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carrier lifetime

carrier lifetime, Total:16 items.

In the international standard classification, carrier lifetime involves: Semiconducting materials, Non-ferrous metals, Testing of metals, Solar energy engineering.

German Institute for Standardization, carrier lifetime

• DIN 50440:1998 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
• DIN V VDE V 0126-18-4-1:2007 Solar wafers - Part 4-1: Process for measuring the electrical characteristics of silicon wafers - Minority carrier lifetime, Inline measuring method
• DIN V VDE V 0126-18-4-2:2007 Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method

Japanese Industrial Standards Committee (JISC), carrier lifetime

• JIS H 0603:1978 Measurement of minority carrier life time in germanium by photoconductive decay method
• JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

Korean Agency for Technology and Standards (KATS), carrier lifetime

• KS D 0265-1989(2019) Measurement of minority carrier life time in germanium by photoconductive decay method
• KS D 0257-2002(2017) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
• KS D 0257-2002(2022) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
• KS D 0265-1989 Measurement of minority carrier life time in germanium by photoconductive decay method
• KS D 0257-2002 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method

Xinjiang Provincial Standard of the People's Republic of China, carrier lifetime

• DB65/T 3485-2013 Measurement method for minority carrier lifetime of solar grade polysilicon block

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, carrier lifetime

• GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
• GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
• GB/T 1553-2023 Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method

American Society for Testing and Materials (ASTM), carrier lifetime

• ASTM F28-91(1997) Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

Group Standards of the People's Republic of China, carrier lifetime

• T/CASAS 026-2023 Test method for minority carrier lifetime in silicon carbide—microwave photoconductive decay

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