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Noble Metal Electron Microscopy

Noble Metal Electron Microscopy, Total:65 items.

In the international standard classification, Noble Metal Electron Microscopy involves: Optics and optical measurements, Optical equipment, Finances. Banking. Monetary systems. Insurance, Linear and angular measurements, Surface treatment and coating, Non-ferrous metals, Products of non-ferrous metals, Testing of metals, Products of the chemical industry, Production of metals, Analytical chemistry.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Noble Metal Electron Microscopy

GB/T 34831-2017 Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope

Professional Standard - Finance, Noble Metal Electron Microscopy

JRT 0267-2023

British Standards Institution (BSI), Noble Metal Electron Microscopy

BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method

Korean Agency for Technology and Standards (KATS), Noble Metal Electron Microscopy

KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method

SE-SIS, Noble Metal Electron Microscopy

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

European Committee for Standardization (CEN), Noble Metal Electron Microscopy

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

International Organization for Standardization (ISO), Noble Metal Electron Microscopy

ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

Association Francaise de Normalisation, Noble Metal Electron Microscopy

NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage

Danish Standards Foundation, Noble Metal Electron Microscopy

DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization, Noble Metal Electron Microscopy

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Noble Metal Electron Microscopy

GB/T 17472-2008 Specification for pastes of precious metal used for microelectronics
GB/T 17472-2022 Specification for pastes of precious metal used for microelectronics
GB/T 17473.2-2008 Test method of precious metals pastes used for microelectronics.Determination of fineness
GB/T 17473.3-2008 Test method of precious metals pastes used for microelectronics.Determination of sheet resistance
GB/T 17473.5-2008 Test method of precious metals pastes used for microelectronics.Determination of viscosity
GB/T 17473.4-2008 Test methods of precious metals pastes used for microelectronics.Determination of adhesion
GB/T 17473.6-2008 Test method of precious metals pastes used for microelectronics.Determination of resolution
GB/T 17473.2-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
GB/T 17473.3-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance
GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity
GB/T 17473.6-1998 Test methods of precious metal pastes used for thick-film microelectronics--Determination of resolution
GB/T 17473.4-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of adhesion
GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
GB/T 17473.7-2008 Test method of precious metals pastes used for microelectronics.Determination of solderability and solderelaching resistance
GB/T 17473.7-1998 Test methods of precious metal pastes used for thick-film microelectronics--Test of solderability and solderleaching resistance
GB/T 43088-2023 Method for determination of dislocation density in metallic thin crystal specimens by microbeam analysis and electron microscopy

ES-UNE, Noble Metal Electron Microscopy

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Professional Standard - Public Safety Standards, Noble Metal Electron Microscopy

GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy

AENOR, Noble Metal Electron Microscopy

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).

Lithuanian Standards Office , Noble Metal Electron Microscopy

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

IT-UNI, Noble Metal Electron Microscopy

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

AT-ON, Noble Metal Electron Microscopy

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)

American Society for Testing and Materials (ASTM), Noble Metal Electron Microscopy

ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

BE-NBN, Noble Metal Electron Microscopy

NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

Japanese Industrial Standards Committee (JISC), Noble Metal Electron Microscopy

JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope

国家市场监督管理总局、中国国家标准化管理委员会, Noble Metal Electron Microscopy

GB/T 17473.7-2022 Test methods of precious metals pastes used for microelectronics—Part 7: Determination of solderability and solder leaching resistance

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Noble Metal Electron Microscopy

GJB 950.3A-2008 Analysis methods for minor elements of precious metals and their alloys.Part 3:Determination of minor palladium ang rhodium in platinum alloys by inductively coupled plasma atomic emission spectrometric method
GJB 950.2A-2008 Analysis methods for minor elements of precious metals and their alloys.Part 2: Determination of minor gold and iron in platinum and platinum alloys, palladium alloys by inductively coupled plasma atomic emission sPedrometric method
GJB 950.1A-2008 Analysis methods for minor elements of precious metals and their alloys. Part 1: Determination of minor lead, antimony, bismuth, and iron in gold and gold alloys, silve and silve alloys, palladium alloys by inductively coupled plasma atomic emission spect

Military Standard of the People's Republic of China-General Armament Department, Noble Metal Electron Microscopy

GJB 950.1A-2021 Analysis methods of trace elements of precious metals and their alloys Part 1: Determination of trace amounts of lead, antimony, bismuth, iron, zinc and cadmium in gold and gold alloys, silver and silver alloys and palladium alloys by inductively coupled