L50 光电子器件综合 标准查询与下载

BS EN 60191-6-2:2002 半导体器件的机械标准化 表面安装半导体器件封装外形图编制的一般规则 1.50mm、1.27mm 和 1.00mm 节距球型和柱型端子封装的设计指南

This part of IEC 60191 covers the requirements for the preparation of drawings of integrated circuit outlines for the various ball terminal packages, e.g. ceramic ball grid array (C-BGA), plastic ball grid array (P-BGA), tape ball grid array (T-BGA) and others as well as column terminal packages, e.g. ceramic column grid array (C-CGA).

Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages

KS B ISO 11145:2001 光学和光子学.激光和激光设备.词汇和符号

이 규격은 용어를 통일하며, 레이저 빔의 특성값과 레이저 관련 제품의 특성을 명확하게 정

Optics and optical instruments-Lasers and laser-related equipment-Vocabulary and symbols

KS B ISO 11421:2001 光学和光学仪器.光学传递函数(OTF)测量的准确性

이 규격은 광 전달 함수(이하 OTF라 한다.) 측정 장비와 규격을 사용하여 OTF 측정

Optics and optical instruments－Accuracy of optical transfer function(OTF) measurement

BS EN ISO 13694:2001 光学和光学仪器.激光和激光设备.激光束功率(能量)密度分布的试验方法

This International Standard specifies methods by which the measurement of power [energy] density distribution is made and defines parameters for the characterization of the spatial properties of laser power [energy] density distribution functions at a given plane. The methods given in this International Standard are intended to be used for the testing and characterization of both continuous wave (cw) and pulsed laser beams used in optics and optical instruments.

Optics and optical instruments. Lasers and laser-related equipment. Test methods for laser beam power (energy) density distribution

ASTM E1171-01 在循环温度和湿度环境下光电模数的标准试验方法

1.1 These test methods provide procedures for stressing photovoltaic modules in simulated temperature and humidity environments. Environmental testing is used to simulate aging of module materials on an accelerated basis.1.2 Three individual environmental test procedures are defined by these test methods: a thermal cycling procedure, a humidity-freeze cycling procedure, and an extended duration damp heat procedure. Electrical biasing is utilized during the thermal cycling procedure to simulate stresses that are known to occur in field-deployed modules.1.3 These test methods define mounting methods for modules undergoing environmental testing, and specify parameters that must be recorded and reported.1.4 These test methods do not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of these test methods.1.5 Any of the individual environmental tests may be performed singly, or may be combined into a test sequence with other environmental or non-environmental tests, or both. Certain pre-conditioning tests such as annealing or light soaking may also be necessary or desirable as part of such a sequence. The determination of any such sequencing and pre-conditioning is beyond the scope of this test method.1.6 These test procedures are limited in duration and therefore the results of these tests cannot be used to determine photovoltaic module lifetimes.1.7 There is no similar or equivalent ISO standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Photovoltaic Modules in Cyclic Temperature and Humidity Environments

ASTM E1802-01 光电模件的隔湿组件试验的标准测试方法

1.1 These test methods provide procedures to determine the insulation resistance of a photovoltaic (PV) module, i.e. the electrical resistance between the module''s internal electrical components and its exposed, electrically conductive, non-current carrying parts and surfaces.1.2 The insulation integrity procedures are a combination of wet insulation resistance and wet dielectric voltage withstand test procedures.1.3 These procedures are similar to and reference the insulation integrity test procedures described in Test Methods E 1462, with the difference being that the photovoltaic module under test is immersed in a wetting solution during the procedures.1.4 These test methods do not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of these test methods.1.5 The values stated in SI units are to be regarded as the standard.1.6 There is no similar or equivalent ISO standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see Section 6.

Standard Test Methods for Wet Insulation Integrity Testing of Photovoltaic Modules

JEDEC JESD73-3-2001 3867: 2.5 V,10位, 2端口,DDR FET交换的描述标准

This standard covers the specification for the 3867, 2.5 V, FET transmission-gate bus switch device with 2.5 V LVTTL compatible control inputs. Not included in this document are device specific parameters and performance levels that the vendor must also supply for the full device description.

