N33 电子光学与其他物理光学仪器 标准查询与下载



共找到 205 条与 电子光学与其他物理光学仪器 相关的标准,共 14

Stray radiant power can be a significant source of error in spectrophotometric measurements. SRP usually increases with the passage of time; therefore, testing should be performed periodically. Moreover, the SRPR test is an excellent indicator of the overall condition of a spectrophotometer. A control-chart record of the results of routinely performed SRPR tests can be a useful indicator of need for corrective action or, at least, of the changing reliability of critical measurements. This test method provides a means of determining the stray radiant power ratio of a spectrophotometer at selected wavelengths in a spectral range, as determined by the SRP filter used, thereby revealing those wavelength regions where significant photometric errors might occur. It does not provide a means of calculating corrections to indicated absorbance (or transmittance) values. The test method must be used with care and understanding, as erroneous results can occur, especially with respect to some modern grating instruments that incorporate moderately narrow bandpass SRP-blocking filters. This test method does not provide a basis for comparing the performance of different spectrophotometers. Note 88212;Kaye (3) discusses correction methods of measured transmittances (absorbances) that sometimes can be used if sufficient information on the properties and performance of the instrument can be acquired. See also A1.2.5. This test method describes the performance of a spectrophotometer in terms of the specific test parameters used. When an analytical sample is measured, absorption by the sample of radiation outside of the nominal bandpass at the analytical wavelength can cause a photometric error, underestimating the transmittance or overestimating the absorbance, and correspondingly underestimating the SRPR. The SRPR indicated by this test method using SRP filters is almost always an underestimation of the true value (see 1.3). A value cited in a manufacturer’s literature represents the performance of a new instrument, tested exactly in accordance with the manufacturer’s specification. The implication is that the manufacturer’s stated SRPR can serve as a benchmark for future performance, provided that the user performs the manufacturer’s specified test. It is recommended that users test new instruments promptly, thereby establishing a comparative benchmark in terms of their own testing facilities. The solution filter ratio method (4.3) is a convenient method for control-charting SRPR. Mielenz, et al., (4) show that its results tend to correlate well with those of the specified wavelength method, but for critical comparison with the manufacturer’s specification, the method used by the manufacturer must be used. Because some instruments reduce SRP by incorporating moderately narrow bandpass SRP-blocking filters that are changed as the wavelength range is scanned, it is possible for SRPR determinations to be highly inaccurate if the cutoff wavelength of the SRP filter falls too close to the absorption edge of an instrument’s SRP-reducing filter (3).1.1 Stray radiant power (SRP) can be a significant source of error in spectrophotometric measurements, and the danger that such error exists is enhanced because its presence often is not suspected (1-4). This test method affords an estimate of the relative radiant power, that is, the Stray Radiant Power Ratio (SRPR), at wavelengths remote from those of the nominal bandpass transmitted through the monochromator of an absorption spectrophotometer. Test-fil......

Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
2004
实施

A-A-59206, dated 3 June 1998, has been reviewed and determined to be valid for use in acquisition

PROBE LIGHT KIT, INSPECTION [Superseded: DLA MIL-P-12001 D CANC NOTICE 1, DLA MIL-P-12001 D, DLA MIL-P-12001 C, DLA MIL-P-12001 B]

ICS
CCS
N33
发布
2003-06-11
实施

This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) including optical fibre amplifiers (OFAs) using active fibres and semiconductor optical amplifiers (SOAs) using semiconductor gain media. Polarization-mode dispersion (PMD) causes an optical pulse to spread in the time domain. This dispersion could impair the performance of a telecommunications system. The effect can be related to differential group velocity and corresponding arrival times of different polarization components of the signal. For a narrowband source, the effect can be related to a differential group delay (DGD) between pairs of orthogonally polarized principal states of polarization (PSP). This test method describes a procedure for measuring the PMD of OAs. The measurement result is obtained from the measurement of the normalized Stokes parameters at two closely spaced wavelengths. The test method described herein requires a polarized signal at the input of the polarimeter with a degree of polarization (DOP) of at least 25 %. Although the test source is highly polarized, the DOP at the output of the OA is reduced by amplified spontaneous emission (ASE). Annex B analyses the impact of ASE on the DOP. In order to assure an accurate measurement, the DOP is measured as part of the measurement procedure. The method described herein has been shown to be immune to polarization-dependent gain (PDG) and polarization dependent loss (PDL) up to approximately 1 dB. Although the Jones matrix eigenanalysis (JME) test method is in principle also applicable to unpumped (that is, unpowered) OAs, the JME technique in this standard applies to pumped (that is, powered) OAs only.

