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Electron diffraction brightness
Electron diffraction brightness, Total:55 items.
In the international standard classification, Electron diffraction brightness involves: Linear and angular measurements, Vocabularies, Analytical chemistry, Testing of metals, Optical equipment, Optics and optical measurements, Paper and board, Medical equipment, Protection against fire, Printed circuits and boards.
RU-GOST R, Electron diffraction brightness
- GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
- GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
International Organization for Standardization (ISO), Electron diffraction brightness
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
- ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
- ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Association Francaise de Normalisation, Electron diffraction brightness
- NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
- NF EN 61262-3:1994 Appareils électromédicaux - Caractéristiques des intensificateurs électro-optiques d'image radiologique partie 3 : détermination de la distribution de luminance et de la non-uniformité de luminance
- NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- NF C74-223*NF EN 61262-3:1994 Medical electrical equipment. Characteristics of electro-optical X-ray image intensifiers. Part 3 : determination of the luminance distribution and luminance non-uniformity.
United States Navy, Electron diffraction brightness
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron diffraction brightness
- GB/T 36165-2018 Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 30703-2014 Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
British Standards Institution (BSI), Electron diffraction brightness
- BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS EN 61262-3:1995 Characteristics of electro-optical X-ray image intensifiers for medical electrical equipment.. Determination of the luminance distribution and luminance non-uniformity
- BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
American National Standards Institute （ANSI), Electron diffraction brightness
German Institute for Standardization, Electron diffraction brightness
- DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
- DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
BE-NBN, Electron diffraction brightness
Korean Agency for Technology and Standards (KATS), Electron diffraction brightness
工业和信息化部, Electron diffraction brightness
- YB/T 4677-2018 Determination of Texture in Steel Electron Backscattered Diffraction (EBSD) Method
Shanghai Provincial Standard of the People's Republic of China, Electron diffraction brightness
- DB31/T 1156-2019 Electron backscatter diffraction method for technical identification of electrical fire melt marks
Professional Standard - Energy, Electron diffraction brightness
- NB/SH/T 6024-2021 Determination of Relative Crystallinity of ZSM-5 Molecular Sieve X-ray Diffraction Method
国家市场监督管理总局、中国国家标准化管理委员会, Electron diffraction brightness
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
International Electrotechnical Commission (IEC), Electron diffraction brightness
GOSTR, Electron diffraction brightness
SE-SIS, Electron diffraction brightness
- SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers
European Committee for Electrotechnical Standardization（CENELEC）, Electron diffraction brightness
- HD 511 S1-1988 Determination of the Luminance Distribution of Electro- Optical X- Ray Image Intensifiers
IN-BIS, Electron diffraction brightness
- IS 13729-1993 Determination of the kluminance distribution of electro-optical x-ray image intensifiers
IEC - International Electrotechnical Commission, Electron diffraction brightness
- PAS 62326-20-2011 Printed boards – Part 20: Electronic circuit board for high-brightness LEDs (Edition 1.0)
Danish Standards Foundation, Electron diffraction brightness
- DS/EN 61262-3:2013 Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 3: Determination of the luminance distribution and luminance non-uniformity
AENOR, Electron diffraction brightness
- UNE-EN 61262-3:1996 MEDICAL ELECTRICAL EQUIPMENT. CHARACTERISTICS OF ELECTRO-OPTICAL X-RAY IMAGE INTENSIFIERS. PART 3: DETERMINATION OF THE LUMINANCE DISTRIBUTION AND LUMINANCE NON-UNIFORMITY.
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron diffraction brightness
- GB/T 34172-2017 Microbeam analysis—Electron backscatter diffraction—Phase analysis method of metal and alloy