ISO 10110 specifies the presentation of design and functional requirements for single optical elements and for optical assemblies in technical drawings used for their manufacture and inspection. This part of ISO 10110 specifies the indication of the level of acceptability of surface imperfections within the effective aperture of individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches. It is to be noted that the acceptance level for localized imperfections is specified taking into account functional effects (affecting image formation or durability of the optical element) as well as cosmetic (appearance) effects. This part of ISO 10110 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It recognizes that permissible imperfections may be specified according to the area affected by imperfections on components or in optical assemblies.
DIN ISO 10110-7-2009由德国标准化学会 DE-DIN 发布于 2009-06。
DIN ISO 10110-7-2009 在中国标准分类中归属于: N30 光学仪器综合,在国际标准分类中归属于: 01.100.20 机械工程制图,37.020 光学设备。
DIN ISO 10110-7-2009 光学和光子学.光学元件和系统的制图准备.第7部分:表面缺陷公差(ISO 10110-7:2008),DIN ISO 10110-7:2009-06的英文版本 由 DIN 58170-54-1980 变更而来。
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