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The use of several electron microscopes

The use of several electron microscopes, Total:62 items.

In the international standard classification, The use of several electron microscopes involves: Linear and angular measurements, Mechanical testing, Analytical chemistry, Water quality, Raw materials for rubber and plastics, Lamps and related equipment, Testing of metals, Optics and optical measurements, Paints and varnishes, Physics. Chemistry, Electrical accessories, Insulating materials, Radiocommunications, Surface treatment and coating, Construction technology, Optical equipment, Lubricants, industrial oils and related products, Electrical engineering in general, Components for electrical equipment, Air quality, Television and radio broadcasting.

Association of German Mechanical Engineers, The use of several electron microscopes

VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems

Association Francaise de Normalisation, The use of several electron microscopes

NF Q00-004:1970 Paper. Method of expressing finished sizes of writing paper and certain classes of printed matter.
NF EN 61347-2-11/A1:2019 Appareillages de lampes - Partie 2-11 : prescriptions particulières pour circuits électroniques divers utilisés avec les luminaires
NF EN 61347-2-11:2002 Appareillages de lampes - Partie 2-11 : prescriptions particulières pour circuits électroniques divers utilisés avec les luminaires

TIA - Telecommunications Industry Association, The use of several electron microscopes

TIA/EIA-455-45-B-1992 FOTP-45 Method for Measuring Optical Fiber Geometry Using a Laboratory Microscope (Withdrawn May@ 2003)

British Standards Institution (BSI), The use of several electron microscopes

BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
BS EN ISO 15680:2003 Water quality. Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption
BS EN 61347-2-11:2002 Lamp controlgear - Particular requirements for miscellaneous electronic circuits used with luminaires
BS EN 61347-2-11:2001+A1:2019 Lamp controlgear. Particular requirements for miscellaneous electronic circuits used with luminaires
PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
19/30392326 DC BS EN 61347-2-11. Lamp controlgear. Part 2-11. Particular requirements for miscellaneous electronic circuitsused with luminaires
20/30424117 DC BS EN IEC 61347-2-11. Controlgear for electric light sources. Part 2-11. Particular requirements for miscellaneous electronic circuits used with luminaires
22/30454698 DC BS EN IEC 61347-2-11. Controlgear for electric light sources. Safety - Part 2-11. Particular requirements for miscellaneous electronic circuits used with luminaires

Danish Standards Foundation, The use of several electron microscopes

DS/EN ISO 15680:2004 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption
DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

German Institute for Standardization, The use of several electron microscopes

DIN EN ISO 15680:2004-04 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption (ISO 15680:2003); German version EN ISO 15680:2003
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Lithuanian Standards Office , The use of several electron microscopes

LST EN ISO 15680:2004 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption (ISO 15680:2003)

AENOR, The use of several electron microscopes

UNE-EN ISO 15680:2004 Water quality - Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption (ISO 15680:2003)
UNE-EN 61347-2-11:2003 Lamp controlgear -- Part 2-11: Particular requirements for miscellaneous electronic circuits used with luminaires

American Society for Testing and Materials (ASTM), The use of several electron microscopes

ASTM D3849-14a Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM D5288-10 Standard Test Method for Determining the Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
ASTM D5288-14 Standard Test Method for Determining Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
ASTM D5288-21 Standard Test Method for Determining Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)
ASTM B651-83(2019) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM D7416-08 Standard Practice for Analysis of In-Service Lubricants Using a Particular Five-Part (Dielectric Permittivity, Time-Resolved Dielectric Permittivity with Switching Magnetic Fields, Laser Particle Coun
ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM D8526-23 Standard Test Method for Analytical Procedure Using Transmission Electron Microscopy for the Determination of the Concentration of Carbon Nanotubes and Carbon Nanotube-containing Particles in Ambient
ASTM D7416-09 Standard Practice for Analysis of In-Service Lubricants Using a Particular Five-Part (Dielectric Permittivity, Time-Resolved Dielectric Permittivity with Switching Magnetic Fields, Laser Particle Counter, Microscopic Debris Analysis, and Orbital Viscome

