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semiconductor oxidation

semiconductor oxidation, Total:28 items.

In the international standard classification, semiconductor oxidation involves: Semiconductor devices, Integrated circuits. Microelectronics, Electronic components in general.

European Committee for Electrotechnical Standardization（CENELEC）, semiconductor oxidation

• EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

British Standards Institution (BSI), semiconductor oxidation

• BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• BS IEC 62373-1:2020 Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET
• 18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method
• 17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET). Part 1. Fast BTI Test method

Association Francaise de Normalisation, semiconductor oxidation

• NF C80-203*NF EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).
• NF EN 62417:2010 Dispositifs à semiconducteurs - Essais d'ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFET)

International Electrotechnical Commission (IEC), semiconductor oxidation

• IEC 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• IEC 62373-1:2020 Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Danish Standards Foundation, semiconductor oxidation

• DS/EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

German Institute for Standardization, semiconductor oxidation

• DIN EN 62417:2010-12 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010
• DIN EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010

ES-UNE, semiconductor oxidation

• UNE-EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)

Defense Logistics Agency, semiconductor oxidation

• DLA SMD-5962-96665 REV D-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX VOLTAGE LEVEL SHIFTER FOR TTL-TO-CMOS OR CMOS-TO- CMOS OPERATION, MONOLITHIC SILICON
• DLA SMD-5962-79018 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128 X 8-BIT RANDOM ACCESS MEMORY (RAM), MONOLITHIC SILICON
• DLA SMD-5962-94532-1994 MICROCIRCUIT, CMOS, 64-BIT MICROPROCESSOR
• DLA SMD-5962-77044 REV F-2005 MICROCIRCUIT, DIGITAL, CMOS, NOR GATES, MONOLITHIC SILICON

Lithuanian Standards Office , semiconductor oxidation

• LST EN 62417-2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

PH-BPS, semiconductor oxidation

• PNS IEC 62373-1:2021 Semiconductor devices - Bias-temperature stability test for metal-ox ide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Group Standards of the People's Republic of China, semiconductor oxidation

• T/CECA 35-2019 Metal oxide semiconductor gas sensor

Professional Standard - Electron, semiconductor oxidation

• SJ 20025-1992 Generic specification for gas sensors of metal-oxide semiconductor
• SJ 20026-1992 Measuring methods for gas sensors of metal-oxide semiconductor
• SJ 20079-1992 Test mehods for gas sensors of metal-oxide semiconductor

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, semiconductor oxidation

• GB/T 15652-1995 Generic specification for gas sensors of metal-oxide semiconductor
• GB/T 15653-1995 Measuring methods for gas sensors of metal-oxide semiconductor

U.S. Military Regulations and Norms, semiconductor oxidation

• ARMY MIL-M-63530 NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
• ARMY MIL-M-63530 (1)-1987 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
• ARMY MIL-M-63530-1981 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)

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