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semiconductor testing

semiconductor testing, Total:21 items.

In the international standard classification, semiconductor testing involves: Software development and system documentation, Inorganic chemicals, Semiconductor devices, Linear and angular measurements, Optoelectronics. Laser equipment.

HU-MSZT, semiconductor testing

• MSZ 700/23.lap-1965
• MSZ 700/36.lap-1961
• MNOSZ 700-8.lap-1955
• MSZ 700/27.lap-1962
• MSZ 700/26.lap-1961
• MSZ 700/41.lap-1961
• MSZ 700/24.lap-1965

Group Standards of the People's Republic of China, semiconductor testing

• T/SHDSGY 113-2022 Radio frequency front end semiconductor test software
• T/ZACA 041-2022 Mixed signal semiconductor device test equipment

Korean Agency for Technology and Standards (KATS), semiconductor testing

• KS M 1804-2008(2018) Test method of hydrofluoric acid for semi-conductor

Danish Standards Foundation, semiconductor testing

• DS/EN 60191-6-16:2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

German Institute for Standardization, semiconductor testing

• DIN EN 60191-6-16:2007-11 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007); German version EN 60191-6-16:2007 / Note: To be replaced by DIN EN 60191-6-16 (2013-...

Defense Logistics Agency, semiconductor testing

• DLA MIL-STD-750 F-2012 TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES
• DLA MIL-STD-750 F CHANGE 1-2013 TEST METHODS FOR SEMICONDUCTOR DEVICES

National Metrological Verification Regulations of the People's Republic of China, semiconductor testing

• JJG(电子) 04008-1987 Trial Verification Regulations for QE1A Double-base Semiconductor Tube Tester

Lithuanian Standards Office , semiconductor testing

• LST EN 60191-6-16-2007 Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007)

British Standards Institution (BSI), semiconductor testing

• 13/30284029 DC BS EN 60191-6-16. Mechanical standardization of semiconductor devices. Part 6-16. Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA

ES-UNE, semiconductor testing

• UNE-EN 60191-6-16:2007 Mechanical standardization of semiconductor devices -- Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 60191-6-16:2007). (Endorsed by AENOR in October of 2007.)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, semiconductor testing

• GB/T 31359-2015 Test methods of semiconductor lasers

CZ-CSN, semiconductor testing

• CSN 35 1540-1979 Tests of power semiconductor converters

RO-ASRO, semiconductor testing

• STAS 11066/2-1980 THYRISTORS Test methods

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