N34 光学计量仪器 标准查询与下载

IEC 62129-2:2011 波长/逛拼测量仪器校准 第2部分 迈克逊单波长米干涉仪

This part of IEC 62129 is applicable to instruments measuring the vacuum wavelength or optical frequency emitted from sources that are typical for the fibre-optic communications industry. These sources include Distributed Feedback (DFB) laser diodes@ External Cavity lasers and single longitudinal mode fibre-type sources. It is assumed that the optical radiation will be coupled to the wavelength meter by a single-mode optical fibre. The standard describes the calibration of wavelength meters to be performed by calibration laboratories or by wavelength meter manufacturers. This standard is part of the IEC 62129 series on the calibration of wavelength/optical frequency measurement instruments. Refer to IEC 62129 for the calibration of optical spectrum analyzers.

Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters

JJF 1280-2011 容栅数显标尺校准规范

本规范适用于分辨力为0.005mm、0.01mm,测量范围（0～2000)mm各种规格的容栅数显标尺的校准。

Calibration Specification for Capacitive Digital Scale Units

DIN ISO 11421:2010 光学和光学仪器.光学传递函数(OTF)测量的准确性(ISO 11421-1997)

This International Standard gives genral guidance on evaluating the sources of error in optical reansfer function (OTF)equipment and in using this information to estimate errors in a measurement of OTF.

Optics and optical instruments - Accuracy of optical transfer function (OTF) measurement (ISO 11421:1997)

JIS B 9921:2010 净化区用光散射空气粒子计数器

Light scattering airborne particle counter for clean spaces

JIS B 9916:2010 消光液载粒子计数器

Light extinction liquid-borne particle counter

JIS B 9925:2010 光散射液载粒子计数器

Light scattering liquid-borne particle counter

ASTM E983-10 在俄歇电子谱法中测定化学效应和基质效应的标准指南

When electron beam excitation is used in AES, the incident electron beam can interact with the specimen material causing physical and chemical changes. In general, these effects are a hindrance to AES analysis because they cause localized specimen modification (1-4). With specimens that have poor electrical conductivity the electron beam can stimulate the development of localized charge on the specimen surface. This effect is a hindrance to AES analysis because the potentials associated with the charge can either adversely affect the integrity of Auger data or make Auger data collection difficult (5, 6).1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES). 1.2 Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these effects and suggestions are offered on how to minimize them. 1.3 General classes of materials are identified which are most likely to exhibit unwanted electron beam effects. In addition, a tabulation of some specific materials which have been observed to undergo electron damage effects is provided. 1.4 A simple method is outlined for establishing the existence and extent of these effects during routine AES analysis. 1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

JJF 1232-2009 反射率测定仪校准规范

本规范规定了基于白色、浅色颜料对比率测量的反射率测定仪的计量特性要求、校准方法及校准所用的仪器设备等内容，适用于此类反射率测定仪的校准。

Calibration Specification for Reflectometers

JIS C 1609-2:2008 光照度计.第2部分:交易或认证用测量仪表

この規格は，一般照明用光源(白熱電球，蛍光ランプ，HIDランプなど)の照度()を測定するアナログ指示式照度計及びデジタル表示式照度計(以下，“照度計’という。)のうち，日本国内における取引又は証明に用いられる照度計について規定する。

Illuminance meters -- Part 2: Measuring instruments used in transaction or certification

GJB/J 6220-2008 红外光学系统焦距测量装置校准规范

本校准规范定了红外光学系统焦距测量装置的计量特性、校准条件、校准项目、校准方法、校准结果的处理和复校时间间隔。 本校准规范适用于新制造（或新购置）、使用中、修理后的红外光学系统焦距测量装置的校准。其他红外焦距测量仪的校准液可参照执行。

Calibration specification for IR optical focal length measuring equipment

JIS C 6185:2008 光学时域反射计的试验方法

この規格は，光ファイバに光パルスを入射し，それによって生じる光ファイバの後方散乱光強度を時間領域で測定するオプティカルタイムドメインリフレクトメータ（以下，OTDRという。)の試験方法についで規定する。

