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X-ray diffractometer semi-quantitative analysis
X-ray diffractometer semi-quantitative analysis, Total:131 items.
In the international standard classification, X-ray diffractometer semi-quantitative analysis involves: Refractories, Radiation protection, Testing of metals, Non-metalliferous minerals, Occupational safety. Industrial hygiene, Analytical chemistry, Semiconducting materials, Non-destructive testing, Education, Nuclear energy engineering, Vocabularies, Air quality, Inorganic chemicals, Paint ingredients, Optics and optical measurements, Products of the chemical industry, Petroleum products in general, Optical equipment, Radiation measurements, Construction materials, Non-ferrous metals, Metalliferous minerals, Protection against fire, Fuels, Coals, Medical sciences and health care facilities in general, Dentistry.
Professional Standard - Ferrous Metallurgy, X-ray diffractometer semi-quantitative analysis
- YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
- YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
- YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials
- YB/T 5338-2006 X-ray Diffraction Method for Quantitative Determination of Retained Austenite in Steel
工业和信息化部, X-ray diffractometer semi-quantitative analysis
- YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
- YB/T 5338-2019 X-ray diffractometer method for quantitative determination of austenite in steel
- YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
- YS/T 1033-2015 Determination of element content of dry anti-seepage materials by X-ray fluorescence spectrometry
- YS/T 806-2020 Chemical analysis methods for aluminum and aluminum alloys Determination of elemental content X-ray fluorescence spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray diffractometer semi-quantitative analysis
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
- GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
- GB/T 8362-1987 Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
- GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina.Part 32:Determination of а-alumina content by X-ray diffraction
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 12162.4-2010/ISO 4037 4-2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
- GB/T 12162.4-2010/ISO 4037 4:2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
- GB/T 12162.4-2010 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy.Part 4:Calibration of area and personal dosemeters in low energy X reference radiation fields
- GB/T 8156.10-1987 Aluminium fluoride for industrial use--Determination of sulphur content--X-ray fluorescence spectrometric method
- GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
- GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
- GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
Professional Standard - Customs, X-ray diffractometer semi-quantitative analysis
- HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
Occupational Health Standard of the People's Republic of China, X-ray diffractometer semi-quantitative analysis
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Japanese Industrial Standards Committee (JISC), X-ray diffractometer semi-quantitative analysis
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
- JIS A 1481-3:2014 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method
- JIS A 1481-3 AMD 1:2022 Determination of asbestos in building material products -- Part 3: Quantitative analysis of containing asbestos by X-ray diffraction method (Amendment 1)
- JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
Professional Standard - Petroleum, X-ray diffractometer semi-quantitative analysis
- SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
- SY/T 6210-1996 X-ray Diffraction Quantitative Analysis Method of Total Clay Minerals and Common Non-clay Minerals in Sedimentary Rocks
American Society for Testing and Materials (ASTM), X-ray diffractometer semi-quantitative analysis
- ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
- ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
- ASTM C1365-06 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-06(2011) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-98 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-98(2004) Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM C1365-18 Standard Test Method for Determination of the Proportion of Phases in Portland Cement and Portland-Cement Clinker Using X-Ray Powder Diffraction Analysis
- ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
- ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
Professional Standard - Education, X-ray diffractometer semi-quantitative analysis
- JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
- JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer
Professional Standard - Nuclear Industry, X-ray diffractometer semi-quantitative analysis
- EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer
Association Francaise de Normalisation, X-ray diffractometer semi-quantitative analysis
- NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
- NF ISO 22262-3:2017 Qualité de l'air - Matériaux solides - Partie 3 : dosage quantitatif de l'amiante par la méthode de diffraction des rayons X
- NF X43-066-3*NF ISO 22262-3:2017 Air quality - Bulk materials - Part 3 : quantitative determination of asbestos by X-ray diffraction method
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF ISO 16258-2:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 2 : méthode indirecte d'analyse
- NF M07-095*NF EN ISO 14597:1999 Petroleum products. Determination of vanadium and nickel content. Wavelength-dispersive X-ray fluorescence spectrometry.
