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Electron Microscope Optics

Electron Microscope Optics, Total:347 items.

In the international standard classification, Electron Microscope Optics involves: Optical equipment, Vocabularies, Air quality, Optics and optical measurements, Medical equipment, Optoelectronics. Laser equipment, Analytical chemistry, Photography, Electronic component assemblies, Electronic components in general, Microbiology, Education, Thermodynamics and temperature measurements, Particle size analysis. Sieving, Technical drawings, Electronic display devices, Non-ferrous metals, Materials for the reinforcement of composites, Testing of metals, Applications of information technology, Protection against crime, Semiconductor devices, Medical sciences and health care facilities in general, Iron and steel products, Paints and varnishes.

International Organization for Standardization (ISO), Electron Microscope Optics

ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 8036-1:1986 Optics and optical instruments; Microscopes; Part 1 : Immersion oil for general use in light microscopy
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 8038-2:2001 Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO 10936-2:2001 Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
ISO 8037-1:1986 Optics and optical instruments; Microscopes; Slides; Part 1 : Dimensions, optical properties and marking
ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Part 1: Requirements and test methods
ISO 19056-3:2022 Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 8255-1:1986 Optics and optical instruments; Microscopes; Cover glasses; Part 1 : Dimensional tolerances, thickness and optical properties
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO/DIS 14880-2 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
ISO/DIS 14880-4 Optics and photonics — Microlens arrays — Part 4: Test methods for geometrical properties
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO/TS 22218-2:2023 Health informatics — Ophthalmic examination device data — Part 2: Specular microscope
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 8600-5:2005 Optics and photonics - Medical endoscopes and endotherapy devices - Part 5: Determination of optical resolution of rigid endoscopes with optics
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO/DIS 14880-3 Optics and photonics — Microlens arrays — Part 3: Test methods for optical properties other than wavefront aberrations
ISO 8600-6:2005 Optics and photonics - Medical endoscopes and endotherapy devices - Part 6: Vocabulary
ISO 9336-3:2020 Optics and photonics — Optical transfer function — Application — Part 3: Telescopes
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 19056-1:2015 Microscopes - Definition and measurement of illumination properties - Part 1: Image brightness and uniformity in bright field microscopy
ISO 29301:2017 Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
ISO 8037-2:1997/cor 1:2002 Optics and optical instruments - Microscopes; Slides - Part 2: Quality of material, standards of finish and mode of packaging; Technical Corrigendum 1
ISO 14132-4:2015 Optics and photonics - Vocabulary for telescopic systems - Part 4: Terms for astronomical telescopes
ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
ISO 9345-2:2014 Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO 14135-1:2014 Optics and photonics - Specifications for telescopic sights - Part 1: General-purpose instruments
ISO 29301:2010 Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 14135-2:2014 Optics and photonics - Specifications for telescopic sights - Part 2: High-performance instruments
ISO/CD 20263:2023 Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

British Standards Institution (BSI), Electron Microscope Optics

BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS 7012-0:1989 Light microscopes - General introduction
BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
BS 7011 Sec.2.1:1989 Consumable accessories for light microscopes. Slides. Specification for dimensions and optical properties
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30395346 DC BS ISO 19056-3. Microscopes. Definition and measurement of illumination properties. Part 3. Incident light fluorescence microscopy with incoherent light sources
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS 7011-3.1:1989 Consumable accessories for light microscopes - Cover glasses - Specification for dimensions and optical properties
BS 7011 Sec.3.1:1989 Consumable accessories for light microscopes. Cover glasses. Specification for dimensions and optical properties
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
23/30464250 DC BS EN ISO 14880-2. Optics and photonics. Microlens arrays - Part 2. Test methods for wavefront aberrations
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
23/30464258 DC BS EN ISO 14880-4. Optics and photonics. Microlens arrays - Part 4. Test methods for geometrical properties
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
20/30349145 DC BS ISO 8600-5. Optics and photonics. Medical endoscopes and endotherapy devices. Part 5. Determination of optical resolution of rigid endoscopes with optics
23/30464254 DC BS EN ISO 14880-3. Optics and photonics. Microlens arrays - Part 3. Test methods for optical properties other than wavefront aberrations
BS 7011 Sec.1.1:1989 Consumable accessories for light microscopes. Immersion oils. Specification for immersion oils for general use
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
19/30372027 DC BS ISO 9336-3. Optics and photonics. Optical transfer function. Application. Part 3. Telescopes
BS ISO 20263:2017 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials

Korean Agency for Technology and Standards (KATS), Electron Microscope Optics

KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 14880-1:2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS B ISO 8038-1:2006 Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 10936-1:2006 Optics and optical instruments－Operation microscopes－Part 1：Requirements and test methods
KS B ISO 10936-1-2006(2016) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 10936-1-2006(2021) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 8038-2-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2:2006 Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 8038-1-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 8038-1-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 14880-2:2018 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 14132-4:2019 Optics and photonics — Vocabulary for telescopic systems — Part 4: Terms for astronomical telescope
KS B ISO 14132-2:2019 Optics and photonics — Vocabulary for telescopic systems — Part 2: Terms for binoculars, monoculars and spotting scopes

KR-KS, Electron Microscope Optics

KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 14880-1-2019 Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
KS B ISO 8038-2-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-1-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS(4/5 in × 1/36 in)
KS B ISO 14880-2-2018 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-1-2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 14132-4-2019 Optics and photonics — Vocabulary for telescopic systems — Part 4: Terms for astronomical telescope
KS B ISO 9345-2-2023 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
KS B ISO 14132-2-2019 Optics and photonics — Vocabulary for telescopic systems — Part 2: Terms for binoculars, monoculars and spotting scopes

Japanese Industrial Standards Committee (JISC), Electron Microscope Optics

JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS T 10936-2:2014 Operation microscopes.Part 2: Light hazard from operation microscopes used in ocular surgery
JIS B 7132-2:2009 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS B 7132-2:2022 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems

Professional Standard - Medicine, Electron Microscope Optics

YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

German Institute for Standardization, Electron Microscope Optics

DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08
DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
DIN ISO 8037-1:2003 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN ISO 8038-2:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006
DIN EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006) English version of DIN EN ISO 14880-3:2006-08
DIN 58959-4:1997-06 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes / Note: To be replaced by DIN 58959-6 Beiblatt 2 (2021-08, t).
DIN EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
DIN EN ISO 14880-1:2019-10 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019); German version EN ISO 14880-1:2019
DIN ISO 8037-1:2003-05 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN ISO 8038-1:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006
DIN EN ISO 14880-4:2006-08 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006); German version EN ISO 14880-4:2006
DIN EN ISO 14880-2:2007-03 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); German version EN ISO 14880-2:2006
DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)
DIN EN ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties (ISO 14880-1:2016); German version EN ISO 14880-1:2016
DIN EN ISO 14880-3:2006-08 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006); German version EN ISO 14880-3:2006
DIN EN ISO 14880-2:2023-05 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO/DIS 14880-2:2023); German and English version prEN ISO 14880-2:2023 / Note: Date of issue 2023-04-07*Intended as replacement for DIN EN ISO 14880-2 (2007-03).
DIN EN ISO 14880-4:2023-05 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO/DIS 14880-4:2023); German and English version prEN ISO 14880-4:2023 / Note: Date of issue 2023-04-07*Intended as replacement for DIN EN ISO 14880-4 (2006-08).
DIN ISO 14132-4:2016-07 Optics and photonics - Vocabulary for telescopic systems - Part 4: Terms for astronomical telescopes (ISO 14132-4:2015); Text in German and English
DIN 58943-32:1995 Medical microbiology - Diagnosis of tuberculosis - Part 32: Detection of mycobacteria by microscopic methods
DIN EN 60749-35:2007-03 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006); German version EN 60749-35:2006
DIN EN ISO 14880-3:2023-05 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO/DIS 14880-3:2023); German and English version prEN ISO 14880-3:2023 / Note: Date of issue 2023-04-07*Intended as replacement for...
DIN EN 61988-2-1:2012-10 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (IEC 61988-2-1:2012); German version EN 61988-2-1:2012 / Note: DIN EN 61988-2-1 (2003-08) and DIN EN 61988-2-2 (2003-11) remain valid alongside this standard until 2015-02...
DIN ISO 14132-2:2017-02 Optics and photonics - Vocabulary for telescopic systems - Part 2: Terms for binoculars, monoculars and spotting scopes (ISO 14132-2:2015); Text in German and English