Test methods of optical time domain reflectometer

JJG(交通) 076-2007 车载式路面激光车辙仪检定规程

本堆积适用于车载式路面激光车辙仪（以下简称激光车制）的首次检定、后续检定和使用中的检验。

Vehicle bearing road laser rut-meter

JJG(交通) 075-2007 车载式路面激光平整度仪检定规程

本规程适用于车载式路面激光平整度仪（以下简称激光平整度仪）的首次检定、后续 检定和使用中的检验。

Vehicle bearing road laser profilometer

JIS B 7913:2007 光学和光学仪器.测量仪器用辅助装置.三角台

この規格はセオドライト，光波測距儀，トータルステーション， GPS測量機及びその附属品(反射鏡，GPSアンテナ，ターゲット，測定工具など)(以下，測量機器という。)に使用される整準台 に適用し，測量機器本体と整準台との接合部及び整準台本体に要求される基本的な機能について規定する。

Optics and optical instruments -- Ancillary devices for geodetic instruments -- Tribrachs

JIS C 1613:2007 金属卤化物灯型曝光仪的强光紫外线辐射计

この規格は，工業材料及び工業製品の物理的特性・化学的特性を人工的に促進劣化させるために，メタルへライドランプを光源として用いる試験機において，その装置内における紫外放射照度(対象物の面に与えられる紫外放射の密度)を，試験機内に非常設で測定する光電素子を用いたメタルハライドランプ方式試験機用高エネルギー(1)紫外放射照度計(以下,放射照度計という。)について規定する。なお，この規格を使用するときの受光部の温度上限は，70°Cとする。注(1)この規格でいう高エネルギーは，波長300-400nmの範囲で，放射照度が300 W・m-2以上とすろ。

High irradiance ultraviolet radiometers of the metalhalide lamp type exposure apparatus

DIN EN 62129:2007 光谱分析仪的校正(IEC 62129-2006)

Calibration of optical spectrum analyzers (IEC 62129:2006); German version EN 62129:2006

ASTM E578-07 荧光测量系统的线性度用标准试验方法

The range of concentration of a fluorescing substance in solution over which the fluorescence varies linearly with the concentration is the range most useful for quantitative analysis. This range is affected by properties of the solution under analysis and by features of the measuring system. This test method provides a means of testing the performance of a fluorescence measuring system and of determining the concentration range over which the system is suitable for making a given quantitative analysis. This test method is not meant for comparing the performance of different fluorescence measuring instruments.1.1 This test method covers a procedure for evaluating the limits of the linearity of response with fluorescence intensity of fluorescence-measuring systems under operating conditions. Particular attention is given to slit widths, filters, and sample containers. This test method can be used to test the overall linearity under a wide variety of instrumental and sampling conditions. The results obtained apply only to the tested combination of slit width and filters, and the size, type and illumination of the sample cuvette, all of which must be stated in the report. The sources of nonlinearity may be the measuring electronics, excessive absorption of either the exciting or emitted radiation, or both, and the sample handling technique, particularly at low concentrations.1.2 This test method has been applied to fluorescence-measuring systems utilizing continuous and low-energy excitation sources (for example, an excitation source of 450-W electrical input or less). There is no assurance that extremely intense illumination will not cause photodecomposition of the compounds suggested in this test method. For this reason it is recommended that this test method not be indiscriminately employed with high-intensity light sources. It is not a test method to determine the linearity of response of other materials. If this test method is extended to employ other chemical substances, the principles within can be applied, but new material parameters, such as the concentration range of linearity, must be established. The user should be aware of the possibility that these other substances may undergo decomposition, or adsorption onto containers.1.3 This test method has been applied to fluorescence-measuring systems utilizing a single detector, that is, a photomultiplier tube or a single photodiode. It has not been demonstrated if this method is effective for photo-array instruments such as those using a CCD or a diode array detector.1.4 This test method is applicable to 10-mm pathlength cuvette formats and instruments covering a wavelength range within 190 to 900 nm. The use of other sample formats has not been established with this test method.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Linearity of Fluorescence Measuring Systems

ISO 14134:2006 光学和光学仪器.天文望远镜规范

This International Standard applies to astronomical telescopes, including finder telescopes, and to their functional specifications. These specifications are restricted to amateur astronomical telescopes, which should be distinguished from hand-held or mounted general purpose monocular telescopes.

Optics and optical instruments - Specifications for astronomical telescopes

JIS B 7912-2:2006 大地测量试验和调查设备的现场程序.第2部分:水准仪

この規格は，レべルの屋外での精度を評価するときに用いられる方法について規定する。

Field procedures for testing geodetic and surveying instruments -- Part 2: Levels

JIS B 7912-4:2006 大地测量试验和调查设备的现场程序.第4部分:光电测距仪(EDM仪)

このJIS B 7912-4は，光波測距儀の屋外での精度を評価するときに用いられる方法について規定する。

Field procedures for testing geodetic and surveying instruments -- Part 4: Electro-optical distance meters (EDM instruments)