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Scanning Probe System
Scanning Probe System, Total:14 items.
In the international standard classification, Scanning Probe System involves: Machine tools, Linear and angular measurements, Mechanical testing, Analytical chemistry, Education, Non-ferrous metals, Optics and optical measurements, Optical equipment, Vocabularies.
International Organization for Standardization (ISO), Scanning Probe System
- ISO 230-10:2011/Amd 1:2014 Test code for machine tools - Part 10: Determination of the measuring performance of probing systems of numerically controlled machine tools - Amendment 1: Measuring performance with scanning probes
- ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
Association of German Mechanical Engineers, Scanning Probe System
- VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Scanning Probe System
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
National Metrological Technical Specifications of the People's Republic of China, Scanning Probe System
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Education, Scanning Probe System
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
Korean Agency for Technology and Standards (KATS), Scanning Probe System
RU-GOST R, Scanning Probe System
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
British Standards Institution (BSI), Scanning Probe System
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy