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Optical and Scanning Microscopes

Optical and Scanning Microscopes, Total:481 items.

In the international standard classification, Optical and Scanning Microscopes involves: Non-ferrous metals, Optical equipment, Waxes, bituminous materials and other petroleum products, Linear and angular measurements, Analytical chemistry, Vocabularies, Air quality, Optics and optical measurements, Machine tool systems, Education, Thermodynamics and temperature measurements, Quality, Electronic display devices, Medical equipment, Protection against crime, Optoelectronics. Laser equipment, Electrical wires and cables, Surface treatment and coating, Construction materials, Non-destructive testing, Mechanical testing, Photography, Particle size analysis. Sieving, Microbiology, Paints and varnishes, Coals, Products of the textile industry, Medical sciences and health care facilities in general, Iron and steel products, Testing of metals, Ceramics, Physics. Chemistry, Fluid power systems, Semiconductor devices, Integrated circuits. Microelectronics, Paint ingredients.

Korean Agency for Technology and Standards (KATS), Optical and Scanning Microscopes

KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS M 0044-1999
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2:2011 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 8039:2006 Optics and optical instruments Microscopes Magnification
KS B ISO 8039-2016(2021) Optics and optical instruments Microscopes Magnification
KS B ISO 8039:2016 Optics and optical instruments Microscopes Magnification
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 8040:2006 Optics and optical instruments－Microscopes－Dimensions of tube slide and tube slot connections
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 12853:2006 Optics and optical instruments-Microscopes-Information provided to the user
KS B ISO 12853-2016(2021) Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 12853:2016 Optics and optical instruments－Microscopes－Information provided to the user
KS B ISO 19012-1-2016(2021) Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 15362:2006 Optics and optical instruments-Stereomicroscopes-Information provided to the user
KS B ISO 8040-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 15362-2016(2021) Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 8478-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 8478-2006(2021) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS B ISO 15362:2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 8040-2006(2016) Optics and photonics — Microscopes —Dimensions of tube slide and tube slot connections
KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 8038-1:2006 Optics and optical instruments－Microscopes－Screw threads for objectives and related nosepieces－Part 1：Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 8038-2:2006 Optics and optical instruments－Screw threads for microscope objectives and related nosepieces－Part 2：Screw thread type M25×0.75 mm
KS B ISO 8038-2-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-2-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 10936-1:2006 Optics and optical instruments－Operation microscopes－Part 1：Requirements and test methods
KS B ISO 10936-1-2006(2016) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 10936-1-2006(2021) Optics and optical instruments — Operation microscopes —Part 1: Requirements and test methods
KS B ISO 14880-2:2013 Optics and photonics ― Microlens arrays ― Part 2: Test methods for wavefront aberrations
KS B ISO 14880-2:2008 Optics and photonics-Microlens arrays-Part 2:Test methods for wavefront aberrations
KS B ISO 8038-1-2006(2021) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 8038-1-2006(2016) Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces —Part 1: Screw thread type RMS(4/5 in×1/36 in)
KS B ISO 9345-1-2016(2021) Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS I ISO 4407:2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS I ISO 4407-2017(2022) Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
KS B ISO 9345-2-2016(2021) Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS I ISO 8672:2006 Air quality－Determination of the number concentration of airborne inorganic fibres by phase contrast optical microscopy(Membrane filter method)

Professional Standard - Commodity Inspection, Optical and Scanning Microscopes

SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
SN/T 3798-2014 Determination of asbestos in building and automobile materials.Polarized light microscope
SN/T 3129.2-2013 Rules for the inspection of optical instruments for import and export.Part 2:Biological microscopes
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export.Part 1:X-ray diffraction and scan electron microscopy method

Japanese Industrial Standards Committee (JISC), Optical and Scanning Microscopes

JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
JIS B 7132-2:2022 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems

International Organization for Standardization (ISO), Optical and Scanning Microscopes

ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 8036-1:1986 Optics and optical instruments; Microscopes; Part 1 : Immersion oil for general use in light microscopy
ISO 8578:1997/Cor 1:2002 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces; Technical Corrigendum 1
ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
ISO 8040:1986 Optics and optical instruments; Microscopes; Connecting dimensions of tube slides and tube slots
ISO 10936-2:2001 Optics and optical instruments - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO 8038-2:2001 Optics and optical instruments - Screw threads for microscope objectives and related nosepieces - Part 2: Screw thread type M25 x 0,75 mm
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO/TR 14880-5:2010 Optics and photonics - Microlens arrays - Part 5: Guidance on testing
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 10935:1996 Optics and optical instruments - Microscopes - Interfacing connection type C
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 15362:1998 Optics and optical instruments - Stereomicroscopes - Information provided to the user
ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
ISO 10936-1:2017 Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Part 1: Requirements and test methods
ISO 8037-1:1986 Optics and optical instruments; Microscopes; Slides; Part 1 : Dimensions, optical properties and marking
ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
ISO 8255-1:2011 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 8255-1:2017 Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties
ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
ISO 8255-1:1986 Optics and optical instruments; Microscopes; Cover glasses; Part 1 : Dimensional tolerances, thickness and optical properties
ISO/CD 4407 Hydraulic fluid power — Fluid contamination — Determination of particulate contamination by the counting method using an optical microscope
ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
ISO 4407:2002 Hydraulic fluid power - Fluid contamination - Determination of particulate contamination by the counting method using an optical microscope
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 14880-3:2006 Optics and photonics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations
ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems
ISO 9345:2019 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
ISO 8672:1993 Air quality; determination of the number concentration of airborne inorganic fibres by phase contrast optical microscopy; membrane filter method
ISO 8672:2014 Air quality - Determination of the number concentration of airborne inorganic fibres by phase contrast optical microscopy - Membrane filter method

British Standards Institution (BSI), Optical and Scanning Microscopes

BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS ISO 8036:2015 Tracked Changes. Microscopes. Immersion liquids for light microscopy
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS 7012-6:1998 Light microscopes. Specification for spectral filters
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
BS ISO 8040:2001 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS 7012-11:1998 Light microscopes - Information provided to the user
BS 7012-0:1989 Light microscopes - General introduction
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
BS 7012-3:1997 Light microscopes - Imaging distances related to mechanical reference planes for tube length 160 mm
BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 10936-1:2002 Optics and optical instruments. Operation microscopes. Requirements and test methods
BS 7011 Sec.2.1:1989 Consumable accessories for light microscopes. Slides. Specification for dimensions and optical properties
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
BS ISO 10936-1:2000 Optics and optical instruments - Operation microscopes - Requirements and test methods
BS ISO 8255-1:2017 Tracked Changes. Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
BS 7012-9:1997 Light microscopes - Specification for interfacing connection type C
BS ISO 8255-1:2011 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS 7011-1-1.1:1998 Consumable accessories for light microscopes - Immersion oils - Specification for immersion oils for general use
BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS ISO 10936-1:2017 Tracked Changes. Optics and photonics. Operation microscopes. Requirements and test methods
BS 7011-0:1989 Consumable accessories for light microscopes. General introduction
12/30265696 DC BS ISO 18115-2 AMD1. Surface chemical analysis. Vocabulary. Part 2. Terms used in scanning-probe microscopy
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 14880-3:2006 Optics and photonics - Microlens arrays - Test methods for optical properties other than wavefront aberrations
BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
BS 7012-13:1997 Light microscopes. Interfacing connection for 35 mm SLR photo cameras (T-thread adaptation)
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
BS ISO 9345-2:2014 Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
BS ISO 4407:2002 Hydraulic fluid power - Fluid contamination - Determination of particulate contamination by the counting method using an optical microscope

American Society for Testing and Materials (ASTM), Optical and Scanning Microscopes

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM F728-81(1997)e1 Standard Practice for Preparing An Optical Microscope for Dimensional Measurements
ASTM F72-95(2001) Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E1813-96e1 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2002) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM D8075-16 Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM D8075-16(2021) Standard Guide for Categorization of Microstructural and Microtextural Features Observed in Optical Micrographs of Graphite
ASTM E1951-98 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-02 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-01 Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM E1951-14(2019) Standard Guide for Calibrating Reticles and Light Microscope Magnifications
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2142-01 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM F1438-93(1999) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1438-93(2020) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1438-93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

PT-IPQ, Optical and Scanning Microscopes

E E 15-1971

Military Standards (MIL-STD), Optical and Scanning Microscopes

DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)
DOD A-A-54386-1991 MICROSCOPE, OPTICAL (BINOCULAR, BRIGHTFIELD)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Optical and Scanning Microscopes

GB/T 27668-2023 Microscope Light Microscopy Terminology
GB/T 26600-2011 Microscopes.Immersion liquids for light microscopy
GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 17361-2013 Microbeam analysis.Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
GB/Z 26083-2010 Determination for Copper(Ⅱ) octaakoxyl-substituted phthalocyanine on graphite surface(scanning tunneling microscope)
GB/T 20082-2006 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope

KR-KS, Optical and Scanning Microscopes

KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 19012-1-2016 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
KS B ISO 12853-2016 Optics and optical instruments－Microscopes－Information provided to the user
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS B ISO 15362-2016 Optics and optical instruments－Stereomicroscopes－Information provided to the user
KS B ISO 8040-2023 Optics and optical instruments — Microscopes — Dimensions of tube slide and tube slot connections
KS K 5578-2023 Detection of landfowl feather fiber in plumage — Light microscopy method
KS B ISO 10936-1-2023 Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
KS B ISO 8038-2-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 2: Screw thread type M25 × 0.75 mm
KS B ISO 8038-1-2023 Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS(4/5 in × 1/36 in)
KS I ISO 4407-2017 Hydraulic fluid power－Fluid contamination－Determination of particulate contamination by the counting method using an optical microscope
KS B ISO 9345-2-2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS B ISO 9345-2-2023 Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems

German Institute for Standardization, Optical and Scanning Microscopes

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 10937:2003 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces (ISO 10937:2000)
DIN ISO 8040:2003 Optics and optical instruments - Microscopes - Dimensions of tube slide and tube slot connections (ISO 8040:2001)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 12853:2005 Optics and optical instruments - Microscopes - Information provided to the user (ISO 12853:1997)
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN 58959-4:1997 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes
DIN ISO 8038-2:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 2: Screw thread type M 25 x 0,75 mm (ISO 8038-2:2001);English version of DIN ISO 8038-2:2006
DIN 58959-4:1997-06 Quality management in medical microbiology - Part 4: Requirements for investigations using light microscopes / Note: To be replaced by DIN 58959-6 Beiblatt 2 (2021-08, t).
DIN ISO 8038-1:2006 Optics and optical instruments - Microscopes - Screw threads for objectives and related nosepieces - Part 1: Screw thread type RMS (4/5 in x 1/36 in) (ISO 8038-1:1997);English version of DIN ISO 8038-1:2006
DIN ISO 8037-1:2003 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations (ISO 14880-2:2006); English version of DIN EN ISO 14880-2:2007-03
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
DIN ISO 8037-1:2003-05 Optics and optical instruments - Microscopes; Slides - Part 1: Dimensions, optical properties and marking (ISO 8037-1:1986)
DIN EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006) English version of DIN EN ISO 14880-4:2006-08
DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)
DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)

National Metrological Technical Specifications of the People's Republic of China, Optical and Scanning Microscopes

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Professional Standard - Machinery, Optical and Scanning Microscopes

JB/T 6842-1993 Test method of scanning electron microscope
JB/T 5384-1991 Scanning electron microscope - Technical specification
JB/T 9333-1999 Microscopes.Immersion oil for general use in light microscopy
JB/T 8230.1-1999 Light microscope.Vocabulary
JB/T 7398.2-1994 Microscope Optical Connection Dimensions

National Metrological Verification Regulations of the People's Republic of China, Optical and Scanning Microscopes

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Optical and Scanning Microscopes

GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

Defense Logistics Agency, Optical and Scanning Microscopes

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR
DLA A-A-50207 A VALID NOTICE 3-2006 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 2-2001 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A VALID NOTICE 1-1993 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION
DLA A-A-50207 A-1988 MICROSCOPE, OPTICAL: MONOCULAR, FIXED-FOCUS, POCKET-TYPE, BETWEEN 40X AND 60X MAGNIFICATION

机械工业部, Optical and Scanning Microscopes

JB/T 8230.1-1995 Light microscopy terminology

Association Francaise de Normalisation, Optical and Scanning Microscopes

NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
NF S12-023:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. CONNECTING DIMENSIONS OF TUBE SLIDES AND TUBE SLOTS.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
NF X11-661:1990 Particle size analysis. Determination of particle size of powders. Optical microscope method.
NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
NF S12-024-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. COVER GLASSES. PART 1 : DIMENSIONAL TOLERANCES,THICKNESS AND OPTICAL PROPERTIES.
NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
NF S12-021-1:1988 OPTICS AND OPTICAL INSTRUMENTS. MICROSCOPES. SLIDES. PART 1 : DIMENSIONS,OPTICAL PROPERTIES AND MARKING.
NF S10-132-2*NF EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Part 2 : test methods for wavefront aberrations
NF S10-132-4*NF EN ISO 14880-4:2006 Optics and phonotics - Microlens arrays - Part 4 : test methods for geometrical properties.
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF ISO 16000-27:2014 Air intérieur - Partie 27 : détermination de la poussière fibreuse déposée sur les surfaces par MEB (microscopie électronique à balayage) (méthode directe)

Professional Standard - Medicine, Optical and Scanning Microscopes

YY 1296-2016 Optical and Photonic Surgical Microscopes Photohazards of Ophthalmic Surgical Microscopes

Professional Standard - Education, Optical and Scanning Microscopes

JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy
JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
JY/T 010-1996 General principles of analytical scanning electron microscopy

Group Standards of the People's Republic of China, Optical and Scanning Microscopes

T/QGCML 1940-2023

RO-ASRO, Optical and Scanning Microscopes

STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS 7353/5-1982 MICROSCOPES Basic optical parameters
STAS SR ISO 8040 Optics and optioal instruments - Mlcroscopes - Connecting dimensions of tube slides and tubes slois
STAS SR ISO 8037-1:1995 Optics and optical instruments Microscopes - Slides Part 1: Dimensions, optical properties and marking
STAS SR ISO 8255-1:1995 Optics and optical instruments Microscopes — Cover glasses Part 1: Dimensional tolerances, thickness and optical properties

RU-GOST R, Optical and Scanning Microscopes

GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
GOST 28489-1990 Light microscopes. Terms and definitions
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST 29214-1991 Optics and optical instruments. Microscopes. Connecting dimensions of tube slides and tube slots
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST R 56169-2014 Optics and optical instruments. Operation microscope. Requirements and test methods
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
GOST 15114-1978 Telescope system for optical devices. Visual method of resolution limits determination
GOST ISO 4407-2006 Industrial cleanliness. Determination of fluid contamination by the counting method using an optical microscope
GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)

PL-PKN, Optical and Scanning Microscopes

PN N53040-1988 Light microscopes Optical mechanical dimensions
PN H04951-1986 Powder metallurgy Determination of the particie size of powder by the optical microscope method
PN-ISO 4407-2021-03 P Hydraulic fluid power -- Fluid contamination -- Determination of particulate contamination by the counting method using an optical microscope

Professional Standard - Petroleum, Optical and Scanning Microscopes

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

Shanghai Provincial Standard of the People's Republic of China, Optical and Scanning Microscopes

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局, Optical and Scanning Microscopes

SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples

Jiangsu Provincial Standard of the People's Republic of China, Optical and Scanning Microscopes

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Judicatory, Optical and Scanning Microscopes

SF/T 0139-2023

IN-BIS, Optical and Scanning Microscopes

IS 5258-1969

Professional Standard - Public Safety Standards, Optical and Scanning Microscopes

GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)
GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

Danish Standards Foundation, Optical and Scanning Microscopes

DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

TIA - Telecommunications Industry Association, Optical and Scanning Microscopes

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices

SE-SIS, Optical and Scanning Microscopes

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

European Committee for Standardization (CEN), Optical and Scanning Microscopes

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
EN ISO 14880-2:2006 Optics and photonics - Microlens arrays - Part 2: Test methods for wavefront aberrations
EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties

American National Standards Institute （ANSI), Optical and Scanning Microscopes

ANSI/TIA/EIA 573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

工业和信息化部, Optical and Scanning Microscopes

SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy

ES-UNE, Optical and Scanning Microscopes

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)

未注明发布机构, Optical and Scanning Microscopes

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice

Association of German Mechanical Engineers, Optical and Scanning Microscopes

VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
DVS 2310-1-1984 Instruction for metallographic section manufacture and evaluation of thermally sprayed layers under the light-optical microscope
VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI/VDE 2655 Blatt 1.1-2008 Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
VDI/VDE 2655 Blatt 1.2-2010 Optical measurement of microtopography - Calibration of confocal microscopes and depth setting standards for roughness measurement

Professional Standard - Aviation, Optical and Scanning Microscopes

HB/Z 110-1986 Plexiglass Fracture Optical Microscope Observation Display Technical Instructions

AENOR, Optical and Scanning Microscopes

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).

Lithuanian Standards Office , Optical and Scanning Microscopes

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Standard Association of Australia （SAA）, Optical and Scanning Microscopes

AS 2856.1:2000(R2013)
AS 2856.1:2000 Coal petrography - Preparation of coal samples for incident light microscopy

AT-ON, Optical and Scanning Microscopes

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

BE-NBN, Optical and Scanning Microscopes

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

Indonesia Standards, Optical and Scanning Microscopes

SNI ISO 10936-1:2008 Microscope for surgery - Part 1 : Specification and test method

ZA-SANS, Optical and Scanning Microscopes

SANS 6154:2006 Glass content of granulated metallurgical slag (transmitted-light microscopy method)

GOSTR, Optical and Scanning Microscopes

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

未注明发布机构, Optical and Scanning Microscopes

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice

VN-TCVN, Optical and Scanning Microscopes

TCVN 6504-1999 Air quality.Determination of the number concentration of airborne inorganic fibres by phase contrast optical microscopy.Membrane filter method