European Committee for Standardization (CEN), Electron Microscope Optics

EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
EN ISO 14880-3:2006 Optics and phonotics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
EN ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
prEN ISO 14880-4 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO/DIS 14880‑4:2023)
prEN ISO 14880-2 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO/DIS 14880‑2:2023)
EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
prEN ISO 14880-3 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO/DIS 14880‑3:2023)
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
EN ISO 10685-3:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 3: Technical information (ISO 10685-3:2012)

Professional Standard - Machinery, Electron Microscope Optics

JB/T 5480-1991 Diaphragm of electron microscope
JB/T 5585-1991 Test method of transmission electron microscope resolution
JB/T 5586-1991 Classification and basic parameter of transmission electron microscope

Danish Standards Foundation, Electron Microscope Optics

DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
DS/EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
DS/ISO 8600-5:2020 Optics and photonics – Medical endoscopes and endotherapy devices – Part 5: Determination of optical resolution of rigid endoscopes with optics
DS/EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/EN 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical

Association Francaise de Normalisation, Electron Microscope Optics

NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF S10-132-1*NF EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1 : vocabulary
NF EN ISO 14880-1:2019 Optique et photonique - Réseaux de microlentilles - Partie 1 : vocabulaire
NF S12-024-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. COVER GLASSES. PART 1 : DIMENSIONAL TOLERANCES,THICKNESS AND OPTICAL PROPERTIES.
NF S12-021-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. SLIDES. PART 1 : DIMENSIONS,OPTICAL PROPERTIES AND MARKING.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
NF S10-132-2*NF EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2 : test methods for wavefront aberrations
NF EN ISO 14880-2:2007 Optique et photonique - Réseaux de microlentilles - Partie 2 : méthodes d'essai pour les aberrations du front d'onde
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF S10-132-3*NF EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3 : test methods for optical properties other than wavefront aberrations.
NF EN ISO 14880-3:2006 Optique et photonique - Réseaux de microlentilles - Partie 3 : méthodes d'essai pour les propriétés optiques autres que les aberrations du front d'onde
NF EN 60749-35:2006 Dispositifs à semiconducteurs - Méthodes d'essai climatiques et mécaniques - Partie 35 : microscopie acoustique pour composants électroniques à boîtier plastique
NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF C93-548-2-1*NF EN 61988-2-1:2012 Plasma display panels - Part 2-1 : measuring methods - Optical and optoelectrical
NF EN ISO 17751-1:2016 Textiles - Analyse quantitative du cachemire, de la laine, d'autres fibres animales spéciales et leurs mélanges - Partie 1 : méthode de microscopie optique

Professional Standard - Commodity Inspection, Electron Microscope Optics

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 3129.2-2013 Rules for the inspection of optical instruments for import and export.Part 2:Biological microscopes

国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscope Optics

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary

TIA - Telecommunications Industry Association, Electron Microscope Optics

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices

Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron Microscope Optics

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscope Optics

GB/T 41869.1-2022 Optics and photonics—Microlens array—Part 1:Vocabulary
GB/T 27668.1-2011 Vocabulary for microscopy.Part 1: Light microscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 41869.2-2022 Optics and photonics—Microlens array—Part 2:Test methods for wavefront aberrations
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 22057.2-2008 Microscopes-Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope

ES-UNE, Electron Microscope Optics

UNE-EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019) (Endorsed by Asociación Española de Normalización in August of 2019.)
UNE-EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
UNE-EN 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical (Endorsed by AENOR in June of 2012.)

