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Crystal enthalpy

Crystal enthalpy, Total:500 items.

In the international standard classification, Crystal enthalpy involves: Plastics, Pipeline components and pipelines, Testing of metals, Rubber and plastics products, Thermodynamics and temperature measurements, Medical equipment, Piezoelectric and dielectric devices, Glass, Pesticides and other agrochemicals, Electronic components in general, Semiconductor devices, Optoelectronics. Laser equipment, IT terminal and other peripheral equipment, Inorganic chemicals, Analytical chemistry, Semiconducting materials, Electric filters, Standardization. General rules, Nuclear energy engineering, Electrical and electronic testing, Audio, video and audiovisual engineering, Electronic display devices, Industrial furnaces, Radiation measurements, Non-ferrous metals, Optics and optical measurements, Physics. Chemistry, Magnetic materials, Solar energy engineering, Galvanic cells and batteries, Organic chemicals, Non-metalliferous minerals, Ceramics, Education, Vocabularies, Integrated circuits. Microelectronics, Sugar. Sugar products. Starch, Test conditions and procedures in general, Road vehicle systems, Rectifiers. Convertors. Stabilized power supply, Cinematography, Components for electrical equipment, Jewellery, Electricity. Magnetism. Electrical and magnetic measurements, Cutting tools, Particle size analysis. Sieving, Products of the chemical industry, Production of metals, Electrical equipment for working in special conditions, Graphical symbols, Chipless working equipment, Energy and heat transfer engineering in general.

British Standards Institution (BSI), Crystal enthalpy

BS EN ISO 11357-3:2013 Plastics. Differential scanning calorimetry (DSC). Determination of temperature and enthalpy of melting and crystallization
BS ISO 18373-2:2008 Rigid PVC pipes - Differential scanning calorimetry (DSC) method - Measurement of the enthalpy of fusion of crystallites
BS EN ISO 11357-3:2018 Tracked Changes. Plastics. Differential scanning calorimetry (DSC). Determination of temperature and enthalpy of melting and crystallization
BS EN ISO 11979-7:2018 Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for the correction of aphakia
BS EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Phakic intraocular lenses
23/30453001 DC BS EN ISO 11979-7. Ophthalmic implants. Intraocular lenses - Part 7. Clinical investigations of intraocular lenses for the correction of aphakia
BS EN ISO 11979-10:2018 Tracked Changes. Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
BS EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Crystal units with thermistors
BS EN 120003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing
BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
BS IEC 60747-7:2011 Semiconductor devices. Discrete devices. Bipolar transistors
BS IEC 60747-7:2010 Semiconductor devices. Discrete devices. Bipolar transistors
BS IEC 60747-7:2010+A1:2019 Semiconductor devices. Discrete devices - Bipolar transistors

Association Francaise de Normalisation, Crystal enthalpy

NF T51-507-3:2013 Plastics - Differential scanning calorimetry (DSC) - Part 3: determination of temperature and enthalpy of melting and crystallization
NF T51-507-3*NF EN ISO 11357-3:2018 Plastics - Differential scanning calorimetry (DSC) - Part 3 : determination of temperature and enthalpy of melting and crystallization
NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
NF EN 120003:1992 Spécification particulière cadre : phototransistors, transistors photodarlington, réseaux de phototransistors
NF EN ISO 11979-7:2018 Implants ophtalmiques - Lentilles intraoculaires - Partie 7 : investigations cliniques de lentilles intraoculaires pour la correction de l'aphakie
NF S94-750-7*NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7 : clinical investigations of intraocular lenses for the correction of aphakia
NF EN ISO 11979-10:2018 Implants ophtalmiques - Lentilles intraoculaires - Partie 10 : Investigations cliniques de lentilles intraoculaires pour la correction de l'amétropie des yeux phaques
NF S94-750-10*NF EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10 : Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
NF C96-611/A1:1972 Semiconductors Junction transistors Particular Standard Sheets
NF S94-750-10:2006 Ophthalmic implants - Intraocular lenses - Part 10 : phakic intraocular lenses.
NF S94-750-10/A1:2014 Ophthalmic implants - Intraocular lenses - Part 10 : phakic intraocular lenses - Amendment 1

American Society for Testing and Materials (ASTM), Crystal enthalpy

ASTM D3418-12e1 Standard Test Method for Transition Temperatures and Enthalpies of Fusion and Crystallization of Polymers by Differential Scanning Calorimetry
ASTM D3418-12 Standard Test Method for Transition Temperatures and Enthalpies of Fusion and Crystallization of Polymers by Differential Scanning Calorimetry
ASTM E793-01 Standard Test Method for Enthalpies of Fusion and Crystallization by Differential Scanning Calorimetry
ASTM E793-95 Standard Test Method for Enthalpies of Fusion and Crystallization by Differential Scanning Calorimetry
ASTM E793-06(2018) Standard Test Method for Enthalpies of Fusion and Crystallization by Differential Scanning Calorimetry
ASTM E793-06 Standard Test Method for Enthalpies of Fusion and Crystallization by Differential Scanning Calorimetry
ASTM E341-08(2020) Standard Practice for Measuring Plasma Arc Gas Enthalpy by Energy Balance
ASTM E341-96(2002) Standard Practice for Measuring Plasma Arc Gas Enthalpy by Energy Balance
ASTM E341-96 Standard Practice for Measuring Plasma Arc Gas Enthalpy by Energy Balance
ASTM E341-08 Standard Practice for Measuring Plasma Arc Gas Enthalpy by Energy Balance
ASTM E341-08(2015) Standard Practice for Measuring Plasma Arc Gas Enthalpy by Energy Balance
ASTM D3418-21 Standard Test Method for Transition Temperatures and Enthalpies of Fusion and Crystallization of Polymers by Differential Scanning Calorimetry
ASTM F2625-10 Standard Test Method for Measurement of Enthalpy of Fusion, Percent Crystallinity, and Melting Point of Ultra-High-Molecular Weight Polyethylene by Means of Differential Scanning Calorimetry
ASTM F2625-10(2016) Standard Test Method for Measurement of Enthalpy of Fusion, Percent Crystallinity, and Melting Point of Ultra-High-Molecular Weight Polyethylene by Means of Differential Scanning Calorimetry
ASTM F2625-07 Standard Test Method for Measurement of Enthalpy of Fusion, Percent Crystallinity, and Melting Point of Ultra-High-Molecular Weight Polyethylene by Means of Differential Scanning Calorimetry

