N33 电子光学与其他物理光学仪器 标准查询与下载

GJB 6460-2008 干涉仪系统传递函数测量.台阶板位相比较法

本标准规定了用台阶板位相比较法测量干涉仪系统传递函数的测量方法。 本标准适用于数字式斐索平面干涉仪系统传递函数的测量。

Measurement of interferometer system transfer function comparison method of phase step

ASTM E275-08 说明和测量紫外线可见分光光度计的性能的标准实施规程

This practice permits an analyst to compare the general performance of an instrument, as it is being used in a specific spectrophotometric method, with the performance of instruments used in developing the method.1.1 This practice covers the description of requirements of spectrophotometric performance, especially for test methods, and the testing of the adequacy of available equipment for a specific method (for example, qualification for a given application). The tests give a measurement of some of the important parameters controlling results obtained in spectrophotometric methods, but it is specifically not to be concluded that all the factors in instrument performance are measured, or in fact may be required for a given application. 1.1.1 This practice is primarily directed to dispersive spectrophotometers used for transmittance measurements rather than instruments designed for diffuse transmission and diffuse reflection. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Describing and Measuring Performance of Ultraviolet and Visible Spectrophotometers

ASTM E2214-08e1 说明和鉴定颜色测定仪性能的标准实施规程

In today''s commerce, instrument makers and instrument users must deal with a large array of bench-top and portable color-measuring instruments, many with different geometric and spectral characteristics. At the same time, manufacturers of colored goods are adopting quality management systems that require periodic verification of the performance of the instruments that are critical to the quality of the final product. The technology involved in optics and electro-optics has progressed greatly over the last decade. The result has been a generation of instruments that are both more affordable and higher in performance. What had been a tool for the research laboratory is now available to the retail point of sale, to manufacturing, to design and to corporate communications. New documentary standards have been published that encourage the use of colorimeters, spectrocolorimeters, and colorimetric spetrometers in applications previously dominated by visual expertise or by filter densitometers. Therefore, it is necessary to determine if an instrument is suitable to the application and to verify that an instrument or instruments are working within the required operating parameters. This practice provides descriptions of some common instrumental parameters that relate to the way an instrument will contribute to the quality and consistency of the production of colored goods. It also describes some of the material standards required to assess the performance of a color-measuring instrument and suggests some tests and test reports to aid in verifying the performance of the instrument relative to its intended application.1.1 This practice provides standard terms and procedures for describing and characterizing the performance of spectral and filter based instruments designed to measure and compute the colorimetric properties of materials and objects. It does not set the specifications but rather gives the format and process by which specifications can be determined, communicated and verified. 1.2 This practice does not describe methods that are generally applicable to visible-range spectroscopic instruments used for analytical chemistry (UV-VIS spectrophotometers). ASTM Committee E13 on Molecular Spectroscopy and Chromatography includes such procedures in standards under their jurisdiction. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Specifying and Verifying the Performance of Color-Measuring Instruments

BS ISO 21501-3:2007 粒度分布测定.单粒子光干扰法.消光液载粒子计数器

ISO 21501-3:2007 describes a calibration and verification method for a light extinction liquid-borne particle counter (LELPC), which is used to measure the size and particle number concentration of particles suspended in liquid. The light extinction method described in ISO 21501-3:2007 is based on single particle measurements. The typical size range of particles measured by this method is between 1 µm and 100 µm in particle size. Instruments that conform to ISO 21501-3:2007 are used for the evaluation of the cleanliness of pharmaceutical products (e.g. injections, water for injections, infusions), as well as the measurement of number and size distribution of particles in various liquids. The following are within the scope of ISO 21501-3:2007: size calibration; verification of size setting; counting efficiency; size resolution; maximum particle number concentration; sampling flow rate; sampling time; sampling volume; calibration interval; test report.

Determination of particle size distribution. Single particle light interaction methods. Light extinction liquid-borne particle counter

BS ISO 21501-4:2007 粒度分布测定.单粒子光干扰法.无菌空间光散射尘埃粒子计数器

ISO 21501-4:2007 describes a calibration and verification method for a light scattering airborne particle counter (LSAPC), which is used to measure the size and particle number concentration of particles suspended in air. The light scattering method described in ISO 21501-4:2007 is based on single particle measurements. The typical size range of particles measured by this method is between 0,1 µm and 10 µm in particle size. Instruments that conform to ISO 21501-4:2007 are used for the classification of air cleanliness in cleanrooms and associated controlled environments in accordance with ISO 14644-1, as well as the measurement of number and size distribution of particles in various environments. The following are within the scope of ISO 21501-4:2007: size calibration; verification of size setting; counting efficiency; size resolution; false count rate; maximum particle number concentration; sampling flow rate; sampling time; sampling volume; calibration interval; test report.

