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Electron Microscopy Tools
Electron Microscopy Tools, Total:125 items.
In the international standard classification, Electron Microscopy Tools involves: Air quality, Optical equipment, Optics and optical measurements, Analytical chemistry, Metrology and measurement in general, Vocabularies, Welding, brazing and soldering, Education, Electronic component assemblies, Linear and angular measurements, Optoelectronics. Laser equipment, Electronic components in general, Testing of metals, Nuclear energy engineering, Protection against crime, Thermodynamics and temperature measurements, Technical drawings, Surface treatment and coating, Electronic display devices, Materials for the reinforcement of composites.
American Society for Testing and Materials (ASTM), Electron Microscopy Tools
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
Korean Agency for Technology and Standards (KATS), Electron Microscopy Tools
Professional Standard - Machinery, Electron Microscopy Tools
Taiwan Provincial Standard of the People's Republic of China, Electron Microscopy Tools
全国标准信息公共服务平台, Electron Microscopy Tools
National Metrological Verification Regulations of the People's Republic of China, Electron Microscopy Tools
- JJG 56-2000 Verification Regulation of Universal Measuring Microscopes and Makers Microscopes
- JJG(航天) 50-1988 Calibration Regulations for Tool Microscopes
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
RU-GOST R, Electron Microscopy Tools
- GOST 8.003-1983 State system for ensuring the uniformity of measurements. Tool-making microscopes. Methods and means of verification
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
- GOST 8.003-2010 State system for ensuring the uniformity of measurements. Tool-making microscopes. Verification procedure
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
International Organization for Standardization (ISO), Electron Microscopy Tools
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Japanese Industrial Standards Committee (JISC), Electron Microscopy Tools
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
British Standards Institution (BSI), Electron Microscopy Tools
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
KR-KS, Electron Microscopy Tools
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
Association Francaise de Normalisation, Electron Microscopy Tools
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
National Metrological Technical Specifications of the People's Republic of China, Electron Microscopy Tools
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Group Standards of the People's Republic of China, Electron Microscopy Tools
Professional Standard - Education, Electron Microscopy Tools
- JY/T 011-1996 General Principles of Transmission Electron Microscopy
- JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscopy Tools
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscopy Tools
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
Association of German Mechanical Engineers, Electron Microscopy Tools
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
- DVS 2804-1975 Heated-tool welding (thermocompression welding) in microscopy (survey)
国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscopy Tools
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
Institute of Interconnecting and Packaging Electronic Circuits (IPC), Electron Microscopy Tools
Professional Standard - Petroleum, Electron Microscopy Tools
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, Electron Microscopy Tools
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Electron Microscopy Tools
International Electrotechnical Commission (IEC), Electron Microscopy Tools
国家能源局, Electron Microscopy Tools
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
German Institute for Standardization, Electron Microscopy Tools
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
工业和信息化部, Electron Microscopy Tools
- YB/T 4676-2018 Analysis of Precipitated Phases in Steel by Transmission Electron Microscopy
Jiangsu Provincial Standard of the People's Republic of China, Electron Microscopy Tools
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
Professional Standard - Nuclear Industry, Electron Microscopy Tools
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
Professional Standard - Judicatory, Electron Microscopy Tools
SE-SIS, Electron Microscopy Tools
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
European Committee for Standardization (CEN), Electron Microscopy Tools
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Danish Standards Foundation, Electron Microscopy Tools
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method