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Semiconductor Kelvin Test

Semiconductor Kelvin Test, Total:24 items.

In the international standard classification, Semiconductor Kelvin Test involves: Integrated circuits. Microelectronics, Semiconducting materials, Electrical engineering in general, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor Kelvin Test

• GB/T 42838-2023 Semiconductor Integrated Circuit Hall Circuit Test Method
• GB/T 14028-1992 General principles of measuring methods of analogue switches for semiconductor integrated circuits
• GB 14028-2018 Basic principles of semiconductor integrated circuit analog switch test methods

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Semiconductor Kelvin Test

• GB/T 14028-2018 Semiconductor integrated circuits—Measuring method of analogue switch

American Society for Testing and Materials (ASTM), Semiconductor Kelvin Test

• ASTM F76-86(1996)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-08(2016)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
• ASTM F76-08(2016) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

AT-OVE/ON, Semiconductor Kelvin Test

• OVE EN IEC 63284:2021 Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors (IEC 47/2681/CDV) (english version)
• OVE EN IEC 63275-2:2021 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation (IEC 47/2680/CDV) (english version)
• OVE EN IEC 60749-39:2020 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV) (english version)
• OVE EN IEC 60749-37:2020 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV) (english version)
• OVE EN IEC 60749-10:2021 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (IEC 47/2692/CDV) (english version)

Professional Standard - Aerospace, Semiconductor Kelvin Test

• QJ 2660-1994 Test method for pulse width modulator of semiconductor integrated circuit switching power supply

British Standards Institution (BSI), Semiconductor Kelvin Test

• BS IEC 63284:2022 Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
• BS IEC 62047-40:2021 Semiconductor devices. Micro-electromechanical devices. Test methods of micro-electromechanical inertial shock switch threshold
• 20/30409285 DC BS IEC 63284. Semiconductor devices. Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

International Electrotechnical Commission (IEC), Semiconductor Kelvin Test

• IEC 62047-40:2021 Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold

German Institute for Standardization, Semiconductor Kelvin Test

• DIN EN IEC 60749-39:2021 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 47/2652/CDV:2020); English version prEN IEC 60749-39:2020
• DIN EN IEC 60749-39:2023-10 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021); German version EN IEC 60749-39:2022 / Note: DIN...
• DIN EN 60749-42:2015 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
• DIN EN 62047-21:2015 Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014
• DIN EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 62047-8:2011); German version EN 62047-8:2011

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