ESDU - Engineering Sciences Data Unit, Crystal enthalpy

ESDU 86007 B-2003 Heat capacity and enthalpy of liquids: alkanes.
ESDU 75015 A-2003 Heat capacity and enthalpy of liquids: aromatic hydrocarbons.
ESDU 79028 B-2005 Heat capacity and enthalpy of liquids: aliphatic alcohols.
ESDU 79028 A-2003 Heat capacity and enthalpy of liquids: Aliphatic alcohols
ESDU 76010 B-2003 Heat capacity and enthalpy of liquids: halogenated methanes.
ESDU 81030 A-2003 Heat capacity and enthalpy of liquids: aliphatic ketones.
ESDU 86023 A-2003 Heat capacity and enthalpy of liquids: alkenes and alkadienes.
ESDU 77007 A-2003 Heat capacity and enthalpy of liquids: halogenated ethanes and ethylenes.
ESDU 85024 A-2003 Heat capacity and enthalpy of liquids: organic sulphur compounds (thiols and sulphides).

Natural Gas Processor's Association (NGPA), Crystal enthalpy

GPA RR-3-1971 Enthalpy and Entropy of Non-Polar Liquids at Low Temperatures
GPA RR-37-1979 Enthalpy Measurements on Synthetic Gas Systems: Hydrogen-Methane Hydrogen-Carbon Monoxide
GPA RR-130-1995 Thermodynamically Consistent Model for the Prediction of Solubilities and Enthalpies of Solution of Acid Gases in Aqueous Alkanolamine Solutions

工业和信息化部, Crystal enthalpy

YS/T 1257-2018 Differential scanning calorimetry for melting and crystallization enthalpy tests of non-ferrous metal materials
JC/T 2613-2021 Ti:sapphire laser crystal
SJ/T 11199-2016 Piezoelectric quartz crystal sheet
JC/T 2416-2017 Relaxor ferroelectric crystal materials
XB/T 516-2021 Yttrium lutetium silicate crystal recycling material
SH/T 1826-2019 Determination of melting enthalpy, crystallinity and melting temperature of plastic ultra-high molecular weight polyethylene (PE-UHMW) materials and products by differential scanning calorimetry (DSC)

Group Standards of the People's Republic of China, Crystal enthalpy

T/CSIQ 72003-2020 Rigid PVC pipes—Measurement of enthalpy of fusion of crystallites—Differential scanning calorimetry (DSC) method
T/CECA 48-2021 Quartz Crystal Microbalance Element
T/QGCML 1655-2023 Thin film transistor LCD
T/CSTM 00316-2022 Optoelectric single crystals - Lithium tantalate single crystals for pyroelectric infrared detection
T/CAB 0180-2022 Measurement method for characteristic parameters of GAGG crystal and crystal array
T/ZZB 0916-2018 Gyromagnetic polycrystalline ferrite
T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
T/CPIA 0037-2022 Specifications for Photovoltaic Crystalline Wafers
T/CECA 72-2022 Gyromagnetic polycrystalline ferrite materials
T/HEBQIA 135-2022 OC1409 Constant Temperature Crystal Oscillator
T/VSAC 001-2023 Appraisal of Mineral Crystal Ornamental Stones
T/SZBX 061-2021 Crystalline silicon photovoltaic module with low degradation
T/CSTM 00035-2020 Cerium-doped yttrium oxyorthosilicate scintillation crystal
T/ZZB 0091-2016 Crystalline silicon terrestrial photovoltaic(PV) modules
T/HEBQIA 073-2022 Superconducting magnets for Czochralski monocrystalline silicon
T/COEMA 002LCD-2022 Polarizer film of low moisture permeability for TFT-LCD

Korean Agency for Technology and Standards (KATS), Crystal enthalpy

KS M ISO 11357-3:2018 Plastics — Differential scanning calorimetry(DSC) — Part 3: Determination of temperature and enthalpy of melting and crystallization
KS M ISO 11357-3:2013 Plastics — Differential scanning calorimetry (DSC) — Part 3: Determination of temperature and enthalpy of melting and crystallization
KS M ISO 11357-3:2003 Plastics -Differential scanning calorimetry (DSC) -Part 3:Determination of temperature and enthalpy of melting and crystallization
KS C 7021-1974(2001) GENERAL RULES FOR TRANSISTORS
KS C 7021-1985 GENERAL RULES FOR TRANSISTORS
KS C 6506-1983 Synthetic Quartz Crysta1
KS M 1401-2017(2022) Sodium sulfite(crystal)
KS C 6506-1983(2008) Synthetic Quartz Crysta1
KS P ISO 11979-7:2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS C 6503-1999 Quartz crystal units for oscillators
KS C 6024-1995(2000) MEASURING METHODS FOR TRANSISTORS
KS C 8531-2005 Crystalline solar cell module
KS C 6503-1984 Quartz crystal units for oscillators
KS C 6024-1985 MEASURING METHODS FOR TRANSISTORS
KS P ISO 11979-10:2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
KS C 6504-1987(2017) Ovens for Quartz Crystal Units
KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS C 8531-1995 Crystalline solar cell module
KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
KS C 6504-1987(2022) Ovens for Quartz Crystal Units
KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors
KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60747-7:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 60747-7:2017 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C 6504-1987 Ovens for Quartz Crystal Units
KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
KS B 3620-2012 Polycrystalline diamond dies for wire drawing
KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-9-2016(2021) Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units

KR-KS, Crystal enthalpy

KS M ISO 11357-3-2018 Plastics — Differential scanning calorimetry(DSC) — Part 3: Determination of temperature and enthalpy of melting and crystallization
KS P ISO 11979-7-2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS P ISO 11979-10-2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60122-4-2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

European Committee for Standardization (CEN), Crystal enthalpy

EN ISO 11357-3:2018 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
EN ISO 11357-3:2013 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
prEN ISO 11979-7 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO/DIS 11979-7:2023)
EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
HD 302 S1-1977 Transistorized ballast for fluorescent lamps

International Organization for Standardization (ISO), Crystal enthalpy

ISO 11357-3:2011 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
ISO 11357-3:1999 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
ISO 11357-3:2018 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
ISO 18373-2:2008 Rigid PVC pipes - Differential scanning calorimetry (DSC) method - Part 2: Measurement of the enthalpy of fusion of crystallites
ISO 11357-3:1999/Amd 1:2005 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization; Amendment 1
ISO/DIS 11979-7 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
ISO/FDIS 11979-7:2011 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses- Part 10:Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
ISO 11979-1:2018 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
ISO 11979-9:2006 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
ISO 11979-10:2006/Amd 1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses; Amendment 1
ISO 11979-9:2006/Amd 1:2014 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses; Amendment 1

Professional Standard - Medicine, Crystal enthalpy

YY/T 0815-2010 Standard test method for measurement of enthalpy of fusion, percent crystallinity ，and melting point of ultra-high-molecular weight polyethylene by means of differential scanning calorimetry
YY 0290.10-2009 Intraocular lenses.Part 10:Phakic intraocular lenses
YY/T 0295.11-1997 Capsulotomy forceps
YY 0290.9-2010 Ophthalmic implants.Intraocular lenses.Part 9 :Multifocal intraocular lenses
YY 0290.1-1997 Intraocular Ienses.Part 1:Terminology

Danish Standards Foundation, Crystal enthalpy

DS/EN ISO 11357-3:2013 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization
DS/EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
DS/EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
DS/IEC 458:1981 Transistorized ballasts for tubular fluorescent lamps

American National Standards Institute （ANSI), Crystal enthalpy

ANSI Z80.13-2007 Phakic Intraocular Lenses
ANSI/EIA 417-A:1991 Crystal Outlines
ANSI Z80.29-2015 Ophthalmics – Accommodative Intraocular Lenses

RU-GOST R, Crystal enthalpy

GOST R 56724-2015 Plastics. Differential scanning calorimetry (DSC). Part 3. Determination of temperature and enthalpy of melting and crystallization

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Crystal enthalpy

GB/T 19466.3-2004 Plastics-Differential scanning calorimetry(DSC)-Part 3:Determination of temperature and enthalpy of melting and crystallization
GB 9558-2001 Crystallo-dimethoate
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2023 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display
GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
GB/T 3352-1994 Synthetic quartz crystal
GB/T 3351~353-1982 artificial quartz crystal
GB/T 8553-1987 Holders (Enclosures), crystal, general specification for
GB/T 8553-2023 General specifications for crystal boxes
GB/T 8756-1988 Collection of metallographs on defects of crystalline germanium
GB/T 31958-2015 Substrate glass for thin film transistor liquid crystal display device
GB 51136-2015 Specifications for factory design of thin film transistor liquid crystal display
GB/T 6628-1996 Lumbered synthetic quartz crystal
GB/T 7895-1987 Optical grade synthetic quartz crystal
GB/T 7895-2008 Optical grade synthetic quartz crystal
GB/T 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 26762-2011 Crystalline fructose and solid fructose-glucose
GB 6430-1986 Crystal box model nomenclature
GB/T 16863-1997 Method for testing refractive index of crystals
GB/T 12633-1990 Terms for the measurements of the properties of the piezoelectric crystals
GB 12274-1990 Quartz crystal controlled oscillators Generic specificatoin for
GB/T 3353-1995 Guide to the use of synthetic quartz crystal

Professional Standard - Aerospace, Crystal enthalpy

QJ 1814-1989 Standard Molar Enthalpy of Formation of Related Components of Composite Solid Propellants

ES-UNE, Crystal enthalpy

UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
UNE-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN 168100:1993 SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
UNE-EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)

HU-MSZT, Crystal enthalpy

SE-SIS, Crystal enthalpy

SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays
SIS SEN 43 60 01-1964 Quartz crystal units for oscillators
SIS SS-CECC 68000-1991 Generic specification: Quartz crystal units

RO-ASRO, Crystal enthalpy

STAS 9675-1974 CRYSTALLINE SILICON
STAS 11437-1980 UNI.IONCTION TRANSISTORS Methods de test
STAS 11418-1980 Semiconductor devices UNIJUNCTION TRANSISTORS Terminology

AENOR, Crystal enthalpy

UNE-EN ISO 11357-3:2013 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization (ISO 11357-3:2011)
UNE-EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
UNE-EN ISO 11979-10:2007/A1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/Amd 1:2014)
UNE-EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006)

German Institute for Standardization, Crystal enthalpy

DIN EN ISO 11357-3:2018 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization (ISO 11357-3:2018)
DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
DIN EN ISO 11979-7:2018-08 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018); German version EN ISO 11979-7:2018
DIN 52341:1993 Testing of glass; chemical analysis of lead crystal glass and crystal glass
DIN EN ISO 11979-7:2023-04 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO/DIS 11979-7:2023); German and English version prEN ISO 11979-7:2023 / Note: Date of issue 2023-03-03*Intended as replace...
DIN EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018)
DIN EN ISO 11979-10:2018-08 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018); German version EN ISO 11979-10:2018
DIN 4000-19:1988-12 Tabular layouts of article characteristics for transistors and thyristors
DIN EN ISO 11357-3:2013 Plastics - Differential scanning calorimetry (DSC) - Part 3: Determination of temperature and enthalpy of melting and crystallization (ISO 11357-3:2011); German version EN ISO 11357-3:2013
DIN EN IEC 60122-4:2019-10 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019); German version EN IEC 60122-4:2019
DIN EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018)
DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
DIN EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007

Professional Standard - Machinery, Crystal enthalpy

JB/T 9495.1-1999 Optical Crystals
JB/T 10789-2007 High pressure crystal growing furnaces.TDR-GY-series high pressure crystal growing furnaces by liquid-encapsulated czoctn-alski method
JB/T 5482-2011 X-ray orientation apparatus
JB/T 8951.1-1999 Insulated gate bipolar transistor
JB/T 11375-2013 Ultra-micro crystal projection screen

中华人民共和国国家质量监督检验检疫总局, Crystal enthalpy

GB/T 9558-2001 Crystallo-dimethoate

European Standard for Electrical and Electronic Components, Crystal enthalpy

EN 120003:1992 Blank detail specification: phototransistors, photodarlington transistors, phototransistor arrays

Taiwan Provincial Standard of the People's Republic of China, Crystal enthalpy

CNS 1996-1978 Stannic Chloride, Crystal (Tin Tetraclrloride Crystals)
CNS 12257-1988 Crystal Filters
CNS 6808-1989 General Rules for Transistors
CNS 3997-1989 Method of Test for Transistors
CNS 11763-1986 Transistor Megaphones
CNS 3009-1994 Simple Type Transistor Radios
CNS 3010-1994 General Type Transistor Radios
CNS 12256-1988 Ovens for Quartz Crystal Units
CNS 6809-1989 Outlines Drawing Methods for Transistors

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Crystal enthalpy

JEDEC JES2-1992 Transistor, Gallium Arsenide Power Fet, Generic Specification
JEDEC JESD10-1976 Low Frequency Power Transistors
JEDEC EIA-398-1972 Measurement of Small Values of Transistor Capacitance
JEDEC JESD6-1967 Measurement of Small Values of Transistor Capacitance

Lithuanian Standards Office , Crystal enthalpy

LST EN 120003-2001 Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
LST EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
LST EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses (ISO 11979-9:2006)

CZ-CSN, Crystal enthalpy

CSN 68 5401-1981 Sodium sulphate rystalliform
CSN 68 5367-1974 Potassium hydrogensulphate crystallic
CSN 65 3127-1963 Crystallic sodium sulphate, technical
CSN 65 3460-1961 Zinc sulphate, crystalic. technical
CSN 35 8813-1979 Tranaiators KU 611, KU 612
CSN 35 8812-1979 Transistore KU 601, KU 602
CSN 35 8936-1960 Holders of piezoelectrio crystal resonators
CSN 01 5111-1974 Sampling of loose and grained materials
CSN 35 8738-1964 Transistore. Measurement of reverse voltages
CSN 35 8750-1964 Transistore. Measurement of h-parameters
CSN 35 8821-1980 Transistore BF 257, BF 258. BF 250
CSN 35 8814-1979 Transistore KD 501, KB 502, KD 503
CSN 35 8930-1960 Holders of piezoelectric crystal resonators
CSN 35 8756-1973 Semiconductor devices. Transistors Measurement of y-parameters
CSN 35 8740-1973 Semiconduotor deviees. Transistore. Measurement of saturation voltage
CSN 35 8909-1962 Transistors. Measurement of reaction impedance
CSN 35 8757 Cast.9-1986 Transistors. Methods for measurement of thermal resistance
CSN 70 8311-1988 Crystal lead glass treated with cutting
CSN 35 8748-1964 Transistors. Measurement of reaction impedance
CSN 35 8912-1962 Transistors. Measurement of reaction impedance

Professional Standard - Light Industry, Crystal enthalpy

QB/T 1173-2002 Monocrystal rock sugar
QB/T 1174-2002 Multicrystal rock sugar
QB/T 1173-1991 Monocrystal rock sugar
QB/T 1174-1991 Multicrystal rock sugar

Professional Standard - Building Materials, Crystal enthalpy

JC/T 2017-2010 Lead fluoride crystal
JC/T 2023-2010 Lesd tungstate scintillation crystals
JC/T 2148-2012 Langasite piezoelectric crystal
JC/T 2690-2022 Magneto-optic crystals of terbium gallium garnet (TGG)

Japanese Industrial Standards Committee (JISC), Crystal enthalpy

JIS C 6703:2008 Crystal filters
JIS C 6704:2017 Synthetic quartz crystal
JIS C 6704:1997 Synthetic quartz crystal
JIS C 6704:2005 Synthetic quartz crystal
JIS C 6704:2009 Synthetic quartz crystal
JIS C 5513:1970 Transistor megaphones
JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
JIS C 8918:2013 Crystalline photovoltaic (PV) modules
JIS C 6701:1995 Quartz crystal units for oscillators
JIS C 6703:1995 General rules of crystal filters
JIS C 8918:1998 Crystalline solar PV modules
JIS C 6705:1984 Quartz crystal units for oscillators (for from 200 to 1000 kHz)
JIS C 7030:1993 Measuring methods for transistors
JIS C 7032:1993 General rules for transistors
JIS C 6703:2002 Generic specification of crystal filters
JIS C 7311:1980 Reliability assured TTL, positive nand gates, integrated circuits
JIS C 8939:1995 Amorphous solar PV modules
JIS H 7004:1990 Glossary of terms used in amorphous metals
JIS B 4131:1998 Diamond/CBN products -- Diamond or CBN grinding wheels
JIS H 7803:2005 General rules for the determination of particle size and crystallite size in metal catalysts
JIS B 4130:1998 Diamond/CBN products -- Grain sizes of diamond or cubic boron nitride
JIS B 4138:1998 Diamond/CBN products -- Diamond or CBN segmented saws
JIS C 6702:1992 Ovens for quartz crystal units

