L50 光电子器件综合 标准查询与下载

DIN EN 61345:1998 光电模块的 UV 试验

The document deals with UV tests of photovoltaic modules.

UV test of photovoltaic (PV) modules (IEC 61345:1998); German version EN 61345:1998

BS EN 60904-8:1998 光电器件.光电器件波谱反应测量

This part of BS EN 60904 gives guidance for the measurement of the relative spectral response of both linear and non-linear photovoltaic devices. This is only applicable to single-junction devices.

Photovoltaic devices - Measurement of spectral response of a photovoltaic (PV) device

IEC 61724:1998 光伏系统性能监测 测量、数据交换和分析指南

本标准规定了对PV系统中与能源有关的性能参数进行监测的程序，这些性能参数为倾斜面辐照度、方阵输出、储能装置的输入和输出、功率调节器的输入和输出，本标准还规定了监测数据交换和分析的程序。这些程序的目的是对独立运行或并网，或与非PV能源如常规发电机和风力发电机互补使用的PV系统的总体性能进行评价。 由于测量没备价格相对较高，本标准不适用于小型独立系统。

Photovoltaic system performance monitoring - Guidelines for measurement, data exchange and analysis

IEC 60904-7:1998 光伏器件 第7部分:光伏器件测试中引起的光谱失配误差的计算

GB/T 6495的本部分规定了在光伏器件测量过程中测试样品和标准器件之间的光谱响应失配与测试光谱和标准光谱之间的失配共同影响造成的误差的确定方法， 本方法仅适用于测试范围内具有线性特性的光伏器件，光伏器件的线性特性在IEC 60904-10-1998中规定。

Photovoltaic devices - Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic device

BS IEC 60747-5-3:1998 分立半导体器件和集成电路.光电器件.测量方法

To be read in conjunction with IEC 60747-1, IEC 62007-1, IEC 62007-2

Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods

BS IEC 60747-5-1:1998 分立半导体器件和集成电路.光电器件.概述

To be read in conjunction with IEC 60747-1, IEC 62007-1, IEC 62007-2

Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General

JIS C 5930:1997 光学转换开关总则

General rules of optical switches

JIS C 5860:1997 光束传输用无源器件总则

この規格は，空間ビーム光を入出射し，主に光伝送に使用する光受動部品の通則であり.空間ビーム光用受動部品の用語，種類，記号。定格，特性の表し方などの一般的な共通事項について規定する。

General rules of passive devices for light beam transmission

JIS C 5920:1997 光衰减器总则

General rules of optical attenuators

IEC 60747-5-2:1997 半导体分立器件和集成电路 第5-2部分:光电子器件 基本额定值和特性

This part of IEC 60747 gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems: - Semiconductor photoemitters, including: . light-emitting diodes (LEDs); . infrared-emitting diodes (IREDs); . laser diodes. - Semiconductor photoelectric detectors, including: . photodiodes; . phototransistors. - Semiconductor photosensitive devices. - Semiconductor devices utilizing the optical radiation for internal operation, including: . photocouplers, optocouplers.

Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics

JIS C 5991:1997 光纤传输用光电二极管测量方法

この規格は，光伝送用フォトダィオード(電子回路内蔵形を除く。以下,フォトダイオードという。)の測定万法について規定する。

Measuring methods of photodiodes for fiber optic transmission

IEC 60747-5-1:1997 半导体分立器件和集成电路 第5-1部分:光电子器件 总规范

This part of IEC 60747 deals with the terminology relating to the semiconductor optoelectronic devices.

Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

IEC 60747-5-3:1997 半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法

This part of IEC 60747 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

SJ 20644-1997 PIN、APD光电探测器总规范

本规范规定了军用PIN、APD光电探测器的一般要求。具体要求和特性在相应军用详细规范中规定。 本规范所包含的产品应按1.2.1规定的密封等级，1.2.2规定的波长分类及1.2.3规定的光耦合类型来分类。

General Specification for Detectors of PIN、APD

JEDEC JESD59-1997 焊线模拟标准

This standard provides a means of describing a bond wire through the use of five parameters. By specifjmg these parameters, anyone may duplicate the drawing of the bond wire either on a plot or with a three dimensional field solver.

Bond Wire Modeling Standard

IEC 60747-12-6:1997 半导体器件 第12-6部分:光电子器件 纤维光学系统或子系统用带/不带尾纤的雪崩光电二极管空白详细规范

Semiconductor devices - Part 12-6: Optoelectronic devices - Blank detail specification for avalanche photodiodes with/without pigtail, for fibre optic systems or subsystems

IEC 60747-12-4:1997 半导体器件 第12-4部分:光电子器件 纤维光学系统或子系统用带/不带尾纤的PIN-FET模块空白详细规格

Semiconductor devices - Part 12-4: Optoelectronic devices - Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems

DIN EN 120004:1997 空白详细规范.与光电晶体管输出匹配的环境级光电耦合器

The document is a blank detail specification for ambient rated photocouplers with phototransistor output.

Blank detail specification: Ambient rated photocouplers with phototransistor output; German version EN 120004:1992

EN 61646:1997 薄膜陆地光电(PV)模块.设计认证和类型认可

This International Standard lays down requirements for the design qualification and type approval of terrestrial thin-film photovoltaic modules suitable for long-term operation in moderate open-air climates as defined in IEC 721-2-1. It is written with amorphous silicon technology in mind, but may also be applicable to other thin-film PV modules. Modifications to this test sequence may be necessary due to the specific characteristics of these other new technologies. The test sequence is based largely on that specified in IEC 1215 for the design qualification and type approval of terrestrial crystalline silicon PV modules. However, some changes have been made to account for the special features of amorphous silicon thin-film modules. Lightsoaking is used to separate light-induced degradation from other degradation mechanisms, and to provide the maximum power at the end of the test sequence as an estimate of the long-term performance of thin-film modules. Modules are annealed before thermal cycling and damp heat tests in order to separate the annealing effects from any degradation resulting from these tests. For thin-film technologies other than amorphous silicon, pretreatments such as light-soaking and annealing may differ or may prove unnecessary. A wet leakage current test has been added because all types of thin-film modules are susceptible to moisture-induced corrosion. The object of this test sequence is to determine the electrical and thermal characteristics of the module and to show, as far as possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure in climates described in the scope. The actual life expectancy of modules so qualified will depend on their design, their environment and the conditions under which they are operated. This standard does not apply to modules used with concentrators.

Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval

DIN EN 61727:1996 光电器件(PV)系统.网络接的特性

The document deals characteristics for the interface pv-systeme-utility.

Photovoltaic (PV) systems - Characteristics of the utility interface (IEC 61727:1995); German version EN 61727:1995