17AC-2022 American National Standard Performance Specifications for Health Physics Instrumentation-Portable Survey Instrumentation for Use in Normal and Extreme Environmental Conditions
IEEE Std 1214-1992 IEEE Standard Multichannel Analyzer (MCA) Histogram Data Interchange Format for Nuclear Spectroscopy

American Society for Testing and Materials (ASTM), Authentic spectrometer

ASTM E2911-23 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM E2911-13 Standard Guide for Relative Intensity Correction of Raman Spectrometers
ASTM E3029-15(2023) Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1866-97 Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1683-02(2014)e1 Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM E1866-97(2002) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E1866-97(2007) Standard Guide for Establishing Spectrophotometer Performance Tests
ASTM E3029-15 Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E1683-02(2022) Standard Practice for Testing the Performance of Scanning Raman Spectrometers
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E932-89(2002) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(1997) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(2021) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E932-89(2013) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM E932-89(2007) Standard Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM D8470-22 Standard Practice for Development and Implementation of Instrument Performance Tests for Use on Multivariate Online, At-Line and Laboratory Spectroscopic Based Analyzer Systems

IN-BIS, Authentic spectrometer

IS 11148-1984 Spectrum Analyzer Performance
IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers

International Organization for Standardization (ISO), Authentic spectrometer

ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Authentic spectrometer

GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 28892-2024 Surface chemical analysis X-ray photoelectron spectroscopy Expression of selected instrument performance parameters
GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 28971-2012 Cigarettes.Determination of tobacco specific N-nitrosamines in sidestream smoke.GC-TEA method

NEMA - National Electrical Manufacturers Association, Authentic spectrometer

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)

GSO, Authentic spectrometer

OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 19618:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) — Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
BH GSO ISO 19618:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) — Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
GSO ISO 29081:2013 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
OS GSO ISO 29081:2013 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
BH GSO ISO 29081:2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
OS GSO ISO 19318:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
BH GSO ISO 19318:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Authentic spectrometer

GB/T 35410-2017 Method of performance testing for liquid chromatography-tandem quadrupole masss spectrometry
GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
GB/T 32998-2016 Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Authentic spectrometer

IEEE N42.17A-2003 Performance Specifications for Health Physics Instrumentation - Portable Instrumentation for Use in Normal Environmental Conditions
IEEE PN42.38A/D1-2018 American National Standard for Performance Criteria for Spectroscopy-Based Portal Monitors Used for Homeland Security Amendment 1
IEEE N42.38A AMD 1-2018 American National Standard for Performance Criteria for Spectroscopy-Based Portal Monitors Used in Homeland Security Amendment 1

CZ-CSN, Authentic spectrometer

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

GB-REG, Authentic spectrometer

REG NASA-LLIS-0903-2000 Lessons Learned ?High Energy Spectroscopic Imager Test Mishap

未注明发布机构, Authentic spectrometer

DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

KR-KS, Authentic spectrometer

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 15632-2023 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a

SCC, Authentic spectrometer

BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
DIN ISO 15632 E:2015 Draft Document - Microbeam analysis - Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012); Text in German and English
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
BS ISO 19318:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

Professional Standard - Electron, Authentic spectrometer

SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

RU-GOST R, Authentic spectrometer

GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement

Indonesia Standards, Authentic spectrometer

SNI 06-6991.1-2004 Soils - Part 1: Test methods of organochlorine pesticides with extraction using n-hexane solvent by gas chromatography-mass spectrophotometers (GC-MS)
SNI 06-6992.1-2004 Sediment - Part 1: Test methods of organochlorine pesticides with extraction using n-hexane solvent by gas chromatography-mass spectrophotometers (GC-MS)

Association Francaise de Normalisation, Authentic spectrometer

NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
NF ISO 29081:2010 Chemical analysis of surfaces - Auger electron spectroscopy - Indication of the methods used for the control and correction of the charge
NF ISO 23547:2022 Measurement of radioactivity - Gamma-emitting radionuclides - Characteristics of measurement standards for the calibration of gamma spectrometers
NF T51-035-2/A1:2012 Plastics - Determination of Charpy impact properties - Part 2 : instrumented impact test - Amendment 1 : précision data.

Danish Standards Foundation, Authentic spectrometer

DS/EN ISO 179-2/A1:2012 Plastics - Determination of Charpy impact properties - Part 2: Instrumented impact test - Amendment 1: Precision data

Standard Association of Australia （SAA）, Authentic spectrometer

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

Professional Standard - Machinery, Authentic spectrometer

JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect

国家市场监督管理总局、中国国家标准化管理委员会, Authentic spectrometer

GB/T 40196-2021 Method for analysing CCA and ACQ in preservative-treated wood and wood preservatives by X-ray fluorescence spectroscopy

BELST, Authentic spectrometer

STB 8067-2017 System for ensuring uniformity of measurements of the Republic of Belarus. Gamma radiation energy spectrometers. Methods of verification