Guizhou Provincial Standard of the People's Republic of China, Crystal enthalpy

DB52/ 455-2004 capsaicin crystals

轻工业部, Crystal enthalpy

QB 1173-1991 Single crystal rock sugar
QB 1174-1991 polycrystal rock sugar

U.S. Military Regulations and Norms, Crystal enthalpy

ARMY MIL-PRF-55310/18 F-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-P-46320 C (4)-1972 POWER SUPPLY: 10516158 (TRANSISTORIZED)
ARMY MIL-P-46320 C-1963 POWER SUPPLY: 10516158 (TRANSISTORIZED)
ARMY QPL-46320-30-1992 POWER SUPPLY, 10516158 (TRANSISTORIZED)
ARMY MIL-PRF-3098/84 F-2013 CRYSTAL UNITS, QUARTZ, CR108/U
ARMY MIL-PRF-3098/95 E VALID NOTICE 2-2013 Crystal Unit, Quartz, CR119/U
ARMY MIL-PRF-55310/29 C-2011 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, HCMOS
ARMY MIL-PRF-55310/34 C-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/38 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 150 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
ARMY MIL-PRF-55310/28 C VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
ARMY MIL-PRF-55310/30 D VALID NOTICE 1-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
ARMY MIL-PRF-3098/16 H VALID NOTICE 1-2008 Crystal Unit, Quartz, CR36/U
ARMY MIL-PRF-3098/17 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR37/U
ARMY MIL-PRF-3098/21 G VALID NOTICE 1-2008 Crystal Unit, Quartz, CR42/U
ARMY MIL-PRF-3098/25 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR46/U
ARMY MIL-PRF-3098/26 G VALID NOTICE 1-2008 Crystal Unit, Quartz, CR47/U
ARMY MIL-PRF-3098/30 F VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR52/U
ARMY MIL-PRF-3098/32 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR54/U
ARMY MIL-PRF-3098/33 J VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR55/U
ARMY MIL-PRF-3098/36 E VALID NOTICE 1-2008 Crystal Unit, Quartz, CR58/U
ARMY MIL-PRF-3098/37 J VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR59/U
ARMY MIL-PRF-3098/38 G VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR60/U
ARMY MIL-PRF-3098/41 H VALID NOTICE 1-2008 Crystal Unit, Quartz, CR63/U
ARMY MIL-PRF-3098/45 J VALID NOTICE 1-2008 Crystal Unit, Quartz, CR67/U
ARMY MIL-PRF-3098/47 J VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR69/U
ARMY MIL-PRF-3098/63 F VALID NOTICE 1-2008 CRYSTAL UNIT, QUARTZ, CR79/U
ARMY MIL-PRF-3098/95 E VALID NOTICE 1-2008 Crystal Unit, Quartz, CR119/U
ARMY MIL-PRF-3098/103 E VALID NOTICE 1-2008 Crystal Unit, Quartz, CR101/U
ARMY MIL-PRF-3098/109 E VALID NOTICE 1-2008 Crystal Unit, Quartz, CR130/U
ARMY MIL-PRF-3098/146 C VALID NOTICE 1-2008 Crystal Unit, Quartz, CR165/U
ARMY MIL-PRF-3098/3 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR18/U
ARMY MIL-PRF-3098/4 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR19/U
ARMY MIL-PRF-3098/7 H VALID NOTICE 1-2008 Crystal Unit, Quartz, CR25/U
ARMY MIL-PRF-3098/8 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR26/U
ARMY MIL-PRF-3098/9 G VALID NOTICE 1-2008 Crystal Unit, Quartz, CR27/U
ARMY MIL-PRF-3098/10 G VALID NOTICE 1-2008 Crystal Unit, Quartz, CR28/U
ARMY MIL-PRF-3098/14 F VALID NOTICE 1-2008 Crystal Unit, Quartz, CR33/U
ARMY MIL-PRF-3098/15 G VALID NOTICE 1-2008 Crystal Unit, Quartz, CR35/U
ARMY QPL-55310-70-2008 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098/103 F-2010 CRYSTAL UNIT, QUARTZ, CR101/U
ARMY MIL-PRF-3098/109 F-2010 CRYSTAL UNIT, QUARTZ, CR130/U
ARMY MIL-PRF-3098/146 D-2010 CRYSTAL UNIT, QUARTZ, CR165/U
ARMY MIL-PRF-3098/62 G-2010 CRYSTAL UNIT, QUARTZ, CR78/U
ARMY MIL-PRF-3098/63 G-2010 CRYSTAL UNIT, QUARTZ, CR79/U
ARMY MIL-PRF-3098/68 G-2010 CRYSTAL UNIT, QUARTZ, CR91/U
ARMY MIL-PRF-3098/72 F-2010 CRYSTAL UNIT, QUARTZ, CR97/U
ARMY MIL-PRF-3098/77 F-2010 CRYSTAL UNIT, QUARTZ, CR5/U
ARMY MIL-PRF-3098/78 F-2010 CRYSTAL UNIT, QUARTZ, CR6/U
ARMY MIL-PRF-3098/54 G-2010 CRYSTAL UNIT, QUARTZ, CR73/U
ARMY MIL-PRF-3098/56 H-2010 CRYSTAL UNIT, QUARTZ, CR85/U
ARMY MIL-PRF-3098/58 J-2010 CRYSTAL UNIT, QUARTZ, CR81/U
ARMY MIL-PRF-3098/59 G-2010 CRYSTAL UNIT, QUARTZ, CR82/U
ARMY MIL-PRF-3098/60 H-2010 CRYSTAL UNIT, QUARTZ, CR83/U
ARMY MIL-PRF-3098/67 F-2010 CRYSTAL UNIT, QUARTZ, CR89/U
ARMY MIL-PRF-3098/38 H-2010 CRYSTAL UNIT, QUARTZ, CR60/U
ARMY MIL-PRF-3098/39 H-2010 CRYSTAL UNIT, QUARTZ, CR61/U
ARMY MIL-PRF-3098/40 G-2010 CRYSTAL UNITS, QUARTZ, CR62/U
ARMY MIL-PRF-3098/41 J-2010 CRYSTAL UNIT, QUARTZ, CR63/U
ARMY MIL-PRF-3098/42 K-2010 CRYSTAL UNIT, QUARTZ, CR64/U
ARMY MIL-PRF-3098/43 H-2010 CRYSTAL UNIT, QUARTZ, CR65/U
ARMY MIL-PRF-3098/45 K-2010 CRYSTAL UNIT, QUARTZ, CR67/U
ARMY MIL-PRF-3098/47 K-2010 CRYSTAL UNIT, QUARTZ, CR69/U
ARMY MIL-PRF-3098/50 E-2010 CRYSTAL UNIT, QUARTZ, CR72/U
ARMY MIL-PRF-3098/51 J-2010 CRYSTAL UNIT, QUARTZ, CR74/U
ARMY MIL-PRF-3098/52 H-2010 CRYSTAL UNIT, QUARTZ, CR75/U
ARMY MIL-PRF-3098/53 M-2010 CRYSTAL UNIT, QUARTZ, CR76/U
ARMY MIL-PRF-3098/3 G-2010 CRYSTAL UNIT, QUARTZ, CR18/U
ARMY MIL-PRF-3098/4 G-2010 CRYSTAL UNIT, QUARTZ, CR19/U
ARMY MIL-PRF-3098/7 J-2010 CRYSTAL UNIT, QUARTZ, CR25/U
ARMY MIL-PRF-3098/8 G-2010 CRYSTAL UNIT, QUARTZ, CR26/U
ARMY MIL-PRF-3098/9 H-2010 CRYSTAL UNIT, QUARTZ, CR27/U
ARMY MIL-PRF-3098/10 H-2010 CRYSTAL UNIT, QUARTZ, CR28/U
ARMY MIL-PRF-3098/14 G-2010 CRYSTAL UNIT, QUARTZ, CR33/U
ARMY MIL-PRF-3098/15 H-2010 CRYSTAL UNIT, QUARTZ, CR35/U
ARMY MIL-PRF-3098/16 J-2010 CRYSTAL UNIT, QUARTZ, CR36/U
ARMY MIL-PRF-3098/17 G-2010 CRYSTAL UNIT, QUARTZ, CR37/U
ARMY MIL-PRF-3098/21 H-2010 CRYSTAL UNIT, QUARTZ, CR42/U
ARMY MIL-PRF-3098/24 F-2010 CRYSTAL UNIT, QUARTZ, CR45/U
ARMY MIL-PRF-3098/25 G-2010 CRYSTAL UNIT, QUARTZ, CR46/U
ARMY MIL-PRF-3098/26 H-2010 CRYSTAL UNIT, QUARTZ, CR47/U
ARMY MIL-PRF-3098/30 G-2010 CRYSTAL UNIT, QUARTZ, CR52/U
ARMY MIL-PRF-3098/32 G-2010 CRYSTAL UNIT, QUARTZ, CR54/U
ARMY MIL-PRF-3098/33 K-2010 CRYSTAL UNIT, QUARTZ, CR55/U
ARMY MIL-PRF-3098/34 J-2010 CRYSTAL UNIT, QUARTZ, CR56/U
ARMY MIL-PRF-3098/36 F-2010 CRYSTAL UNIT, QUARTZ, CR58/U
ARMY MIL-PRF-3098/37 K-2010 CRYSTAL UNIT, QUARTZ, CR59/U
ARMY QPL-55310-71-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY QPL-55310-74-2010 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098 K-2010 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098 K (1)-2011 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098 K (1) SUPP 1-2013 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR
ARMY MIL-PRF-55310/36 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Crystal enthalpy

