N32 放大镜与显微镜 标准查询与下载
共找到 340 条与 放大镜与显微镜 相关的标准，共 23 页
本标准规定了生物显微镜产品的分类及基本参数、技术要求、试验方法、检验规则和抽样、标志、包装及运输贮存。 本标准适用于在可见光下进行观察的机械筒长为160mm或无穷远的各类生物显微镜。
Biological microscope
- ICS
- 37.020
- CCS
- N32
- 发布
- 1999-10-10
- 实施
- 2000-03-01
本标准规定了显微镜物镜的基本参数、技术要求、试验方法和标志。 本标准适用于共轭距离为185mm、195mm和无限远的明场观察的显微物镜。
Microscope--Objectives
- ICS
- 37.020
- CCS
- N32
- 发布
- 1996-08-13
- 实施
- 1996-12-01
本标准规定了显微镜聚光镜的基本参数、技术要求、试验方法和标志。 本标准适用于透射光观察的显微镜聚光镜。
Microscope--Condensers
- ICS
- 37.020
- CCS
- N32
- 发布
- 1996-08-13
- 实施
- 1996-12-01
本标准规定了显微镜目镜的基本参数、技术要求、试验方法和标志。 本标准适用于显微镜观察目镜、摄影目镜和投影目镜。
Microscopes--Oculars(eyepieces)
- ICS
- 37.020
- CCS
- N32
- 发布
- 1996-08-13
- 实施
- 1996-12-01
1.1?This test method uses optical microscopy for the detection, semi-quantification, and identification of fungal structures in tape lift preparations. 1.2?This test method describes the preparation techniques for tape-lift matrices, the procedure for confirming the presence of
Standard Test Method for Direct Microscopy of Fungal Structures from Tape
- ICS
- CCS
- N32
- 发布
- 2021
- 实施
This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).
Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
- ICS
- 37.020
- CCS
- N32
- 发布
- 2017-12-01
- 实施
Microscopes -- Information provided to the user
- ICS
- 37.020
- CCS
- N32
- 发布
- 2017-10-20
- 实施
Optics and photonics - Operation microscopes - Part 1: Requirements and test methods
- ICS
- 11.040.30;37.020
- CCS
- N32
- 发布
- 2017-08-01
- 实施
Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
- ICS
- 37.020
- CCS
- N32
- 发布
- 2017-06-28
- 实施
- 2017-06-28
Microscopes - Cover glasses - Part 1: Dimensional tolerances, thickness and optical properties
- ICS
- 37.020
- CCS
- N32
- 发布
- 2017-06
- 实施
Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties (ISO 14880-1:2016); German version EN ISO 14880-1:2016
- ICS
- 01.040.31;31.260
- CCS
- N32
- 发布
- 2016-12
- 实施
Microscopes. Graticules for eyepieces
- ICS
- 37.020
- CCS
- N32
- 发布
- 2016-11-30
- 实施
- 2016-11-30
Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
- ICS
- 01.040.31;31.260
- CCS
- N32
- 发布
- 2016-11-19
- 实施
- 2016-11-19
Optics and photonics. Microlens arrays. Vocabulary and general properties
- ICS
- 01.040.31;31.260
- CCS
- N32
- 发布
- 2016-08-31
- 实施
- 2016-08-31
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ICS
- 37.020
- CCS
- N32
- 发布
- 2016-08
- 实施
