L50 光电子器件综合 标准查询与下载

JEDEC JESD8C-2006 标称电压3 V/3.3 V供电数字集成电路的接口标准

This standard (a replacement of JEDEC Standards 8, 8-1, 8-1A, and 8B) defines dc interface parameters for a family of digital circuits operating from a power supply of nominal 3 V/3.3 V and driving/driven by parts of the same family. Clause 2 describes normal DC electrical characteristics and clause 2.4 (added by revision C) describes the optional characteristics for Schmitt trigger operation. The specifications in this standard represent a minimum set, or ‘base line’ set, of interface specifications for LVTTL compatible and LVCMOS compatible circuits.

Interface Standard for Nominal 3 V/3.3 V Supply Digital Integrated Circuits

JIS C 6115-2:2006 pin-FET模块的测量方法

この規格は，pin-FETそジュールの電気的・光学的特性の測定方法について規定する。

Measuring methods of pin-FET modules

JIS C 6115-1:2006 pin-FET模块的一般规则

この規格は，pin-FETモジュールの用語，記号，分類，最大定格，性能などの一般的な共通事項について規定する。

General rules of pin-FET modules

JIS C 6114-2:2006 光学调制器模块的测量方法

この規格は，光伝送に使用する光変調器モジュールの測定方法について規定する。

Measuring method of optical modulator modules

JIS C 6114-1:2006 光学调制器模块的一般规则

この規格は光変調器モジュールの用語，記号.分頬，最人定格，性能などの一般的な共通事項について規定する。

General rules of optical modulator modules

JEDEC JESD89A-2006 阿尔法粒子和陆地宇宙光的测量和传送 导致在半导体设备中的轻微错误

Soft errors are nondestructive functional errors induced by energetic ion strikes. Soft errors are a subset of single event effects (SEE), and include single-event upsets (SEU), multiple-bit upsets (MBU), singleevent functional interrupts (SEFI), single-event transients (SET) that, if latched, become SEU, and singleevent latchup (SEL) where the formation of parasitic bipolar action in CMOS wells induce a lowimpedance path between power and ground, producing a high current condition (SEL can also cause latent and hard errors).

Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices

KS B ISO 14534:2005 眼科光学.隐形眼镜与隐形眼镜护理产品.基本要求

이 규격은 콘택트렌즈, 콘택트렌즈 관리 제품들과 그 밖의 콘택트렌즈 부속물에 대한 안전 성

Ophthalmic optics-Contact lenses and contact lens care products-Fundamental requirements

KS B ISO 14889:2005 眼科光学.眼镜镜片.未切精加工眼镜片的基本要求

이 규격은 완제품 안경 렌즈를 위한 중요 요구 사항에 대하여 규정한다. 이 규격은 보호 안

Ophthalmic optics-Spectacle lenses-Fundamental requirements for uncut finished lenses

KS B ISO 13212:2005 眼科光学.接触镜保护产品.储存寿命的测定指南

이 규격은 콘택트렌즈 관리 제품의 저장 기간 결정을 위해 수집된 정보를 사용하기 위한 안정

Ophthalmic optics-Contact lens care products-Guidelines for determination of shelf-life

KS B ISO 1180:2005 气动工具用柄与卡盘衬套的配件尺寸

이 규격은 공압 공구용 섕크 및 그에 대응되는 척 부싱과 관련되어 있으며 다음에 대해 규정

Shanks for pneumatic tools and fitting dimensions of chuck bushings

ISO 15902:2004/cor 1:2005 光学和光子学.衍射光学.词汇.技术勘误1

This standard is Optics and photonics - Diffractive optics - Vocabulary; Technical Corrigendum 1.

Optics and photonics - Diffractive optics - Vocabulary; Technical Corrigendum 1

IEC 61290-1-3:2005 光学放大器.试验方法.第1-3部分:光功率参数和增益参数.光功率计法

This International Standard applies to all commercially available optical amplifiers (OA) and optically amplified subsystems. It applies to OA using optically pumped fibres (OFA based on either rare-earth doped fibres or on the Raman effect), semiconductors (SOA), and waveguides (POWA). NOTE The applicability of the test methods described in the present standard to distributed Raman amplifiers is for further study. The object of this standard is to establish uniform requirements for accurate and reliable measurements, by means of the optical power meter test method, of the following OA parameters, as defined in Clause 3 of IEC 61291-1: a) nominal output signal power; b) gain; c) reverse gain; d) maximum gain; e) polarization-dependent gain; f) large-signal output stability; g) saturation output power; h) maximum input signal power; i) maximum output signal power; j) input power range; k) output power range; I) maximum total output power. In addition this test method provides a means for measuring the following parameters: - maximum gain wavelength; gain wavelength band. NOTE All numerical values followed by (t) are suggested values for which the measurement is assured. Other values may be acceptable but should be verified. The object of this standard is specifically directed to single-channel amplifiers. For multichannel amplifiers, one should refer to the IEC 61290-10 series2.

Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method

IEC 61290-1-2:2005 光学放大器.试验方法.第1-2部分:光功率参数和增益参数.电频谱分析仪法

This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) and optically amplified sub-systems. It applies to OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductors (SOAs), and waveguides (POWAs). NOTE The applicability of the test methods described in the present standard to distributed Raman amplifiers is for further study. The object of this standard is to establish uniform requirements for accurate and reliable measurements, by means of the electrical spectrum analyzer test method, of the following OA parameters, as defined in Clause 3 of IEC 61291-1: a) nominal output signal power b) gain; c) reverse gain; d) maximum gain; e) polarization-dependent gain; f) large-signal output stability; g) saturation output power; h) maximum input signal power; i) maximum output signal power; j) input power range; k) output power range; I) maximum total output power. In addition this test method provides a means for measuring the following parameters: - maximum gain wavelength; - gain wavelength band. NOTE All numerical values followed by (t) are suggested values for which the measurement is assured. Other values may be acceptable, but should be verified. The object of this standard is specifically directed to single-channel amplifiers. For multichannel amplifiers, one should refer to the IEC 61290-10 series2.

Optical amplifiers - Test methods - Part 1-2: Power and gain parameters - Electrical spectrum analyzer method

KS C IEC 61829:2005 晶体硅光伏方阵.I.V特性现场测量

이 규격은 결정계 실리콘 태양 전지 어레이가 설치된 장소에서의 특성 측정과 표준 시험 조건

Crystalline silicon photovoltaic(PV) array-On-site measurement of I-V characteristics

DIN EN ISO 11807-1:2005 集成光学.词汇.第1部分:基本术语和符号

Integrated optics - Vocabulary - Part 1: Basic terms and symbols (ISO 11807-1:2001); German version EN ISO 11807-1:2005

DIN EN ISO 14881:2005 集成光学.接口.耦合特性相关参数

This International Standard defines the relevant properties for coupling light into and out of integrated optical chips (IOC) and chips with optoelectronic integrated circuits (OEIC). This standard is limited to butt coupling via the wave-guide endfaces. The definitions provide the basis for specifying the elements to be coupled (e. g. fibres, integrated optical chips) related to coupling properties.#,,#

Integrated optics - Interfaces - Parameters relevant to coupling properties (ISO 14881:2001); German version EN ISO 14881:2005

DIN EN ISO 11807-2:2005 集成光学.词汇.第2部分:分类用术语

This part of ISO 11807 defines terms used in the classification of integrated optical elements, integrated optical chips and integrated optical devices, which find applications, for example, in the fields of optical communications and sensors.

Integrated optics - Vocabulary - Part 2: Terms used in classification (ISO 11807-2:2001); German version EN ISO 11807-2:2005

KS C IEC 61721:2005 光伏组件对意外碰撞的承受能力(抗撞击试验)

이 시험의 목적은 우발적 충격 손상에 대한 모듈의 내성을 평가하기 위함이다.

Susceptibility of a photovoltaic(PV) module to accidental impact damage(resistance to impact test)

KS C IEC 61702:2005 直接耦合光伏水泵系统的额定值

이 규격은 직결형 태양광 발전(PV) 펌프 시스템의 단기 특성들(순간적 또는 일일 기간)에

Rating of direct coupled photovoltaic(PV) pumping systems

EN ISO 14881:2005 集成光学.接口.有关耦合特性的参数.ISO 14881-2001

This International Standard defines the relevant properties for coupling light into and out of integrated optical chips (IOC) and chips with optoelectronic integrated circuits (OEIC). This International Standard is limited to butt coupling via the waveguide endfaces. The definitions provide the basis for specifying the elements to be coupled (e. g. fibres, integrated optical chips) related to coupling properties.

Integrated optics - Interfaces - Parameters relevant to coupling properties ISO 14881:2001