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Atomic Force Microscopy and Scanning

Atomic Force Microscopy and Scanning, Total:16 items.

In the international standard classification, Atomic Force Microscopy and Scanning involves: Linear and angular measurements, Non-ferrous metals, Thermodynamics and temperature measurements, Optical equipment, Optics and optical measurements, Analytical chemistry.

American Society for Testing and Materials (ASTM), Atomic Force Microscopy and Scanning

• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

Korean Agency for Technology and Standards (KATS), Atomic Force Microscopy and Scanning

• KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
• KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
• KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Group Standards of the People's Republic of China, Atomic Force Microscopy and Scanning

• T/QGCML 1940-2023

International Organization for Standardization (ISO), Atomic Force Microscopy and Scanning

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Japanese Industrial Standards Committee (JISC), Atomic Force Microscopy and Scanning

• JIS K 0132:1997 General rules for scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China, Atomic Force Microscopy and Scanning

• JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery, Atomic Force Microscopy and Scanning

• JB/T 6842-1993 Test method of scanning electron microscope
• JB/T 5384-1991 Scanning electron microscope - Technical specification

National Metrological Verification Regulations of the People's Republic of China, Atomic Force Microscopy and Scanning

• JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Atomic Force Microscopy and Scanning

• GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

KR-KS, Atomic Force Microscopy and Scanning

• KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Others:   AFM scanning, Atomic Force Microscopy and Scanning, Scanning Probe Atomic Force Microscopy, Scanning Probe Microscopy and Atomic Force Microscopy, Atomic Force Scanning Near Field Microscopy, Atomic Force Microscopy and Scanning Probe Microscopy, AFM Scanning Probe, Scan Tunneling and Atomic Force, Scanning Tunneling Atomic Force Microscopy, scanning atomic force microscope, Fast Scanning Atomic Force Microscopy, AFM scanning, Atomic Force Scanning Microscope, Atomic Force Microscopy and Scanning, AFM Surface Scanning, AFM Scanning Tunnel, Atomic Force Scanning Probe Microscope, Atomic Force Microscope and Scanning Tunneling Microscope, Scanning Tunneling Microscopy and Atomic Force, Scanning Tunneling Atomic Force Microscopy.