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Mass Spec + Molecules

Mass Spec + Molecules, Total:35 items.

In the international standard classification, Mass Spec + Molecules involves: Analytical chemistry, Education, Nuclear energy engineering, Water quality, Raw materials for rubber and plastics.

British Standards Institution (BSI), Mass Spec + Molecules

BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 13084:2018 Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)

International Organization for Standardization (ISO), Mass Spec + Molecules

ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 16564:2004 Rubber, raw natural - Determination of average molecular mass and molecular-mass distribution by size exclusion chromatography (SEC)
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry

KR-KS, Mass Spec + Molecules

Association Francaise de Normalisation, Mass Spec + Molecules

NF ISO 17560:2006 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage du bore dans le silicium par profilage d'épaisseur
NF ISO 14237:2010 Analyse chimique des surfaces - Spectrométrie de masse des ions secondaires - Dosage des atomes de bore dans le silicium à l'aide de matériaux dopés uniformément
NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
NF EN ISO 22125-2:2019 Qualité de l'eau - Technétium-99 - Partie 2 : méthode d'essai par spectrométrie de masse couplée à un plasma induit )

American Society for Testing and Materials (ASTM), Mass Spec + Molecules

ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM C1476-00 Standard Test Method for Analysis of Urin for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry
ASTM E1162-11 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM C1476-06 Standard Test Method for Analysis of Urine for Technetium-99 by Inductively Coupled Plasma-Mass Spectrometry

Professional Standard - Education, Mass Spec + Molecules

JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry

Japanese Industrial Standards Committee (JISC), Mass Spec + Molecules

JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

国家市场监督管理总局、中国国家标准化管理委员会, Mass Spec + Molecules

GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

AT-ON, Mass Spec + Molecules

ONORM M 6603-1-1997 Water analysis - Determination of potassium and sodium by atomic absorption spectrometry
ONORM M 6604-1995 Water analysis - Determination of selenium by atomic absorption spectrometry (hydride technique)

Taiwan Provincial Standard of the People's Republic of China, Mass Spec + Molecules

CNS 8413-2002 Methods of test for chemical, mass spectrometric, spectrochemical, nuclear, and radiochemical analysis of nuclear-grade plutonium nitrate solutions

Standard Association of Australia （SAA）, Mass Spec + Molecules

AS 4873.1:2005 Recommended practice for inductively coupled plasma-mass spectrometry (ICP-MS) - Principles and techniques

Korean Agency for Technology and Standards (KATS), Mass Spec + Molecules

KS M ISO 16564:2007 Rubber, raw natural－Determination of average molecular mass and molecular－mass distribution by size exclusion chromatography(SEC)