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SEM
SEM, Total:176 items.
In the international standard classification, SEM involves: Optical equipment, Air quality, Optics and optical measurements, Education, Linear and angular measurements, Vocabularies, Analytical chemistry, Surface treatment and coating, Non-ferrous metals, Protection against crime, Thermodynamics and temperature measurements, Electronic display devices, Paints and varnishes, Testing of metals, Textile fibres, Optoelectronics. Laser equipment, Construction materials, Iron and steel products, Physics. Chemistry, Ceramics, Fishing and fish breeding, Medical equipment.
British Standards Institution (BSI), SEM
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- 18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
Japanese Industrial Standards Committee (JISC), SEM
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
Professional Standard - Commodity Inspection, SEM
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
- SN/T 3009-2011 Identification of seawater corrosion on metallic surface by SEM
International Organization for Standardization (ISO), SEM
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
American Society for Testing and Materials (ASTM), SEM
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2142-08(2015) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08 Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM E2142-08(2023) Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
National Metrological Technical Specifications of the People's Republic of China, SEM
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Machinery, SEM
- JB/T 6842-1993 Test method of scanning electron microscope
- JB/T 5384-1991 Scanning electron microscope - Technical specification
- JB/T 7503-1994 Thickness of cross section of metal coatings Scanning electron microscope measuring method
National Metrological Verification Regulations of the People's Republic of China, SEM
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Korean Agency for Technology and Standards (KATS), SEM
KR-KS, SEM
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
Professional Standard - Education, SEM
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
- JY/T 0586-2020 General Rules for Analytical Methods of Laser Scanning Confocal Microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, SEM
- GB/T 16594-1996 Micron grade lenght measurement by SEM
- GB/T 31563-2015 Metallic coatings.Measurement of coating thickness.Scanning electron microscope method
- GB/T 17722-1999 Gold-plated thickness measurement by SEM
- GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
- GB/T 20307-2006 General rules for nanometer-scale length measurement by SEM
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
- GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 30834-2014 Standard test methods for rating and classifying inclusions in steel.Scanning electron microscope
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 36422-2018 Man-made fiber.Test method for micro morphology and diameter.Scanning electron microscope method
- GB/T 30834-2022 Rating and classifying of inclusions in steel—Scanning electron microscope method
- GB/T 25189-2010 Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 14593-2008 Quantitative analysis method of cashmere,wool and their blends.Scanning electron microscope method
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
- GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effectes on topography induced by nanoparticles
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
Group Standards of the People's Republic of China, SEM
- T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
- T/QGCML 1940-2023
- T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
- T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
- T/CSTM 00346-2021 Automatic classification and statistics for the Inclusions in Steel —Energy dispersive spectrum method of scanning electron microscope
- T/GAIA 017-2022 Determination of fluorine content in the surface coating of aluminum and aluminum alloys— Scanning electron microscope and energy dispersive spectrometer method
Professional Standard - Petroleum, SEM
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, SEM
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Association of German Mechanical Engineers, SEM
- VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3866 Blatt 5-2017 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
国家能源局, SEM
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
Military Standard of the People's Republic of China-General Armament Department, SEM
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
- GJB 8288-2014 Verification regulation for ultra-high speed rotating mirror streak camera system
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, SEM
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
Guangdong Provincial Standard of the People's Republic of China, SEM
- DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method
Jiangsu Provincial Standard of the People's Republic of China, SEM
- DB32/T 4546-2023 Technical specifications for automated inspection of diatom images using scanning electron microscopes
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
Professional Standard - Judicatory, SEM
国家市场监督管理总局、中国国家标准化管理委员会, SEM
- GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification
- GB/T 38783-2020 Method of coating thickness determination for precious metal composites by scanning electron microscope
- GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
Association Francaise de Normalisation, SEM
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
- NF T25-111-4:1991 Carbon fibres- Texture and structure- Part 4: Fractography by scaning electron microscope
- NF EN ISO 19749:2023 Nanotechnologies - Détermination de la distribution de taille et de forme des particules par microscopie électronique à balayage
SE-SIS, SEM
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), SEM
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
RU-GOST R, SEM
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
- GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
- GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
Danish Standards Foundation, SEM
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
German Institute for Standardization, SEM
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
Professional Standard - Public Safety Standards, SEM
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1418-2017 Elemental Composition Examination of Forensic Science Glass Evidence Scanning Electron Microscopy/Energy Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
ES-UNE, SEM
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
工业和信息化部, SEM
- YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy
- SJ/T 11759-2020 Measurement of Photovoltaic Cell Electrode Grid Line Aspect Ratio Laser Scanning Confocal Microscopy
Fujian Provincial Standard of the People's Republic of China, SEM
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, SEM
- GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy
AENOR, SEM
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
Lithuanian Standards Office , SEM
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
AT-ON, SEM
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
BE-NBN, SEM
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
Shandong Provincial Standard of the People's Republic of China, SEM
- DB37/T 420.2-2004 Diagnosis protocol for scorpion finger disease in mariculture fish part 2: Scanning electron microscopy diagnostic method
未注明发布机构, SEM
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
国家食品药品监督管理局, SEM