ZH
RU
ES

Gold silicon wafer

Gold silicon wafer, Total:25 items.

In the international standard classification, Gold silicon wafer involves: Cutting tools, Integrated circuits. Microelectronics, Testing of metals, Semiconducting materials, Electricity. Magnetism. Electrical and magnetic measurements, Semiconductor devices, Materials for aerospace construction, Electric filters.

Group Standards of the People's Republic of China, Gold silicon wafer

• T/ZZB 0594-2018 Electroplated diamond wire for silicon chips
• T/CPIA 0038-2022 Electroplated diamond wire for photovoltaic silicon wafer cutting
• T/CASAS 032-2023 Test method for the content of metal elements on the surface of silicon carbide wafer—Inductively coupled plasma mass spectrometry

Defense Logistics Agency, Gold silicon wafer

• DLA SMD-5962-78008 REV H-2005 MICROCIRCUIT, DIGITAL, MOS CLOCK DRIVERS, MONOLITHIC SILICON
• DLA SMD-5962-88572 REV B-1991 MICROCIRCUIT, DIGITAL, NMOS INTERRUPT GENERATOR, MONOLITHIC SILICON
• DLA SMD-5962-88503 REV J-2003 MICROCIRCUIT, LINEAR, DUAL MOSFET DRIVERS, MONOLITHIC SILICON
• DLA SMD-5962-97543 REV C-2003 MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
• DLA SMD-5962-95557 REV A-1997 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE FLASH PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
• DLA SMD-5962-95826 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NOR GATE, MONOLITHIC SILICON
• DLA SMD-5962-94709-1994 MICROCIRCUIT, LINEAR, CMOS, BANG-BANG CONTROLLER, MONOLITHIC SILICON
• DLA SMD-5962-95794 REV B-2004 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, OCTAL TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
• DLA SMD-5962-95599 REV B-1999 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY 4000 GATES, MONOLITHIC SILICON
• DLA SMD-5962-88770 REV H-2003 MICROCIRCUIT, LINEAR, SINGLE POWER MOSFET DRIVER, MONOLITHIC SILICON
• DLA SMD-5962-96691 REV D-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, SRAM, 128K X 8-BIT, MONOLITHIC SILICON
• DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
• DLA SMD-5962-96621 REV E-2005 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON
• DLA SMD-5962-96654 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, OR GATE, MONOLITHIC SILICON
• DLA SMD-5962-96655 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, AND GATE, MONOLITHIC SILICON
• DLA SMD-5962-94734-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
• DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT, DIGITAL, HCMOS 8-INPUT, NOR/OR GATE, MONOLITHIC SILICON
• DLA SMD-5962-95521 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 10,000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
• DLA SMD-5962-88549 REV A-1992 MICROCIRCUIT, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Gold silicon wafer

• GB/T 24578-2015 Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
• GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会, Gold silicon wafer

• GB/T 39145-2020 Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry

Others:   Silicon circuit, silicon wafer, Sample Wafer, Silicon Spectrum, Silicon Spectrum, Wafer sample, Silicon wafer infrared, Wafer analysis, Silicon wafer, Wafer analysis, test wafer, test wafer, Gold silicon wafer, Scan silicon wafer, Wafer inspection, Silicon wafer gold, switch silicon, silicon wafer carbon, Silicon Wafer Plating, Wafer Cutting.