Standard for Description of 3867: 2.5 V, 10-Bit, 2-Port, DDR FET Switch

JIS C 8906:2000 光电系统性能的测量程序

この規格は，地上用太陽電池モジュールで構成された太陽光発電ンスデム（以下,システムという。）の性能表示に用いる，入射太陽エネルギーによる太陽電池アレイ出力電力量，バワーコンディショナ出力電力量などのエネルギーに関する運転特性の測定方法及び測定データを受渡当事者間で交換する場合のデータレコードとファイルの書式について規定する。

Measuring procedure of photovoltaic system performance

SJ 20791-2000 微通道板光电倍增管总规范

本规范规定了军用微通道板光电倍增管的-般要求、质量保证规定和交货准备等。 本规范适用于具有微通道板的光电倍增管。

General specification for microchannel plate photomultiplier tubes

SJ 20786-2000 半导体光电组件总规范

本规范规定了军用半导体光电组件的-般要求和质量保证规定等。 本规范适用于军用半导体光电组件的研制、生产和采购。

General specification for semiconductor opto-electronic assembly

SJ 20791.1-2000 GDB-603型微通道板光电倍增管详细规范

Detail specification for type GDB-603 Microchannel plate photomultiplier tube

SJ 20792-2000 微通道板光电倍增管测试方法

本标准规定了微通道板光电倍增管光电参数的测试条件、调整程序和测试方法。 本标准适用于微通道板光电倍增管光电参数的测试。

Methods of measurement for microchannel plate photomultiplier tubes

JEDEC JESD286-B-2000 测量半导体二极管前向交换特性的标准

EWJEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the EIA General Counsel.

Standard for Measuring Forward Switching Characteristics of Semiconductor Diodes

ASTM E1462-00(2006) 光电器件模块的完整性绝缘和连续地面路径的标准试验方法

The design of a photovoltaic module or system intended to provide safe conversion of the sunrsquo;radiant energy into useful electricity must take into consideration the possibility of hazard should the user come into contact with the electrical potential of the module. These test methods describe procedures for verifying that the design and construction of the module or system are capable of providing protection from shock through normal installation and use. At no location on the module should this electrical potential be accessible, with the obvious exception of the intended output leads. These test methods describe procedures for determining the ability of the module to provide protection from electrical hazards. These procedures may be specified as part of a series of qualification tests involving environmental exposure, mechanical stress, electrical overload, or accelerated life testing. These procedures are normally intended for use on dry modules; however, the test modules may be either wet or dry, as indicated by the appropriate protocol. These procedures may be used to verify module assembly on a production line. Insulation resistance and leakage current are strong functions of module dimensions, ambient relative humidity and absorbed water vapor, and the ground path continuity procedure is strongly affected by the location of contacts and test leads to the module frame and grounding points. 5.6.1 For these reasons, it is the responsibility of the user of these test methods to specify the maximum acceptable leakage current for the dielectric voltage withstand test, and the maximum acceptable resistance for the ground path continuity procedure. 5.6.2 Fifty μA has been commonly used as the maximum acceptable leakage current (see ANSI/UL 1703, Section 26.1), and 0.1 Ω has been commonly used as the maximum acceptable resistance. Some module designs may not use any external metallic components and thus lack a ground point designated by the module manufacturer. In these cases, the ground path continuity test is not applicable.1.1 These test methods cover procedures for (1) testing for current leakage between the electrical circuit of a photovoltaic module and its external components while a user-specified voltage is applied and (2) for testing for possible module insulation breakdown (dielectric voltage withstand test).1.2 A procedure is described for measuring the insulation resistance between the electrical circuit of a photovoltaic module and its external components (insulation resistance test).1.3 A procedure is provided for verifying that electrical continuity exists between the exposed external conductive surfaces of the module, such as the frame, structural members, or edge closures, and its grounding point (ground path continuity test).1.4 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method.1.5 There is no similar or equivalent ISO standard.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Methods for Insulation Integrity and Ground Path Continuity of Photovoltaic Modules

ASTM E1462-00 光电器件模块的完整性绝缘和连续地面路径的标准试验方法

1.1 These test methods cover procedures for (1) testing for current leakage between the electrical circuit of a photovoltaic module and its external components while a user-specified voltage is applied and (2) for testing for possible module insulation breakdown (dielectric voltage withstand test). 1.2 A procedure is described for measuring the insulation resistance between the electrical circuit of a photovoltaic module and its external components(insulation resistance test). 1.3 A procedure is provided for verifying that electrical continuity exists between the exposed external conductive surfaces of the module, such as the frame, structural members, or edge closures, and its grounding point (ground point continuity test). 1.4 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method. 1.5 There is no similar or equivalent ISO standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Methods for Insulation Integrity and Ground Path Continuity of Photovoltaic Modules

JEDEC JESD66-1999 半导体闸流管电涌保护设备分级认证和特征测试的瞬时电压抑止器标准

The Thyristor Surge Protective Device (TSPD) is a semiconductor device that is recently finding widespread application in the telecommunications industry. The intent of this standard is to provide information on test methods that will reduce the possibility of disagreement and misunderstanding between TSPD vendors and users, and facilitate the determination of device interchangability. This publication is not intended to preclude or discourage other approaches that similarly represent good engineering practice, or that may be acceptable to, or have been accepted by, appropriate bodies. Parties who wish to bring other approaches to the attention of the formulating committee to be considered for inclusion in future revisions of this publication are encouraged to do so. It is the intention of the formulating committee to revise and update this publication from time to time as may be occasioned by changes in technology, industry practice, or government regulations, or for other appropriate reasons.

Transient Voltage Suppressor Standard for Thyristor Surge Protective Device Rating Verification and Characteristic Testing

ASTM E1143-99 根据试验参数测定光电器件参数线性度的标准试验方法

1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance. 1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level. 1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices. 1.4 The values stated in SI units are to be regarded as the standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter

ASTM E1597-99 海上环境用光电器件的盐水压力浸渍和温度试验的标准试验方法

1.1 This test method provides a procedure for determining the ability of photovoltaic modules to withstand repeated immersion or splash exposure by seawater as might be encountered when installed in a marine environment, such as a floating aid-to-navigation. A combined environmental cycling exposure with modules repeatedly submerged in simulated saltwater at varying temperatures and under repetitive pressurization provides an accelerated basis for evaluation of aging effects of a marine environment on module materials and construction. 1.2 This test method defines photovoltaic module test specimens and requirements for positioning modules for test, references suitable methods for determining changes in electrical performance and characteristics, and specifies parameters which must be recorded and reported. 1.3 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method. 1.4 There is no similar or equivalent ISO Standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Saltwater Pressure Immersion and Temperature Testing of Photovoltaic Modules for Marine Environments

ASTM E1362-99 非浓缩器光电二次标准电池校准的标准试验方法

1.1 This test method covers calibration and characterization of secondary terrestrial photovoltaic reference cells to a desired reference spectral irradiance distribution. The recommended physical requirements for these reference cells are described in Specification E1040. Reference cells are principally used in the determination of the electrical performance of a photovoltaic device. 1.2 Secondary reference cells are calibrated indoors using simulated sunlight or outdoors in natural sunlight by reference to a primary reference cell previously calibrated to the same desired reference spectral irradiance distribution. 1.3 This test method applies only to the calibration of a photovoltaic cell that demonstrates a linear short-circuit current versus irradiance characteristic over its intended range of use, as defined in Test Method E1143. 1.4 This test method applies only to the calibration of a photovoltaic cell that has been fabricated using a single photovoltaic junction. 1.5 There is no similar or equivalent ISO standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells

ASTM E1171-99 在循环温度和湿度环境下光电模数的标准试验方法

1.1 These test methods provide procedures for stressing photovoltaic modules in simulated temperature and humidity environments. Environmental testing is used to simulate aging of module materials on an accelerated basis.1.2 Three individual environmental test procedures are defined by these test methods: a thermal cycling procedure, a humidity-freeze cycling procedure, and an extended duration damp heat procedure. Electrical biasing is utilized during the thermal cycling procedure to simulate stresses that are known to occur in field-deployed modules.1.3 These test methods define mounting methods for modules undergoing environmental testing, and specify parameters that must be recorded and reported.1.4 These test methods do not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of these test methods.1.5 Any of the individual environmental tests may be performed singly, or may be combined into a test sequence with other environmental or non-environmental tests, or both. Certain pre-conditioning tests such as annealing or light soaking may also be necessary or desirable as part of such a sequence. The determination of any such sequencing and pre-conditioning is beyond the scope of this test method.1.6 These test procedures are limited in duration and therefore the results of these tests cannot be used to determine photovoltaic module lifetimes.1.7 There is no similar or equivalent ISO standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Photovoltaic Modules in Cyclic Temperature and Humidity Environments