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Secondary ion mass spectrometry + sims

Secondary ion mass spectrometry + sims, Total:7 items.

In the international standard classification, Secondary ion mass spectrometry + sims involves: Analytical chemistry.

American Society for Testing and Materials (ASTM), Secondary ion mass spectrometry + sims

• ASTM E1635-95(2000) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1635-06(2019) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
• ASTM E1162-11(2019) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

Japanese Industrial Standards Committee (JISC), Secondary ion mass spectrometry + sims

• JIS K 0169:2012 Surface chemical analysis -- Secondary-ion mass spectrometry (SIMS) -- Method for estimating depth resolution parameters with multiple delta-layer reference materials

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