IEEE 176-1949 STANDARDS ON PIEZOELECTRIC CRYSTALS
IEEE 180-1962 STANDARDS ON PIEZOELECTRIC AND FERROELECTRIC CRYSTALS: DEFINITIONS OF FERROELECTRIC CRYSTAL TERMS 1962 (62 IRE 14.S1)
IEEE 218-1956 STANDARD METHODS OF TESTING TRANSISTORS

Electronic Components, Assemblies and Materials Association, Crystal enthalpy

ECA 417-A-1991 Crystal Outlines

Professional Standard - Education, Crystal enthalpy

JY 200-1985 Transistor millivoltmeter
JY/T 0006-2011 Transistor Characteristic Tracer

国家市场监督管理总局、中国国家标准化管理委员会, Crystal enthalpy

GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals
GB/T 37398-2019 Barium fluoride scintillation crystal
GB/T 8756-2018 Collection of metallographs on defects of germanium crystal
GB/T 39131-2020 Terms and definitions of synthetic crystal materials
GB/T 36648-2018 Specification for TFT liquid crystal monomers
GB/T 36647-2018 Specification for liquid crystal monomers
GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
GB/T 41325-2022 Low density crystal originated pit polished monocrystalline silicon wafers for integrated circuit

YU-JUS, Crystal enthalpy

JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15
JUS N.R1.373-1980 Semiconductor ?iodes. Essentialratings and characteristics. Low-power signaldiodes
JUS N.R1.390-1979 Bipolar tnmmton. Etsential ratings and chancteristics: bw-power signal transistors
JUS N.R1.450-1981 Bipolar transistors. Measuring methods
JUS N.R1.352-1979 Letter symbohfor semkonductor devices. Thyristors.
JUS N.R9.074-1986 Piezoelectric vibrators. Ouartz crystal units. Two wire crystal holder outline, type 19
JUS N.R9.072-1986 Piezoe/ectric vibrators. Ctuartz crystal units. Two wfre crystaf holder outline, type 16
JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20
JUS N.R9.076-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal hotder outllne, type08
JUS N.R9.075-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal holder outline, type 10
JUS N.R9.078-1986 Piezoelectric vibrators. Quartz crystal units. Turo wire crystal holder outline, type 21

AR-IRAM, Crystal enthalpy

IRAM 17 724-1963

TR-TSE, Crystal enthalpy

TS 2319-1976 Quartz Crystal Units For Oscilators

Professional Standard - Electron, Crystal enthalpy

SJ/T 11199-1999 Piezoelectric quartz crystal blanks
SJ/Z 9155.2-1987 Quartz crystal oscillator Part 2: Guide to the use of quartz crystal oscillator
SJ/T 10639-1995 Quartz crystal unit terms
SJ 1852-1981 Terms for quartz crystal controlled oscillators
SJ/T 10333-1993 Methods of measurement for uni-junction transistors
SJ/T 2217-2014 Technical specification for phototransistor of silicon

PL-PKN, Crystal enthalpy

PN T01504 ArkusZ30-1975 Transistors hnb measurement
PN T01504 ArkusZ23-1974 Transistors Parameters [y] measurements
PN T01208-03-1992 Semiconductor devices Bipolar transistors Measuring methods

Hebei Provincial Standard of the People's Republic of China, Crystal enthalpy

DB13/T 1288-2010 Crystalline silicon solar cells
DB13/T 2255-2015 Crystalline silicon solar all-glass module

Defense Logistics Agency, Crystal enthalpy

DLA MIL-S-19500/529 VALID NOTICE 4-2011 Semiconductor Device, Transistor, Silicon Type 2N3904
DLA MIL-S-19500/244 B VALID NOTICE 3-2011 Transistor, PNP, Germanium Type 2N2273
DLA MIL-S-19500/216 A VALID NOTICE 3-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON TYPE 2N1051
DLA MIL-S-19500/273 A VALID NOTICE 3-2011 Semiconductor Device, Transistor Type Type 2N744
DLA MIL-S-19500/303 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N2631 and 2N2876
DLA MIL-S-19500/248 A VALID NOTICE 4-2011 Transistor, NPN, Silicon Types 2N2015, 2N2016
DLA MIL-M-38510/114 B VALID NOTICE 1-2008 MICROCIRCUITS, LINEAR, BI-FET OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
DLA MIL-PRF-19500/139 B NOTICE 2-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE JAN-2N1119
DLA MIL-S-19500/288 (2)-1966 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON TYPE 2N2377
DLA MIL-S-19500/288 VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N2377
DLA MIL-S-19500/170 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Type 2N1499A
DLA MIL-S-19500/179 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Silicon Type 2N1234
DLA MIL-S-19500/216 A VALID NOTICE 4-2011 Semiconductor Device, Transistor, NPN, Silicon Type 2N1051
DLA MIL-S-19500/40 B VALID NOTICE 3-2011 Semiconductor, Transistor, NPN, Germanium, Power Type 2N326
DLA SMD-5962-90798-1992 MICROCIRCUITS, DIGITAL, FAST, CMOS, DUAL ODD-PARITY GENERATOR/CHECKERS, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-85508 REV C-2005 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, MULTIPLEXER, MONOLITHIC SILICON
DLA SMD-5962-86708 REV A-2007 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, HIGH SPEED REGISTER, MONOLITHIC SILICON
DLA MIL-PRF-55310/21 F-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA MIL-PRF-55310/21 G-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 60.0 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
DLA MIL-PRF-19500/210 B NOTICE 1-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, PHOTO TYPE 2N986
DLA MIL-S-19500/72 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium Types 2N499 and 2N499A
DLA MIL-S-19500/49 C VALID NOTICE 4-2011 Semiconductor Device, Transistor, PNP, Germanium, Types 2N464, 2N465, 2N467
DLA MIL-S-19500/173 A VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N389 and 2N424 (Navy)
DLA MIL-S-19500/215 VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N1173 and 2N1174 (Navy)
DLA QPL-3098-91-2006 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-92-2008 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-93-2010 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-95-2010 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-97-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-98-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-99-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA DSCC-DWG-04029-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5927
DLA DSCC-DWG-04030-2005 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE 2N5926

International Electrotechnical Commission (IEC), Crystal enthalpy

IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
IEC 60747-7:2000 Semiconductor devices - Part 7: Bipolar transistors
IEC 60747-8:2000 Semiconductor devices - Part 8: Field-effect transistors

未注明发布机构, Crystal enthalpy

BS EN ISO 11979-9:2006+A1:2014 Ophthalmic implants — Intraocular lenses — Part 9 : Multifocal intraocular lenses
DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators

Professional Standard - Chemical Industry, Crystal enthalpy

HG/T 4357-2012 Polarizer for the thin film transistor-Liquid crystal display (TFT-LCD)

United States Navy, Crystal enthalpy

NAVY A-A-51445-1986 KIT, DISPOSABLE, LENSECTOMY

National Metrological Verification Regulations of the People's Republic of China, Crystal enthalpy

JJG 181-2005 Quartz Crystal Frequency Standards

Military Standard of the People's Republic of China-General Armament Department, Crystal enthalpy

GJB 1787-1993 Specifications for Artificial Quartz Crystals
GJB 1648-1993 General specifications for crystal oscillators
GJB 1648-2-2011 Genenral specification for crystal oscillators
GJB 1648A-2011 Genenral specification for crystal oscillators
GJB 2138-1994 General specification for quartz crystal components
GJB 1508A-2021 General specifications for crystal filters
GJB 2138A-2015 General specification for quartz crystal components
GJB 1508-1992 General specification for quartz crystal filters

Indonesia Standards, Crystal enthalpy

SNI 3140.1-2008 Cristal sugar - Part 1: raw sugar

ES-AENOR, Crystal enthalpy

UNE 53-631-1989

ANSI - American National Standards Institute, Crystal enthalpy

Z80.13-2007 Ophthalmics – Phakic Intraocular Lenses (VC)
Z80.7-2002 For Ophthalmic Optics - Intraocular Lenses (VC)
Z80.30-2018 Ophthalmics – Toric Intraocular Lenses
Z80.7-2013 Ophthalmic Optics – Intraocular Lenses (VC)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Crystal enthalpy

GB/T 35316-2017 Collection of metallographs on defects of sapphire crystal
GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

Professional Standard - Agriculture, Crystal enthalpy

GB 9558-1988 Dimethoate powder and crystal dimethoate

Aerospace Industries Association, Crystal enthalpy

AIA NAS 4117-1996 Heat Sink-Insulator, Wafer Type

AIA/NAS - Aerospace Industries Association of America Inc., Crystal enthalpy

NAS4117-1996 Heat Sink-Insulator@ Wafer Type

Institute of Electrical and Electronics Engineers (IEEE), Crystal enthalpy

IEEE Std 176-1949*ANSI C83.3-1951 IEEE Standards on Piezoelectric Crystals, 1949
IEEE Std 218-1956(R1980)*56 IRE 28.S2 IEEE Standard Methods of Testing Transistors

CEN - European Committee for Standardization, Crystal enthalpy

EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

Professional Standard - Commodity Inspection, Crystal enthalpy

SN/T 1175-2003 Methods for the inspection of thin film transistor color liquid crystal display devices for import and export

European Committee for Electrotechnical Standardization（CENELEC）, Crystal enthalpy

EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
HD 302-1975 Transistorized Ballast for Fluorescent Lamps

IN-BIS, Crystal enthalpy

Aerospace Industries Association/ANSI Aerospace Standards, Crystal enthalpy

AIA/NAS NAS 4117-1996 Heat Sink-Insulator, Wafer Type

BE-NBN, Crystal enthalpy

NBN A 14-101-1974

TH-TISI, Crystal enthalpy

TIS 1864-2009 Semiconductor devices.part 7: bipolar transistors