Determination of particle size distribution. Single particle light interaction methods. Light scattering airborne particle counter for clean spaces

BS ISO 21501-2:2007 粒度分布测定.单粒子光干扰法.光散射液载粒子计数器

ISO 21501-2:2007 describes a calibration and verification method for a light scattering liquid-borne particle counter (LSLPC), which is used to measure the size and particle number concentration of particles suspended in liquid. The light scattering method described in ISO 21501-2:2007 is based on single particle measurements. The typical size range of particles measured by this method is between 0,1 µm and 10 µm in particle size. Instruments that conform to ISO 21501-2:2007 are used for the evaluation of the cleanliness of pure water and chemicals, as well as the measurement of number and size distribution of particles in various liquids. The measured particle size using the LSLPC depends on the refractive index of particles and medium; therefore the measured particle size is equivalent to the calibration particles in pure water. The following are within the scope of ISO 21501-2:2007: size calibration; verification of size setting; counting efficiency; size resolution; false count rate; maximum particle number concentration; sampling flow rate; sampling time; sampling volume; calibration interval; test report.

Determination of particle size distribution. Single particle light interaction methods. Light scattering liquid-borne particle counter

NF X21-002:2007 微光束分析.电子探针微量分析.波长色散光谱学用实验参数测定指南

Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.

NF X21-006:2007 微光束分析.电子探针微量分析.用波长色散X-射线光谱测量法进行块状样品的定量点分析

Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.

JIS C 1609-1:2006 光照度计.第1部分:通用测量仪器

この規格は，昼光などの自然の光及び一般照明用光源(白熱電球，蛍光ランプ，HIDランプなど)の照度を測定する指針形及びディジタル形照度計(以下,照度計という。)について規定する。なお，測定システムの一部であるような照度測定器(測光器), LEDなどの特殊光源を測定する照度測定器，及び水中照度計などの特殊用途の照度計についてもできるだけこの規格を用いるのがよい。

Illuminance meters Part 1: General measuring instruments

ASTM D7298-06(2011)e1 用偏振滤光仪测量相对清晰度的标准试验方法

This test method assists in evaluating the effect of layout, typeface, type size, color, and background on the legibility of printed matter. Previous research has shown that results are more significantly impacted by subject age than any other effect. Older subjects tend to require more light when using this instrument. Because subjects age at different rates as a result of lifestyle and genetics, variability of data tends to increase with increasing age. This test method was developed using subjects of ages 19 to 28 years. It is advised that subjects age 19 to 28 be used in cases where variability needs to be kept to a minimum. Testers can compare legibility between various groups of subjects (by age, light intensity, distance, vision characteristics of the subjects) and one against other label configurations within groups of subjects1.1 This test method provides an objective means to comparatively measure the ease of reading printed matter for use in package labeling. 1.2 This test method is not intended to quantify the legibility of a printed item against a standard but to compare its legibility against other items. 1.3 This test method uses human subjects to view printed matter mounted in a specialized instrument. 1.4 The user of this test method must be aware that results may differ from one age group of subjects to another. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Measurement of Comparative Legibility by Means of Polarizing Filter Instrumentation

JJG 925-2005 净全辐射表

本规程适用于工作级热电式净全辐射表(以下简称净全辐射表)的首次检定、后续检定和使用中检验。

Net Pyrradiometers

NF S10-131:2005 集成光学.接口.有关耦合特性的参数

Integrated optics - Interfaces - Parameters relevant to coupling properties.

NF S10-130-2:2005 集成光学.词汇.第2部分:分类用术语

Integrated optics - Vocabulary - Part 2 : terms used in classification.

NF S10-130-1:2005 集成光学.词汇.第1部分:基本术语和符号

Integrated optics - Vocabulary - Part 1 : basic terms and symbols.