Korean Agency for Technology and Standards (KATS), The use of several electron microscopes

KS I ISO 15680:2022 Water quality — Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption
KS C IEC 61347-2-11-2002(2017) Lamp controlgear?Part 2-11 : Particular requirements for miscellaneous electronic circuits used with luminaires
KS C IEC 61020-3-2002(2008) Electromechanical switches for use in electronic equipment Part 3：Sectional specification for in－line package switches

KR-KS, The use of several electron microscopes

KS I ISO 15680-2022 Water quality — Gas-chromatographic determination of a number of monocyclic aromatic hydrocarbons, naphthalene and several chlorinated compounds using purge-and-trap and thermal desorption

BE-NBN, The use of several electron microscopes

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

IT-UNI, The use of several electron microscopes

UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

International Organization for Standardization (ISO), The use of several electron microscopes

ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 8322-10:1995 Building construction — Measuring instruments — Procedures for determining accuracy in use — Part 10: Difference between non-glass reflectors and electronic distance-measuring prisms (traditional glas
ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures

ES-UNE, The use of several electron microscopes

UNE-EN 61347-2-11:2003/A1:2019 Lamp controlgear - Part 2-11: Particular requirements for miscellaneous electronic circuits used with luminaires

ZA-SANS, The use of several electron microscopes

SANS 61347-2-11:2018 Lamp controlgear Part 2-11: Particular requirements for miscellaneous electronic circuits used with luminaires

IN-BIS, The use of several electron microscopes

IS 2032 Pt.2-1962

American National Standards Institute （ANSI), The use of several electron microscopes

ANSI/ASTM D5288:2010 Test Method for Determining the Tracking Index of Electrical Insulating Materials Using Various Electrode Materials (Excluding Platinum)

International Telecommunication Union (ITU), The use of several electron microscopes

ITU-T F.30-1993 Use of Various Sequences of Combinations for Special Purposes - Operations and Quality of Service; Telegraph Services (Study Group I) 5 pp
ITU-T F.30 FRENCH-1993 Use of Various Sequences of Combinations for Special Purposes - Operations and Quality of Service; Telegraph Services (Study Group I) 5 pp
ITU-T F.30 SPANISH-1993 Use of Various Sequences of Combinations for Special Purposes - Operations and Quality of Service; Telegraph Services (Study Group I) 5 pp
ITU-R BT.1845-2008 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels and sizings
ITU-R BT.1845 ARABIC-2008 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels and sizings
ITU-R BT.1845 CHINESE-2008 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels and sizings
ITU-R BT.1845 RUSSIAN-2008 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels and sizings ??????????? ???????? ?? ???????????, ??????? ??????? ???????????? ??? ????????? ????????????? ???????? ? ??????
ITU-R BT.1845 SPANISH-2008 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels and sizings Directrices sobre la m閠rica que ha de utilizarse para adaptar programas de televisi髇 a aplicaciones de radiod
ITU-R BT.1845-2010 Guidelines on metrics to be used when tailoring television programmes to broadcasting applications at various image quality levels, display sizes and aspect ratios

Standard Association of Australia （SAA）, The use of several electron microscopes

AS/NZS 61347-2-11:2003 Lamp controlgear Part 2.11: Particular requirements for miscellaneous electronic circuits used with luminaires (IEC 61347-2-11:2001 MOD)

RU-GOST R, The use of several electron microscopes

GOST 15543-1970 Electrical articles. Applications for different climatic regions. General technical requirements as to environment climatic aspects influence

BELST, The use of several electron microscopes

STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements
STB 2209-2011 Nano-sized carbon and non-carbon materials and composites based on them. The technique for determining elemental composition using scan electron microscopy measurements