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x-ray chemical composition analysis

x-ray chemical composition analysis, Total:499 items.

In the international standard classification, x-ray chemical composition analysis involves: Products of non-ferrous metals, Analytical chemistry, Non-ferrous metals, Products of the chemical industry, Construction materials, Refractories, Fuels, Non-metalliferous minerals, Coals, Soil quality. Pedology, Optics and optical measurements, Ferroalloys, Ceramics, Particle size analysis. Sieving, Testing of metals, Ferrous metals, Vocabularies, Inorganic chemicals, Nuclear energy engineering, Wastes, Power stations in general, Radiation measurements, Metalliferous minerals, Iron and steel products, Radiation protection, Electronic tubes, Linear and angular measurements, Protection against crime, Non-destructive testing, Occupational safety. Industrial hygiene, Medical equipment, Laboratory medicine, Air quality, Education, Glass, Textile fibres, Semiconducting materials, Water quality, Geology. Meteorology. Hydrology, Paint ingredients, Welding, brazing and soldering, Optical equipment, Surface treatment and coating, Corrosion of metals.


Professional Standard - Non-ferrous Metal, x-ray chemical composition analysis

  • YS/T 869-2013 Chemical analysis of 4A-Zeolite.X-ray fluorescence spectrometric method
  • YS/T 703-2014 Method for chemical analysis of Limstone.Determination of element contents.X-ray fluorescence spectrometric method
  • YS/T 581.10-2006 Determination of chemical contents and physical properties of aluminium fluoride Part 10:Determination of sulphur content by X-ray fluorescence spectrometric method
  • YS/T 575.23-2009 Method for chemical analysis of aluminum ores.Part 23:Determination of element contents X-ray fluorescence spectrometric method
  • YS/T 581.16-2008 Chemical analysis methods and determination of physical performance of industrial aluminium fluoride.Part 16: X-ray fluorescence spectrometric method for the determination of elements content
  • YS/T 581.18-2012 Chemical analysis methods and physical properties of Aluminum Fluoride.Part 18:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets
  • YS/T 273.14-2008 Chemical analysis methods and determination of physical performance of synthetic cryolite.Part 14: X-ray fluorescence spectrometric method for the determination of elements content
  • YS/T 273.11-2006 Chemical analysis methods and physical properties of cryolite. Part 11:Determination of sulphur content by X-ray fluorescence spectrometric method
  • YS/T 273.15-2012 Chemical analysis methods and physical properties of cryolite.Part 15:X-ray fluorescence spectrometric method for the determination of elements content using pressed powder tablets

Japanese Industrial Standards Committee (JISC), x-ray chemical composition analysis

  • JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
  • JIS R 5204:2002 Chemical analysis method of cement by x-ray fluorescence
  • JIS R 5204:2019 Chemical analysis method of cement by X-ray fluorescence
  • JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
  • JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
  • JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
  • JIS G 1256:1982 Fluorescence X-ray analysis method of steel
  • JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
  • JIS K 0131:1996 General rules for X-ray diffractometric analysis
  • JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
  • JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
  • JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
  • JIS K 0148:2005 Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
  • JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
  • JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
  • JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
  • JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
  • JIS G 1204:1978 General rules for fluorescent X-ray analysis of iron and steel
  • JIS G 1256 AMD 2:2013 Iron and steel.Method for X-ray fluorescence spectrometric analysis (Amendment 2)
  • JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
  • JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
  • JIS K 0160:2009 Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • JIS T 0306:2002 Analysis of state for passive film formed on metallic biomaterials by X-ray photoelectron spectroscopy
  • JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

International Organization for Standardization (ISO), x-ray chemical composition analysis

  • ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • ISO 29581-2:2010 Cement - Test methods - Part 2: Chemical analysis by X-ray fluorescence
  • ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
  • ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
  • ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
  • ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
  • ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
  • ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
  • ISO/TR 12389:2009 Methods of testing cement - Report of a test programme - Chemical analysis by x-ray fluorescence
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • ISO 20565-2:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
  • ISO 19318:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 19318:2021 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
  • ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • ISO 14706:2014 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
  • ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
  • ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 % to 45 % of ZrO<(Index)2> (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica
  • ISO 17331:2004 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • ISO 22863-4:2021 Fireworks - Test methods for determination of specific chemical substances - Part 4: Analysis of lead and lead compounds by X-ray fluorescence spectrometry (XRF)
  • ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
  • ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica

British Standards Institution (BSI), x-ray chemical composition analysis

  • BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
  • BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Wet chemical analysis
  • BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 29581-2:2010 Cement - Test methods - Chemical analysis by X-ray fluorescence
  • BS EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Wet chemical analysis
  • BS EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008)
  • BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
  • BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
  • BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
  • BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
  • DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
  • BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • PD ISO/TR 12389:2009 Methods of testing cement. Report of a test programme. Chemical analysis by x-ray fluorescence
  • BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
  • BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Wet chemical analysis
  • BS EN ISO 20565-2:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method). Part 2: Wet chemical analysis
  • BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
  • BS 1902-9.1:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of alumino-silicate refractories by X-ray fluorescence
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS EN ISO 21079-2:2009 Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method). Wet chemical analysis
  • BS EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Part 2: Wet chemical analysis (ISO 21079-2:2008)
  • BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
  • BS ISO 19318:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS ISO 22863-4:2021 Fireworks. Test methods for determination of specific chemical substances. Analysis of lead and lead compounds by X-ray fluorescence spectrometry (XRF)
  • BS EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Apparatus, reagents, dissolution and determination of gravimetric silica
  • BS EN ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica (ISO 10058-1:2008)
  • BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
  • 23/30446996 DC BS EN ISO 21068-4. Chemical analysis of raw materials and refractory products containing silicon carbide, silicon nitride, silicon oxynitride and sialon - Part 4. XRD methods
  • BS ISO 16258-2:2015 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Method by indirect analysis
  • BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
  • BS EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - XRD methods
  • BS 1902 Sec.9.2:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of silica refractories by X-ray fluorescence
  • BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
  • BS ISO 17331:2004+A1:2010 Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS 1902 Sec.9.1:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of alumino-silicate refractories by X-ray fluorescence
  • BS EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Apparatus, reagents, dissolution and gravimetric silica
  • 19/30401682 DC BS ISO 22863-4. Fireworks. Test methods for determination of specific chemical substances. Part 4. Analysis of lead and lead compounds by X-ray Fluorescence spectrometry (XRF)
  • 20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
  • BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray chemical composition analysis

  • GB/T 42360-2023 Total Reflection X-ray Fluorescence Spectroscopic Analysis of Water for Surface Chemical Analysis
  • GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
  • GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF.Fused cast bead method
  • GB/T 21114-2007 X-ray Fluorescence Spectrochemical Analysis of Refractory Materials - Molten Glass Disk Method
  • GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
  • GB/T 30904-2014 Inorganic chemicals for industrial use.Crystal form analysis.X-ray diffraction method
  • GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
  • GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
  • GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
  • GB/T 17416.2-1998 Method for chemical analysis of Zirconium ores.Determination of Zirconium and Hafnium contents.X-ray fluorescence spectrometric method
  • GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
  • GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • GB/T 14849.5-2010 Chemical analysis of slion metal.Part 5: Determination of elements content.Analysis using an X-ray fluorescence method
  • GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
  • GB/T 13710-1992 Blank detail specificationn of X-ary tubes for analysis
  • GB/T 14506.28-1993 Silicate rocks. Determination of contents of major and minor elements. X-ray fluorescence spectrometric method
  • GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
  • GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
  • GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina.Part 32:Determination of а-alumina content by X-ray diffraction
  • GB/T 14849.5-2014 Methods for chemical analysis of silicon metal.Part 5:Determination of impurity contents.X-ray fluorescence method
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 5225-1985 Metal materials--Quantitative phase analysis--"value K" method of x-ray diffraction
  • GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
  • GB/T 30701-2014 Surface chemical analysis.Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • GB/T 3284-2015 Analytical method of the chemical composition in the quartz glass
  • GB/T 3284-1993 Analytical method of the chemical composition in the quartz glass
  • GB/T 5889-1986 Method of quantitative analysis of ramie chemical components
  • GB 5889-1986 Quantitative analysis method of chemical composition of ramie
  • GB/T 8156.10-1987 Aluminium fluoride for industrial use--Determination of sulphur content--X-ray fluorescence spectrometric method
  • GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
  • GB/T 31590-2015 Analytical method of chemical composition for flue gas DeNOx catalysts
  • GB/T 31590-2015(英文版) Analytical method of chemical composition for flue gas DeNO x catalysts
  • GB/T 222-1984 Method of sampling steel for determination of chemical composition and permissible variations for product analysis
  • GB/T 6609.30-2009 Chemical analysis methods and determination of physical performance of alumina.Part 30:X-ray fluorescence spectrometric method for the determination content of trace elements
  • GB/T 31589-2015 Analytical method of chemical composition for activated MDEA decarbonization desulfurization agent
  • GB/T 6767-1986 Radiochemical analysis of cesium-137 in water
  • GB/T 16597-1996 Analytical methods of metallurgical products. General rule for X-ray fluorescence spectrometric methods
  • GB/T 17362-2008 Scanning electron microscope X-ray energy spectrum analysis method for gold products
  • GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
  • GB/T 18882.2-2002 Chemical analysis methods for mixed rare earth oxide of ion-absorpted type RE ore-Determination of fifteen REO relative content--X-ray fluorescence spectrometric method

工业和信息化部, x-ray chemical composition analysis

  • YS/T 1344.3-2020 Chemical analysis method of tin-doped indium oxide powder Part 3: Phase analysis X-ray diffraction analysis method
  • YS/T 1178-2017 Aluminum slag phase analysis X-ray diffraction method
  • YB/T 172-2020 Quantitative phase analysis of silica bricks by X-ray diffraction method
  • YS/T 806-2020 Chemical analysis methods for aluminum and aluminum alloys Determination of elemental content X-ray fluorescence spectrometry
  • YS/T 575.23-2021 Methods of chemical analysis of bauxite ores Part 23: Determination of elemental content X-ray fluorescence spectrometry
  • YS/T 581.15-2012 Methods for chemical analysis and determination of physical properties of aluminum fluoride Part 15: Determination of elemental content by X-ray fluorescence spectrometry (tablet pressing) method
  • HG/T 5909-2021 Analysis method of chemical components of meropenem synthesis catalyst
  • HG/T 5586-2019 Analysis method of chemical components of supported ammonia synthesis catalyst
  • HG/T 5319-2018 Analysis method of chemical composition of manganese oxide desulfurizer
  • HG/T 5038-2016 Analysis method of chemical composition of Raney nickel catalyst
  • YS/T 1160-2016 Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K value method
  • HG/T 5040-2016 Analysis method of chemical components of prereduced ammonia synthesis catalyst
  • HG/T 5587-2019 Methods for analysis of chemical components of catalysts used for hydrogenation to synthesize aromatic amines
  • HG/T 5580-2019 Analysis method of chemical composition of polyethylene oxide catalyst
  • HG/T 5030-2016 Method for analyzing the chemical composition of catalysts for cobalt and molybdenum sulfide
  • HG/T 5589-2019 Analysis method of chemical components of propylene polymerization catalyst
  • HG/T 5193-2017 Analysis method of chemical components of methanol hydrogen production catalyst
  • HG/T 5757-2020 Methods for analyzing chemical components of aluminum-based hydrogenation catalysts
  • HG/T 5527-2019 Analysis method of chemical composition of aluminum-based desulfurizer
  • HG/T 5039-2016 Analysis method of chemical composition of CO2 dehydrogenation catalyst for urea synthesis
  • HG/T 5418-2018 Method for analyzing chemical components of manganese-based ozone decomposition catalysts
  • HG/T 5530-2019 Methods for analyzing chemical components of silicate molecular sieve catalysts
  • HG/T 5198-2017 Analysis method of chemical composition of medium temperature iron oxide desulfurizer
  • HG/T 5317-2018 Analysis method of chemical components of room temperature demercaptan catalyst
  • YB/T 4144-2019 Establish and control atomic emission spectroscopy chemical analysis curve rules
  • HG/T 5410-2018 Analysis method of chemical components of medium-temperature sulfur-tolerant hydrolysis catalysts
  • HG/T 5583-2019 Analysis method of chemical components of ethylene gas phase polymerization catalyst
  • HG/T 5414-2018 Analysis method of chemical composition of diesel hydrorefining catalyst
  • HG/T 5762-2020 Analysis method of chemical composition of chromium-based ethylene polymerization catalyst

Association Francaise de Normalisation, x-ray chemical composition analysis

  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF EN ISO 12677:2011 Analyse chimique des matériaux réfractaires par fluorescence de rayons X - Méthode de la perle fondue
  • NF B40-670-2*NF EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2 : wet chemical analysis
  • NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
  • NF A11-103:1977 Chemical analysis of ferroniobium. Determination of niobium by X ray fluorescence spectrometry.
  • NF EN ISO 10058-2:2009 Analyse chimique des produits de magnésie et de dolomie (méthode alternative à la méthode par fluorescence de rayons X) - Partie 2 : méthodes d'analyse chimique par voie humide
  • NF B49-329-2*NF EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2 : wet chemical analysis
  • NF EN ISO 21587-2:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 2 : méthodes d'analyse chimique par voie humide
  • NF B49-435-2*NF EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2 : wet chemical analysis.
  • NF B40-677*NF EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
  • NF EN ISO 20565-2:2009 Analyse chimique des produits réfractaires contenant du chrome et des matières premières contenant du chrome (méthode alternative à la méthode par fluorescence de rayons X) - Partie 2 : méthodes d'analyse chimique par voie humide
  • NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
  • NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
  • FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
  • NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
  • NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
  • NF B49-424-2*NF EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 % to 45 % of ZrO2 (alternative to the X-ray fluorescence method) - Part 2 : Wet chemical analysis
  • NF S92-502:2006 Medical biology analysis laboratory - Anthroporadiametric - Lungs countings - Measurements of low energy X and gamma emitters (less than 200 keV).
  • NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
  • NF S57-037-4*NF ISO 22863-4:2021 Fireworks - Test methods for determination of specific chemical substances - Part 4 : analysis of lead and lead compounds by X-ray fluorescence spectrometry (XRF)
  • NF ISO 22863-4:2021 Artifices de divertissement - Méthodes d'essai pour la détermination de substances chimiques spécifiques - Partie 4 : analyse du plomb et de ses composés par spectrométrie de fluorescence des rayons X (XRF)
  • NF EN 16424:2014 Caractérisation des déchets - Méthode de dépistage pour la détermination de la composition élémentaire au moyen d'analyseurs portables de fluorescence X
  • NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
  • NF A06-590:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis.
  • NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
  • NF EN ISO 22940:2021 Combustibles solides de récupération - Détermination de la composition élémentaire par fluorescence de rayons X
  • NF B49-435-1*NF EN ISO 20565-1:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 1 : apparatus, reagents, dissolution and determination of gravimetric silica
  • NF EN ISO 21587-1:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 1 : appareillage, réactifs, dissolution et teneur en silice par gravimétrie
  • NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
  • NF B40-670-1*NF EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1 : apparatus, reagents, dissolution and gravimetric silica

Professional Standard - Chemical Industry, x-ray chemical composition analysis

  • HG/T 6150-2023 X-ray fluorescence spectrometry method for chemical composition analysis of lubricating oil hydroisomerization catalyst
  • HG/T 3554-2013 Analytical method of chemical composition in ammonia synthesis catalyst
  • HG/T 3554-1981 Analytical Method for Chemical Components of Ammonia Synthesis Catalyst
  • HG/T 4198-2011 Method for Analyzing Chemical Components of Methanol Synthesis Catalysts
  • HG/T 2511-2005 Analytical method of chemical composition in methanation catalyst
  • HG/T 2511-2013 Analytical method of chemical composition in methanation catalyst
  • HG/T 3554-2005 Analytical method of chemical composition in ammonia synthesis catalyst
  • HG/T 4678-2014 Analytical method of chemical composition in iron-based catalyst Fischer-Tropsch synthesis
  • HG/T 3555-2016 Analytical method of chemical components in light oil reforming catalyst
  • HG/T 3555-2006 Analytical method of chemical components in light oil reforming catalyst
  • HG/T 2512-2005 Analytical method of chemical composition in zinc oxide desulfurization sorbent
  • HG/T 2512-2013 Analytical method of chemical composition in zinc oxide desulfurization sorbent
  • HG/T 3543-2014 Analytical method of chemical composition in natural gas reforming catalyst
  • HG/T 3543-1988 Analytical method of chemical composition for natural gas reforming catalysts
  • HG/T 2511-1993 Analytical method for chemical composition of methanation catalyst
  • HG/T 4682-2014 Analytical method of chemical composition in the catalyst for cyclohexanol dehydrogenation
  • HG/T 4854-2015 Analytical method of chemical composition in iron oxide desulfurization sorbent at room temperature
  • HG/T 6147-2023 Analytical method for chemical composition of platinum palladium series deoxidizer
  • HG/T 2512-1993 Analytical method for chemical composition of zinc oxide desulfurizer
  • HG 1-1431-1981 Analytical method for chemical composition of vanadium catalyst for sulfuric acid production

PT-IPQ, x-ray chemical composition analysis

Korean Agency for Technology and Standards (KATS), x-ray chemical composition analysis

  • KS L 5222-2009(2019) Chemical analysis method of cement by x-ray fluorescence
  • KS M 0043-2009 General rules for X-ray diffractometric analysis
  • KS L ISO 21587-2:2012 Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS E ISO 10086-2:2007 Coal-Methods for evaluating flocculants for use in coal preparation-Part 2:Flocculants as filter aids in rotary vacuum filtration systems
  • KS D ISO 14706-2003(2018)
  • KS D ISO 15472-2003(2018)
  • KS L ISO 21587-2-2012(2017) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 10058-2:2012 Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 20565-2-2012(2022) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 10058-2-2012(2022) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 21587-2-2012(2022) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS L ISO 20565-2-2012(2017) Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 10058-2-2012(2017) Chemical analysis of magnesite and dolomite refractory products(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
  • KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
  • KS L ISO 20565-2:2012 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS E 3076-2002 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
  • KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
  • KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
  • KS D ISO 14706:2003 Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
  • KS L ISO 21079-2-2012(2022) Chemical analysis of refractories containing alumina, zirconia and silica-Refractories containing 5 % to 45 % of ZrO2(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
  • KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
  • KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
  • KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
  • KS D ISO 15470:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS L ISO 21079-2-2012(2017) Chemical analysis of refractories containing alumina, zirconia and silica-Refractories containing 5 % to 45 % of ZrO2(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS L ISO 21079-2:2012 Chemical analysis of refractories containing alumina, zirconia and silica-Refractories containing 5 % to 45 % of ZrO2(alternative to the X-ray fluorescence method)-Part 2:Wet chemical analysis
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 19318-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Reporting of methods used for charge control and charge correction
  • KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
  • KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
  • KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
  • KS D ISO 19318:2005 Surface chemical analysis-X-ray photoelectron spectroscopy-Reporting of methods used for charge control and charge correction
  • KS E ISO 10086-1:2007 Coal-Methods for evaluating flocculants for use in coal preparation-Part 1:Basic parameters
  • KS M 1068-2005 Qualitative/quantitative screening by XRF spectrometry
  • KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
  • KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
  • KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
  • KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
  • KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
  • KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS L ISO 10058-1:2012 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method)-Part 1:Apparatus, reagents, dissolution and determination of gravimetric silica
  • KS E 3076-2017 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
  • KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
  • KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
  • KS D 1681-1993 Method for emission spectrochemical analysis of aluminium ingot
  • KS D 2086-1993 Methods for emission spectrochemical analysis of titanium
  • KS L 3316-2009 Method for X-ray fluorescence spectrometric analysis of refractory brikcs and refractory mortars
  • KS E 3075-2002 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
  • KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
  • KS L ISO 21587-1-2012(2022) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)-Part 1:Apparatus, reagents, dissolution and determination of gravimetric silica
  • KS L ISO 21587-1:2012 Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)-Part 1:Apparatus, reagents, dissolution and determination of gravimetric silica

German Institute for Standardization, x-ray chemical composition analysis

  • DIN 51729-10:1996 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray fluorescence analysis
  • DIN 51729-10:2011-04 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray Fluorescence Analysis
  • DIN EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); English version of DIN EN ISO 21587-2:2007-12
  • DIN EN ISO 21587-2:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007); German version EN ISO 21587-2:2007
  • DIN 51729-10:2011 Testing of solid fuels - Determination of chemical composition of fuel ash - Part 10: X-Ray Fluorescence Analysis
  • DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
  • DIN EN ISO 10058-2:2009 Chemical analysis of magnesites and dolomites refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008); English version of DIN EN ISO 10058-2:2009-04
  • DIN EN ISO 10058-2:2009-04 Chemical analysis of magnesites and dolomites refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008); German version EN ISO 10058-2:2008
  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN EN ISO 20565-2:2009-06 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 20565-2:2008); German version EN ISO 20565-2:2008
  • DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
  • DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 20565-2:2008); English version of DIN EN ISO 20565-2:2009-06
  • DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN EN ISO 12677:2013-02 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011); German version EN ISO 12677:2011
  • DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN 55912-2 Bb.2:1999 Pigments - Titanium dioxide pigments - Methods of analysis; establishing a calibration graph using the X-ray fluorescence analysis
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia and silica - Refractories containing 5 % to 45 % of ZrO<(Index)2> (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21079-2:2008); German version EN ISO 21079
  • DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN EN ISO 21587-1:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007); German version EN ISO 21587-1:2007
  • DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
  • DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
  • DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
  • DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
  • DIN EN ISO 12677:2012 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011); German version EN ISO 12677:2011
  • DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
  • DIN EN ISO 12677:2013 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011); German version EN ISO 12677:2011
  • DIN ISO 11505:2018-02 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)
  • DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
  • DIN EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007); English version of DIN EN ISO 21587-1:2007-12

Danish Standards Foundation, x-ray chemical composition analysis

  • DS/EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • DS/EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • DS/EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • DS/CEN/TR 10354:2012 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
  • DS/EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
  • DS/EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • DS/ISO 22863-4:2021 Fireworks – Test methods for determination of specific chemical substances – Part 4: Analysis of lead and lead compounds by X-ray fluorescence spectrometry (XRF)
  • DS/EN 14726:2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis
  • DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
  • DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
  • DS/EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica

国家市场监督管理总局、中国国家标准化管理委员会, x-ray chemical composition analysis

  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
  • GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
  • GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • GB/T 36923-2018 Identification of pearl powder―X-ray diffraction analysis
  • GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
  • GB/T 37354-2019 Analytical method of chemical composition for activated carbon mercury removal catalyst
  • GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods

未注明发布机构, x-ray chemical composition analysis

  • BS EN ISO 12677:2011(2014) Chemical analysis of refractory products by X - ray fluorescence (XRF) — Fused cast - bead method
  • BS EN ISO 20565-2:2008(2010) Chemical analysis of chrome - bearing refractory products and chrome - bearing raw materials (alternative to the X - ray fluorescence method) Part 2 : Wet chemical analysis
  • BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • BS 6870-3:1989(1999) Analysis of aluminium ores — Part 3 : Method for multi - element analysis by wavelength dispersive X - ray fluorescence
  • BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction

Guangdong Provincial Standard of the People's Republic of China, x-ray chemical composition analysis

  • DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry

RU-GOST R, x-ray chemical composition analysis

  • GOST 33850-2016 Soils. Determination of chemical composition by X-Ray fluorescence spectrometry
  • GOST 28033-1989 Steel. Method of X-ray-fluorescent analysis
  • GOST R 55879-2013 Solid mineral fuels. Determination of chemical composition of ash by X-Ray fluorescence
  • GOST R 55410-2013 Refractory. Analysis by X-ray fluorescence (XRF)
  • GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
  • GOST 16865-1979 X-ray apparatus for structural and spectral analyses. Terms and definitions
  • GOST R 50267.28-1995 Medical electrical equipment. Part 2. Particular requirements for the safety of X-ray source assemblies and X-ray tube assemblies for medical diagnosis
  • GOST 6012-2011 Nickel. Methods of chemical-atomic-emission spectral analysis
  • GOST 8776-2010 Cobalt. Methods of chemical-atomic-emission spectral analysis
  • GOST 6012-1978 Nickel. Methods of chemical-atomic-emission spectral analysis
  • GOST 19647-1974 Methods and means of radioisotope X-ray analysis. Terms and definitions

European Committee for Standardization (CEN), x-ray chemical composition analysis

  • EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
  • CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
  • EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
  • EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008)
  • EN ISO 20565-2:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis
  • EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21079-2:2008)

KR-KS, x-ray chemical composition analysis

ES-UNE, x-ray chemical composition analysis

  • UNE-EN ISO 10058-2:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008) (Endorsed by AENOR in February of 2009.)
  • UNE-EN ISO 20565-2:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 20565-2:2008) (Endorsed by AENOR in February of 2009.)

Lithuanian Standards Office , x-ray chemical composition analysis

  • LST EN ISO 21587-2:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007)
  • LST EN ISO 10058-2:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 10058-2:2008)
  • LST EN ISO 20565-2:2009 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 20565-2:2008)
  • LST EN ISO 12677:2012 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011)
  • LST EN ISO 21079-2:2008 Chemical analysis of refractories containing alumina, zirconia, and silica - Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21079-2:2008)
  • LST EN 14726-2005 Aluminium and aluminium alloys - Chemical analysis - Guideline for spark optical emission spectrometric analysis
  • LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
  • LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

AENOR, x-ray chemical composition analysis

  • UNE-EN ISO 21587-2:2008 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 2: Wet chemical analysis (ISO 21587-2:2007)
  • UNE-EN ISO 12677:2012 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method (ISO 12677:2011)
  • UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

Professional Standard - Machinery, x-ray chemical composition analysis

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x-ray chemical composition analysis

  • GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
  • GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
  • GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
  • GB/T 33503-2017 Analytical method of the chemical composition in the glass containing lead
  • GB/T 32997-2016 Surface chemical analysis—General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Standard Association of Australia (SAA), x-ray chemical composition analysis

  • AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser

American Society for Testing and Materials (ASTM), x-ray chemical composition analysis

  • ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
  • ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
  • ASTM E1085-95(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
  • ASTM E1085-95(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
  • ASTM E1085-95(2004)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
  • ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
  • ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
  • ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
  • ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
  • ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
  • ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
  • ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
  • ASTM D2332-13(2021) Standard Practice for Analysis of Water-Formed Deposits by Wavelength-Dispersive X-Ray Fluorescence
  • ASTM E322-96e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
  • ASTM D7902-20 Standard Terminology for Radiochemical Analyses
  • ASTM D7902-18 Standard Terminology for Radiochemical Analyses
  • ASTM D7902-14 Standard Terminology for Radiochemical Analyses
  • ASTM D7902-14e1 Standard Terminology for Radiochemical Analyses
  • ASTM D7902-16 Standard Terminology for Radiochemical Analyses
  • ASTM C1605-04(2014) Standard Test Methods for Chemical Analysis of Ceramic Whiteware Materials Using Wavelength Dispersive X-Ray Fluorescence Spectrometry
  • ASTM D5381-93(2003) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
  • ASTM D5381-93(1998) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
  • ASTM C1605-04 Standard Test Methods for Chemical Analysis of Ceramic Whiteware Materials Using Wavelength Dispersive X-Ray Fluorescence Spectrometry
  • ASTM C1605-04(2009) Standard Test Methods for Chemical Analysis of Ceramic Whiteware Materials Using Wavelength Dispersive X-Ray Fluorescence Spectrometry

Professional Standard - Ferrous Metallurgy, x-ray chemical composition analysis

  • YB/T 172-2000 Phase quantitative analysis of silica bricks.X-ray diffraction method
  • YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method
  • YB/T 4177-2008 Determination of chemical composition in stag by X-ray fluorescence spectrometry
  • YB/T 5320-2006 X-ray Diffraction K Value Method for Quantitative Phase Analysis of Metallic Materials

Professional Standard - Commodity Inspection, x-ray chemical composition analysis

  • SN/T 3322.1-2012 Chemical analysis of limenite concentrate for import and export.Part 1:Determination of major and minor components.Wavelength dispersive X-ray fluorescence spectrometry
  • SN/T 3318.2-2015 Chemical analysis of zirconium sand.Part 2:Determination of zirconium, iron and titanium contents.Wavelength dispersion X-ray fluorescence spectrometric method