BS ISO 16700:2004 微电子束分析.扫描电子显微镜.图像放大校准指南

This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

DB31/T 315-2004 透射电子显微镜放大倍率校准方法

Calibration method of magnification of transmission electron microscope

JB/T 5482-2004 X射线晶体定向仪 技术条件

本标准规定了用于单晶定向和测量用的X射线晶体定向仪的要求，试验方法、检验规则、标志、包装、运输、贮存。 本标准适用于各种单晶、双晶衍射型定向仪。

Technical conditions of X-ray crystal orientation instrument

DB31/T 297-2003 扫描电子显微镜放大倍率校准方法

Calibration method of magnification of scanning electron microscope

ASTM E995-04 螺旋电子光谱法和X射线光电光谱法中减去背景技术的标准指南

Background subtraction techniques in AES were originally employed as a method of enhancement of the relatively weak Auger signals to distinguish them from the slowly varying background of secondary and backscattered electrons. Interest in obtaining useful information from the Auger peak line shape, concern for greater quantitative accuracy from Auger spectra, and improvements in data gathering techniques, have led to the development of various background subtraction techniques. Similarly, the use of background subtraction techniques in XPS has evolved mainly from the interest in the determination of chemical states (binding energy values), greater quantitative accuracy from the XPS spectra, and improvements in data acquisition. Post-acquisition background subtraction is normally applied to XPS data. The procedures outlined are popular in XPS and AES. General reviews of background subtraction techniques have been published (1 and 2 ).3 1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

ASTM E387-04 用不透明滤光器评估色散分光光度计杂散辐射功率的标准试验方法

1.1 Stray radiant power (SRP) can be a significant source of error in spectrophotometric measurements, and the danger that such error exists is enhanced because its presence often is not suspected (). This test method affords an estimate of the relative radiant power, that is, the Stray Radiant Power Ratio (SRPR), at wavelengths remote from those of the nominal bandpass transmitted through the monochromator of an absorption spectrophotometer. Test-filter materials are described that discriminate between the desired wavelengths and those that contribute most to SRP for conventional commercial spectrophotometers used in the ultraviolet, the visible, the near infrared, and the mid-infrared ranges. These procedures apply to instruments of conventional design, with usual sources, detectors, including array detectors, and optical arrangements. The vacuum ultraviolet and the far infrared present special problems that are not discussed herein.Note 1Research () has shown that particular care must be exercised in testing grating spectrophotometers that use moderately narrow bandpass SRP-blocking filters. Accurate calibration of the wavelength scale is critical when testing such instruments. Refer to Practice E 275.1.2 These procedures are neither all-inclusive nor infallible. Because of the nature of readily available filter materials, with a few exceptions, the procedures are insensitive to SRP of very short wavelengths in the ultraviolet, or of lower frequencies in the infrared. Sharp cutoff longpass filters are available for testing for shorter wavelength SRP in the visible and the near infrared, and sharp cutoff shortpass filters are available for testing at longer visible wavelengths. The procedures are not necessarily valid for "spike" SRP nor for "nearby SRP." (See Annexes for general discussion and definitions of these terms.) However, they are adequate in most cases and for typical applications. They do cover instruments using prisms or gratings in either single or double monochromators, and with single and double beam instruments.Note 2Instruments with array detectors are inherently prone to having higher levels of SRP. See Annexes for the use of filters to reduce SRP.1.3 The proportion of SRP (that is, SRPR) encountered with a well-designed monochromator, used in a favorable spectral region, typically is 0.1 % transmittance or better, and with a double monochromator it can be less than 110-6, even with a broadband continuum source. Under these conditions, it may be difficult to do more than determine that it falls below a certain level. Because SRP test filters always absorb some of the SRP, and may absorb an appreciable amount if the specified measurement wavelength is not very close to the cutoff wavelength of the SRP filter, this test method underestimates the true SRPR. However, actual measurement sometimes requires special techniques and instrument operating conditions that are not typical of those occurring during use. When absorption measurements with continuum sources are being made, it can be that, owing to the effect of slit width on SRP in a double monochromator, these test procedures may offset in some degree the effect of absorption by the SRP filter; that is, because larger slit widths than normal might be used to admit enough energy to the monochromator to permit evaluation of the SRP, the stray proportion indicated could be greater than would normally be encountered in use (but the net effect is still more likely to be an underestimation of the true SRPR). Whether the indicated SRPR equals or differs from the normal-use value depends on how much the SRP is increased with the wider slits and on how much of the SRP is absorbed by the SRP filter. What must be accepted is that the numerical value obtained for the SRPR is a characteristic of the particular test conditions as well as of the performance of the instrument in normal use. It i......

Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method