Optical fibre amplifiers - Basic specification - Polarization mode dispersion - Jones matrix eigenanalysis method (JME)

ICS
33.180.30
CCS
N33
发布
2003-05-23
实施
2003-05-23

All S/H systems change with time and use. Therefore, a calibration procedure for evaluating the operation of an S/H system is desirable. This calibration procedure provides a method of obtaining an optimized interferometric image pattern associated with a given size anomaly. The use of straining blocks as calibration devices provides a means for ensuring the continued optimal performance of the S/H system. Straining blocks can also be used to compare performance of S/H systems in different facilities. At not greater than a three (3) month interval the S/H system shall be calibrated following the procedures described in this practice. When necessary, adjustments, repairs, or modifications shall be made to the S/H system until it is able to observe, in the same image, all anomalies of size within the range of interest contained in the straining blocks.1.1 This practice describes the construction and use of a calibration device for demonstrating the anomaly detection capability of interferometric laser imaging nondestructive tire inspection system. A common practice within the industry is to refer to these systems as shearographic/holographic (S/H) systems. 1.2 This standard practice applies to S/H systems that are used for evaluating the structural integrity of pneumatic tires, (for example, presence or absence of anomalies within the tire). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System

ICS
31.260
CCS
N33
发布
2003
实施

This European Standard specifies performance criteria for equipment probes used in biotechnological process with respect to the potential hazards to the worker and the environment microorganisms in use. This European Standard applies where the intended use of the equipment probes includes hazardous or potentially hazardous microorganisms used in biotechnological processes or where exposure of the worker or the environment to such microorganisms is restricted for reasons of safety.

Biotechnology - Performance Criteria for Piping and Instrumentation - Part 6: Equipment Probes

ICS
07.080;07.100.01
CCS
N33
发布
2001-02-01
实施

This practice permits an analyst to compare the general performance of his instrument, as he is using it in a specific spectrophotometric method, with the performance of instruments used in developing the method. 1.1 This practice covers the description of requirements of spectrophotometric performance especially for ASTM methods, and the testing of the adequacy of available equipment for a specific method. The tests give a measurement of some of the important parameters controlling results obtained in spectrophotometric methods, but it is specifically not to be concluded that all the factors in instrument performance are measured.1.1.1 This practice is not to be used (1) as a rigorous test of performance of instrumentation, or (2) to intercompare the quantitative performance of instruments of different design.1.1.2 This practice is primarily directed to dispersive spectrophotometers used for transmittance measurements rather than instruments designed for diffuse transmission and diffuse reflection.

Standard Practice for Describing and Measuring Performance of Ultraviolet, Visible, and Near-Infrared Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
2001
实施

Atomic absorption spectrometry (AAS) - Part 1: Terms; explanations

ICS
01.040.71;71.040.40
CCS
N33
发布
2000-04
实施

  本标准规定了电子光学仪器包装的一般要求、制箱要求、钉箱要求、防护要求和试验方法。   本标准适用于对电子光学仪器的包装。

General specifications of pachaging for electron optical instrument

ICS
CCS
N33
发布
1999-08-10
实施
2000-01-01

  本标准规定了透射电子显微镜的试验方法。   本标准适用于透射电镜主机性能的试验。

Test method for the transmission electron microscope

ICS
CCS
N33
发布
1999-08-10
实施
2000-01-01

本标准规定了可见分光光度计的产品分类、技术方法、试验方法、检验规则、标志、包装、运输、贮存等。 本标准适用于主要光谱区为360nm~800nm的可见分光光度计。

Visible spectrophotometer

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了分光光度计系列产品的基本参数和主要技术指标。 本标准适用于各类分光光度计。

Spectrophotometer series and its basic parameter

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了平面光栅摄谱仪的基本参数、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于JB/T 8231规定的平面光栅摄谱仪。

Plane-gratings spectrographs

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

  本标准规定了多晶X射线衍射仪的技术要求、检验规则和试验方法等。 本标准适用于多晶X射线射衍射仪。

Specification for X-ray diffractometer

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

  本标准规定了光谱仪器用狭缝的基本参数、技术要求和试验方法。   本标准适用于摄谱仪、分光光度计、单色仪、强光分光仪等光谱仪器用狭缝。

Slits for optical spectrum instruments

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了白度计术语、产品分类、技术要求、试验方法、检验规则、标志、包装、运输、贮存等。 本标准适用于测量白色和近白色物体表面白度的滤光白度计。

Whiteness meter

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

  本标准规定了侧窗荧光分析X射线管的型号规格、外形尺寸、技术要求、试验方法和检验规则等。   本标准适用于侧窗荧光分析X射线,端窗荧光管亦可参照使用。

Side window fluorescence analysis X-ray tube

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了激光喇曼分光光度计的产品分类、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于双单色器、三单色器激光喇曼分光光度计。

Laser Raman spectrophotometer

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了光谱投影仪的基本参数、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于对摄谱仪所摄片作定性和半定量分析的光谱投影仪。

Spectrum projector

ICS
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了平面光栅摄谱仪的基本参数。 本标准适用于平面光栅摄谱仪。

The basic parameters of the plane-gratings spectrographs

ICS
17.180.30
CCS
N33
发布
1999-08-06
实施
2000-01-01

本标准规定了立式接触式干涉仪的基本参数及尺寸、技术要求、试验方法等。 本标准适用于比较法测量长度的立式接触式干涉仪。

Vertical contact interferometers

ICS
17.180.30
CCS
N33
发布
1999-08-06
实施
2000-01-01



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