Professional Standard - Building Materials, x-ray chemical composition analysis

Professional Standard - Nuclear Industry, x-ray chemical composition analysis

  • EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
  • EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
  • EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
  • EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
  • EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
  • EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer

Group Standards of the People's Republic of China, x-ray chemical composition analysis

  • T/CACE 064-2022 Determination of coal gasification slag compositions—X-ray fluorescence spectrometric method

Professional Standard - Electricity, x-ray chemical composition analysis

  • DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction

Professional Standard - Geology, x-ray chemical composition analysis

  • DZ/T 0279.1-2016 Analytical methods of regional geochemical samples Part 1: Determination of 24 components such as aluminum oxide and other components by powder compression—X-ray fluorescence spectrometry
  • DZ/T 0370-2021 Technical regulations for portable X-ray fluorescence on-site analysis
  • DZ/T 0279.10-2016 Methods of Analysis of Regional Geochemical Samples - Part 10: Determination of Chlorine and Bromine Quantification Powder Compression - X-ray Fluorescence Spectrometry

American National Standards Institute (ANSI), x-ray chemical composition analysis

  • ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment

Yunnan Provincial Standard of the People's Republic of China, x-ray chemical composition analysis

  • DB53/T 639.7-2014 Methods for chemical analysis of direct reduced iron - Part 7: Determination of multiple elements by X-ray fluorescence spectrometry

Professional Standard - Public Safety Standards, x-ray chemical composition analysis

  • GA/T 1655-2019 Forensic Science Soil Elemental Composition Examination X-ray Fluorescence Spectroscopy
  • GA/T 1654-2019 Forensic Science Paper Elemental Composition Examination Wavelength Dispersive X-ray Fluorescence Spectroscopy
  • GA/T 1422-2017 X-ray Diffraction Method for Examining Composition of Common Fire and Explosives in Forensic Science
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy

Taiwan Provincial Standard of the People's Republic of China, x-ray chemical composition analysis

  • CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
  • CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
  • CNS 4986-1979 Methods of Chemical Analysis for Synthetic Detergents

Occupational Health Standard of the People's Republic of China, x-ray chemical composition analysis

  • GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

International Electrotechnical Commission (IEC), x-ray chemical composition analysis

  • IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube

Professional Standard - Light Industry, x-ray chemical composition analysis

  • QB/T 1272-1991 Preparation of samples for chemical analysis of finished fur products and general rules for chemical analysis
  • QB/T 1967.3-2017 Test method for chemical composition analysis of white ceramic pigment
  • QB/T 1967.5-2017 Test method for chemical composition analysis of black ceramic pigment
  • QB/T 2578-2002 Standard test method for chemical composition of ceramic materials by spectrophotometry

Professional Standard - Petroleum, x-ray chemical composition analysis

  • SY/T 6240-1996 Chemical analgsis method of barite
  • SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks

Professional Standard - Education, x-ray chemical composition analysis

  • JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
  • JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

RO-ASRO, x-ray chemical composition analysis

HU-MSZT, x-ray chemical composition analysis

Institute of Electrical and Electronics Engineers (IEEE), x-ray chemical composition analysis

  • IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers

Professional Standard - Rare Earth, x-ray chemical composition analysis

  • XB/T 610.1-2007 Chemical analysis methods for samarium cobalt permanent magnet alloy powdep- Determination of samarium and cobalt- X-ray fluorescence sPedrometric method

Anhui Provincial Standard of the People's Republic of China, x-ray chemical composition analysis

  • DB34/T 2127.2-2014 Methods of Analysis of Samples for Regional Geochemical Surveys Part 2: Determination of Multielement Content by X-ray Fluorescence Spectrometry

CZ-CSN, x-ray chemical composition analysis

  • CSN 70 0637 Cast.2-1986 Glass testing methods. Chemical analysis of glass. Determination of barium oxide at presence of lead oxide. Gravimetric method

中华人民共和国环境保护部, x-ray chemical composition analysis

IN-BIS, x-ray chemical composition analysis

工业和信息化部/国家能源局, x-ray chemical composition analysis

  • JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers




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