ZH
RU
ES
How to use electron microscope
How to use electron microscope, Total:32 items.
In the international standard classification, How to use electron microscope involves: Safety of machinery, Medical equipment, Analytical chemistry, Physics. Chemistry, Raw materials for rubber and plastics, Optics and optical measurements, Paints and varnishes, Testing of metals, Surface treatment and coating, Lubricants, industrial oils and related products, Construction technology, Optical equipment.
US-CFR-file, How to use electron microscope
- CFR 33-149.403-2013 Navigation and navigable waters. Part149:Deepwater ports: design, construction, and equipment. Section149.403:How may I request the use of alternate or supplemental firefighting and fire prevention equipment or procedures?
- CFR 40-86.1861-17-2014 Protection of Environment. Part86:Control of emissions from new and in-use highway vehicles and engines. Section86.1861-17:How do the NMOG+NOX and evaporative emission credit programs work?
Danish Standards Foundation, How to use electron microscope
- DS-håndbog 116.3.6:2021 Using frequency converters and guidance in leakage currents and stray currents – What is the meaning?
- DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- DS/ISO/TS 22292:2021 Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Group Standards of the People's Republic of China, How to use electron microscope
International Organization for Standardization (ISO), How to use electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- ISO 8322-10:1995 Building construction — Measuring instruments — Procedures for determining accuracy in use — Part 10: Difference between non-glass reflectors and electronic distance-measuring prisms (traditional glas
- ISO/FDIS 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
- ISO 29301:2023 Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
British Standards Institution (BSI), How to use electron microscope
- BS ISO 25498:2018 Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
- PD ISO/TS 22292:2021 Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Association Francaise de Normalisation, How to use electron microscope
- FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BE-NBN, How to use electron microscope
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
American Society for Testing and Materials (ASTM), How to use electron microscope
- ASTM D3849-14a Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
- ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
- ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
- ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
- ASTM B651-83(2019) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with Double-Beam Interference Microscope
- ASTM D7416-08 Standard Practice for Analysis of In-Service Lubricants Using a Particular Five-Part (Dielectric Permittivity, Time-Resolved Dielectric Permittivity with Switching Magnetic Fields, Laser Particle Coun
German Institute for Standardization, How to use electron microscope
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
未注明发布机构, How to use electron microscope
- DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy
IT-UNI, How to use electron microscope
- UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.
GOSTR, How to use electron microscope
- PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
BELST, How to use electron microscope
- STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements