L50 光电子器件综合 标准查询与下载

JEDEC JESD8-14A-2005 非终结数字集成电路的1.0 V(正负)0.1V (正常范围)和0.7 V - 1.1 V (宽量程)供电电压和接口标准

This standard defines power supply voltage ranges, dc interface and switching parameters for a high speed, low voltage family of nonterminated digital circuits driving/driven by parts of the same family, or mixed families which comply with the input receiver specifications. The specifications in this standard represent a minimum set of interface specifications for CMOS compatible circuits.

1.0 V +/- 0.1 V (Normal Range) and 0.7 V - 1.1 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits

ASTM E973-05a 测量光电装置与光电参比电池之间光谱不协调参数的标准试验方法

The calculated error in the photovoltaic device current determined from the spectral mismatch parameter can be used to determine if a measurement will be within specified limits before the actual measurement is performed. The spectral mismatch parameter also provides a means of correcting the error in the measured device current due to spectral mismatch. 5.2.1 The spectral mismatch parameter is formulated as the fractional error in the short-circuit current due to spectral differences.3 ,4 5.2.2 Error due to spectral mismatch can be corrected by dividing the measured photovoltaic cell current by M, a procedure used in Test Methods E 948 and E 1036 1.1 This test method covers a procedure for the determination of a spectral mismatch parameter used in performance testing of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of the error, introduced in the testing of a photovoltaic device, caused by mismatch between the spectral responses of the photovoltaic device and the photovoltaic reference cell, as well as mismatch between the test light source and the reference spectral irradiance distribution to which the photovoltaic reference cell was calibrated. Examples of reference spectral irradiance distributions are Tables E 490 or G 159.1.3 The spectral mismatch parameter can be used to correct photovoltaic performance data for spectral mismatch error.1.4 This test method is intended for use with linear photovoltaic devices.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a Photovoltaic Reference Cell

ASTM E1143-05 根据试验参数测定光电器件参数线性度的标准试验方法

This test method is used to evaluate the applicability of other ASTM test methods to a photovoltaic device. The procedure described in this test method is intended to be used to determine the degree of linearity between the short-circuit current of a photovoltaic device and the irradiance level incident on the device. This test method can be used for other device parameters, provided the function passes through the origin.1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance.1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level.1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter

ASTM E1597-05 海洋环境用光电组件的盐水压力浸渍试验和温度试验的标准试验方法

The useful life of photovoltaic modules deployed in marine applications (such as floating aids-to-navigation) may depend on the ability to withstand repeated exposure to salt atmosphere, immersion in seawater, and the temperature changes associated with seawater splash falling on modules operating in sunlight. The effects of these exposures may be physical or electrical changes in the module, or both. This test method describes a procedure for positioning the test specimen, conducting a cyclical combined pressure, immersion, and temperature (PIT) test, and reporting the results. It also references methods for conducting module electrical performance and insulation integrity tests. Data generated by this test method may be used to evaluate and compare the effects of a simulated marine environment on test specimens. This test method requires recording of visible effects as well as electrical performance. 4.3.1 Effects on modules may vary from none to significant changes. Some physical changes in the module may be visible when there are no apparent electrical changes in the module. Similarly, electrical changes may occur with no visible changes in the module.1.1 This test method provides a procedure for determining the ability of photovoltaic modules to withstand repeated immersion or splash exposure by seawater as might be encountered when installed in a marine environment, such as a floating aid-to-navigation. A combined environmental cycling exposure with modules repeatedly submerged in simulated saltwater at varying temperatures and under repetitive pressurization provides an accelerated basis for evaluation of aging effects of a marine environment on module materials and construction.1.2 This test method defines photovoltaic module test specimens and requirements for positioning modules for test, references suitable methods for determining changes in electrical performance and characteristics, and specifies parameters which must be recorded and reported.1.3 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Saltwater Pressure Immersion and Temperature Testing of Photovoltaic Modules for Marine Environments

JEDEC JESD8-12A-2005 非终结数字集成电路的1.2 V(正负)0.1V (正常范围)和0.8 - 1.3 V(宽量程)供电电压和接口标准

This standard defines power supply voltage ranges, dc interface and switching parameters for a high speed, low voltage family of nonterminated digital circuits driving/driven by parts of the same family, or mixed families which comply with the input receiver specifications. The specifications in this standard represent a minimum set of interface specifications for CMOS compatible circuits.

1.2 V +/- 0.1V (Normal Range) and 0.8 - 1.3 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits

JEDEC JESD8-11A-2005 非终结数字集成电路的1.5V(正负)0.1V (正常范围)和0.9V到1.6V(宽量程)供电电压和接口标准

This standard defines power supply voltage ranges, dc interface and switching parameters for a high speed, low voltage family of nonterminated digital circuits driving/driven by parts of the same family, or mixed families which comply with the input receiver specifications. The specifications in this standard represent a minimum set of interface specifications for CMOS compatible circuits; however, they also allow limited interoperability with EIA/JESD8-6 compliant HSTL devices.

1.5 V +/- 0.1 V (Normal Range) and 0.9 V 1.6 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital integrated Circuits

ASTM E1143-05(2015) 根据试验参数测定光电器件参数线性度的标准试验方法

5.1 This test method is used to evaluate the applicability of other ASTM test methods to a photovoltaic device. 5.2 The procedure described in this test method is intended to be used to determine the degree of linearity between the short-circuit current of a photovoltaic device and the irradiance level incident on the device. This test method can be used for other device parameters, provided the function passes through the origin. 1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance. 1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level. 1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices. 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter

JEDEC JESD22A121.01-2005 测量锡和锡合金表面须晶生长的试验方法

The predominant terminal finishes on electronic components have been Sn-Pb alloys. As the industry moves toward Pb-free components and assembly processes, the predominant terminal finish materials will be pure Sn and alloys of Sn, including Sn-Bi and Sn-Ag.

Test Method for Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes

ASTM E1143-05(2010) 根据试验参数测定光电器件参数线性度的标准试验方法

This test method is used to evaluate the applicability of other ASTM test methods to a photovoltaic device. The procedure described in this test method is intended to be used to determine the degree of linearity between the short-circuit current of a photovoltaic device and the irradiance level incident on the device. This test method can be used for other device parameters, provided the function passes through the origin.1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance. 1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level. 1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices. 1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determining the Linearity of a Photovoltaic Device Parameter with Respect To a Test Parameter

ASTM E973-05 测量光电装置与光电参比电池之间光谱不协调参数的标准试验方法

1.1 This test method covers a procedure for the determination of a spectral mismatch parameter used in performance testing of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of the error, introduced in the testing of a photovoltaic device, caused by mismatch between the spectral responses of the photovoltaic device and the photovoltaic reference cell, as well as mismatch between the test light source and the reference spectral irradiance distribution to which the photovoltaic reference cell was calibrated. Examples of reference spectral irradiance distributions are Tables E 490 or G 159.1.3 The spectral mismatch parameter can be used to correct photovoltaic performance data for spectral mismatch error.1.4 This test method is intended for use with linear photovoltaic devices.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Determination of the Spectral Mismatch Parameter Between a Photovoltaic Device and a Photovoltaic Reference Cell

KS B ISO 14132-4:2004 光学和光学仪器.望远镜设备词汇.第4部分:天文望远镜的术语

이 규격은 천체 망원경에 사용되는 용어와 정의, 부호에 대하여 규정한다.

Optics and optical instruments－Vocabulary for telescopic systems－Part 4：Terms for astronomical telescopes

KS B ISO 13666:2004 眼科光学.眼镜镜片.词汇

이 규격은 안광학, 특히 반제품 안경 렌즈 블랭크, 완제품 안경 렌즈 및 피팅 목적과 관련

Ophthalmic optics-Spectacle lenses-Vocabulary

KS B ISO 14997:2004 光学和光学仪器.测定光学元件表面缺陷的试验方法

이 규격은 표면 결함의 측정에 대하여 KS B ISO 10110-7에 규정된 두 가지의 시

Optics and optical instruments-Test methods for surface imperfections of optical elements

KS B ISO 15367-1:2004 激光及激光相关设备.激光束波前形状测定用试验方法.第1部分:术语和基础领域

이 규격은 레이저 광선의 전파 방향에 대략적으로 수직한 면을 통해 파면 위상의 공간적 분포

Lasers and laser-related equipment－Test methods for determination of the shape of a laser beam wavefront－Part 1：Terminology and fundamental aspects

KS B ISO 14132-3:2004 光学和光学仪器.望远镜设备词汇.第3部分:望远镜视野的术语

이 규격은 망원 조준경의 용어, 정의, 부호를 규정한다.

Optics and optical instruments－Vocabulary for telescopic systems－Part 3：Terms for telescopic sights

KS B ISO 11807-1:2004 集成光学.词汇.第1部分:基本术语和符号

이 규격은 집적 광학 장치 및 이와 관련하여 광통신, 광센서 분야 등에서 응용되는 광소자

Integrated optics－Vocabulary－Part 1：Basic terms and symbols

KS B ISO 14132-1:2004 光学和光学仪器.望远镜设备词汇.第1部分:通用术语和字母索引

이 규격은 망원경계 전체에 대한 일반적인 개념의 용어, 정의와 부호를 규정한다. 필요한 경

Optics and optical instruments－Vocabulary for telescopic systems－Part 1：General terms and alphabetical indexes of terms in ISO 14132

KS B ISO 10934-1:2004 光学和光学仪器.显微镜词汇.第1部分:光学显微镜

이 규격은 광학 현미경 분야에서 사용되는 용어 및 그에 대한 정의에 대하여 규정한다.

Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy

KS B ISO 14132-2:2004 光学和光学仪器.望远镜设备词汇.第2部分:双筒望远镜、单筒望远镜和定位观测望远镜的术语

이 규격은 쌍안경, 단안경 및 스파팅 스코프에 사용되는 용어, 정의, 부호를 규정한다.

Optics and optical instruments－Vocabulary for telescopic systems－Part 2：Terms for binoculars, monoculars and spotting scopes

KS B ISO 1219-2:2004 流体动力系统和元件.图形符号和电路图.第2部分:电路图

이 규격은 ISO 1219-1의 기호를 사용한 공압 및 유압 선도의 제도에 대한 주요

Fluid power systems and components-Graphic symbols andcircuit diagrams-Part 2:Circuit diagrams