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Semiconductor Catalytic Ability

Semiconductor Catalytic Ability, Total:132 items.

In the international standard classification, Semiconductor Catalytic Ability involves: Ceramics, Surface treatment and coating, Semiconductor devices, Rectifiers. Convertors. Stabilized power supply, Integrated circuits. Microelectronics, Products of the textile industry.

Korean Agency for Technology and Standards (KATS), Semiconductor Catalytic Ability

KS L ISO 10676-2012(2022) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxyg
KS L ISO 10676:2012 Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
KS L ISO 10676-2012(2017) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxyg
KS L ISO 22197-1:2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-2:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
KS L ISO 22197-3:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
KS L ISO 22197-4:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 4: Removal of formaldehyde
KS L ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics)-Test method for air-purification performance of semiconducting photocatalytic materials-Part 1:Removal of nitric oxide
KS L ISO 22197-1:2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 27448-2011(2021) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS L ISO 27448-2011(2016) Fine ceramics(advanced ceramics, advanced technical ceramics)－Test method for self-cleaning performance of semiconducting photocatalytic materials－Measurement of water contact angle
KS L ISO 27447-2011(2016) Fine ceramics (advanced ceramics, advanced technical ceramics)－Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 27447-2011(2021) Fine ceramics (advanced ceramics, advanced technical ceramics)－Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 22197-5:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 5: Removal of methyl mercaptan
KS L ISO 27447:2011 Fine ceramics (advanced ceramics, advanced technical ceramics)－Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 17168-1:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
KS L ISO 17168-2:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 2: Remova
KS L ISO 17168-3:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 3: Remova
KS L ISO 17168-4:2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 4: Remova

British Standards Institution (BSI), Semiconductor Catalytic Ability

BS ISO 10676:2010 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BS ISO 10676:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
BS PD CEN/TS 16599:2014 Photocatalysis. Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications
BS EN 62418:2010 Semiconductor devices. Metallization stress void test
BS ISO 22197-2:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of acetaldehyde
BS ISO 22197-3:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials - Removal of toluene
BS ISO 22197-1:2008 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Removal of nitric oxide
BS ISO 22197-4:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of formaldehyde
BS ISO 22197-3:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of toluene
BS ISO 22197-2:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of acetaldehyde
BS ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
BS ISO 22197-5:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of methyl mercaptan
BS ISO 22197-1:2016 Tracked Changes. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of nitric oxide
BS ISO 22197-4:2021 Tracked Changes. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of formaldehyde
BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials
BS ISO 17168-2:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of acetaldehyde
BS ISO 22197-5:2021 Tracked Changes. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Removal of methyl mercaptan
BS ISO 17168-4:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of formaldehyde
BS ISO 27448:2009 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for self-cleaning performance of semiconducting photocatalytic materials - Measurement of water contact angle
BS ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antifungal activity of semiconducting photocatalytic materials
BS ISO 19635:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antialgal activity of semiconducting photocatalytic materials
BS ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of nitric oxide
BS ISO 17168-5:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of methyl mercaptan
21/30425873 DC BS ISO 22197-4. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 4. Removal of formaldehyde
BS ISO 17168-3:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Removal of toluene
21/30425876 DC BS ISO 22197-5. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 5. Removal of methyl mercaptan
BS ISO 22601:2019 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative analysis of total organic carbon (TOC)
BS ISO 27447:2019 Tracked Changes. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for antibacterial activity of semiconducting photocatalytic materials
BS ISO 19810:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment. Measurement of water contact angle
BS ISO 19652:2018 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for complete decomposition performance of semiconducting photocatalytic materials under indoor lighting environment. Decomposition of acetaldehyde
BS ISO 17299-5:2014 Textiles. Determination of deodorant property. Metal-oxide semiconductor sensor method
BS ISO 14605:2013 Fine ceramics (advanced ceramics, advanced technical ceramics). Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
20/30409285 DC BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

