N33 电子光学与其他物理光学仪器 标准查询与下载

JB/T 8234-1999 看谱镜

本标准规定了看谱镜的产品分类、技术要求、试验方法、检验规则和标志、包装、运输、贮存。 本标准适用于在可见光谱范围内对合金钢和有色金属及其合金作目视光谱分析的看谱镜。

Spectroscope

JB/T 8235-1999 单色仪

本标准规定了单色仪和产品分类、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于棱镜式和光栅式单色仪。

Monochromator

JB/T 8239.1-1999 衍射光栅.基本参数

本标准规定了衍射光栅的基本型式、基本参数和尺寸。 本标准适用于反射式衍射光栅。

Basic parameters for diffraction grating

JB/T 8239.2-1999 衍射光栅.技术条件

本标准规定了衍射光栅的技术指标名称和代号、技术要求、试验方法检验规则、标志、包装、运输、贮存等。 本标准适用于JB/T 8239.1规定的反射式衍射光栅。 本标准中所述光谱均指一级光谱。

Specification for diffraction grating

JB/T 9323-1999 光弹性仪

本标准规定了光弹性仪的基本参数、技术要求、试验方法、检验规则、标志、包装、运输及贮存。 本标准适用于作静载荷测量的透射式光弹性仪。

Photoelasticimeter

ASTM E1479-99(2005) 感应耦合等离子体光学放射分光计的描述与规定的标准规程

This practice describes the essential components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES). The components include excitation/radio-frequency generators, sample introduction systems, spectrometers, detectors, and signal processing and displays. This description allows the user or potential user to gain a cursory understanding of an ICP-AES system. This practice also provides a means for comparing and evaluating various systems, as well as understanding the capabilities and limitations of each instrument. Training8212;The vendor should provide training in safety, basic theory of ICP spectrochemical analysis, operations of hardware and software, and routine maintenance for at least one operator. Training ideally should consist of the basic operation of the instrument at the time of installation, followed by an in-depth course one or two months later. Advanced courses are also offered at several of the important spectroscopy meetings that occur throughout the year as well as by independent training institutes. Furthermore, several independent consultants are available who can provide training, in most cases at the userrsquo;site.1.1 This practice describes the components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES) that are basic to its operation and to the quality of its performance. This practice identifies critical factors affecting accuracy, precision, and sensitivity. It is not the intent of this practice to specify component tolerances or performance criteria, since these are unique for each instrument. A prospective user should consult with the vendor before placing an order, to design a testing protocol to demonstrate that the instrument meets all anticipated needs.1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 13.

Standard Practice for Describing and Specifying Inductively-Coupled Plasma Atomic Emission Spectrometers

ASTM E1479-99 感应耦合等离子体光学放射分光计的描述与规定的标准规程

1.1 This practice describes the components of an inductively-coupled plasma optical emission spectrometer that are basic to its operation and to the quality of its performance. It is not the intent of this practice to specify component tolerances or performance criteria, since these are unique for each instrument. The practice does, however, attempt to identify critical factors affecting accuracy, precision, and sensitivity. A prospective user should consult with the vendor before placing an order, to design a testing protocol to demonstrate that the instrument meets all anticipated needs. For more detailed information, consult a publication by Haas, Knisely, Winge, and Fassel. 1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 9.

Standard Practice for Describing and Specifying Inductively-Coupled Plasma Atomic Emission Spectrometers

DLA A-A-59206-1998 检验用光探针(被替代:DLA MIL-P-12001 D 撤消公告 1,DLA MIL-P-12001 D,DLA MIL-P-12001 C,DLA MIL-P-12001 B)

This commercial item description (CID) covers hand-held inspection probe lights intended for use in illuminating inaccessible areas with small clearances

PROBE LIGHT KIT, INSPECTION [Superseded: DLA MIL-P-12001 D CANC NOTICE 1, DLA MIL-P-12001 D, DLA MIL-P-12001 C, DLA MIL-P-12001 B]

ASTM E766-98(2008)e1 扫描电子显微镜的放大系数的标准校正规范

Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to international/national standards, such as NIST-SRM 484, with this practice will yield magnifications accurate to better than 5 % over the calibrated range of operating conditions. The accuracy of the calibrated magnifications, or dimensional measurements, will be poorer than the accuracy of the calibration specimen used with this practice. For accuracy approaching that of the calibration specimen this practice must be applied with the identical operating conditions (accelerating voltage, working distance and magnification) used to image the specimens of interest. It is incumbent upon each facility using this practice to define the standard range of magnification and operating conditions as well as the desired accuracy for which this practice will be applied. The standard operating conditions must include those parameters which the operator can control including: accelerating voltage, working distance, magnification, and imaging mode.1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. Therefore, this practice must be applied to each set of standard operating conditions to be used. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

ASTM E766-98 校准扫描电子显微镜的放大倍数

1.1 This practice is designed to calibrate the magnification of scanning electron microscopes (SEMs) using the National Institute of Standards and Technology (NIST) calibration specimen Standard Reference Material (SRM)484. Since the relationship between true magnification and magnification indicated on the SEM readout may be different at different magnifications, this practice must be applied to each magnification for which true magnification is desired. 1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

ASTM E766-98(2003) 校准扫描电子显微镜的放大倍数

Proper use of this practice can yield calibrated magnifications with precision of 5 % or better within a magnification range of from 10 to 50 000X. The use of calibration specimens traceable to international/national standards, such as NIST-SRM 484, with this practice will yield magnifications accurate to better than 5 % over the calibrated range of operating conditions. The accuracy of the calibrated magnifications, or dimensional measurements, will be poorer than the accuracy of the calibration specimen used with this practice. For accuracy approaching that of the calibration specimen this practice must be applied with the identical operating conditions (accelerating voltage, working distance and magnification) used to image the specimens of interest. It is incumbent upon each facility using this practice to define the standard range of magnification and operating conditions as well as the desired accuracy for which this practice will be applied. The standard operating conditions must include those parameters which the operator can control including: accelerating voltage, working distance, magnification, and imaging mode.1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. Therefore, this practice must be applied to each set of standard operating conditions to be used.1.2 The values stated in SI units are to be regarded as the standard.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

JIS K 0132:1997 扫描电子显微镜总则

この規格は，走査電子顕微鏡を用いて，主として二 次電子による試料表面の微小部の形態観察と分析を行う場合の一般的事項について規定する。

General rules for scanning electron microscopy

DIN 58960-2:1997 分析试验光度计.第2部分:技术设计、分类.元件、术语

The document contains an overview concerning the classification of photometers for analytical tests and concerning the components of photometers.

Photometer for analytical tests - Part 2: Technical design; classification, components, concepts

JIS B 7910:1997 电子光学测距仪(EDM).精度的现场测定程序

Electro-optical distance measuring instruments (EDM) -- Field procedures for determining accuracy

ASTM E995-97 螺旋电子光谱法中基本抽减技术

1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation. 1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS). 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy

WJ 2278-1995 分光光度计波长检定用干涉滤光片检定规程

Regulations for verification of interference filters for wavelength verification of spectrophotometers

WJ 2300-1995 平面光栅摄谱仪检定规程

Verification Regulations for Plane Grating Spectrograph

WJ 2299-1995 电感耦合等离子体顺序扫描光谱仪检定规程

Inductively Coupled Plasma Sequential Scanning Spectrometer Verification Regulations

WJ 2279-1995 低压石英汞灯波长标准器检定规程

Verification rules for wavelength standard device of low-pressure quartz mercury lamp

WJ 2297-1995 电子探针检定规程

Electronic Probe Verification Regulations