American National Standards Institute （ANSI), Electron Microscope Optics

ANSI/TIA/EIA 573C000-1998 Sectional Specification for Field-Portable Optical Microscopes

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscope Optics

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

International Electrotechnical Commission (IEC), Electron Microscope Optics

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy
IEC 61988-2-1:2012 Plasma Display Panels - Part 2-1: Measuring methods - Optical and optoelectrical
IEC 62679-3-1:2014 Electronic paper displays - Part 3-1: Optical measuring methods
IEC TR 62977-2-5:2018 Electronic displays devices - Part 2-5: Transparent displays - Measurements of optical characteristics
IEC 63145-20-10:2019 Eyewear display - Part 20-10: Fundamental measurement methods - Optical properties
IEC 62977-3-9:2023 Electronic displays - Part 3-9: Evaluation of optical performance - Display sparkle contrast

RO-ASRO, Electron Microscope Optics

STAS SR ISO 8037-1:1995 Optics and optical instruments Microscopes - Slides Part 1: Dimensions, optical properties and marking
STAS SR ISO 8255-1:1995 Optics and optical instruments Microscopes — Cover glasses Part 1: Dimensional tolerances, thickness and optical properties

Indonesia Standards, Electron Microscope Optics

SNI ISO 10936-1:2008 Microscope for surgery - Part 1 : Specification and test method

Professional Standard - Education, Electron Microscope Optics

JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

Group Standards of the People's Republic of China, Electron Microscope Optics

T/QGCML 1940-2023
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/TIAA 014-2018 Optical measuring methods of display devices for Vehicle electronic rearview mirror

RU-GOST R, Electron Microscope Optics

GOST R 59743.1-2021 Optics and photonics. Microlens arrays. Part 1. Terms and definitions. Classification
GOST 15114-1978 Telescope system for optical devices. Visual method of resolution limits determination
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R IEC 61988-2-1-2015 Plasma display panels. Part 2-1. Measuring methods. Optical and optoelectrical

American Society for Testing and Materials (ASTM), Electron Microscope Optics

ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations

Professional Standard - Petroleum, Electron Microscope Optics

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局, Electron Microscope Optics

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

工业和信息化部, Electron Microscope Optics

YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
SJ/T 11591.4.1.1-2016 Stereoscopic display devices Part 4-1-1: Measurement methods for glasses-type stereoscopic display devices - Optics and optoelectronics

Professional Standard - Public Safety Standards, Electron Microscope Optics

GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry

Lithuanian Standards Office , Electron Microscope Optics

LST EN ISO 14880-1:2005/AC:2009 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2001/Cor 1:2003/Cor 2:2005)
LST EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)
LST EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006)

AENOR, Electron Microscope Optics

UNE-EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006)
UNE-EN ISO 14880-4:2007 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Electron Microscope Optics

GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
GJB 5384.23-2005 Test methods of performance for pyrotechnic composition Part 23: Determination of particles size distribution for solid smoke particles Electron microscope method

Military Standard of the People's Republic of China-General Armament Department, Electron Microscope Optics

GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
GJB 8684.23-2015 Test methods for pyrotechnic properties - Part 23: Determination of particle size distribution of smoke solid particles by electron microscopy

IPC - Association Connecting Electronics Industries, Electron Microscope Optics

IPC/JEDEC J-STD-035 CD-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components (Incorporates Amendment 1: January 2007)

PH-BPS, Electron Microscope Optics

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

GOSTR, Electron Microscope Optics

GOST R IEC 62679-3-1-2017 Electronic paper displays. Part 3-1. Optical measurement methods

European Committee for Electrotechnical Standardization（CENELEC）, Electron Microscope Optics

EN 61988-2-1:2012 Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical

CEN - European Committee for Standardization, Electron Microscope Optics

EN ISO 10685-2:2012 Ophthalmic optics - Spectacle frames and sunglasses electronic catalogue and identification - Part 2: Commercial information