International Organization for Standardization (ISO), Semiconductor Catalytic Ability

ISO 10676:2010 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for water purification performance of semiconducting photocatalytic materials by measurement of forming ability of active oxygen
ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
ISO 19722:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
ISO 22197-3:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
ISO 22197-2:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
ISO 22197-1:2007 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide
ISO 22197-2:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 2: Removal of acetaldehyde
ISO 22197-3:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 3: Removal of toluene
ISO 22197-4:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 4: Removal of formaldehyde
ISO 22197-5:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 5: Removal of methyl mercaptan
ISO 22197-4:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 4: Removal of formaldehyde
ISO 22197-5:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 5: Removal of methyl mercaptan
ISO 13125:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antifungal activity of semiconducting photocatalytic materials
ISO 19635:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antialgal activity of semiconducting photocatalytic materials
ISO 27447:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials
ISO 27447:2009 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for antibacterial activity of semiconducting photocatalytic materials
ISO 17168-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 1: Removal of nitric oxide
ISO 17168-2:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 2: Removal of acetaldehyde
ISO 17168-3:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 3: Removal of toluene
ISO 17168-4:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 4: Removal of formaldehyde
ISO 22601:2019 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative
ISO 19810:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment - Measurement of water contact angle
ISO 19652:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for complete decomposition performance of semiconducting photocatalytic materials under indoor lighting environment - Decomposition of acetaldehyde
ISO 19810:2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for self-cleaning performance of semiconducting photocatalytic materials under indoor lighting environment — Measurement of water contact angle
ISO 17168-5:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment - Part 5: Removal of methyl mercaptan

Association Francaise de Normalisation, Semiconductor Catalytic Ability

XP CEN/TS 16599:2014 Photocatalyse - Détermination des conditions d'irradiation pour tester les propriétés photocatalytiques de matériaux semi-conducteurs
XP B44-014*XP CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
NF ISO 22197-4:2021 Céramiques techniques - Méthodes d'essai relatives à la performance des matériaux photocatalytiques semi-conducteurs pour la purification de l'air - Partie 4 : élimination du formaldéhyde
NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF C80-204*NF EN 62418:2011 Semiconductor devices - Metallization stress void test
NF ISO 22197-5:2021 Céramiques techniques - Méthodes d'essai relatives à la performance des matériaux photocatalytiques semi-conducteurs pour la purification de l'air - Partie 5 : élimination du mercaptan méthylique
NF EN 62418:2011 Dispositifs à semi-conducteurs - Essai sur les cavités dues aux contraintes de la métallisation
NF ISO 14605:2013 Céramiques techniques - Sources lumineuses destinées aux essais des matériaux photocatalytiques semi-conducteurs dans un environnement d'éclairage intérieur
NF B44-101-4:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 4: removal of formaldehyde
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials
NF EN IEC 62969-2:2018 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 2 : méthodes d'évaluation du rendement de la transmission d'énergie sans fil par résonance pour les capteurs de véhicules automobiles
NF B44-101-5:2013 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 5: removal of methyl mercaptan
NF B44-101-5*NF ISO 22197-5:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 5 : removal of methyl mercaptan
NF B44-101-4*NF ISO 22197-4:2021 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 4 : removal of formaldehyde
NF ISO 18560-1:2014 Céramiques techniques - Méthode d'essai pour mesurer les performances des matériaux photocatalytiques semiconducteurs pour purifier l'air selon la méthode de la chambre d'essai dans un environnement d'éclairage intérieur - Partie 1 : élimina...
NF B44-105*NF ISO 14605:2013 Fine Ceramics (advanced ceramics, advanced technical ceramics) - Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

European Committee for Standardization (CEN), Semiconductor Catalytic Ability

PD CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions
CEN/TS 16599:2014 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions

German Institute for Standardization, Semiconductor Catalytic Ability

DIN CEN/TS 16599:2014-07*DIN SPEC 7397:2014-07 Photocatalysis - Irradiation conditions for testing photocatalytic properties of semiconducting materials and the measurement of these conditions; German version CEN/TS 16599:2014
DIN EN 62418:2010-12 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
DIN 43653:1976-03 High rupturing-capacity fuses for semi-conductor converters
DIN ISO 22197-1:2018-12 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN ISO 22197-1:2018 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
DIN ISO 22197-1:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2007)
DIN EN 62418:2010 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010

HU-MSZT, Semiconductor Catalytic Ability

MSZ 771/5-1979

Danish Standards Foundation, Semiconductor Catalytic Ability

DS/EN 62418:2010 Semiconductor devices - Metallization stress void test

European Committee for Electrotechnical Standardization（CENELEC）, Semiconductor Catalytic Ability

EN 62418:2010 Semiconductor devices - Metallization stress void test

International Electrotechnical Commission (IEC), Semiconductor Catalytic Ability

IEC 62418:2010 Semiconductor devices - Metallization stress void test
IEC 60747-8-4:2004 Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications

ES-UNE, Semiconductor Catalytic Ability

UNE-EN 62418:2010 Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)

Japanese Industrial Standards Committee (JISC), Semiconductor Catalytic Ability

JIS R 1750:2012 Fine ceramics -- Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
JIS R 1708:2016 Fine ceramics (Advanced ceramics, advanced technical ceramics) -- Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
JIS R 1712:2022 Fine ceramics (advanced ceramics, advanced technical ceramics) -- Test method for antialgal activity of semiconducting photocatalytic materials

Professional Standard - Machinery, Semiconductor Catalytic Ability

JB/T 8736-1998 Aluminum nitride ceramics substrate intended to be used in power semiconductor modules

Lithuanian Standards Office , Semiconductor Catalytic Ability

LST EN 62418-2010 Semiconductor devices - Metallization stress void test (IEC 62418:2010)

AENOR, Semiconductor Catalytic Ability

UNE-ISO 22197-1:2012 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for air-purification performance of semiconducting photocatalytic materials. Part 1: Removal of nitric oxide
UNE 127197-1:2013 Test method application to evaluate the air-purification performance of semiconducting photocatalytic materials soaked into precast concrete products - Part 1: Removal of nitric oxide.

KR-KS, Semiconductor Catalytic Ability

KS L ISO 22197-1-2018 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 22197-2-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 2: Removal of acetaldehyde
KS L ISO 22197-4-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 4: Removal of formaldehyde
KS L ISO 22197-3-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 3: Removal of toluene
KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
KS L ISO 22197-1-2022 Fine ceramics(advanced ceramics, advanced technical ceramics) — Test method for air-purification performance of semiconducting photocatalytic materials — Part 1: Removal of nitric oxide
KS L ISO 27447-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials
KS L ISO 22197-5-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials — Part 5: Removal of methyl mercaptan
KS L ISO 17168-1-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 1: Remova
KS L ISO 17168-2-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 2: Remova
KS L ISO 17168-4-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 4: Remova
KS L ISO 17168-3-2020 Fine ceramics(advanced ceramics, advanced technical ceramics) —Test method for air-purification performance of semiconducting photocatalytic materials under indoor lighting environment —Part 3: Remova
KS L ISO 14605-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Light source for testing semiconducting photocatalytic materials used under indoor lighting environment

Defense Logistics Agency, Semiconductor Catalytic Ability

DLA SMD-5962-94642-1994 MICROCIRCUIT, DIGITAL, CMOS, ENHANCED MULTI-FUNCTIONAL PERIPHERAL, MONOLITHIC SILICON
DLA SMD-5962-90544 REV A-2003 MICROCIRCUIT, DIGITAL, CMOS, HIGH PERFORMANCE MICROCONTROLLER MONOLITHIC SILICON
DLA SMD-5962-90997-1991 MICROCIRCUIT, DIGITAL, CHMOS BUS CONTROLLER, MONOLITHIC SILICON