L04 基础标准与通用方法 标准查询与下载

ANSI/IEEE 1490:2011 指南:项目管理协会(PMI)标准的采用:项目管理知识体系指南(PMBOK指南).2008年(第4版)

Guide: Adoption of the Project Management Institute (PMI) Standard: A Guide to the Project Management Body of Knowledge (PMBOK Guide) - 2008 (4th edition)

ASTM F1263-11 电子元件辐射试验中超量试验数据分析的标准指南

Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

IEEE 1490-2011 指南.项目管理协会(PMI)标准的采用.项目管理知识体系指南(PMBOKę Guide).第4版

Guide - Adoption of the Project Management Institute (PMIę) Standard - A Guide to the Project Management Body of Knowledge (PMBOKę Guide) - Fourth Edition

ANSI/IEEE 1658:2011 数字模拟转换器设备的检测方法和术语标准

Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

DB13/T 1323-2010 LED加速寿命试验方法

本标准规定了LED加速寿命试验的定义、试验准备、试验步骤、试验数据的处理、结果的计算。本标准适用于各种可见和非可见单色光LED器件产品光输出功率缓慢退化失效模式的LED加速寿命试验。对于不考虑色温漂移的白光LED器件产品，可以参照本标准。

LED Accelerated Life Test Method

BS CWA 16213:2010 最终用户电子技能框架要求

End user e-skills framework requirements

SAE J2556-2010 辐射(RE)窄频带数据分析功率谱密度(PSD)

This SAE Information Report defines a procedure for indicating the severity of narrowband emissions from an electronic system-component.

Radiated Emissions (RE) Narrowband Data Analysis Power Spectral Density (PSD)

IEC 61340-5-3:2010 静电学.第5-3部分:静电现象中电子设备的保护.静电放电敏感设备的封装用性能和要求分类

This part of IEC 61340 defines the ESD protective packaging properties needed to protect electrostatic discharge sensitive devices (ESDS) through all phases of production, transport and storage. Test methods are referenced to evaluate packaging and packaging materials for these product and material properties. Performance limits are provided. This standard does not address protection from electromagnetic interference (EMI), radio frequency interference (RFI), electromagnetic pulsing (EMP) nor protection of volatile materials.

Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classification for packaging intended for electrostatic discharge sensitive devices

ASTM E668-10 测定电子设备在辐射硬度试验中的吸收剂量用热致发光-剂量测定法(TLD)的标准应用规程

Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements. Note 28212;For comprehensive discussions of various dosimetry methods applicable to the radiation types and energy and absorbed dose-rate range discussed in this practice, see ICRU Reports 14, 17, 21, and 34.1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10−2 to 104 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 10−2 to 1010 Gy/s (1 to 1012 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice. Note 18212;The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost. 1.2 This standard dose not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

IEEE 1641-2010 信号和试验术语

Signal and test definition

ASTM E2377-10 轻量级电子设备屏蔽标准规范

1.1 This specification covers two types of lightweight electrical equipment shelters designed for transport on the M1152A1, M1152A1 with B2 Armor Kit, M1037, and M1097 High Mobility Multipurpose Wheeled Vehicle (HMMWV). These shelters are transported by rail, air, marine and highway when mounted or dismounted from their vehicles. 1.2 Classification8212;The shelters will be of the following types, as specified (see 6.2). 1.2.1 Type I8212;Shelter, Electrical Equipment, Lightweight (w/o Tunnel, 17-2-0035-1). 1.2.2 Type III8212;Shelter, Electrical Equipment, Lightweight, Modified, General Purpose (w/ Tunnel, 17-2-0035-3). 1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard. 1.4 The following safety hazards caveat pertains only to the test required portion, Section 4, of this specification: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Standard Specification for Shelter, Electrical Equipment, Lightweight

JIS C 60068-2-69:2009 环境试验.第2-69部分:试验.试验Te:用润湿称量法进行表面安装装置(SMD)电子元件的可焊性试验

This Standard outlines test Te, solder bath wetting balance method and solder globule wetting balance method,applicable for surface mounting devices.

Environmental testing -- Part 2-69: Tests -- Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method

JIS C 60068-2-21:2009 环境试验.第2-21部分:试验.试验U:引出端和整体安装件的坚固性

This Japanese Industrial Standard has been prepared based on the sixth edition of IEC 60068-2-21 published in 2006 without modifying the technical contents.

Environmental testing -- Part 2-21: Tests -- Test U: Robustness of terminations and integral mounting devices

JIS C 60068-2-82:2009 环境试验.第2-82部分:试验.试验XW1:电子和电气元件用晶须试验方法

This Standard specifies whisker tests for electric or electronic components representing the finished stage,with tin or tin-alloy finish.

Environmental testing -- Part 2-82: Tests -- Test XW1: Whisker test methods for electronic and electric components

JIS C 5070:2009 表面安装技术.第2部分:表面安装器件(SMD)的运输和存储条件.使用指南

This Standard describes the transportation and storage conditions for surface mounting devices (hereafter referred to as "SMDs")that are fulfilled and used in order to enable trouble-free processing of surface mounting devices, both active and passive.

Surface mounting technology -- Part 2: Transportation and storage conditions of surface mounting devices (SMD) -- Application guide

IEC 60068-2-82:2007/COR1:2009 环境试验.第2-82部分:试验.试验XW1:电子和电气组件用晶须试验方法.勘误表1

Environmental testing - Part 2-82: Tests - Test XW₁: Whisker test methods for electronic and electric components; Corrigendum 1

IEC 49/890/DTS:2009 IEC/TS 61994-4-4,版本2:频率控制和选择用压电体及电介质装置.术语表.第4-4部分:材料.表面声波(SAW)装置用材料

IEC/TS 61994-4-4, Ed. 2: Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

KS C IEC 60512-2-2:2009 电子设备连接器.试验和测量.第2-2部分:电连续性和接触电阻试验.试验2b:接触电阻.规定试验电流法

이 표준은 세부 명세를 요구할 때, IEC 기술 위원회 48의 업무 범위 내의 전자기기용

Connectors for electronic equipment-Tests and measurements-Part 2-2:Electrical continuity and contact resistance tests-Test 2b:Contact resistance-Specified test current method

NF C93-704-1-5*NF EN 62137-1-5:2009 表面安装技术.表面安装焊接点用环境和持久测试方法.第1-5部分:机械剪切疲劳试验

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-5 : mechanical shear fatigue test.

GJB 6784-2009 军用地面电子设施防雷通用要求

本标准规定了军用地面电子设施防雷工程设计、施工、检测、维护和管理。 本标准适用于固定式和移动式军用地面电子设施防雷通用要求。 本标准不适用于油库、弹药库等易燃易爆场所地面电子设施防雷通用要求。

Rules for the continental military electronic facilities against lightning