- NF ISO 16258-1:2015 Air des lieux de travail - Fraction alvéolaire de la silice cristalline par diffraction de rayons X - Partie 1: méthode directe d'analyse sur filtre
- NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
- NF EN 16424:2014 Caractérisation des déchets - Méthode de dépistage pour la détermination de la composition élémentaire au moyen d'analyseurs portables de fluorescence X
- NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
- NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif
International Organization for Standardization (ISO), X-ray diffractometer semi-quantitative analysis
- ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- ISO 22262-3:2016 Air quality - Bulk materials - Part 3: Quantitative determination of asbestos by X-ray diffraction method
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
- ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
German Institute for Standardization, X-ray diffractometer semi-quantitative analysis
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
- DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
- DIN 25703:1993 Determination of the uranium and plutonium content in nitric acid solutions by wavelength dispersive X-ray fluorescence analysis
- DIN 51440-1:2003 Testing of gasolines - Determination of phosphorus content - Part 1: Analysis by wavelength dispersive X-ray spectrometry (XRS)
- DIN EN ISO 14597:1999 Petroleum products - Determination of vanadium and nickel content - Wavelength-dispersive X-ray fluorescence spectrometry (ISO 14597:1997); German version EN ISO 14597:1999
Korean Agency for Technology and Standards (KATS), X-ray diffractometer semi-quantitative analysis
- KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- KS D ISO 14706-2003(2018)
- KS M 1068-2005 Qualitative/quantitative screening by XRF spectrometry
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS M ISO 14597:2003 Petroleum products－Determination of vanadium and nickel content－Wavelength-dispersive X-ray fluorescence spectrometry
- KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
- KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
- KS C IEC 61017-2:2005 Radiation protection instrumentation－Portable, transportable or installed equipment to measure X or gamma radiation for environmental monitoring－Part 2：Integrating assemblies
- KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS E ISO 10086-1:2007 Coal－Methods for evaluating flocculants for use in coal preparation－Part 1：Basic parameters
Standard Association of Australia （SAA）, X-ray diffractometer semi-quantitative analysis
- AS 2879.3:2010 Alumina, Part 3: Determination of alpha alumina content by X-ray diffraction
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
工业和信息化部/国家能源局, X-ray diffractometer semi-quantitative analysis
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
Professional Standard - Agriculture, X-ray diffractometer semi-quantitative analysis
- SN/T 3323.7-2023 Iron oxide scale - Part 7: Determination of free α-SiO2 content X-ray diffraction K value method
National Metrological Technical Specifications of the People's Republic of China, X-ray diffractometer semi-quantitative analysis
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
KR-KS, X-ray diffractometer semi-quantitative analysis
- KS D ISO 14706-2003(2023)
- KS D ISO 15472-2003(2023)
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
- KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray diffractometer semi-quantitative analysis
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
- GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
RU-GOST R, X-ray diffractometer semi-quantitative analysis
- GOST 19647-1974 Methods and means of radioisotope X-ray analysis. Terms and definitions
Professional Standard - Non-ferrous Metal, X-ray diffractometer semi-quantitative analysis
- YS/T 438.5-2013 Methods for physical performance determination of Sandy alumina.Part 5:X-ray diffraction spectrum method for determination of α-alumina content
- YS/T 703-2014 Method for chemical analysis of Limstone.Determination of element contents.X-ray fluorescence spectrometric method
- YS/T 575.23-2009 Method for chemical analysis of aluminum ores.Part 23:Determination of element contents X-ray fluorescence spectrometric method
(U.S.) Ford Automotive Standards, X-ray diffractometer semi-quantitative analysis
British Standards Institution (BSI), X-ray diffractometer semi-quantitative analysis
- BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
- BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
- BS EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Apparatus, reagents, dissolution and gravimetric silica
- 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
- BS EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Apparatus, reagents, dissolution and determination of gravimetric silica
- BS EN ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents,
dissolution and determination of
gravimetric silica (ISO 10058-1:2008)
Shandong Provincial Standard of the People's Republic of China, X-ray diffractometer semi-quantitative analysis
- DB37/T 266-1999 X-ray fluorescence analysis method for the determination of the amount of waste slag added in building material products
International Electrotechnical Commission (IEC), X-ray diffractometer semi-quantitative analysis
- IEC 60846-2:2007 Radiation protection instrumentation - Ambient and/or directional dose equivalent (rate) meters and/or monitors for beta, X and gamma radiation - Part 2: High range beta and photon dose and dose rate portable instruments for emergency radiation protection
- IEC 61017-2:1994 Radiation protection instrumentation; portable, transportable or installed equipment to measure X or gamma radiation for environmental monitoring; part 2: integrating assemblies
Group Standards of the People's Republic of China, X-ray diffractometer semi-quantitative analysis
- T/NAIA 0128-2022 Rapid Determination of Aluminum Hydroxide Determination of Element Content by X-ray Fluorescence Spectroscopic Analysis (Tablet)
Professional Standard - Machinery, X-ray diffractometer semi-quantitative analysis
- JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect
- JB/T 11602.1-2013 Non-destructive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 1: Voltage divider method
Professional Standard - Medicine, X-ray diffractometer semi-quantitative analysis
- YY/T 1807-2022 Rapid non-destructive testing of main components in metal materials for dental restorations Hand-held X-ray fluorescence spectrometer method (semi-quantitative method)